[go: up one dir, main page]

CN101090075B - Method for manufacturing vertical embedded capacitor substrate and structure thereof - Google Patents

Method for manufacturing vertical embedded capacitor substrate and structure thereof Download PDF

Info

Publication number
CN101090075B
CN101090075B CN2007101287102A CN200710128710A CN101090075B CN 101090075 B CN101090075 B CN 101090075B CN 2007101287102 A CN2007101287102 A CN 2007101287102A CN 200710128710 A CN200710128710 A CN 200710128710A CN 101090075 B CN101090075 B CN 101090075B
Authority
CN
China
Prior art keywords
those
layer
dielectric layer
several
layers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN2007101287102A
Other languages
Chinese (zh)
Other versions
CN101090075A (en
Inventor
廖国成
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advanced Semiconductor Engineering Inc
Original Assignee
Advanced Semiconductor Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Semiconductor Engineering Inc filed Critical Advanced Semiconductor Engineering Inc
Priority to CN2007101287102A priority Critical patent/CN101090075B/en
Publication of CN101090075A publication Critical patent/CN101090075A/en
Application granted granted Critical
Publication of CN101090075B publication Critical patent/CN101090075B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

A vertical embedded capacitor substrate manufacturing method and structure, mainly include providing several conducting layers, these conducting layers are made up of a wire layer and a first dielectric layer, the wire layer is formed on the first dielectric layer; providing a plurality of composite layers, wherein the composite layers are composed of a patterned electrode layer and a second dielectric layer, and the patterned electrode layer is formed on the second dielectric layer; pressing the conducting layers and the composite layers to form a block body, wherein the patterned electrode layer is contacted with the first dielectric layer, and the block body is defined with a plurality of vertical embedded capacitor substrates and a plurality of cutting channels among the vertical embedded capacitor substrates; and cutting the block along the cutting lines to separate the vertical embedded capacitor substrates in a single body.

Description

垂直式内埋电容基板的制作方法及其结构Fabrication method and structure of vertical embedded capacitor substrate

技术领域technical field

本发明是有关于一种内埋电容基板,特别是有关于一种垂直式内埋电容基板的制造方法及其结构。The present invention relates to an embedded capacitor substrate, in particular to a method for manufacturing a vertical embedded capacitor substrate and its structure.

背景技术Background technique

如图1所示,现有的内埋电容基板10是包含有一上表面11、一下表面12、若干个内埋电容13及若干个导线14,该些内埋电容13是电性连接该些导线14,该些内埋电容13是具有一第一电极131、一介电层132及一第二电极133,该些第一电极131与该些第二电极133是分别平行设置于该上表面11与该下表面12,一芯片50可通过该些导线14与该些内埋电容11电性连接,但是该些内埋电容11的该些第一电极131与该些第二电极133的布局方式是为水平式,即分别平行该上表面11与该下表面12,其会占去基板相当多的布局空间,使得该些内埋电容11的布局数量会受限于基板尺寸大小,而无法大量应用,且在电容数量不足时,仍需依靠外加式电容c来补偿,其不仅会增加额外的SMT制程,更会增加封装体体积及制作成本。As shown in FIG. 1, the existing embedded capacitor substrate 10 includes an upper surface 11, a lower surface 12, several embedded capacitors 13 and several wires 14, and these embedded capacitors 13 are electrically connected to these wires. 14. The embedded capacitors 13 have a first electrode 131, a dielectric layer 132 and a second electrode 133, and the first electrodes 131 and the second electrodes 133 are respectively arranged on the upper surface 11 in parallel With the lower surface 12, a chip 50 can be electrically connected to the embedded capacitors 11 through the wires 14, but the layout of the first electrodes 131 and the second electrodes 133 of the embedded capacitors 11 It is a horizontal type, that is, parallel to the upper surface 11 and the lower surface 12 respectively, which will take up a considerable amount of layout space on the substrate, so that the number of layouts of these embedded capacitors 11 will be limited by the size of the substrate, and cannot be used in large quantities. application, and when the number of capacitors is insufficient, it is still necessary to rely on an external capacitor c to compensate, which will not only increase the additional SMT process, but also increase the volume of the package and the production cost.

