CN100563276C - Digital Subscriber Line Test Method and Device - Google Patents

Abstract

The invention discloses a kind of digital subscriber line testing process, be included in the access layer equipment, support the veneer of Single Ended Loop Test and/or Dual-Ended Loop Test for the veneer configuration of not supporting Single Ended Loop Test and/or Dual-Ended Loop Test; Veneer by described support Single Ended Loop Test and/or Dual-Ended Loop Test carries out Single Ended Loop Test and/or Dual-Ended Loop Test to the digital subscriber line that port connected on the veneer of not supporting Single Ended Loop Test and/or Dual-Ended Loop Test.Accordingly, the invention also discloses a kind of digital subscriber's loop test device.The DSL that the present invention can simplify connecting on the equipment of not supporting SELT and/or DELT technology tests, and reduces testing cost and form automatic test course.

Description

Digital Subscriber Line Test Method and Device

technical field

The present invention relates to the technical field of Digital Subscriber Line (DSL, Digital Subscriber Line), in particular to a digital subscriber line testing method and device.

Background technique

With the gradual expansion of Digital Subscriber Line Access Multiplexer (DSLAM, Digital Subscriber Line Access Multiplexer) network scale, DSLAM network applications are faced with problems such as rapid user cable selection, accurate fault location and automatic line maintenance. In the initial stage of DSLAM network construction, small-scale network services can be maintained manually; however, with the gradual expansion of the DSLAM network scale, manual testing and maintenance of DSL is far from meeting the needs of DSLAM network development. , so DSL testing and maintenance issues have become the bottleneck of DSLAM network scale development.

Among them, there are two testing techniques for testing DSL to collect test data: single-ended line testing (SELT, Single Ended Line Testing) and double-ended line testing (DELT, Dual Ended Line Testing). The characteristics of SELT and DELT are as follows:

SELT technology can be used to detect and find out the detailed characteristics of a certain DSL. In terms of line topology, SELT technology can be used to test information such as line length, (bridge) tap location and (bridge) tap length. In terms of line status, SELT technology can also help service providers test the specific location of the short circuit and the specific location of the load coil, which allows the service provider to have a very clear understanding of line noise and other interference characteristics.

According to the definition of ITU-T standard ADSL2 (G.992.3), DELT technology can be used for the test of line diagnosis mode. This built-in test function can make the measurement of DSL at both ends of the line without sending maintenance engineers to test The equipment is connected to the end of the DSL (that is, the end of the user's home), so the testing process is more convenient. The test data obtained by testing DSL with DELT technology can help maintenance engineers analyze the location and source of faults caused by crosstalk, radio frequency interference or (bridge) taps.

In the current DSLAM network, only the ADSL2+ chip in the Asymmetrical Digital Subscriber Line (ADSL, Asymmetrical Digital Subscriber Line) device can provide the SELT/DELT function, while others such as the Very high speed Digital Subscriber Line (VDSL, Very high speed Digital SubscriberLine) and Single pair High Speed Digital Subscriber Line (SHDSL, Single pair High speed Digital Subscriber Line) devices have not yet provided the capability of SELT/DELT technology.

Based on the above reasons, when testing the DSL connected to devices that do not support SELT and/or DELT technology, such as VDSL and SHDSL, the following two methods are usually used for testing:

1) Use an external test instrument independent of the DSLAM to test the DSL. Since the use of an external test instrument to test the DSL usually requires mobile testing between different geographic locations, this will result in the inability to share between multiple DSLAMs Testing technology makes it difficult to form an automated testing process.

2) Deploy a line card capable of supporting SELT and/or DELT technology on each rack of the DSL central office, and reroute the DSL to be tested so that it can pass through the main distribution frame that can support SELT and/or DELT technology line cards, and then connect the DSL to the DSL port of the DSLAM, it is possible to test the DSL connected to the equipment that does not support SELT and/or DELT technology, such as VDSL and SHDSL. However, this method needs to deploy a line card supporting SELT and/or DELT technology on each rack of the DSL central office, and needs to re-route the DSL that needs to be tested, which leads to high testing costs and requires testing implementation. The process is more complicated and cumbersome.

Contents of the invention

The technical problem to be solved by the present invention is to propose a digital subscriber line testing method and device to simplify the testing of DSL connected to equipment that does not support SELT and/or DELT technologies, reduce testing costs and form an automated testing process.

