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CN101290090B - Light source scattering illumination device of detection system - Google Patents

Light source scattering illumination device of detection system Download PDF

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Publication number
CN101290090B
CN101290090B CN2007100981483A CN200710098148A CN101290090B CN 101290090 B CN101290090 B CN 101290090B CN 2007100981483 A CN2007100981483 A CN 2007100981483A CN 200710098148 A CN200710098148 A CN 200710098148A CN 101290090 B CN101290090 B CN 101290090B
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light
light source
detection system
heat
source scattering
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CN101290090A (en
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涂钟范
王俊杰
石宇森
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Industrial Technology Research Institute ITRI
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Abstract

The invention is a light source scattering illumination device of detection system, comprising: a reflection cover body, a Teflon scattering layer and at least one light-emitting device. The reflector body is provided with a slotted hole. The Teflon (PTFE) scattering layer is arranged on the inner wall of the reflector body. The at least one light-emitting device is arranged in the reflector body and is also provided with a plurality of light-emitting bodies which are arranged in an array form to provide light sources. The Teflon scattering layer can provide excellent scattering efficiency so as to generate uniform scattered light. The light emitting device selects a high-power light emitting diode as a light emitting source and can also provide better light intensity, so that the light source scattering device can generate high-brightness and uniform scattered light to solve the problem of insufficient illumination intensity of the detection system.

Description

检测系统的光源散射照明装置Light source scattering lighting device for detection system

技术领域technical field

本发明涉及的是一种散射照明装置,尤其是指一种利用铁氟龙材料作为散射膜以及利用数组式光源来增加光源量以达到均匀散射光与提升照明强度的一种检测系统的光源散射照明装置。The present invention relates to a diffused lighting device, in particular to a light source scattering detection system which uses Teflon material as a diffuser film and uses an array of light sources to increase the amount of light source to achieve uniform scattered light and improve illumination intensity. lighting fixtures.

背景技术Background technique

检测程序在产品的制造过程中,扮演相当重要的角色。利用检测装置撷取待测物的影像,透过自动或者是人工的判断,以辨别出产品,例如:面板、印刷电路板或者是芯片的缺陷,例如:杂质、线路短路或断路、刮伤等缺陷,以做好质量的控管。Inspection procedures play a very important role in the manufacturing process of products. Use the detection device to capture the image of the object to be tested, and use automatic or manual judgment to identify the product, such as: panel, printed circuit board or chip defects, such as: impurities, short circuit or open circuit, scratches, etc. Defects, in order to do a good job in quality control.

请参阅图1所示,所述的图为现有技术所公开的散射照明装置示意图。所述的装置1具有一基座10、一反射罩体12、一发光装置13以及一面型影像撷取装置14。所述的基座10上承载有一待测物15。所述的反射罩体12设置在所述的基座10且罩覆在所述的待测物15上,所述的反射罩体12的上方开设有一槽孔16。所述的照明装置13设置在所述的反射罩体12之内壁边缘。所述的照明装置13所发射出的光源经由所述的反射罩体12散射至所述的待测物15上,以使所述的面型影像撷取装置14透过所述的槽孔16撷取所述的待测物15的影像,以进行检测。Please refer to FIG. 1 , which is a schematic diagram of a diffuse lighting device disclosed in the prior art. The device 1 has a base 10 , a reflective cover 12 , a light emitting device 13 and a one-sided image capturing device 14 . The base 10 carries a test object 15 . The reflective cover 12 is disposed on the base 10 and covers the object under test 15 , and a slot 16 is defined above the reflective cover 12 . The illuminating device 13 is arranged on the inner wall edge of the reflective cover 12 . The light emitted by the illuminating device 13 is diffused onto the object under test 15 through the reflective cover 12 , so that the surface image capturing device 14 passes through the slot 16 An image of the object under test 15 is captured for detection.