发明内容Contents of the invention

本发明的主要目的是在于提供一种垂直式内埋电容基板的制造方法及其结构,其主要是利用若干个图案化电极层与若干个介电层所构成的垂直式内埋电容,增加基板的电路布局空间及设计弹性,除了无须使用额外的SMT制程来增加外加式电容外,更可让使用该垂直式内埋电容基板的封装体(Package)体积缩小及降低制作成本。The main purpose of the present invention is to provide a manufacturing method and structure of a vertical embedded capacitor substrate, which mainly uses a vertical embedded capacitor composed of several patterned electrode layers and several dielectric layers to increase the number of substrates. The circuit layout space and design flexibility, in addition to not needing to use additional SMT process to increase the external capacitor, but also can reduce the size of the package using the vertical embedded capacitor substrate and reduce the production cost.

依据本发明的一种垂直式内埋电容基板的制作方法,是包含提供若干个导通层,该些导通层是由一导线层及一第一介电层所组成,该导线层是形成于该第一介电层上;提供若干个复合层,该些复合层是由一图案化电极层及二介电层所组成,该图案化电极层是形成于该第二介电层上;压合该些导通层及该些复合层以形成一块体,图案化电极层和第一介电层相接触,该块体是定义有若干个垂直式内埋电容基板及在该些垂直式内埋电容基板间的若干个切割道;以及沿着该些切割道切割该块体,以单体化分离该些垂直式内埋电容基板。A method for manufacturing a vertical embedded capacitor substrate according to the present invention includes providing several conduction layers, the conduction layers are composed of a wire layer and a first dielectric layer, and the wire layer is formed On the first dielectric layer; providing a plurality of composite layers, the composite layers are composed of a patterned electrode layer and two dielectric layers, the patterned electrode layer is formed on the second dielectric layer; Pressing the conduction layers and the composite layers to form a body, the patterned electrode layer is in contact with the first dielectric layer, the body is defined with several vertical embedded capacitance substrates and the vertical a plurality of cutting lines between the embedded capacitor substrates; and cutting the block along the cutting lines to singulate and separate the vertical embedded capacitor substrates.

依据本发明的另一种垂直式内埋电容基板的制作方法,是包含提供若干个导通层,该些导通层是由一导线层及一第一介电层所组成,该导线层是形成于该第一介电层上;提供若干个第一复合层,该些第一复合层是由一图案化电极层及一第二介电层所组成,该图案化电极层是形成于该第二介电层上;提供若干个第二复合层,该些第二复合层是由一平板电极层及一第三介电层所组成,该平板电极层是形成于该第三介电层上;压合该些导通层、该些第一复合层与该些第二复合层以形成一块体,图案化电极层和第一介电层相接触,同时平板电极层与第一介电层接触,该块体是定义有若干个垂直式内埋电容基板及在该些垂直式内埋电容基板间的若干个切割道;以及沿着该些切割道切割该块体,以单体化分离该些垂直式内埋电容基板。Another method for manufacturing a vertical embedded capacitor substrate according to the present invention includes providing several conduction layers, the conduction layers are composed of a wire layer and a first dielectric layer, and the wire layer is Formed on the first dielectric layer; providing a plurality of first composite layers, the first composite layers are composed of a patterned electrode layer and a second dielectric layer, the patterned electrode layer is formed on the On the second dielectric layer; several second composite layers are provided, the second composite layers are composed of a flat electrode layer and a third dielectric layer, the flat electrode layer is formed on the third dielectric layer on; press the conductive layers, the first composite layers and the second composite layers to form a body, the patterned electrode layer is in contact with the first dielectric layer, and the flat electrode layer is in contact with the first dielectric layer Layer contact, the block is defined with a number of vertical embedded capacitor substrates and a number of dicing lines between the vertical embedded capacitor substrates; and cutting the block along the dicing lines to singulate The vertical embedded capacitor substrates are separated.

