CN100527450C - Semiconductor optoelectronic component and its cutting method - Google Patents
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 80
- 238000005520 cutting process Methods 0.000 title claims abstract description 46
- 238000000034 method Methods 0.000 title claims abstract description 38
- 230000005693 optoelectronics Effects 0.000 title claims description 65
- 239000000758 substrate Substances 0.000 claims abstract description 42
- 229910003460 diamond Inorganic materials 0.000 claims abstract description 41
- 239000010432 diamond Substances 0.000 claims abstract description 41
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 41
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 40
- 239000010703 silicon Substances 0.000 claims abstract description 40
- 239000000463 material Substances 0.000 claims description 13
- 239000013078 crystal Substances 0.000 abstract description 19
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 11
- 230000000694 effects Effects 0.000 description 9
- 238000003698 laser cutting Methods 0.000 description 7
- 238000000605 extraction Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 150000001875 compounds Chemical class 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910007709 ZnTe Inorganic materials 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910021480 group 4 element Inorganic materials 0.000 description 1
- 230000001795 light effect Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
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Abstract
Description
技术领域 technical field
本发明是有关于一种半导体光电组件及其切割方法,尤指一种合并电射切割与钻石刀切割的半导体光电组件的切割方法,其可以去除半导体光电组件晶粒上的焦黑区域并减少钻石刀的损耗。The invention relates to a semiconductor optoelectronic component and its cutting method, especially to a cutting method of a semiconductor optoelectronic component combined with electric jet cutting and diamond knife cutting, which can remove the scorched area on the crystal grain of the semiconductor optoelectronic component and reduce the diamond Knife loss.
背景技术 Background technique
由于红蓝绿是全彩的三原色,高亮度的蓝光发光二极管(LED)对于全彩色显示器的应用日益受到重视,而光信息存取技术也将采用具有短波长的蓝光发光二极管作为光源。此外,由蓝光发光二极管衍生的白光发光二极管也被认为是下一世代的照明技术。Since red, blue and green are the three primary colors of full-color, the application of high-brightness blue light-emitting diodes (LEDs) for full-color displays has been increasingly valued, and optical information access technology will also use short-wavelength blue light-emitting diodes as light sources. In addition, white light-emitting diodes derived from blue light-emitting diodes are also considered to be the next generation of lighting technology.
一般传统的发光二极管的切割方式有钻石刀切割与镭射切割这两种方式。请参照图5所示,钻石刀切割是于发光二极管芯片的基板背面以钻石刀切割出一道深度数微米(um)的沟槽(80),又称为划线(scribe)程序,再于发光二极管芯片正面对准划线处以刀片劈裂(break),形成发光二极管晶粒。由于白光和蓝光发光二极管大多使用质地非常坚硬的蓝宝石基板(sapphiresubstrate),因此若于白光和蓝光发光二极管采用钻石刀切割方法,将导致钻石刀刀锋磨耗严重,进而增加了发光二极管的制造成本。此外,由于钻石刀是以点接触的方式切割,因此沟槽两侧常形成侧向与径向的裂痕,在劈裂时芯片往往无法完全依照预定的方向断裂,造成晶粒的崩角与破裂现象,因而造成晶粒的外观不佳,使得制程良率降低。Generally, the traditional cutting methods of light-emitting diodes include diamond knife cutting and laser cutting. Please refer to Figure 5, diamond knife dicing is to cut a groove (80) with a depth of several microns (um) on the back of the substrate of the light-emitting diode chip with a diamond knife, also known as the scribe (scribe) process, and then emit light The front side of the diode chip is aligned with the scribe line and split by a blade to form the LED grain. Since white light and blue light emitting diodes mostly use a very hard sapphire substrate, if a diamond knife cutting method is used for white light and blue light emitting diodes, it will cause serious abrasion of the diamond blade, thereby increasing the manufacturing cost of the light emitting diodes. In addition, since the diamond knife is cut in a point-contact manner, lateral and radial cracks are often formed on both sides of the groove. When splitting, the chip often cannot be completely broken according to the predetermined direction, resulting in chipping and cracking of the crystal grains. Phenomenon, thus resulting in poor appearance of the grains, which reduces the process yield.