In order to solve the above problems, the technical scheme proposed by the present invention is as follows:

A digital subscriber line test method, comprising steps:

A. In the access layer device, configure a single board that supports single-ended line test and/or double-ended line test for a single board that does not support single-ended line test and/or double-ended line test;

B. The single-ended line is performed on the digital subscriber line connected to the port on the single-board that does not support the single-ended line test and/or double-ended line test by the single board that supports the single-ended line test and/or double-ended line test test and/or double-ended line test, wherein, the single board supporting single-ended line test and/or double-ended line test is connected to the internal test bus in the access layer device, and the digital subscriber line is connected to the The external test bus in the access layer device is connected, and the internal test bus and the external test bus are connected during testing.

The single board supporting single-ended line test and/or double-ended line test is a single-ended test board integrated with a single-ended line test and/or double-ended line test function test card.

The single board supporting single-ended line test and/or double-ended line test is a service single board integrated with single-ended line test and/or double-ended line test function test card.

Correspondingly, the present invention also proposes a digital subscriber line test device, which is used to test the digital subscriber line connected to the port on the single board that does not support single-ended line test and/or double-ended line test in the access layer equipment ,include:

A board that supports single-ended line testing and/or double-ended line testing is used to perform single-ended line testing and / or double-ended line test;

An inner connector for connecting the single board supporting single-ended line test and/or double-ended line test to the inner test bus of the access layer device during testing; and

The outer connector is used to connect the digital subscriber line connected to the port on the board that does not support single-ended line test and/or double-ended line test to the external test bus of the access layer device during testing;

The internal test bus and the external test bus of the access layer equipment are connected during testing.

Wherein the inner connector is arranged in a single board supporting single-ended line test and/or double-ended line test; or

It is set at the line grabbing point of the single-ended line test and/or double-ended line test that supports external line grabbing.

The board supporting single-ended line test and/or double-ended line test is a test board or service board integrated with a single-ended line test and/or double-ended line test function test card.

Wherein the outer connector is arranged in a single board that does not support single-ended line test and/or double-ended line test; or

It is set at the line grab point of the board that supports external line grab and does not support single-end line test and/or double-end line test.

Wherein the inner connector is an inner relay; the outer connector is an outer relay.

Wherein the internal test bus and the external test bus are directly connected through wires or connected through relays.

The beneficial effect that the present invention can reach is as follows:

The digital subscriber line test method and device of the present invention configure a single board that supports SELT and/or DELT for a single board that does not support SELT and/or DELT in the access layer equipment, and pass the single board that supports SELT and/or DELT during the test. Connect the board to the internal test bus of the access layer device, and connect the DSL connected to the port on the board that does not support SELT and/or DELT to the external test bus of the access layer device, and connect the internal and external test buses Realize the purpose of performing SELT and/or DELT on the DSL connected to the port on the single board that does not support SELT and/or DELT by the single board that supports SELT and/or DELT, so there is no need to use independent external test equipment for unsupported SELT and/or DELT access layer equipment can be tested without rerouting the DSL to be tested, so the process of testing access layer equipment that does not support SELT and/or DELT can be simplified and the cost of testing can be reduced And it is easy to form an automated testing process.

Description of drawings

Fig. 1 is the main realization principle flowchart of digital subscriber line test method of the present invention;

Fig. 2 is the main composition structure schematic diagram of the digital subscriber line testing device of the present invention;

Fig. 3 is a schematic diagram of the composition and structure of a specific embodiment of a digital subscriber line testing device of the present invention using a relay to realize a connector.

Detailed ways

The realization principle of the digital subscriber line testing method and testing device thereof of the present invention is to use the port on the single board that supports SELT and/or DELT technology to connect the corresponding digital subscriber to the port on the single board that does not support SELT and/or DELT technology Line DSL performs SELT and/or DELT test processing.

The implementation principle and specific implementation process of the digital subscriber line testing method and testing device of the present invention will be described in detail below in conjunction with each accompanying drawing.

Please refer to Fig. 1, this figure is the main realization principle flowchart of digital subscriber line test method of the present invention, and its main realization process is as follows:

Step S10, in the access layer equipment in the DSLAM network system (such as a digital subscriber line access multiplexer DSLAM), support SELT for single-board configurations that do not support single-ended line test SELT and/or double-ended line test DELT technology and/or single boards with DELT technology;

Step S20, when there is a problem with the DSL connected to a certain port on a single board that does not support SELT and/or DELT technology in the access layer device, the configured support SELT and/or DELT technology in the single board Any port on the board that does not support SELT and/or DELT technology performs corresponding SELT and/or DELT test processing on the DSL that is connected to the port on the board that does not support SELT and/or DELT technology, so that the board that does not support SELT and/or DELT technology Perform fault detection and maintenance on the DSL connected to any port in the network.