依据本发明的一种垂直式内埋电容基板,其包含若干个导通层及若干个第一复合层,该些导通层是具有一导线层及一第一介电层,该导线层是形成于该第一介电层上,该些第一复合层是形成于该些导通层之间,其具有一图案化电极层及一第二介电层,该些图案化电极层是具有若干个电极,图案化电极层和第一介电层相接触。According to a vertical embedded capacitor substrate of the present invention, it comprises several conductive layers and several first composite layers, and these conductive layers have a wire layer and a first dielectric layer, and the wire layer is Formed on the first dielectric layer, the first composite layers are formed between the conducting layers, and have a patterned electrode layer and a second dielectric layer, and the patterned electrode layers have Several electrodes, the patterned electrode layer is in contact with the first dielectric layer.

与现有技术相比,本发明其主要是利用若干个图案化电极层与若干个介电层所构成的垂直式内埋电容,增加基板的电路布局空间及设计弹性,除了无须使用额外的SMT制程来增加外加式电容外,更可让使用该垂直式内埋电容基板的封装体(Package)体积缩小及降低制作成本。Compared with the prior art, the present invention mainly utilizes the vertical embedded capacitance formed by several patterned electrode layers and several dielectric layers to increase the circuit layout space and design flexibility of the substrate, except that no additional SMT In addition to increasing the external capacitance through the manufacturing process, the volume of the package using the vertical embedded capacitance substrate can be reduced and the production cost can be reduced.

附图说明Description of drawings

图1是现有的内埋电容基板的立体示意图。FIG. 1 is a schematic perspective view of a conventional embedded capacitor substrate.

图2A至图2D是依据本发明的第一较佳实施例,一种垂直式内埋电容基板的制造方法流程图。2A to 2D are flowcharts of a method for manufacturing a vertical embedded capacitor substrate according to a first preferred embodiment of the present invention.

图3是依据本发明的第一较佳实施例,在该垂直式内埋电容基板形成至少一线路层的制程剖面示意图。3 is a schematic cross-sectional view of the process of forming at least one circuit layer on the vertical embedded capacitor substrate according to the first preferred embodiment of the present invention.

图4是依据本发明的第一较佳实施例,在该线路层上的形成若干个凸块的制程剖面示意图。FIG. 4 is a schematic cross-sectional view of the process of forming several bumps on the circuit layer according to the first preferred embodiment of the present invention.

图5A至图5E是依据本发明的第二较佳实施例,一种垂直式内埋电容基板的制造方法流程图。5A to 5E are flowcharts of a method for manufacturing a vertical embedded capacitor substrate according to a second preferred embodiment of the present invention.

图6是依据本发明的第二较佳实施例,在该垂直式内埋电容基板形成至少一线路层的制程剖面示意图。6 is a schematic cross-sectional view of the process of forming at least one circuit layer on the vertical embedded capacitor substrate according to the second preferred embodiment of the present invention.

图7是依据本发明的第二较佳实施例,在该线路层上形成若干个凸块的制程剖面示意图。FIG. 7 is a schematic cross-sectional view of the process of forming several bumps on the circuit layer according to the second preferred embodiment of the present invention.