请参照图6所示,镭射切割方式是以镭射代替钻石刀进行划线程序,因镭射划线所划出的沟槽(90)具有高深宽比,因此劈裂后的发光二极管晶粒其外观较钻石刀切割方式为佳,又因镭射切割方式无钻石刀损耗的问题,因此发光二极管晶粒的制造成本较低。然而,由于镭射切割会在沟槽(90)内壁表面形成一焦黑层,因此会于发光二极管晶粒表面形成焦黑区域,影响发光二极管晶粒的光取出效果。Please refer to Figure 6, the laser cutting method is to use laser instead of diamond knife to carry out the scribing process, because the groove (90) drawn by laser scribing has a high aspect ratio, so the appearance of the split light-emitting diode crystal grain It is better than the diamond knife cutting method, and because the laser cutting method does not have the problem of diamond knife loss, the manufacturing cost of the light-emitting diode crystal grains is lower. However, since laser cutting will form a charred layer on the inner wall surface of the groove (90), a charred area will be formed on the surface of the LED grain, affecting the light extraction effect of the LED grain.
由于晶粒的切割分离已属于发光二极管的后段制程,因此若是因为切割制程的质量不良而造成产品的报废,前段制程等耗时又昂贵的生产成本投入将付诸流水,所以晶粒的切割对于发光二极管等半导体光电组件的制造具有关键的重要性。Since the cutting and separation of die belongs to the back-end process of light-emitting diodes, if the product is scrapped due to poor quality of the cutting process, the time-consuming and expensive production costs such as the front-end process will be put into flow, so the cutting of die It is of key importance for the manufacture of semiconductor optoelectronic components such as light-emitting diodes.
发明内容 Contents of the invention
有鉴于传统的半导体光电组件切割方法具有外观良率不佳、钻石刀磨耗大以及影响光取出效果等问题,本发明的主要目的在于提供一种半导体光电组件及其切割方法,其可以降低钻石刀的磨耗,提高外观良率并可藉由在半导体光电组件晶粒侧面形成或粗糙的表面或倾斜面,增加出光效果。In view of the problems that the traditional cutting method of semiconductor optoelectronic components has the problems of poor appearance yield, high diamond knife wear, and affecting the light extraction effect, the main purpose of the present invention is to provide a semiconductor optoelectronic component and its cutting method, which can reduce the cost of the diamond knife. wear, improve the appearance yield and increase the light-emitting effect by forming a rough surface or an inclined surface on the side of the semiconductor optoelectronic component crystal grain.
为达成以上的目的,本发明的半导体光电组件的切割方法是包括以下的步骤:In order to achieve the above object, the cutting method of the semiconductor optoelectronic component of the present invention comprises the following steps:
准备半导体光电组件芯片:该半导体光电组件芯片是包含有一基板,于基板表面形成有一外延硅层;Prepare a semiconductor optoelectronic component chip: the semiconductor optoelectronic component chip includes a substrate, and an epitaxial silicon layer is formed on the surface of the substrate;
镭射划线:以镭射于半导体光电组件芯片表面划设导引沟槽;Laser scribing: use laser to draw guide grooves on the surface of semiconductor optoelectronic component chips;
钻石刀切割:以钻石刀于导引沟槽中进行切割;Diamond knife cutting: use a diamond knife to cut in the guide groove;
形成半导体光电组件晶粒:将半导体光电组件芯片沿已划设的沟槽劈裂,形成半导体光电组件晶粒。Forming semiconductor optoelectronic component grains: Splitting semiconductor optoelectronic component chips along the grooves that have been drawn to form semiconductor optoelectronic component crystal grains.
较佳的是,其中的镭射划线步骤是于半导体光电组件芯片的背面划设导引沟槽。Preferably, the laser scribing step is to draw a guide groove on the back surface of the semiconductor optoelectronic component chip.
较佳的是,其中的镭射划线步骤前,是先去除半导体光电组件芯片正面欲划设沟槽区域的外延硅层,再以镭射于基板己去除外延硅层的表面划设导引沟槽。Preferably, before the laser scribing step, first remove the epitaxial silicon layer in the area where the groove is to be drawn on the front side of the semiconductor optoelectronic component chip, and then use laser to draw a guide groove on the surface of the substrate where the epitaxial silicon layer has been removed .