Wherein, in step S20, any port of the single board that supports SELT and/or DELT technology can be connected to the internal test bus in the access layer device, and the corresponding port of the single board that does not support SELT and/or DELT technology can be connected The DSL in question is connected to the external test bus in the access layer device, and the internal and external test buses in the access layer device are connected, so that the path formed by the above-mentioned processing can be used to realize the SELT and/or DELT The purpose of performing SELT and/or DELT test processing on the DSL connected to the port of the single board that does not support SELT and/or DELT technology.

The above boards supporting SELT and/or DELT can be realized by integrating a test card with SELT and/or DELT technology functions on the test board; it can also be realized by integrating a test card with SELT and/or DELT technology functions on the business board Test card to achieve.

Please refer to Fig. 2, which is a schematic diagram of the main components of the digital subscriber line testing device of the present invention, wherein the digital subscriber line testing device is mainly composed of a single board 10 supporting SELT and/or DELT, an inner connector 20 and an outer connector 40 , to perform SELT and/or DELT test processing on the DSL connected to the port on the board that does not support SELT and/or DELT in the access layer device, wherein the main functions of each component are as follows:

The single board 10 that supports SELT and/or DELT is mainly used for performing SELT and/or SELT on the DSL 50 that has a fault problem when the DSL 50 connected to the port on the single board that does not support SELT and/or DELT has a problem. DELT test processing.

The inner connector 20 is mainly used to connect the above-mentioned single board 10 supporting SELT and/or DELT to the internal test bus 30 in the access layer device when the DSL 50 having a problem is tested, and when a problem occurs at the end When the DSL 50 is tested, disconnect the above-mentioned single board 10 that supports SELT and/or DELT and the connection of the internal test bus 30;

Wherein the inner connector 20 can be arranged in the single board 10 supporting SELT and/or DELT; it can also be arranged at the wire grabbing point of the single board 10 supporting SELT and/or DELT which supports external wire grabbing; and the inner side connector The device 20 can be realized by an internal relay.

The outer connector 40 is mainly used to connect the DSL 50 with a fault problem connected to the port on the single board 70 that does not support SELT and/or DELT in the access layer device when the DSL 50 with a problem is tested. To the external test bus 60 of the access layer equipment, and when the DSL 50 having a problem is tested at the end, the DSL 50 is reconnected to the corresponding port on the single board 70 that does not support SELT and/or DELT;

Wherein the outer connector 40 can be arranged in the veneer 70 that does not support SELT and/or DELT; it can also be arranged at the line grabbing point of the veneer 70 that does not support SELT and/or DELT that supports external grip lines; and the The outside connector 40 may be realized by an outside relay.

Wherein when carrying out SELT and/or DELT test processing to the DSL 50 that appears problem by digital subscriber line testing device of the present invention, the inner test bus 30 and the outer test bus 60 in the access layer equipment are in the connected state, wherein the inner test bus 30 and the external test bus 60 can be directly connected by a wire, or can also connect the internal test bus 30 and the external test bus 60 by using a relay, and realize that the internal test bus 30 and the external test bus 60 are connected by closing the relay together.

As shown in Figure 2, the digital subscriber line testing device of the present invention is connected to the inner test bus 30 by the single board 10 supporting SELT and/or DELT by the inner connector 20, and then through the connection of the inner test bus 30 and the outer test bus 60 relationship, and then by connecting the DSL 50 to be tested to the external test bus 60 through the outside connector 40, a loop for testing the DSL 50 to be tested can be formed, so that the DSL 50 to be tested can be SELT and/or or DELT test processing purposes.

The above-mentioned single board 10 supporting SELT and/or DELT can be realized by integrating a test card with SELT and/or DELT technical functions on the test single board; it can also be realized by integrating SELT and/or DELT technical functions on the business single board test card to achieve.

Please refer to Fig. 3, which is a schematic diagram of the composition structure of the embodiment of the digital subscriber line testing device of the present invention using relays to realize the connector. The port on the board is called the port under test (that is, the DSL connected to the port under test is tested), and the port on the single board supporting SELT and/or DELT is called the auxiliary port.

As shown in Figure 3, when it is necessary to test the DSL connected to the port under test, first connect the outer relay K1 of the port under test to the external test bus in the access layer device, and then connect the inner relay K2 of the auxiliary port Connect to the internal test bus in the access layer device, and then connect the internal and external test bus (as shown in the figure, use the connecting cable to directly connect the internal and external test bus); then start the SELT and/or DELT function of the auxiliary port to test the The DSL connected to the tested port is subjected to SELT and/or DELT test processing, so as to obtain the test result of the DSL connected to the tested port.