具体实施方式Detailed ways

请参阅图2A至图2C,其是本发明的第一较佳实施例,一种垂直式内埋电容基板20的制作方法。首先,请参阅图2A,提供若干个导通层21,该些导通层21是由一导线层211及一第一介电层212所组成,该导线层211是形成于该第一介电层212上,在本实施例中,该些导线层211是由一平板金属层以微影蚀刻制程制作完成(图未绘出),该些导线层211是具有若干个导线211a,该些导线211a是用以取代现有基板的导通孔;之后,请参阅图2B,提供若干个复合层22,该些复合层22是由一图案化电极层221及一第二介电层222所组成,其中该图案化电极层221是形成于该第二介电层222上,在本实施例中,该些图案化电极层221是由一平板金属层以微影蚀刻制程制作完成(图未绘出),该些图案化电极层221是具有若干个电极221a,用以构成若干个电容结构C(如图2C所示),该些电容结构C可依据应用上的不同电性需求作串、并联设计,较佳地,该些电极221a是呈阵列状分布,而该些第二介电层222与该些第一介电层212是可为环氧树脂(epoxyresin)、FR4、BT树脂、高分子材料或陶瓷材料;接着,请参阅图2C,压合该些导通层21及该些复合层22以形成一块体B,图案化电极层221和第一介电层212相接触,该块体B是定义有若干个垂直式内埋电容基板20及在该些垂直式内埋电容基板20间的若干个切割道B1,在本实施例中,该些垂直式内埋电容基板20的尺寸是可依据应用需求而定;最后,请参阅图2D,沿着该些切割道B1切割该块体B,以单体化分离该些垂直式内埋电容基板20,经单体化分离的该些垂直式内埋电容基板20是具有一第一表面201及一第二表面202,该些第一表面201与该些第二表面202是显露该些导线211a及该些电极221a,该些导线211a与该些电极221a是可用以电性连接至少一芯片或至少一电路组件(图未绘出)。Please refer to FIG. 2A to FIG. 2C , which are the first preferred embodiment of the present invention, a method for manufacturing a vertical embedded capacitor substrate 20 . First, referring to FIG. 2A, several conducting layers 21 are provided. These conducting layers 21 are composed of a wiring layer 211 and a first dielectric layer 212. The wiring layer 211 is formed on the first dielectric layer. On the layer 212, in this embodiment, the wiring layers 211 are made by a flat metal layer with a lithographic etching process (not shown in the figure), and the wiring layers 211 have several wirings 211a. 211a is used to replace the via holes of the existing substrate; then, please refer to FIG. 2B , providing several composite layers 22, which are composed of a patterned electrode layer 221 and a second dielectric layer 222 , wherein the patterned electrode layer 221 is formed on the second dielectric layer 222. In this embodiment, the patterned electrode layers 221 are made of a flat metal layer by a lithographic etching process (not shown in the figure) 2), these patterned electrode layers 221 have several electrodes 221a to form several capacitive structures C (as shown in FIG. 2C ), and these capacitive structures C can be connected in series according to different electrical requirements in applications. Parallel design, preferably, the electrodes 221a are distributed in an array, and the second dielectric layers 222 and the first dielectric layers 212 can be epoxy resin (epoxyresin), FR4, BT resin, Polymer material or ceramic material; Next, referring to FIG. 2C, the conductive layers 21 and the composite layers 22 are laminated to form a body B, the patterned electrode layer 221 is in contact with the first dielectric layer 212, and the The block B is defined with a number of vertical embedded capacitor substrates 20 and a number of cutting lines B1 between these vertical embedded capacitor substrates 20. In this embodiment, the vertical embedded capacitor substrates 20 The size can be determined according to the application requirements; finally, referring to FIG. 2D , the block B is cut along the cutting lines B1 to singulate and separate the vertical embedded capacitor substrates 20 . The vertical embedded capacitor substrates 20 have a first surface 201 and a second surface 202, the first surfaces 201 and the second surfaces 202 expose the wires 211a and the electrodes 221a, the The wire 211a and the electrodes 221a can be used to electrically connect at least one chip or at least one circuit component (not shown).