本发明的半导体光电组件是具有一基板与一外延硅层,外延硅层是形成于基板的一表面,基板的侧面设有粗糙表面,该粗糙表面是为于半导体光电组件芯片表面进行镭射划线而产生导引沟槽,再于导引沟槽内进行钻石刀切割所形成,粗糙区域可为一倾斜面或者一波浪状表面。The semiconductor optoelectronic component of the present invention has a substrate and an epitaxial silicon layer, the epitaxial silicon layer is formed on a surface of the substrate, and the side of the substrate is provided with a rough surface, and the rough surface is used for laser scribing on the surface of the semiconductor optoelectronic component chip The guide groove is produced, and then diamond knife cutting is performed in the guide groove to form. The rough area can be an inclined surface or a wavy surface.
较佳的是,倾斜面是设于半导体光电组件晶粒的未设有外延硅层的表面。Preferably, the inclined surface is provided on the surface of the crystal grain of the semiconductor optoelectronic component not provided with the epitaxial silicon layer.
本发明可达成的具体功效包括:The specific effects that the present invention can achieve include:
1.本发明是先于半导体光电组件芯片的基板上以镭射划设导引沟槽,再以钻石刀切割去除镭射所生成的焦黑层,因此可以避免半导体光电组件晶粒表面形成焦黑区域而影响出光效果。1. In the present invention, a guide groove is drawn with a laser on the substrate of the semiconductor optoelectronic component chip, and then the scorched layer generated by the laser is removed by cutting with a diamond knife. Light effect.
2.本发明因钻石刀是于镭射划设的导引沟槽中切割,由于焦黑层的材料性质较为脆弱,因此不易造成钻石刀的磨损,且相较于仅用钻石刀切割的方式,导引沟槽两侧较不易产生侧向的裂痕,因此半导体光电组件芯片在分离形成半导体光电组件晶粒时,可使芯片沿预定的导引沟槽断裂,所以晶粒的外观较佳,可提高晶粒良率,降低制造成本,并且无须保留过宽的切割道,增加芯片可分离出的晶粒数目。2. In the present invention, because the diamond knife is cut in the guide groove drawn by the laser, because the material properties of the charred black layer are relatively fragile, it is not easy to cause the wear of the diamond knife, and compared with only cutting with a diamond knife, the guide Lateral cracks are less likely to occur on both sides of the guide groove, so when the semiconductor optoelectronic component chip is separated to form the semiconductor optoelectronic component grain, the chip can be broken along the predetermined guide groove, so the appearance of the grain is better, which can improve The grain yield rate reduces the manufacturing cost, and there is no need to keep an overly wide dicing line, which increases the number of grains that can be separated from the chip.
3.本发明的切割方法相较单纯仅用镭射的切割方式,由于钻石刀的切割可于半导体光电组件晶粒侧面自然形成倾斜面,进而提高半导体光电组件的出光效率。3. Compared with the simple laser cutting method, the cutting method of the present invention can naturally form an inclined surface on the side of the crystal grain of the semiconductor optoelectronic component due to the cutting of the diamond knife, thereby improving the light extraction efficiency of the semiconductor optoelectronic component.
附图说明 Description of drawings
图1是为本发明切割方法的流程图。Fig. 1 is a flowchart of the cutting method of the present invention.
图2是为本发明切割方法第一较佳实施例的流程图。Fig. 2 is a flowchart of the first preferred embodiment of the cutting method of the present invention.
图3是为本发明切割方法第二较佳实施例的流程图。Fig. 3 is a flowchart of the second preferred embodiment of the cutting method of the present invention.
图4是为本发明半导体光电组件的示意图。Fig. 4 is a schematic diagram of the semiconductor optoelectronic component of the present invention.
图5是为镭射切割方法的流程图。Fig. 5 is a flow chart of the laser cutting method.
图6是为钻石刀切割方法的流程图。Fig. 6 is a flow chart of the diamond knife cutting method.