Wherein, the outer relay K1 may be in a single board that does not support SELT and/or DELT, or at a line grabbing point of a single board that does not support SELT and/or DELT that supports external thread grabbing (referred to as an external thread grabbing frame); Correspondingly, the inner relay K2 may be in the single board supporting SELT and/or DELT, or at the line grabbing point of the single board supporting SELT and/or DELT supporting external thread grabbing (referred to as the external thread grabbing frame); The line grabbing point in the external line grabbing frame can be in front of or behind the ordinary telephone service (POTS, Plain Old Telephone Service) splitter (Spliter), and the user can decide whether to disconnect the POTS service through the operation interface. Since the port to be tested and the auxiliary port are both in the access layer device, no matter whether the position of the line grabbing point is inside the board or in the external line grabbing frame, these line grabbing points will be located on the Main Distribution Frame (MDF, Main Distribution Frame). ), so there is no need to reroute the DSL to be tested in engineering, so it can simplify the test process of SELT and/or DELT for the DSL connected to the device that does not support SELT and/or DELT.

Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention also intends to include these modifications and variations.

Claims (9)

1, a kind of digital subscriber line testing process comprises step:

A, in access layer equipment, support the veneer of Single Ended Loop Test and/or Dual-Ended Loop Test for the veneer configuration of not supporting Single Ended Loop Test and/or Dual-Ended Loop Test;

B, the digital subscriber line that port connected on the veneer of not supporting Single Ended Loop Test and/or Dual-Ended Loop Test is carried out Single Ended Loop Test and/or Dual-Ended Loop Test by the veneer of described support Single Ended Loop Test and/or Dual-Ended Loop Test, wherein, the veneer of described support Single Ended Loop Test and/or Dual-Ended Loop Test links to each other with build-in test bus in the described access layer equipment, described digital subscriber line links to each other with outer test bus in the described access layer equipment, and described build-in test bus and outer test bus link to each other when test.

2, digital subscriber line testing process as claimed in claim 1 is characterized in that, the veneer of described support Single Ended Loop Test and/or Dual-Ended Loop Test is the testing single-board that is integrated with Single Ended Loop Test and/or Dual-Ended Loop Test functional test card.

3, digital subscriber line testing process as claimed in claim 1 is characterized in that, the veneer of described support Single Ended Loop Test and/or Dual-Ended Loop Test is the service board that is integrated with Single Ended Loop Test and/or Dual-Ended Loop Test functional test card.

4, a kind of digital subscriber's loop test device is used for the digital subscriber line that access layer equipment does not support the port on the veneer of Single Ended Loop Test and/or Dual-Ended Loop Test to connect is tested, and comprising:

Support the veneer of Single Ended Loop Test and/or Dual-Ended Loop Test, be used for the digital subscriber line that port connected on the veneer of not supporting Single Ended Loop Test and/or Dual-Ended Loop Test is carried out Single Ended Loop Test and/or Dual-Ended Loop Test;

Interior side-connector is used in when test the veneer of described support Single Ended Loop Test and/or Dual-Ended Loop Test being connected to the build-in test bus of access layer equipment; With

Outer side-connector is used for the time will not supporting the digital subscriber line that port connected on the veneer of Single Ended Loop Test and/or Dual-Ended Loop Test to be connected to the outer test bus of access layer equipment in test;

Wherein the build-in test bus of access layer equipment links to each other when testing with outer test bus.

5, digital subscriber's loop test device as claimed in claim 4 is characterized in that, described interior side-connector is arranged in the veneer of supporting Single Ended Loop Test and/or Dual-Ended Loop Test; Or

What be arranged on the veneer of supporting outside support Single Ended Loop Test of grabbing line and/or Dual-Ended Loop Test grabs line point place.

6, as claim 4 or 5 described digital subscriber's loop test devices, it is characterized in that the veneer of described support Single Ended Loop Test and/or Dual-Ended Loop Test is testing single-board or the service board that is integrated with Single Ended Loop Test and/or Dual-Ended Loop Test functional test card.

7, digital subscriber's loop test device as claimed in claim 4 is characterized in that, described outer side-connector is arranged in the veneer of not supporting Single Ended Loop Test and/or Dual-Ended Loop Test; Or

Be arranged on support the outside veneer of not supporting Single Ended Loop Test and/or Dual-Ended Loop Test of grabbing line grab line point place.

As claim 4,5 or 7 described digital subscriber's loop test devices, it is characterized in that 8, described interior side-connector is inboard relay; Described outer side-connector is an outside relay.

9, digital subscriber's loop test device as claimed in claim 4 is characterized in that, described build-in test bus directly links to each other by lead with outer test bus or links to each other by relay.

Images