请参阅图3,在本实施例中,可另包含在该些垂直式内埋电容基板20的该些第一表面201与该些第二表面202上形成至少一线路层23,该线路层23是电性连接该些导线层211的该些导线211a及该些图案化电极层221的该些电极221a,使该芯片或该电路组件可通过该线路层23与该垂直式内埋电容基板20电性连接。或者,请参阅图4,又另包含在该线路层23上形成若干个凸块24,使该芯片可通过该些凸块24与该垂直式内埋电容基板20电性连接。Please refer to FIG. 3 , in this embodiment, at least one circuit layer 23 may be formed on the first surfaces 201 and the second surfaces 202 of the vertical embedded capacitor substrates 20, the circuit layer 23 It is to electrically connect the wires 211a of the wire layers 211 and the electrodes 221a of the patterned electrode layers 221, so that the chip or the circuit component can pass through the wire layer 23 and the vertical embedded capacitor substrate 20 electrical connection. Or, please refer to FIG. 4 , further comprising forming a plurality of bumps 24 on the circuit layer 23 so that the chip can be electrically connected to the vertical embedded capacitor substrate 20 through the bumps 24 .

请参阅图5A及图5E,其是本发明的第二较佳实施例,一种垂直式内埋电容基板30的制作方法。首先,请参阅图5A,提供若干个导通层31,该些导通层31是由一导线层311及一第一介电层312所组成,该导线层311是形成于该第一介电层312上,在本实施例中,该些导线层311是具有若干个导线311a;之后,请参阅图5B,提供若干个第一复合层32,该些第一复合层32是由一图案化电极层321及一第二介电层322所组成,该图案化电极层321是形成于该第二介电层322上,在本实施例中,该些图案化电极层321是具有若干个电极321a,该些电极321a是呈阵列状分布;之后,请参阅图5C,提供若干个第二复合层33,该些第二复合层33是由一平板电极层331及一第三介电层332所组成,该平板电极层331是形成于该第三介电层332上,在本实施例中,该些第三介电层332、该些第二介电层322与该些第一介电层312是可为相同材料或不相同材料;接着,请参阅图5D,压合该些导通层31、该些第一复合层32与该些第二复合层33以形成一块体B,图案化电极层321和第一介电层312相接触,同时平板电极层331与第一介电层312接触,该块体B是定义有若干个垂直式内埋电容基板30及在该些垂直式内埋电容基板30间的若干个切割道B1;最后,请参阅图5E,沿着该些切割道B1切割该块体B,以单体化分离该些垂直式内埋电容基板30,经单体化分离的该些垂直式内埋电容基板30是具有一第一表面301及一第二表面302,该些第一表面301与该些第二表面302是显露该些导线311a、该些电极321a及该些平板电极层331,该些导线311a、该些电极321a及该些平板电极层331是可用以电性连接至少一芯片或至少一电路组件(图未绘出)。Please refer to FIG. 5A and FIG. 5E , which are the second preferred embodiment of the present invention, a method for manufacturing a vertical embedded capacitor substrate 30 . First, referring to FIG. 5A, several conducting layers 31 are provided. These conducting layers 31 are composed of a wiring layer 311 and a first dielectric layer 312. The wiring layer 311 is formed on the first dielectric layer. On the layer 312, in this embodiment, the wire layers 311 have several wires 311a; then, referring to FIG. 5B, several first composite layers 32 are provided, and these first composite layers 32 are formed by a The electrode layer 321 and a second dielectric layer 322 are formed. The patterned electrode layer 321 is formed on the second dielectric layer 322. In this embodiment, the patterned electrode layers 321 have several electrodes. 321a, these electrodes 321a are distributed in an array; then, referring to FIG. 5C, several second composite layers 33 are provided. Composed, the plate electrode layer 331 is formed on the third dielectric layer 332, in this embodiment, the third dielectric layers 332, the second dielectric layers 322 and the first dielectric layers The layer 312 can be the same material or different materials; then, please refer to FIG. 5D, press the conductive layers 31, the first composite layers 32 and the second composite layers 33 to form a body B, the pattern The electrode layer 321 is in contact with the first dielectric layer 312, and the flat electrode layer 331 is in contact with the first dielectric layer 312. The block B is defined with a number of vertical embedded capacitor substrates 30 and in these vertical Several cutting lines B1 between the embedded capacitor substrates 30; finally, please refer to FIG. The vertical embedded capacitor substrates 30 separated by bulking have a first surface 301 and a second surface 302, the first surfaces 301 and the second surfaces 302 expose the wires 311a, the electrodes 321a and the flat electrode layers 331, the wires 311a, the electrodes 321a and the flat electrode layers 331 can be used to electrically connect at least one chip or at least one circuit component (not shown).