主要组件符号说明Explanation of main component symbols
(11)基板 (111)沟槽(11) Substrate (111) Groove
(112)倾斜面 (12)外延硅层(112) Inclined surface (12) Epitaxial silicon layer
(13)金属电极(13) Metal electrodes
(21)基板 (211)沟槽(21) Substrate (211) Groove
(212)倾斜面 (22)外延硅层(212) Inclined surface (22) Epitaxial silicon layer
(31)p型电极 (32)GaAs外延硅层(31) p-type electrode (32) GaAs epitaxial silicon layer
(33)n型GaAs基板 (34)n型电极(33) n-type GaAs substrate (34) n-type electrode
(35)倾斜面(35) inclined surface
(80)沟槽(80) Groove
(90)沟槽(90) Groove
具体实施方式 Detailed ways
请参照图1所示,本发明半导体光电组件的切割方法是包括:Please refer to shown in Fig. 1, the cutting method of semiconductor optoelectronic component of the present invention is to comprise:
准备半导体光电组件芯片:请参照图2所示,半导体光电组件芯片是于基板(11)上形成有外延硅层(12),并于外延硅层(12)上设有金属电极(13),此外延硅层(12)材料可为III-V族化合物的半导体材料,如GaN、GaS、GaP、InP、InGaAlN、InGaAlP、InGaAlAs及GaAlPAs等材料;外延硅层(12)材料亦可为II-VI族化合物的半导体材料,如ZnO、ZnSe、ZnS及ZnTe等材料;外延硅层(12)材料亦可为IV族元素的半导体材料,如Si及Ge等材料。Prepare semiconductor optoelectronic component chip: please refer to as shown in Figure 2, the semiconductor optoelectronic component chip is formed with an epitaxial silicon layer (12) on the substrate (11), and is provided with a metal electrode (13) on the epitaxial silicon layer (12), The epitaxial silicon layer (12) material can be a semiconductor material of III-V compound, such as materials such as GaN, GaS, GaP, InP, InGaAlN, InGaAlP, InGaAlAs and GaAlPAs; the epitaxial silicon layer (12) material can also be II- Semiconductor materials of group VI compounds, such as ZnO, ZnSe, ZnS and ZnTe; the epitaxial silicon layer (12) material can also be semiconductor materials of group IV elements, such as Si and Ge.
镭射划线:以镭射于半导体光电组件芯片的基板表面划设导引沟槽,此时由于镭射的高温熔融作用,使沟槽内壁表面形成一焦黑层;请参照图2所示,于本发明切割方法的第一较佳实施例中,镭射是于半导体光电组件芯片背面,即未形成外延硅层(12)的表面,划设导引沟槽(111);请参照图3所示,于本发明切割方法的第二较佳实施例中,先利用制程方式将半导体光电组件芯片正面欲划设沟槽区域的外延硅层(22)去除,再以镭射于基板(21)己去除外延硅层(22)的表面划设导引沟槽(211);Laser scribing: Use laser to draw a guide groove on the substrate surface of the semiconductor optoelectronic component chip. At this time, due to the high temperature melting effect of the laser, a charred black layer is formed on the inner wall surface of the groove; please refer to Figure 2, which is used in the present invention In the first preferred embodiment of the cutting method, the laser is on the back side of the semiconductor optoelectronic component chip, that is, the surface where the epitaxial silicon layer (12) is not formed, and guide grooves (111) are drawn; please refer to FIG. In the second preferred embodiment of the cutting method of the present invention, the epitaxial silicon layer (22) on the front surface of the semiconductor optoelectronic component chip to be grooved (22) is removed by a process method, and then the epitaxial silicon layer (22) is removed on the substrate (21) by laser. A guide groove (211) is defined on the surface of the layer (22);
钻石刀切割:以钻石刀于镭射划设出的沟槽(111)(211)中进行切割,将镭射形成的焦黑层刮除并增加划线深度;由于焦黑层的材料特性较为脆弱,因此不易造成钻石刀的磨损;此时由于事先以镭射划出导引沟槽(111)(211),因此钻石刀在沟槽(111)(211)内切割时,钻石刀可以较大的面积与沟槽(111)(211)接触,因此沟槽(111)(211)两侧较不易产生侧向的裂痕;也由于沟槽(111)(211)两侧较不易产生侧向裂痕,因此芯片无须保留过宽的切割道,增加芯片可分离出的晶粒数目;Diamond knife cutting: use a diamond knife to cut in the grooves (111) (211) drawn by the laser, scrape off the charred layer formed by the laser and increase the depth of the line; because the material properties of the charred layer are relatively fragile, it is not easy Cause the wearing and tearing of diamond cutter; Owing to delineate guide groove (111) (211) with laser in advance at this moment, so when diamond cutter cuts in groove (111) (211), diamond cutter can be bigger area and groove Groove (111) (211) contact, so groove (111) (211) both sides are less likely to produce lateral cracks; Keep too wide dicing line to increase the number of crystal grains that can be separated from the chip;
形成半导体光电组件晶粒:将半导体光电组件芯片沿已划设的沟槽(111)(211)分离,以形成半导体光电组件晶粒;由于镭射划线所生成的焦黑层已由钻石刀切割刮除,因此可避免焦黑层影响半导体光电组件晶粒的出光效果;此外,由于沟槽(111)(211)两侧的侧向裂痕大幅减少,因此芯片在分离劈裂时可依沟槽的方向断裂,避免晶粒产生崩角或破裂的现象,提高晶粒的外观良率;藉由钻石刀切割可于半导体光电组件晶粒的侧面自然形成粗糙的表面,此表面可为倾斜面(112)(212)而可增加半导体光电组件的出光效果;于第一较佳实施例中,倾斜面(112)是形成于半导体光电组件晶粒的背面;于第二较佳实施例中,倾斜面(212)是形成于半导体光电组件晶粒的正面。Forming semiconductor optoelectronic component grains: separating the semiconductor optoelectronic component chips along the scribed grooves (111) (211) to form semiconductor optoelectronic component grains; the scorched black layer generated due to laser scribing has been cut and scraped by a diamond knife Therefore, it can avoid the influence of the charred black layer on the light-emitting effect of the crystal grains of the semiconductor optoelectronic component; in addition, because the lateral cracks on both sides of the groove (111) (211) are greatly reduced, the chip can be separated according to the direction of the groove when splitting. Fracture, avoid chipping or cracking of the crystal grains, and improve the appearance yield of the grains; by cutting with a diamond knife, a rough surface can be naturally formed on the side of the crystal grain of the semiconductor optoelectronic component, and this surface can be an inclined surface (112) (212) to increase the light-emitting effect of the semiconductor optoelectronic component; in the first preferred embodiment, the inclined surface (112) is formed on the back side of the semiconductor optoelectronic component crystal grain; in the second preferred embodiment, the inclined surface ( 212) is formed on the front side of the crystal grain of the semiconductor optoelectronic component.
本发明的半导体光电组件是具有一基板(11)(21)与—外延硅层(12)(22),外延硅层(12)(22)是形成于基板(11)(21)的一表面,基板的侧面设有粗糙表面,该粗糙表面是为于半导体光电组件芯片表面进行镭射划线而产生导引沟槽,再于导引沟槽内进行钻石刀切割所形成。该粗糙表面可为倾斜面(112)(212),由于基板(11)(21)侧面是设有倾斜面(112)(212),因此可增加半导体光电组件晶粒的出光效果,倾斜面(112)(212)可形成于基板(11)(21)未形成有外延硅层(12)(22)的表面,或形成有外延硅层(12)(22)的表面;该粗糙的表面亦可为波浪状的表面,其是为镭射划线所产生波浪状的表面,再经钻石刀切割刮除焦黑层所形成。The semiconductor optoelectronic component of the present invention has a substrate (11) (21) and an epitaxial silicon layer (12) (22), and the epitaxial silicon layer (12) (22) is formed on a surface of the substrate (11) (21) The side surface of the substrate is provided with a rough surface, which is formed by laser scribing on the surface of the semiconductor optoelectronic component chip to generate a guide groove, and then cutting with a diamond knife in the guide groove. The rough surface can be an inclined surface (112) (212). Since the side of the substrate (11) (21) is provided with an inclined surface (112) (212), it can increase the light output effect of the crystal grain of the semiconductor optoelectronic component, and the inclined surface ( 112)(212) can be formed on the surface of the substrate (11)(21) without the epitaxial silicon layer (12)(22), or on the surface with the epitaxial silicon layer (12)(22); the rough surface is also It can be a wavy surface, which is formed by laser scribing and then scraping off the burnt black layer by cutting with a diamond knife.
请参照图4所示,本发明的半导体光电组件实施例是包含一p型电极(31)、一GaAs外延硅层(32)、一n型GaAs基板(33)与一n型电极(34),GaAs外延硅层(32)是设于n型GaAs基板(33)的表面,p型电极(31)是设于GaAs外延硅层(32)的表面,n型电极(34)是设于n型GaAs基板(33)的表面,由镭射划线与钻石刀切割所形成的倾斜面(35)可形成于n型GaAs基板(33)未形成有GaAs外延硅层(32)的表面。Please refer to shown in Fig. 4, the embodiment of the semiconductor optoelectronic component of the present invention comprises a p-type electrode (31), a GaAs epitaxial silicon layer (32), an n-type GaAs substrate (33) and an n-type electrode (34) , the GaAs epitaxial silicon layer (32) is located on the surface of the n-type GaAs substrate (33), the p-type electrode (31) is located on the surface of the GaAs epitaxial silicon layer (32), and the n-type electrode (34) is located on the n-type GaAs substrate (33) surface. On the surface of the n-type GaAs substrate (33), the inclined surface (35) formed by laser scribing and diamond knife cutting can be formed on the surface of the n-type GaAs substrate (33) on which no GaAs epitaxial silicon layer (32) is formed.
本发明的切割方法是先于半导体光电组件芯片的基板(11)(21)上以镭射划设导引沟槽(111)(211),再以钻石刀切割去除镭射划线所造成的焦黑层,因此可以避免半导体光电组件晶粒表面形成焦黑区域而影响出光效果。此外,因钻石刀是于镭射划设的导引沟槽(111)(211)中切割,因此不易造成钻石刀的磨损。本发明的切割方法相较单纯仅用镭射的切割方式,可于半导体光电组件晶粒侧面自然形成倾斜面(112)(212),进而提高半导体光电组件的出光效率。The cutting method of the present invention is to first draw the guide groove (111) (211) with laser on the substrate (11) (21) of the semiconductor optoelectronic component chip, and then use a diamond knife to cut and remove the charred layer caused by the laser scribing , so it can avoid the formation of scorched black areas on the surface of semiconductor optoelectronic component crystal grains and affect the light extraction effect. In addition, since the diamond knife is cut in the guide groove (111) (211) drawn by laser, it is not easy to cause wear of the diamond knife. Compared with the laser cutting method, the cutting method of the present invention can naturally form inclined surfaces (112) (212) on the crystal grain side of the semiconductor optoelectronic component, thereby improving the light extraction efficiency of the semiconductor optoelectronic component.
本发明的切割方法是可应用于各式半导体光电组件上,如发光二极管、镭射二极管、光检测器与太阳能电池等半导体组件。The cutting method of the present invention can be applied to various semiconductor optoelectronic components, such as semiconductor components such as light emitting diodes, laser diodes, light detectors and solar cells.
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CN103116198A (en) * | 2013-02-04 | 2013-05-22 | 宏茂光电(苏州)有限公司 | Light diffusion sheet and trimming method thereof |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1163014A (en) * | 1994-10-07 | 1997-10-22 | 克里研究公司 | Method for manufacturing high-efficiency light-emitting diodes and resulting diode structures |
CN1354527A (en) * | 2000-11-22 | 2002-06-19 | 国联光电科技股份有限公司 | Cutting Method of Group III Nitride Semiconductor Light-Emitting Components |
US20030047543A1 (en) * | 2001-09-10 | 2003-03-13 | Micron Technology, Inc. | Wafer dicing device and method |
CN1643656A (en) * | 2002-03-12 | 2005-07-20 | 浜松光子学株式会社 | Method for deviding substrate |
CN1645563A (en) * | 2004-01-20 | 2005-07-27 | 株式会社迪斯科 | Semiconductor wafer processing method |
-
2007
- 2007-01-09 CN CNB2007100001004A patent/CN100527450C/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1163014A (en) * | 1994-10-07 | 1997-10-22 | 克里研究公司 | Method for manufacturing high-efficiency light-emitting diodes and resulting diode structures |
CN1354527A (en) * | 2000-11-22 | 2002-06-19 | 国联光电科技股份有限公司 | Cutting Method of Group III Nitride Semiconductor Light-Emitting Components |
US20030047543A1 (en) * | 2001-09-10 | 2003-03-13 | Micron Technology, Inc. | Wafer dicing device and method |
CN1643656A (en) * | 2002-03-12 | 2005-07-20 | 浜松光子学株式会社 | Method for deviding substrate |
CN1645563A (en) * | 2004-01-20 | 2005-07-27 | 株式会社迪斯科 | Semiconductor wafer processing method |
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