又如美国专利US.Pat.No.6,341,878也是公开了类似前述的技术,其光源装置是以平面的背光源方式设置在待测物的下方。前述的技术类型的缺点在于仅适用在小面积的检测,并无法在高速下撷取待测物的影像。除此的外,前述技术的反射罩体内所涂布的光散射材料,如:SPECTRALON或者是SPECTRAFLECT等光散射材料,多为价格昂贵且有毒性的材料。为了减低成本,有些制造商以白漆来取代,如此反而降低散射光投射至待测物的强度。Another example is US Pat. No. 6,341,878 which also discloses a technique similar to the above, in which the light source device is arranged under the object under test in the form of a planar backlight source. The disadvantages of the above-mentioned technology types are that they are only suitable for small-area detection, and cannot capture the image of the object under test at high speed. In addition, the light-scattering materials coated in the reflectors of the aforementioned technologies, such as SPECTRALON or SPECTRAFLECT, are mostly expensive and toxic materials. In order to reduce costs, some manufacturers replace it with white paint, which reduces the intensity of scattered light projected to the object under test.

由于面型扫瞄有速度上的缺点,因此发展了线扫瞄光电耦合组件(Charged-coupled device,CCD,以下简称线扫瞄CCD)来进行快速扫瞄。由于线扫瞄CCD具有量测速度快的特性,因此特别适合快速缺陷影像侦测。不过因为线扫瞄CCD扫瞄影像的方式是由复数个扫瞄线来构成一个扫瞄面,因此在高速扫瞄下线与线之间CCD的曝光时间变短,进而产生了线扫瞄CCD进光亮不足的问题。Due to the disadvantage of speed in area scanning, a line-scan photocoupler (Charged-coupled device, CCD, hereinafter referred to as line-scan CCD) was developed to perform fast scanning. Because the line scan CCD has the characteristics of fast measurement speed, it is especially suitable for fast defect image detection. However, because the line-scan CCD scans an image by multiple scanning lines to form a scanning surface, the exposure time of the CCD between lines and lines becomes shorter during high-speed scanning, thereby producing a line-scan CCD. Into the problem of insufficient light.

为了解决这个问题,因此需要强度较大的投光系统,以及便宜散射效果良好的材料,使得线扫瞄CCD可以获得足够的亮度来撷取影像。因此亟需一种检测系统的光源散射照明装置来解决现有技术所产生的问题。In order to solve this problem, a powerful light projection system and cheap materials with good scattering effect are needed, so that the line scan CCD can obtain enough brightness to capture images. Therefore, there is an urgent need for a light source scattering lighting device for a detection system to solve the problems in the prior art.

发明内容Contents of the invention

本发明的主要目的为提供一种检测系统的光源散射照明装置,其是利用铁氟龙材料作为散射膜,达到提升散射效率以均匀光线以及降低成本的目的。The main purpose of the present invention is to provide a light source scattering lighting device for a detection system, which uses Teflon material as a scattering film to achieve the purpose of improving the scattering efficiency, uniform light and reducing costs.

本发明的次要目的为提供一种检测系统的光源散射照明装置,其是高功率的发光二极管数组来提供照明,达到增加光线强度的目的。A secondary object of the present invention is to provide a light source scattering lighting device for a detection system, which is a high-power LED array to provide lighting to achieve the purpose of increasing light intensity.

本发明的另一目的为提供一种检测系统的光源散射照明装置,其是在发光源上设置有散热的机制,以避免光源温度过高,达到延长发光源寿命的目的。Another object of the present invention is to provide a light source scattering lighting device for a detection system, which is provided with a heat dissipation mechanism on the light source to avoid excessive temperature of the light source and prolong the life of the light source.

为了达到上述的目的,本发明提供一种检测系统的光源散射装置,其是包含有:一反射罩体,其是开设有一槽孔;一铁氟龙(PTFE)散射层,其是设置在所述的反射罩体的内壁上;以及至少一发光装置,其是设置在所述的反射罩体内,所述的发光装置还具有复数个发光体,所述的复数个发光体是排成数组形式以提供光源。In order to achieve the above object, the present invention provides a light source scattering device for a detection system, which includes: a reflective cover with a slot; a Teflon (PTFE) scattering layer arranged on the on the inner wall of the reflective cover; and at least one light-emitting device, which is arranged in the reflective cover, and the light-emitting device also has a plurality of luminous bodies, and the plurality of luminous bodies are arranged in an array to provide a light source.

较佳的是,所述的反射罩体为一圆形罩体。其中所述的发光装置为一环形数组的发光装置,其是设置在所述的圆形罩体开口之内壁周围。Preferably, the reflective cover is a circular cover. The light-emitting device is an annular array of light-emitting devices, which are arranged around the inner wall of the opening of the circular cover.

较佳的是,所述的反射罩体为一椭圆形罩体。其中所述的发光装置为一环形数组的发光装置,其是设置在所述的椭圆形罩体开口之内壁周围。Preferably, the reflective cover is an oval cover. Wherein the light-emitting device is an annular array of light-emitting devices, which are arranged around the inner wall of the opening of the oval cover.

较佳的是,所述的反射罩体为一半圆柱形罩体。其中所述的发光装置为一直线形数组的发光装置,其是设置在所述的半圆柱形罩体开口之内壁边缘。Preferably, the reflective cover is a semi-cylindrical cover. The light-emitting device is a linear array of light-emitting devices, which are arranged on the edge of the inner wall of the opening of the semi-cylindrical cover.

较佳的是,所述的发光体为一发光二极管。其中所述的发光二极管的功率范围为3W~7W。Preferably, the illuminant is a light emitting diode. The power range of the light-emitting diodes described therein is 3W-7W.

较佳的是,所述的发光装置还包括有:一基板,其是与所述的复数个发光体相耦接;以及一散热板,其是与所述的基板相连接,以吸收所述的复数个发光体所产生的热。所述的基板上还开设有复数个通孔,以将热传递至所述的散热板上。而所述的通孔还充填有一绝缘导热材料。此外所述的散热板上还具有复数个散热鳍片。Preferably, the light-emitting device further includes: a substrate, which is coupled to the plurality of luminous bodies; and a heat dissipation plate, which is connected to the substrate to absorb the The heat generated by the plurality of luminous bodies. A plurality of through holes are also opened on the base plate to transmit heat to the heat dissipation plate. The through hole is also filled with an insulating and heat-conducting material. In addition, the heat dissipation plate also has a plurality of heat dissipation fins.

较佳的是,所述的发光装置还包括有:一基板,其是与所述的复数个发光体相耦接;一绝缘导热层,其是设置在所述的基板的一侧;以及一散热板,其是与所述的绝缘导热层相连接,以吸收所述的复数个发光体所产生的热。其中所述的基板上还开设有复数个通孔,以将热传递至所述的散热板上。而且,所述的通孔还充填有一绝缘导热材料。除此的外,所述的散热板上还具有复数个散热鳍片。Preferably, the light-emitting device further includes: a substrate, which is coupled to the plurality of luminous bodies; an insulating and heat-conducting layer, which is arranged on one side of the substrate; and a The heat dissipation plate is connected with the insulating and heat-conducting layer to absorb the heat generated by the plurality of luminous bodies. A plurality of through holes are also opened on the substrate to transfer heat to the heat dissipation plate. Moreover, the through hole is also filled with an insulating and heat-conducting material. In addition, the heat dissipation plate also has a plurality of heat dissipation fins.

附图说明Description of drawings

图1为现有技术所公开的散射照明装置示意图;Fig. 1 is a schematic diagram of a diffuse lighting device disclosed in the prior art;

图2A以及图2B为本发明的检测系统的光源散射照明装置较佳实施例示意图;2A and 2B are schematic diagrams of a preferred embodiment of the light source scattering lighting device of the detection system of the present invention;

图3为不同散射材质在波长范围400nm~700nm下的反射率;Figure 3 shows the reflectance of different scattering materials in the wavelength range of 400nm to 700nm;

图4A为本发明的光源装置第一较佳实施例示意图;4A is a schematic diagram of a first preferred embodiment of the light source device of the present invention;

图4B为本发明的光源装置第二较佳实施例示意图;4B is a schematic diagram of a second preferred embodiment of the light source device of the present invention;

图5为本发明的检测系统的光源散射照明装置另一较佳实施例示意图。Fig. 5 is a schematic diagram of another preferred embodiment of the light source scattering illumination device of the detection system of the present invention.

附图标记说明:1-散射照明装置;10-基座;12-反射罩体;13-发光装置;14-面型影像撷取装置;15-待测物;16-槽孔;2-光源散射照明装置;20-罩体;201-槽孔;21-铁氟龙散射层;22-发光装置;220-发光体;2200-发光二极管;2201-焊点;2202-正极;2203-负极;2204-底座;221-基板;2210-通孔;222-绝缘导热层;223-散热板;2230-散热鳍片;23-影像撷取装置;3-光源散射照明装置;30-罩体;301-线形槽孔;31-铁氟龙散射层;32-发光装置;33-影像撷取装置。Explanation of reference signs: 1-scattering lighting device; 10-base; 12-reflecting cover; 13-light emitting device; 14-surface image capture device; 15-object under test; 16-slot hole; Scattering lighting device; 20-cover body; 201-slot hole; 21-Teflon scattering layer; 22-light-emitting device; 220-luminous body; 2200-light-emitting diode; 2204-base; 221-substrate; 2210-through hole; 222-insulation and heat conduction layer; 223-heat dissipation plate; 2230-radiation fin; 23-image capture device; - linear slots; 31 - Teflon scattering layer; 32 - light emitting device; 33 - image capture device.

具体实施方式Detailed ways

以下结合附图,对本发明上述的和另外的技术特征和优点作更详细的说明。The above and other technical features and advantages of the present invention will be described in more detail below in conjunction with the accompanying drawings.

请参阅图2A以及图2B所示,所述的图为本发明的检测系统的光源散射照明装置较佳实施例示意图。在图2A中,所述的光源散射照明装置2具有一反射罩体20、一铁氟龙(Poly tetrafluoroethylene,PTEF)散射层21以及至少一发光装置22。在本实施例中,所述的反射罩体20为一半圆柱形的罩体,罩体20的上方开设有一槽孔201,所述的槽孔201为一线形的槽孔。在所述的槽孔201的上方设置有一影像撷取装置23,所述的影像撷取装置23在本实施例中为一线扫瞄光电耦合组件(线扫瞄CCD)。Please refer to FIG. 2A and FIG. 2B , which are schematic diagrams of a preferred embodiment of the light source scattering illumination device of the detection system of the present invention. In FIG. 2A , the light source scattering lighting device 2 has a reflective cover 20 , a Teflon (Poly tetrafluoroethylene, PTEF) scattering layer 21 and at least one light emitting device 22 . In this embodiment, the reflective cover 20 is a semi-cylindrical cover, and a slot 201 is defined above the cover 20, and the slot 201 is a linear slot. An image capture device 23 is disposed above the slot 201 , and the image capture device 23 in this embodiment is a line-scan photocoupler device (line-scan CCD).

如图2B所示,在所述的反射罩体20之内壁面上,贴附有所述的铁氟龙散射层21,所述的铁氟龙散射层21可以提供较佳的反射率,使得由所述的发光装置22所发射出的光线经过所述的铁氟龙散射层21的后可以产生均匀的光线分布而投射的一待测物(图中未示)。请参阅图3所示,所述的图为不同散射材质在波长范围400nm~700nm下的反射率比较表的图示。从图中可以发现,以厚度2.2mm,测试光线波长范围为400nm~700nm的状况下,铁氟龙材料的确比SPETROLON以及SPECTRAFLECT等类的材料具有较佳的反射率。此外,铁氟龙也比SPETROLON以及SPECTRAFLECT等类的材料便宜且符合环保。As shown in Figure 2B, on the inner wall surface of the reflective cover 20, the Teflon scattering layer 21 is attached, and the Teflon scattering layer 21 can provide better reflectivity, so that The light emitted by the light-emitting device 22 passes through the Teflon scattering layer 21 and can generate uniform light distribution to project an object under test (not shown in the figure). Please refer to FIG. 3 , which is an illustration of a comparison table of reflectivity of different scattering materials in the wavelength range of 400nm-700nm. It can be seen from the figure that, with a thickness of 2.2 mm and a test light wavelength range of 400 nm to 700 nm, Teflon material does have better reflectivity than SPETROLON and SPECTRAFLECT materials. In addition, Teflon is also cheaper and environmentally friendly than materials such as SPETROLON and SPECTRAFLECT.

所述的至少一发光装置22,其是设置在所述的反射罩体20内,所述的发光装置22还具有复数个发光体,所述的复数个发光体是排成数组形式以提供光源。在本实施例中,具有一对发光装置22,分别设置在所述的半圆柱的反射罩体20之内壁两侧边缘上,以提供照明所需的光线。请参阅图4A所示,所述的图为本发明的光源装置第一较佳实施例示意图。所述的发光装置22具有一基板221、一绝缘导热层222以及一散热板223。所述的基板221是与所述的复数个发光体220作电性连接。所述的发光体220具有一发光二极管2200,其是设置在一底座2204上,所述的底座2204为金属材质,以增加散热效果。所述的底座2204的两侧具有正极2202与负极2203,其是分别凭借焊锡与所述的基板2200上的焊点2201作电性连接。在本实施例中,所述的正极2202是与所述的底座2204相导通。所述的发光二极管2200为高功率的发光二极管,其功率在3W~7W之间,但不在此限。The at least one light-emitting device 22 is arranged in the reflective cover 20, and the light-emitting device 22 also has a plurality of illuminants, and the plurality of illuminants are arranged in arrays to provide light sources . In this embodiment, there are a pair of light emitting devices 22, which are respectively arranged on the two side edges of the inner wall of the semi-cylindrical reflective cover 20 to provide light required for lighting. Please refer to FIG. 4A , which is a schematic diagram of a first preferred embodiment of the light source device of the present invention. The light-emitting device 22 has a substrate 221 , an insulating and heat-conducting layer 222 and a heat dissipation plate 223 . The substrate 221 is electrically connected to the plurality of illuminants 220 . The illuminant 220 has a light emitting diode 2200, which is set on a base 2204, and the base 2204 is made of metal to increase the cooling effect. Both sides of the base 2204 have a positive electrode 2202 and a negative electrode 2203, which are respectively electrically connected to the solder joints 2201 on the substrate 2200 by means of solder. In this embodiment, the anode 2202 is connected to the base 2204 . The light-emitting diode 2200 is a high-power light-emitting diode, and its power is between 3W-7W, but not limited thereto.

由于使用高功率发光二极管可以产生高亮度的效果,但是也容易伴随高温的问题,因此本发明的发光装置具有散热的设计,以降低发光体220的温度,进而延长发光体220的寿命。所述的基板221的底面是与所述的绝缘导热层222相连接。所述的绝缘导热层222是可为导热膏或导热胶所形成;此外,所述的绝缘导热层222还可以透过背胶贴附在所述的基板221上。为了增加导热的效果,所述的基板221上还可以开设有复数个通孔2210。所述的通孔2210内可以是空气,或者是充填有导热材料,以将所述的发光二极管所产生的热传导致所述的绝缘导热层222,然后再传至所述的散热板223上。所述的散热板223,是透过绝缘背胶与所述的绝缘导热层222相连接,所述的散热板223上还可以具有散热鳍片2230以增加散热的效果。请参阅图4B所示,所述的图为本发明的光源装置第二较佳实施例示意图。在本实施例中,所述的散热板223也可以透过绝缘的背胶与所述的基板221相连接,然后达到散热的效果。Since the use of high-power light-emitting diodes can produce high-brightness effects, it is also prone to high temperature problems. Therefore, the light-emitting device of the present invention has a heat dissipation design to reduce the temperature of the luminous body 220, thereby prolonging the life of the luminous body 220. The bottom surface of the substrate 221 is connected to the insulating and heat-conducting layer 222 . The insulating and heat-conducting layer 222 can be formed by heat-conducting paste or heat-conducting adhesive; in addition, the insulating and heat-conducting layer 222 can also be attached to the substrate 221 through the adhesive. In order to increase the effect of heat conduction, a plurality of through holes 2210 may also be opened on the substrate 221 . The through hole 2210 may be filled with air or heat conducting material, so as to transfer the heat generated by the light emitting diode to the insulating heat conducting layer 222 and then to the heat dissipation plate 223 . The heat dissipation plate 223 is connected to the insulating heat conduction layer 222 through the insulating adhesive, and the heat dissipation plate 223 may also have heat dissipation fins 2230 to increase the effect of heat dissipation. Please refer to FIG. 4B , which is a schematic diagram of a second preferred embodiment of the light source device of the present invention. In this embodiment, the heat dissipation plate 223 can also be connected to the substrate 221 through an insulating back glue, so as to achieve the effect of heat dissipation.

请参阅图5所示,所述的图为本发明的检测系统的光源散射照明装置另一较佳实施例示意图。在本实施例中,所述的散射照明装置3的反射罩体30为一半球形罩体,但不以此为限,例如:也可以为一半椭圆球形罩体。所述的反射罩体30的上方也开设有一线形槽孔301,在罩体30内壁周围则设置有一发光装置32,所述的发光装置32上具有复数个呈现环形排列的发光体。所述的发光装置32的细部结构如前所述,在此不做赘述。在所述的线形槽孔301上方具有一影像撷取装置33,所述的影像撷取装置33在本实施例中为一线扫瞄CCD。Please refer to FIG. 5 , which is a schematic diagram of another preferred embodiment of the light source scattering lighting device of the detection system of the present invention. In this embodiment, the reflective cover 30 of the diffuse lighting device 3 is a semi-spherical cover, but it is not limited thereto, for example, it may also be a semi-elliptical spherical cover. A linear slot 301 is also opened on the top of the reflective cover 30, and a light emitting device 32 is arranged around the inner wall of the cover 30, and the light emitting device 32 has a plurality of luminous bodies arranged in a ring. The detailed structure of the light emitting device 32 is as described above, and will not be repeated here. There is an image capture device 33 above the linear slot 301, and the image capture device 33 is a line-scanning CCD in this embodiment.

综合上述,本发明提供的检测系统的光源散射照明装置,具有降低成本以及提高光线强度与均匀散光的优点,可以应用在不同的场合,因此可以满足业界的需求,进而提高所述的产业的竞争力以及带动周遭产业的发展,诚已符合发明专利法所规定申请发明所需具备的要件,故依法呈提发明专利的申请。To sum up the above, the light source scattering lighting device of the detection system provided by the present invention has the advantages of reducing cost and improving light intensity and uniform astigmatism, and can be applied in different occasions, so it can meet the needs of the industry and further improve the competitiveness of the industry In order to promote the development of surrounding industries, and sincerity has met the requirements required for an invention application as stipulated in the Invention Patent Law, the application for an invention patent is submitted according to law.

以上所述仅为本发明的较佳实施例,对本发明而言仅仅是说明性的,而非限制性的。本专业技术人员理解,在本发明权利要求所限定的精神和范围内可对其进行许多改变,修改,甚至等效,但都将落入本发明的保护范围内。The above descriptions are only preferred embodiments of the present invention, and are only illustrative rather than restrictive to the present invention. Those skilled in the art understand that many changes, modifications, and even equivalents can be made within the spirit and scope defined by the claims of the present invention, but all will fall within the protection scope of the present invention.

Claims (11)

1.一种检测系统的光源散射装置,其特征在于:其是包含有:1. A light source scattering device of a detection system, characterized in that: it comprises: 一反射罩体,其是开设有一线性槽孔;A reflective cover, which is provided with a linear slot; 一铁氟龙散射层,其是设置在所述的反射罩体的内壁上;以及A Teflon scattering layer, which is arranged on the inner wall of the reflective cover; and 至少一发光装置,其是设置在所述的反射罩体内,所述的发光装置还具有复数个发光体,所述的复数个发光体是排成数组形式以提供光源;At least one light-emitting device, which is arranged in the reflective cover, and the light-emitting device also has a plurality of illuminants, and the plurality of illuminants are arranged in an array to provide a light source; 所述的反射罩体为一半圆柱形罩体,所述至少一发光装置设置于所述半圆柱形罩体开口的内壁边缘。The reflective cover is a semi-cylindrical cover, and the at least one light-emitting device is arranged on the edge of the inner wall of the opening of the semi-cylindrical cover. 2.根据权利要求1所述的检测系统的光源散射装置,其特征在于:所述的发光体为一发光二极管。2. The light source scattering device of the detection system according to claim 1, wherein the illuminant is a light emitting diode. 3.根据权利要求2所述的检测系统的光源散射装置,其特征在于:所述的发光二极管的功率范围为3W~7W。3. The light source scattering device of the detection system according to claim 2, characterized in that: the power range of the light emitting diode is 3W-7W. 4.根据权利要求1所述的检测系统的光源散射装置,其特征在于:所述的发光装置还包括有:4. The light source scattering device of the detection system according to claim 1, wherein the light emitting device further comprises: 一基板,其与所述的复数个发光体相耦接;以及a substrate, which is coupled to the plurality of light emitters; and 一散热板,其与所述的基板相连接,以吸收所述的复数个发光体所产生的热量。A heat dissipation plate is connected with the base plate to absorb the heat generated by the plurality of luminous bodies. 5.根据权利要求4所述的检测系统的光源散射装置,其特征在于:所述的基板上还开设有复数个通孔,以将热传递至所述的散热板上。5 . The light source scattering device of the detection system according to claim 4 , wherein a plurality of through holes are opened on the substrate to transfer heat to the heat sink. 6 . 6.根据权利要求5所述的检测系统的光源散射装置,其特征在于:所述的通孔还充填有一绝缘导热材料。6 . The light source scattering device of the detection system according to claim 5 , wherein the through hole is also filled with an insulating and heat-conducting material. 7 . 7.根据权利要求4所述的检测系统的光源散射装置,其特征在于:所述的散热板上还具有复数个散热鳍片。7. The light source scattering device of the detection system according to claim 4, characterized in that: the heat dissipation plate further has a plurality of heat dissipation fins. 8.根据权利要求1所述的检测系统的光源散射装置,其特征在于:所述的发光装置还包括有:8. The light source scattering device of the detection system according to claim 1, wherein the light emitting device further comprises: 一基板,其是与所述的复数个发光体相耦接;a substrate, which is coupled to the plurality of light emitters; 一绝缘导热层,其是设置在所述的基板的一侧;以及an insulating and heat-conducting layer, which is arranged on one side of the substrate; and 一散热板,其是与所述的绝缘导热层相连接,以吸收所述的复数个发光体所产生的热。A heat dissipation plate is connected with the insulating and heat-conducting layer to absorb the heat generated by the plurality of luminous bodies. 9.根据权利要求8所述的检测系统的光源散射装置,其特征在于:所述的基板上还开设有复数个通孔,以将热传递至所述的散热板上。9 . The light source scattering device of the detection system according to claim 8 , wherein a plurality of through holes are opened on the substrate to transfer heat to the heat sink. 10 . 10.根据权利要求9所述的检测系统的光源散射装置,其特征在于:所述的通孔还充填有一绝缘导热材料。10 . The light source scattering device of the detection system according to claim 9 , wherein the through hole is also filled with an insulating and heat-conducting material. 11 . 11.根据权利要求8所述的检测系统的光源散射装置,其特征在于:所述的散热板上还具有复数个散热鳍片。11. The light source scattering device of the detection system according to claim 8, characterized in that: the heat dissipation plate further has a plurality of heat dissipation fins.
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