请参阅图6,在本实施例中,可另包含在该些垂直式内埋电容基板30的该些第一表面301与该些第二表面302上形成至少一线路层34,该线路层34是电性连接该些导线层311的该些导线311a、该些图案化电极层321的该些电极321a及该些平板电极层331,使该芯片或该电路组件可通过该线路层34与该垂直式内埋电容基板30电性连接。或者,请参阅图7,又另包含在该线路层34上形成若干个凸块35,使该芯片或该电路组件可通过该些凸块35与该垂直式内埋电容基板30电性连接。Please refer to FIG. 6 , in this embodiment, at least one circuit layer 34 may be formed on the first surfaces 301 and the second surfaces 302 of the vertical embedded capacitor substrates 30 , the circuit layer 34 It is to electrically connect the wires 311a of the wire layers 311, the electrodes 321a of the patterned electrode layers 321 and the flat electrode layers 331, so that the chip or the circuit component can pass through the wire layer 34 and the The vertical embedded capacitor substrate 30 is electrically connected. Or, referring to FIG. 7 , it further includes forming a plurality of bumps 35 on the circuit layer 34 so that the chip or the circuit component can be electrically connected to the vertical embedded capacitor substrate 30 through the bumps 35 .

请参阅图5E及图6,其是依据本发明的垂直式内埋电容基板结构,一种垂直式内埋电容基板30是包含有若干个导通层31及若干个第一复合层32,该些导通层31是具有一导线层311及一第一介电层312,该导线层311是形成于该第一介电层312上,该些导线层311是具有若干个导线311a,该些第一复合层32是形成于该些导通层31之间,其具有一图案化电极层321及一第二介电层322,该些图案化电极层321是具有若干个电极321a,图案化电极层321和第一介电层312相接触,较佳地,该些电极321a是呈阵列状分布。在本实施例中,该垂直式内埋电容基板30是另包含有若干个第二复合层33,该些第二复合层33是具有一平板电极层331及一第三介电层332,该些第二复合层33是形成于该些导通层31之间,平板电极层331与第一介电层312相接触,或者,在另一实施例中,该些第二复合层33是可形成于该些第一复合层32之间,平板电极层331与第二介电层322相接触。本发明是通过该些图案化电极层321与该些第二介电层322或该些平板电极层331与该些第三介电层332所构成的垂直式内埋电容,大幅增加基板的电路布局空间及设计弹性,除了无须使用额外的SMT制程来增加外加式电容外,更可让使用该垂直式内埋电容基板30的封装体(Package)体积缩小及降低制作成本。Please refer to FIG. 5E and FIG. 6, which are vertical embedded capacitor substrate structures according to the present invention. A vertical embedded capacitor substrate 30 includes a plurality of conducting layers 31 and a plurality of first composite layers 32. The conductive layers 31 have a wire layer 311 and a first dielectric layer 312, the wire layer 311 is formed on the first dielectric layer 312, the wire layers 311 have a plurality of wires 311a, the wire layers 311 The first composite layer 32 is formed between the conducting layers 31 and has a patterned electrode layer 321 and a second dielectric layer 322. The patterned electrode layer 321 has a plurality of electrodes 321a, patterned The electrode layer 321 is in contact with the first dielectric layer 312. Preferably, the electrodes 321a are distributed in an array. In this embodiment, the vertical embedded capacitor substrate 30 further includes a plurality of second composite layers 33, and the second composite layers 33 have a flat electrode layer 331 and a third dielectric layer 332. The second composite layers 33 are formed between the conduction layers 31, and the flat electrode layer 331 is in contact with the first dielectric layer 312, or, in another embodiment, the second composite layers 33 can be Formed between the first composite layers 32 , the flat electrode layer 331 is in contact with the second dielectric layer 322 . The present invention greatly increases the circuit of the substrate through the vertical embedded capacitance formed by the patterned electrode layers 321 and the second dielectric layers 322 or the flat electrode layers 331 and the third dielectric layers 332. The layout space and design flexibility, in addition to not needing to use additional SMT process to increase the external capacitor, can also reduce the size of the package using the vertical embedded capacitor substrate 30 and reduce the manufacturing cost.

Claims (10)

1. the manufacture method of a vertical built-in capacity substrate, it is characterized in that: it comprises:
Several conductting layers are provided, and those conductting layers are made up of a conductor layer and one first dielectric layer, and this conductor layer is to be formed on this first dielectric layer;
Several composite beds are provided, and those composite beds are made up of a patterned electrode layer and one second dielectric layer, and this patterned electrode layer is to be formed on this second dielectric layer;
Those conductting layers of pressing and those composite beds are to form a block, and the patterned electrode layer and first dielectric layer contact, and this block is that definition has several vertical built-in capacity substrates and several Cutting Roads between those vertical built-in capacity substrates; And
Cut this block along those Cutting Roads, separate those vertical built-in capacity substrates, and those vertical built-in capacity substrates are to have a first surface and a second surface with singulation.
2. the manufacture method of vertical built-in capacity substrate as claimed in claim 1, it is characterized in that: it comprises at least one line layer of formation in addition on those first surfaces and those second surfaces of those vertical built-in capacity substrates, and this line layer is to electrically connect those conductor layers and those patterned electrode layer.
3. the manufacture method of vertical built-in capacity substrate as claimed in claim 2 is characterized in that: it comprises in addition and forms several projections on this line layer.
4. the manufacture method of a vertical built-in capacity substrate, it is characterized in that: it comprises:
Several conductting layers are provided, and those conductting layers are made up of a conductor layer and one first dielectric layer, and this conductor layer is to be formed on this first dielectric layer;
Several first composite beds are provided, and those first composite beds are made up of a patterned electrode layer and one second dielectric layer, and this patterned electrode layer is to be formed on this second dielectric layer;
Several second composite beds are provided, and those second composite beds are made up of a plate electrode layer and one the 3rd dielectric layer, and this plate electrode layer is to be formed on the 3rd dielectric layer;
Those conductting layers of pressing, those first composite beds and those second composite beds are to form a block, the patterned electrode layer and first dielectric layer contact, the plate electrode layer contacts with first dielectric layer simultaneously, and this block is that definition has several vertical built-in capacity substrates and several Cutting Roads between those vertical built-in capacity substrates; And
Cut this block along those Cutting Roads, separate those vertical built-in capacity substrates, and those vertical built-in capacity substrates have a first surface and a second surface with singulation.
5. the manufacture method of vertical built-in capacity substrate as claimed in claim 4 is characterized in that: its comprise in addition form those conductor layers of at least one electric connection, patterned electrode layer and plate electrode layer line layer on those first surfaces and those second surfaces of those vertical built-in capacity substrates.
6. the manufacture method of vertical built-in capacity substrate as claimed in claim 5 is characterized in that: it comprises in addition and forms several projections on this line layer.
7. vertical built-in capacity substrate, it is characterized in that: it comprises: several conductting layers, it has a conductor layer and one first dielectric layer, and this conductor layer is to be formed on this first dielectric layer; And several first composite beds, it is formed between those conductting layers, and it has a patterned electrode layer and one second dielectric layer, and those patterned electrode layer have several electrodes, and the patterned electrode layer and first dielectric layer contact.
8. vertical built-in capacity substrate as claimed in claim 7, it is characterized in that: it includes several second composite beds in addition, those second composite beds are to be formed between those conductting layers, those second composite beds have a plate electrode layer and one the 3rd dielectric layer, and the plate electrode layer contacts with first dielectric layer.
9. vertical built-in capacity substrate as claimed in claim 7, it is characterized in that: it includes several second composite beds in addition, those second composite beds are to be formed between those first composite beds, those second composite beds have a plate electrode layer and one the 3rd dielectric layer, and the plate electrode layer contacts with second dielectric layer.
10. vertical built-in capacity substrate as claimed in claim 7 is characterized in that: those conductor layers have several leads.
CN2007101287102A 2007-07-03 2007-07-03 Method for manufacturing vertical embedded capacitor substrate and structure thereof Active CN101090075B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2007101287102A CN101090075B (en) 2007-07-03 2007-07-03 Method for manufacturing vertical embedded capacitor substrate and structure thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2007101287102A CN101090075B (en) 2007-07-03 2007-07-03 Method for manufacturing vertical embedded capacitor substrate and structure thereof

Publications (2)

Publication Number Publication Date
CN101090075A CN101090075A (en) 2007-12-19
CN101090075B true CN101090075B (en) 2010-04-14

Family

ID=38943341

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2007101287102A Active CN101090075B (en) 2007-07-03 2007-07-03 Method for manufacturing vertical embedded capacitor substrate and structure thereof

Country Status (1)

Country Link
CN (1) CN101090075B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI510152B (en) * 2013-07-10 2015-11-21 Ind Tech Res Inst Embedded capacitor module

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5258153A (en) * 1991-06-11 1993-11-02 Compagnie Europeenne De Composants Electroniques Lcc Method for the manufacture of stacked or wound type metallized polyethlene naphthalene film capacitors
CN1340991A (en) * 2000-07-31 2002-03-20 日本特殊陶业株式会社 Wiring baseplate and its manufacture method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5258153A (en) * 1991-06-11 1993-11-02 Compagnie Europeenne De Composants Electroniques Lcc Method for the manufacture of stacked or wound type metallized polyethlene naphthalene film capacitors
CN1340991A (en) * 2000-07-31 2002-03-20 日本特殊陶业株式会社 Wiring baseplate and its manufacture method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JP特开2006-351820A 2006.12.28

Also Published As

Publication number Publication date
CN101090075A (en) 2007-12-19

Similar Documents

Publication Publication Date Title
US10177125B2 (en) Semiconductor package assembly
TWI566350B (en) Semiconductor device
WO2012074783A3 (en) Low-profile microelectronic package, method of manufacturing same, and electronic assembly containing same
JP2003031730A5 (en)
CN105261606A (en) Coreless layer package substrate and manufacturing method thereof
TW201431012A (en) Substrate embedding passive element
CN102832192B (en) Back-side contact formation
TW200532725A (en) Solid electrolytic capacitor, transmission-line device, method of producing the same, and composite electronic component using the same
CN107210554A (en) Method for manufacturing electric interconnection structure
CN103377818A (en) High-frequency element with through-hole via inductor and manufacturing method thereof
CN101090075B (en) Method for manufacturing vertical embedded capacitor substrate and structure thereof
CN105575945A (en) MOM capacitor and manufacturing method for MOM capacitor
US7525140B2 (en) Integrated thin film capacitors with adhesion holes for the improvement of adhesion strength
CN106341945B (en) A flexible circuit board and method of making the same
JP2003258107A5 (en)
EP1367645A3 (en) Semiconductor device and manufacturing method thereof
CN103310990B (en) Solid electrolytic capacitor substrate module and circuit board comprising same
TW200830510A (en) Embedded passive device and methods for manufacturing the same
EP1544913A3 (en) Semiconductor device and method of manufacturing thereof
TWI308788B (en) Manufacturing method and structure for a substrate with vertical embedding capacitor
CN101677100B (en) Capacitive element and manufacturing method thereof
CN1996595B (en) Capacitor structure for integrated circuit
US20140085845A1 (en) Thick-film hybrid circuit structure and method of manufacture the same
CN207976857U (en) Touch panel
US7064427B2 (en) Buried array capacitor and microelectronic structure incorporating the same

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant