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CN100498359C - Circuit connection detection device, electronic equipment and detection method - Google Patents

Circuit connection detection device, electronic equipment and detection method Download PDF

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CN100498359C
CN100498359C CNB2007101270347A CN200710127034A CN100498359C CN 100498359 C CN100498359 C CN 100498359C CN B2007101270347 A CNB2007101270347 A CN B2007101270347A CN 200710127034 A CN200710127034 A CN 200710127034A CN 100498359 C CN100498359 C CN 100498359C
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substrate
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contact
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CN101067640A (en
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蔡英宏
周诗频
黄清育
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AUO Corp
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AU Optronics Corp
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Abstract

The invention provides a circuit connection detection device, an electronic device and a detection method. The circuit connection detection device comprises a substrate, a circuit module, a group of sensing elements and a detection unit. A plurality of contact pads are arranged on the substrate. The circuit module includes a plurality of conductive bumps respectively corresponding to the contact pads on the substrate. The sensing elements are respectively and correspondingly arranged on two sides of at least one of the partial contact pads and the corresponding conductive bumps; the detection unit is connected with the group of sensing elements so as to output an error signal when at least one of the contact pads provided with the sensing elements on two sides and the corresponding conductive bumps deforms and contacts the sensing elements. The invention can replace the manual detection by an automatic process, reduce the cost, the assembly difficulty and the possibility of detection loss, and has lower production cost.

Description

电路接合检测装置、电子设备及检测方法 Circuit bonding detection device, electronic equipment and detection method

技术领域 technical field

本发明涉及一种电路接合检测装置、其使用的检测方法以及使用此检测装置及方法的光电装置;特别涉及一种显示面板上电路接合检测装置、其使用的检测方法以及使用此检测装置及方法的显示面板。The present invention relates to a circuit bonding detection device, a detection method used therefor, and an optoelectronic device using the detection device and method; in particular, a circuit bonding detection device on a display panel, a detection method used therefor, and the detection device and method used display panel.

背景技术 Background technique

随着显示面板技术的不断提升,带动对显示面板驱动集成电路在封装上的技术成长需求。以薄膜晶体管液晶显示装置为例,目前常见的驱动电路封装方式包含卷带封装(Tape Carrier Package,TCP)、薄膜上芯片(Chip on Film,COF)以及玻璃上芯片(Chip on Glass,COG)三种。其中玻璃上芯片的封装方式由于具有降低成本、简化工艺及高精密度的优点,因此渐渐成为广泛使用的封装方式。With the continuous improvement of display panel technology, the technical growth demand for the packaging of display panel driver integrated circuits is driven. Taking thin-film transistor liquid crystal display devices as an example, the current common driving circuit packaging methods include Tape Carrier Package (TCP), Chip on Film (COF) and Chip on Glass (COG). kind. Among them, the chip-on-glass packaging method has gradually become a widely used packaging method due to its advantages of lower cost, simplified process and high precision.

图1所示为传统玻璃上芯片封装方式的示意图。玻璃基板10上设置电性连接于薄膜晶体管的导通垫11。芯片30上的驱动电路具有与导通垫11产生电连接的导电块31。在导通垫11与导电块31之间设有一层具有传导粒子22的接合材料20,例如各向异性导电胶膜(ACF)。当将芯片30压合至玻璃基板10上后,导通垫11即可借助中间受压的接合材料与对应的导电块31导通。Figure 1 shows a schematic diagram of a conventional chip-on-glass package. The conductive pad 11 electrically connected to the thin film transistor is disposed on the glass substrate 10 . The driving circuit on the chip 30 has a conductive block 31 electrically connected to the conductive pad 11 . A layer of bonding material 20 with conductive particles 22 , such as anisotropic conductive film (ACF), is disposed between the conducting pad 11 and the conductive block 31 . After the chip 30 is bonded to the glass substrate 10 , the conductive pad 11 can conduct with the corresponding conductive block 31 by means of the bonding material under pressure.

然而对于包含玻璃上芯片在内的所有封装方式而言,芯片30与基板上线路的对位精确度及压痕的检测均为工艺成品率提升的重点。如图1所示,由于过压或芯片30的衬底33厚度不均匀等原因,往往会造成导电块31的变形过大,进而造成有瑕疵的不良产品。为筛选出这类不良产品,一般均由人进行目视检测。然而此种方式的筛选造成工艺不连贯,且有漏检的风险。However, for all packaging methods including chip-on-glass, the alignment accuracy between the chip 30 and the circuit on the substrate and the detection of indentation are the key points to improve the process yield. As shown in FIG. 1 , due to reasons such as overvoltage or uneven thickness of the substrate 33 of the chip 30 , the deformation of the conductive block 31 is often too large, resulting in defective products with defects. In order to screen out such defective products, visual inspection is generally carried out by humans. However, this method of screening results in incoherent processes and the risk of missed detection.

发明内容 Contents of the invention

本发明的目的在于提供一种电路接合检测装置及其使用的检测方法,可用自动化的工艺取代人力检测。The object of the present invention is to provide a circuit joint testing device and a testing method thereof, which can replace manual testing with an automated process.

本发明的另一目的在于提供一种电路接合检测装置及其使用的检测方法,可降低成本并使组装难度降低。Another object of the present invention is to provide a circuit joint testing device and a testing method thereof, which can reduce cost and ease assembly difficulty.

本发明的另一目的在于提供一种电路接合检测装置及其使用的检测方法,可降低检测漏失的可能性。Another object of the present invention is to provide a circuit joint testing device and a testing method thereof, which can reduce the possibility of missing testing.

本发明的另一目的在于提供一种显示装置,具有较低的生产成本。Another object of the present invention is to provide a display device with lower production cost.

本发明的电路接合检测装置包含基板、电路模块、一组感测元件及检测单元。基板上设有多个接触垫。在多个接触垫中,由至少一个接触垫形成第一组。电路模块对应设置于基板上。电路模块包含有多个导电凸块。导电凸块分别对应于基板上的接触垫。感测元件分别对应设置于第一组中的接触垫及其对应的导电凸块至少其中之一的两侧。检测单元耦接于感测元件,以便当该第一组中的该接触垫及对应于该第一组中的该接触垫的该导电凸块的至少其中之一产生变形而接触该组感测元件中的至少一个感测元件时,输出错误信号。The circuit bonding detection device of the present invention includes a substrate, a circuit module, a set of sensing elements and a detection unit. A plurality of contact pads are arranged on the substrate. Among the plurality of contact pads, at least one contact pad forms a first group. The circuit modules are correspondingly arranged on the substrate. The circuit module includes a plurality of conductive bumps. The conductive bumps respectively correspond to contact pads on the substrate. The sensing elements are correspondingly arranged on two sides of at least one of the contact pads in the first group and at least one of the corresponding conductive bumps. The detection unit is coupled to the sensing element, so that when at least one of the contact pad in the first group and the conductive bump corresponding to the contact pad in the first group is deformed, it contacts the group of sensing elements. When at least one of the sensing elements is detected, an error signal is output.

上述装置中,该错误信号可为该第一组中的该接触垫及对应于该第一组中的该接触垫的该导电凸块的至少一个的信号差值。In the above device, the error signal may be a signal difference between the contact pad in the first group and at least one of the conductive bumps corresponding to the contact pad in the first group.

上述装置中,该组感测元件中的至少一个感测元件可包含线状图案、矩形图案、或上述图案的组合。In the above device, at least one sensing element in the set of sensing elements may comprise a line pattern, a rectangular pattern, or a combination of the above patterns.

上述装置中,所述多个接触垫可包含至少一个第二组,该第二组可具有多个接触垫,如此具有至少一个接触垫的该第一组的设置位置可包含设置于具有所述多个接触垫的该第二组的外侧、具有所述多个接触垫的该第二组之中、或上述的组合。In the above-mentioned device, the plurality of contact pads may include at least one second group, and the second group may have a plurality of contact pads, so that the first group having at least one contact pad may be arranged at a location with the first group of contact pads. outside of the second group of contact pads, within the second group of contact pads, or a combination thereof.

上述装置中,该组感测元件的其中一个感测元件可具有接地信号及共通信号其中之一。In the above device, one of the sensing elements in the group of sensing elements may have one of a ground signal and a common signal.

上述装置中,该组感测元件的其中一个感测元件可具有接地信号,另一个感测元件可具有共通信号。In the above device, one sensing element of the group of sensing elements may have a ground signal, and the other sensing element may have a common signal.

上述装置中,该组感测元件的其中一个感测元件与该第一组中的该接触垫的其中一侧边的距离可实质上大于或实质上等于2微米。In the above device, the distance between one sensing element of the group of sensing elements and one side of the contact pad in the first group may be substantially greater than or substantially equal to 2 micrometers.

上述装置中,该第一组中的该接触垫及对应于该第一组中的该接触垫的该导电凸块的至少一个的至少一个侧边产生变形时的变形量实质上可大于或实质上等于50%。In the above device, when the contact pad in the first group and at least one side of at least one of the conductive bump corresponding to the contact pad in the first group are deformed, the amount of deformation can be substantially greater than or substantially above is equal to 50%.

上述装置中,该电路模块可包含集成电路、柔性衬底、刚性衬底、或上述的组合。In the above device, the circuit module may include an integrated circuit, a flexible substrate, a rigid substrate, or a combination thereof.

上述装置中,该基板的材料可包含透明材料、不透明材料或柔性材料。In the above device, the material of the substrate may include transparent material, opaque material or flexible material.

本发明还提供一种电路接合检测装置,包含:基板,该基板上设置有多个接触垫,其中该接触垫包含至少一个第一组,该第一组具有至少两个接触垫;电路模块,对应设置于该基板上,且包含多个导电凸块,所述多个导电凸块对应于所述多个接触垫;一组感测元件,与该第一组中的各接触垫及其对应的导电凸块至少其中之一对应地交错排列;以及检测单元,连接于该组感测元件,以便当该第一组中的所述多个接触垫的至少一个及对应于该第一组中的所述多个接触垫的所述多个导电凸块的至少一个产生变形而接触该组感测元件中的至少一个感测元件时,输出错误信号。The present invention also provides a circuit bonding detection device, comprising: a substrate, on which a plurality of contact pads are arranged, wherein the contact pads include at least one first group, and the first group has at least two contact pads; a circuit module, Correspondingly arranged on the substrate and including a plurality of conductive bumps corresponding to the plurality of contact pads; a group of sensing elements, corresponding to each contact pad in the first group and its corresponding At least one of the conductive bumps is correspondingly staggered; and the detection unit is connected to the group of sensing elements, so that when at least one of the plurality of contact pads in the first group corresponds to the first group When at least one of the plurality of conductive bumps of the plurality of contact pads is deformed and contacts at least one sensing element in the group of sensing elements, an error signal is output.

上述装置中,该错误信号可为该第一组中的所述多个接触垫的至少一个及对应于该第一组中的该接触垫的该导电凸块的至少一个的信号差值。In the above device, the error signal may be a signal difference between at least one of the plurality of contact pads in the first group and at least one of the conductive bumps corresponding to the contact pad in the first group.

上述装置中,该组感测元件中的至少一个感测元件可包含线状图案、矩形图案、或上述图案的组合。In the above device, at least one sensing element in the set of sensing elements may comprise a line pattern, a rectangular pattern, or a combination of the above patterns.

上述装置中,所述多个接触垫可包含至少一个第二组,该第二组具有多个接触垫,如此具有所述多个接触垫的该第一组的设置位置可包含设置于具有所述多个接触垫的该第二组的外侧、具有所述多个接触垫的该第二组之中、或上述的组合。In the above device, the plurality of contact pads may include at least one second group, the second group has a plurality of contact pads, so that the first group with the plurality of contact pads may be disposed at a location with the plurality of contact pads. outside of the second group of the plurality of contact pads, in the second group of the plurality of contact pads, or a combination thereof.

上述装置中,该组感测元件的其中一个感测元件可具有接地信号及共通信号其中之一。In the above device, one of the sensing elements in the group of sensing elements may have one of a ground signal and a common signal.

上述装置中,该组感测元件的其中一个感测元件可具有接地信号,另一个感测元件具有共通信号。In the above device, one sensing element of the group of sensing elements may have a ground signal, and the other sensing element may have a common signal.

上述装置中,该第一组中的所述多个接触垫的至少一个及对应于该第一组中的所述多个接触垫的该导电凸块的至少一个的至少其中之一在产生变形时的变形量可实质上大于或实质上等于50%。In the above device, at least one of at least one of the plurality of contact pads in the first group and at least one of the conductive bumps corresponding to the plurality of contact pads in the first group is deformed The amount of deformation can be substantially greater than or substantially equal to 50%.

上述装置中,该电路模块可包含集成电路、柔性衬底、刚性衬底、或上述的组合。In the above device, the circuit module may include an integrated circuit, a flexible substrate, a rigid substrate, or a combination thereof.

上述装置中,该基板的材料可包含透明材料、不透明材料或柔性材料。In the above device, the material of the substrate may include transparent material, opaque material or flexible material.

本发明还提供一种电子设备,该电子设备包含上述电路接合检测装置。The present invention also provides an electronic device, which includes the above-mentioned circuit joint detection device.

本发明还提供一种电路压合检测装置的检测方法,该方法包含:提供电路压合检测装置,该电路压合检测装置包含基板,且该基板上设置有多个接触垫,其中所述多个接触垫包含至少一个第一组,该第一组具有至少一个接触垫;电路模块,对应设置于该基板上,且包含多个导电凸块,所述多个导电凸块对应于所述多个接触垫;一组感测元件,对应设置于该第一组中的该接触垫及其对应的导电凸块的至少其中之一的两侧;以及检测单元,连接于该组感测元件;压合该基板及该电路模块,使得该基板上的所述多个接触垫与该电路模块上的所述多个导电凸块电性连接;以及测量该组感测元件,以判断该基板上的具有至少一个接触垫的该第一组与该电路模块上的对应于该第一组中的所述多个接触垫的该导电凸块的至少一个是否产生变形。The present invention also provides a detection method of a circuit pressure detection device, the method includes: providing a circuit pressure detection device, the circuit pressure detection device includes a substrate, and a plurality of contact pads are arranged on the substrate, wherein the plurality of contact pads The contact pads include at least one first group, and the first group has at least one contact pad; the circuit module is correspondingly arranged on the substrate, and includes a plurality of conductive bumps, and the plurality of conductive bumps correspond to the plurality of conductive bumps. a contact pad; a group of sensing elements, correspondingly disposed on both sides of at least one of the contact pad and its corresponding conductive bump in the first group; and a detection unit, connected to the group of sensing elements; pressing the substrate and the circuit module so that the plurality of contact pads on the substrate are electrically connected to the plurality of conductive bumps on the circuit module; and measuring the set of sensing elements to determine the Whether at least one of the first group having at least one contact pad and the conductive bump on the circuit module corresponding to the plurality of contact pads in the first group is deformed.

上述方法中,压合该基板及该电路模块的步骤可包含:将该基板上的所述多个接触垫与该电路模块上的所述多个导电凸块进行对位。In the above method, the step of pressing the substrate and the circuit module may include: aligning the plurality of contact pads on the substrate with the plurality of conductive bumps on the circuit module.

上述方法还可包含:在该基板与该电路模块之间提供接合材料。The above method may further include: providing a bonding material between the substrate and the circuit module.

上述方法中,测量该感测元件的步骤可包含将一信号传输到该组感测元件中的至少一个感测元件,且该组感测元件将另一信号传输到该检测单元,来检测该另一信号是否实质上等于该信号。In the above method, the step of measuring the sensing element may include transmitting a signal to at least one sensing element in the group of sensing elements, and the group of sensing elements transmits another signal to the detection unit to detect the Whether the other signal is substantially equal to this signal.

上述方法中,该信号可包含共通信号、接地信号、或上述信号的组合。In the above method, the signal may include a common signal, a ground signal, or a combination of the above signals.

本发明提供一种电路压合检测装置的检测方法,该方法包含:提供电路压合检测装置,该电路压合检测装置包含基板,且该基板上设置有多个接触垫,其中所述多个接触垫包含至少一个第一组,该第一组具有至少两个接触垫;电路模块,对应设置于该基板上,且包含多个导电凸块,所述多个导电凸块对应于所述多个接触垫;一组感测元件,与该第一组中的各接触垫及其对应的导电凸块的至少其中之一对应地交错排列;以及检测单元,连接于该组感测元件;压合该基板及该电路模块,使得该基板上的所述多个接触垫与该电路模块上的所述多个导电凸块电性连接;以及测量该组感测元件,以判断该基板上的具有至少两个接触垫的该第一组与该电路模块上的对应于该第一组中的所述多个接触垫的该导电凸块的至少一个是否产生变形。The present invention provides a detection method of a circuit pressure detection device, which includes: providing a circuit pressure detection device, the circuit pressure detection device includes a substrate, and the substrate is provided with a plurality of contact pads, wherein the plurality of The contact pads include at least one first group, and the first group has at least two contact pads; the circuit module is correspondingly arranged on the substrate, and includes a plurality of conductive bumps, and the plurality of conductive bumps correspond to the plurality of contact pads. contact pads; a group of sensing elements, corresponding to at least one of each contact pad in the first group and at least one of the corresponding conductive bumps; and a detection unit connected to the group of sensing elements; combining the substrate and the circuit module so that the plurality of contact pads on the substrate are electrically connected to the plurality of conductive bumps on the circuit module; and measuring the set of sensing elements to determine the contact pads on the substrate Whether at least one of the first group having at least two contact pads and the conductive bump on the circuit module corresponding to the plurality of contact pads in the first group is deformed.

上述方法中,压合该基板及该电路模块的步骤可包含:将该基板上的所述多个接触垫与该电路模块上的所述多个导电凸块进行对位。In the above method, the step of pressing the substrate and the circuit module may include: aligning the plurality of contact pads on the substrate with the plurality of conductive bumps on the circuit module.

上述方法还可包含:在该基板与该电路模块之间提供接合材料。The above method may further include: providing a bonding material between the substrate and the circuit module.

上述方法中,测量该感测元件的步骤可包含:将一信号传输到该组感测元件中的至少两个感测元件,且该组感测元件将另一信号传输到该检测单元,来检测该另一信号是否实质上等于该信号。In the above method, the step of measuring the sensing element may include: transmitting a signal to at least two sensing elements in the set of sensing elements, and the set of sensing elements transmits another signal to the detection unit to It is detected whether the other signal is substantially equal to the signal.

上述方法中,该信号可包含共通信号、接地信号、或上述信号的组合。In the above method, the signal may include a common signal, a ground signal, or a combination of the above signals.

本发明还提供一种电子设备的检测方法,包含上述的电路接合检测装置的检测方法。The present invention also provides a detection method of electronic equipment, including the detection method of the above-mentioned circuit joint detection device.

本发明的电路压合状态检测方法包含:设置感测元件于第一组中接触垫的两侧;压合基板与电路模块,使基板上的所述多个接触垫与电路模块上的所述多个导电凸块电性连接;以及测量该组感测元件,以判断位于该组感测元件之间的接触垫及其对应的导电凸块至少其中之一是否有产生变形。当检测单元判断接触垫及其对应的导电凸块至少其中之一产生变形时,则输出错误信号。The circuit pressing state detection method of the present invention includes: arranging sensing elements on both sides of the contact pads in the first group; pressing the substrate and the circuit module, so that the plurality of contact pads on the substrate and the circuit modules on the circuit module A plurality of conductive bumps are electrically connected; and the group of sensing elements is measured to determine whether at least one of the contact pads and the corresponding conductive bumps between the group of sensing elements is deformed. When the detection unit determines that at least one of the contact pad and its corresponding conductive bump is deformed, an error signal is output.

附图说明 Description of drawings

图1为传统液晶面板上控制电路压合的示意图;FIG. 1 is a schematic diagram of lamination of a control circuit on a traditional liquid crystal panel;

图2为本发明电路接合检测装置的第一实施例剖面图;2 is a cross-sectional view of the first embodiment of the circuit bonding detection device of the present invention;

图3为图2所示第一实施例的变化实施例剖面图;Fig. 3 is a sectional view of a variant embodiment of the first embodiment shown in Fig. 2;

图4a为第二实施例的俯视图,其中第一组接触垫位于第二组接触垫外侧;Fig. 4a is a top view of the second embodiment, wherein the first group of contact pads is located outside the second group of contact pads;

图4b为第二实施例的变化实施例,其中第一组接触垫位于第二组接触垫之中;Fig. 4b is a variant embodiment of the second embodiment, wherein the first group of contact pads is located in the second group of contact pads;

图4c为第二实施例的变化实施例,其中部分第一组接触垫位于第二组接触垫外侧;Fig. 4c is a variant embodiment of the second embodiment, wherein part of the first group of contact pads is located outside the second group of contact pads;

图5a为第三实施例的俯视图,其中第一组接触垫由单一接触垫形成;Figure 5a is a top view of a third embodiment in which the first set of contact pads is formed by a single contact pad;

图5b为第三实施例的变化实施例,其中第一组接触垫由单一接触垫形成;Fig. 5b is a variant embodiment of the third embodiment, wherein the first group of contact pads is formed by a single contact pad;

图6为第四实施例的示意图;Fig. 6 is the schematic diagram of the fourth embodiment;

图7为第五实施例的俯视图,其中电路模块包含柔性衬底或刚性衬底;7 is a top view of a fifth embodiment, wherein the circuit module includes a flexible substrate or a rigid substrate;

图8为第六实施例的俯视图,其中电路模块同时包含柔性衬底及刚性衬底;8 is a top view of the sixth embodiment, wherein the circuit module includes both a flexible substrate and a rigid substrate;

图9a为由三个接触垫组成第一组时的第七实施例示意图;Fig. 9a is a schematic diagram of the seventh embodiment when the first group is composed of three contact pads;

图9b为第七实施例的变化实施例的示意图;Fig. 9b is a schematic diagram of a variant embodiment of the seventh embodiment;

图10为本发明电路压合检测方法的实施例流程图;FIG. 10 is a flow chart of an embodiment of the circuit pressing detection method of the present invention;

图11为应用于显示面板及电子设备的实施例示意图。FIG. 11 is a schematic diagram of an embodiment applied to a display panel and an electronic device.

其中,附图标记说明如下:Wherein, the reference signs are explained as follows:

100 基板100 substrates

110 接触垫110 contact pad

111 第一组111 Group 1

112 第二组112 second group

200 接合材料200 bonding material

220 导电粒子220 conductive particles

300 电路模块300 circuit modules

310 导电凸块310 conductive bump

350 柔性电路板350 flexible circuit board

370 印刷电路板370 printed circuit board

500 感测元件500 sensing elements

700 检测单元700 detection units

701 错误信号701 error signal

710 警示装置710 warning device

具体实施方式 Detailed ways

本发明提供一种电路接合检测装置、其使用的检测方法以及使用此检测装置及方法的光电装置。本发明的实施例,较佳地,是以检测玻璃上芯片工艺为范例说明;然而在不同实施例中,本发明也可检测薄膜上芯片工艺的电路、卷带封装、或其他具有类似构造成的电路。其中玻璃上芯片工艺及薄膜上芯片工艺中,较佳地,使用各向异性导电胶膜作为主要接合材料;然而在不同实施例中,接合材料也使用其他适当材料(如焊锡、贴布、或其它材料)作为接合材料。再者,本发明的下述实施例均以其中一侧来当作实施范例,但不限于此,也可选择性地在全部侧边都使用本发明的下述实施例。The invention provides a circuit joint detection device, a detection method used therein, and an optoelectronic device using the detection device and method. The embodiment of the present invention, preferably, is illustrated by an example of detecting a chip-on-glass process; however, in different embodiments, the present invention can also detect a circuit of a chip-on-film process, a tape-and-reel package, or other devices with a similar structure. circuit. Among them, in the chip-on-glass process and the chip-on-film process, preferably, the anisotropic conductive adhesive film is used as the main bonding material; however, in different embodiments, the bonding material also uses other suitable materials (such as solder, patch, or other materials) as bonding material. Furthermore, the following embodiments of the present invention all take one side as an implementation example, but not limited thereto, and the following embodiments of the present invention can also be selectively used on all sides.

本发明的电路接合检测装置包含基板100、电路模块300、一组感测元件500及检测单元700。在图2所示的第一实施例中,基板100上设有多个接触垫110,其排列方式包含并排排列、品字型排列、或其它排列方式等。此外,如图2所示,在多个接触垫110中,由至少一个接触垫110形成第一组111。接触垫110电性连接于基板100上的薄膜晶体管或其他形式的信号传导电路。基板100的材料可包含:柔性材料,例如橡胶、聚酰类、聚醇类、聚酯类、热固性聚合物、热塑性聚合物、或其它聚合物、或上述的组合;不透明材料,例如硅片、陶瓷、或其它材料;或透明材料,例如玻璃、石英、或其它材料。在图2所示的本实施例中,基板100的材料以玻璃为实施范例,但不限于此材料。接触垫110的材料包含:反射材料,例如金、银、铜、铁、锡、铅、镉、钨、钛、钽、钕、铝、钼、铪、或其它金属、或上述金属的合金、或上述金属的氮化物、或上述金属的氧化物、或上述金属的氮氧化物、或上述金属的组合;透明材料,例如铟锡氧化物、铝锌氧化物、铟锌氧化物、镉锡氧化物、或其它材料、或上述材料的组合;或非金属的材料,例如掺杂的含硅单晶材料、掺杂的含硅多晶材料、掺杂的含硅微晶材料、掺杂的含硅非晶材料、或含锗的材料、或其它材料、或上述材料的组合;或上述材料的组合。The circuit bonding detection device of the present invention includes a substrate 100 , a circuit module 300 , a set of sensing elements 500 and a detection unit 700 . In the first embodiment shown in FIG. 2 , a plurality of contact pads 110 are disposed on the substrate 100 , and the arrangement includes a side-by-side arrangement, a letter-shaped arrangement, or other arrangements. In addition, as shown in FIG. 2 , among the plurality of contact pads 110 , at least one contact pad 110 forms a first group 111 . The contact pad 110 is electrically connected to the thin film transistor or other signal conducting circuits on the substrate 100 . The material of the substrate 100 may include: flexible materials such as rubber, polyamides, polyalcohols, polyesters, thermosetting polymers, thermoplastic polymers, or other polymers, or combinations thereof; opaque materials such as silicon wafers, Ceramic, or other material; or transparent material, such as glass, quartz, or other material. In the present embodiment shown in FIG. 2 , the material of the substrate 100 is exemplified by glass, but is not limited to this material. The material of the contact pad 110 includes: reflective materials, such as gold, silver, copper, iron, tin, lead, cadmium, tungsten, titanium, tantalum, neodymium, aluminum, molybdenum, hafnium, or other metals, or alloys of the above metals, or Nitrides of the above metals, or oxides of the above metals, or oxynitrides of the above metals, or combinations of the above metals; transparent materials, such as indium tin oxide, aluminum zinc oxide, indium zinc oxide, cadmium tin oxide , or other materials, or a combination of the above materials; or non-metallic materials, such as doped silicon-containing single crystal material, doped silicon-containing polycrystalline material, doped silicon-containing microcrystalline material, doped silicon-containing Amorphous material, or germanium-containing material, or other materials, or a combination of the above materials; or a combination of the above materials.

电路模块300对应地设置于基板100上。电路模块300上包含有多个导电凸块310。上述多个导电凸块310分别对应于基板100上的接触垫110,因此导电凸块310在电路模块300上的排列方式较佳地对应于接触垫110的排列方式。导电凸块310与接触垫110较佳地借助处于它们之间的接合材料200进行信号或电连接。接合材料200较佳地包含具有/不具有导电粒子220的接合物,例如:各向异性导电胶膜或其它聚合物,本发明是以具有导电粒子的各向异性导电胶膜为例;然而在不同实施例中,接合材料也可用其他适合的材料(如焊锡、贴布、或其它材料)代替。导电凸块310较佳地由导电金属制成,例如金、银、铜等。电路模块300为集成电路(如芯片、或其它集成电路)、印刷电路板、柔性电路板、或其他基板为基材的模块,或上述电路或模块的组合。本实施例是以集成电路(如芯片)为实施范例,但并不限于此。The circuit module 300 is correspondingly disposed on the substrate 100 . The circuit module 300 includes a plurality of conductive bumps 310 . The plurality of conductive bumps 310 respectively correspond to the contact pads 110 on the substrate 100 , so the arrangement of the conductive bumps 310 on the circuit module 300 preferably corresponds to the arrangement of the contact pads 110 . The conductive bumps 310 and the contact pads 110 are preferably in signal or electrical connection with the bonding material 200 therebetween. The bonding material 200 preferably includes a bonding material with/without conductive particles 220, such as: anisotropic conductive adhesive film or other polymers, and the present invention takes an anisotropic conductive adhesive film with conductive particles as an example; however, in In different embodiments, the bonding material can also be replaced by other suitable materials (such as solder, patch, or other materials). The conductive bump 310 is preferably made of conductive metal, such as gold, silver, copper, and the like. The circuit module 300 is an integrated circuit (such as a chip or other integrated circuits), a printed circuit board, a flexible circuit board, or other modules with substrates as base materials, or a combination of the above circuits or modules. This embodiment takes an integrated circuit (such as a chip) as an example, but is not limited thereto.

在图2所示的第一实施例中,以感测元件500分别对应设置于具有第一组111中接触垫110两侧的基板上100为实施范例,但并不限于此,可选择性地依不同实施例而改变,如图3所示第一实施例的变化例中,感测元件500设置于电路模块300上、或二者(如基板100及电路模块300)都设置有感测元件500。感测元件500与相邻接触垫110侧边的距离依设计而定,本发明的实施例较佳地以实质上大于或实质上等于2微米(μm)为实施范例,但并不限于此,也可配合较精密的电路设计,将此距离加以调整及缩减。位于接触垫110两侧的感测元件500分别传输不同的信号。本实施例是以位于接触垫110一侧的感测元件500传输接地信号Vg,而以位于同一接触垫110另一侧的感测元件500传输共通信号Vcom,共通信号的实施范例例如为基板100上的电路所传输的Vcom。但不限于此,二者所传输的不同信号也可选择性地传输基板100上电路所提供的信号、电路模块300所提供的信号以及其他信号源所提供的信号或电压电位至少其中之一。In the first embodiment shown in FIG. 2 , the sensing elements 500 are respectively disposed on the substrate 100 corresponding to the two sides of the contact pad 110 in the first group 111 as an example, but it is not limited thereto. Optionally, It varies according to different embodiments. In the modification of the first embodiment shown in FIG. 3 , the sensing element 500 is arranged on the circuit module 300, or both (such as the substrate 100 and the circuit module 300) are provided with sensing elements. 500. The distance between the sensing element 500 and the side of the adjacent contact pad 110 depends on the design. The embodiment of the present invention is preferably substantially greater than or substantially equal to 2 micrometers (μm) as an example, but it is not limited thereto. This distance can also be adjusted and reduced in conjunction with a more precise circuit design. The sensing elements 500 located on both sides of the contact pad 110 respectively transmit different signals. In this embodiment, the sensing element 500 on one side of the contact pad 110 transmits the ground signal Vg, and the sensing element 500 on the other side of the same contact pad 110 transmits the common signal Vcom. An example of the common signal is the substrate 100. Vcom transmitted by the circuit on. But not limited thereto, the different signals transmitted by the two can also selectively transmit at least one of the signal provided by the circuit on the substrate 100 , the signal provided by the circuit module 300 , and the signal or voltage potential provided by other signal sources.

检测单元700分别耦接于感测元件500,以检测感测元件500上的信号或信号的变化。检测单元700可选择性地以固件模块、软件模块、硬件模块、或上述模块的组合形式存在于接合检测装置中。此外,为了使人容易得知信号是否有误,较佳地,检测单元700连接于警示装置710,然而不限于此,也可不使用此警示装置710而使用其它装置。警示装置710包含显示屏幕、扬声装置、表单产生装置、或其他装置、或上述装置的组合;而警示的方式则包含荧幕显示、警示音、报表、或其他形式、或上述形式的组合。当第一组111中的接触垫110或其所对应的导电凸块310因压合或其他原因产生变形并接触任一感测元件500时,检测单元700即可借助传递和/或检测到感测元件500上的信号而得知此状态的改变。此外,若同一接触垫110两侧的检测单元700同时遭到接触时,检测单元700也可检测到此状态的改变。为了能够较容易地规范及判断接触垫110和/或导电凸块310的变形标准,较佳地,可设计将接触垫110和/或导电凸块310在同一维度(如水平方向)上的变形量当作容许值。当接触垫110和/或导电凸块310的侧边与感测元件500接触时,较佳地,接触垫110和/或导电凸块310在同一维度上的变形量实质上大于或实质上等于50%。然而变形量也可依接触垫110和/或导电凸块310的尺寸、排列的间距或压合的深度加以改变;例如可将此变形量容许度缩小至实质上约12.5%或放宽至实质上约80%。The detection units 700 are respectively coupled to the sensing elements 500 to detect signals or signal changes on the sensing elements 500 . The detection unit 700 can optionally exist in the joint detection device in the form of a firmware module, a software module, a hardware module, or a combination of the above modules. In addition, in order to make it easy for people to know whether the signal is wrong, preferably, the detection unit 700 is connected to the warning device 710 , but it is not limited thereto, and other devices can be used instead of the warning device 710 . The warning device 710 includes a display screen, a speaker device, a form generating device, or other devices, or a combination of the above devices; and the warning method includes screen display, warning sound, report, or other forms, or a combination of the above forms. When the contact pad 110 in the first group 111 or its corresponding conductive bump 310 is deformed due to pressing or other reasons and contacts any sensing element 500, the detection unit 700 can detect the sensing element 500 by means of transmission and/or detection. This change of state is known by the signal on the sensing element 500. In addition, if the detection units 700 on both sides of the same contact pad 110 are touched at the same time, the detection units 700 can also detect the state change. In order to easily standardize and judge the deformation standard of the contact pad 110 and/or the conductive bump 310, preferably, the deformation of the contact pad 110 and/or the conductive bump 310 in the same dimension (such as the horizontal direction) can be designed The amount is regarded as the allowable value. When the side of the contact pad 110 and/or the conductive bump 310 is in contact with the sensing element 500, preferably, the amount of deformation of the contact pad 110 and/or the conductive bump 310 in the same dimension is substantially greater than or substantially equal to 50%. However, the amount of deformation can also be changed according to the size of the contact pad 110 and/or the conductive bump 310, the pitch of the arrangement, or the depth of the bonding; about 80%.

当检测单元700检测到和/或传递感测元件500上的信号或是信号变化后,检测单元700即据以传输错误信号701,并可借助警示装置710发出警示。为了使得错误信号701较易被判别,因此,感测元件500接触的接触垫110和/或导电凸块310的信号变化(即差值),较佳地,为绝对信号差值,但不限于此,也可依原信号差值来判断。When the detection unit 700 detects and/or transmits the signal on the sensing element 500 or the signal changes, the detection unit 700 transmits the error signal 701 accordingly, and can issue a warning by means of the warning device 710 . In order to make the error signal 701 easier to be judged, therefore, the signal change (that is, the difference) of the contact pad 110 and/or the conductive bump 310 contacted by the sensing element 500 is preferably an absolute signal difference, but is not limited to Therefore, it can also be judged according to the original signal difference.

在图4a所示的第二实施例中,在基板110上的全部的多个接触垫110中,还可由多个接触垫110形成第二组112接触垫110。就此实施例而言,第一组111内包含有至少两个接触垫110;然而在不同实施例中,第一组111可包含一个或两个以上的接触垫110,例如包含一个、两个、三个、四个、五个、或六个等数目的接触垫110。如图4a所示,当第一组111内包含两个相邻的接触垫110时,可在此两个接触垫110的两侧及中间分别设置一个感测元件500;换言之,在此第一组111内设置有三个感测元件500。然而在不同实施例中,在此相邻的两个接触垫110中,也可在每一接触垫110的两侧均设置分离的感测元件500,因此,两个相邻的接触垫110之间设置有两个独立的感测元件500。In the second embodiment shown in FIG. 4 a , among all the plurality of contact pads 110 on the substrate 110 , a second group 112 of contact pads 110 can also be formed by the plurality of contact pads 110 . As far as this embodiment is concerned, the first group 111 contains at least two contact pads 110; however, in different embodiments, the first group 111 may contain one or more than two contact pads 110, for example, one, two, There are three, four, five, or six contact pads 110 . As shown in FIG. 4a, when the first group 111 includes two adjacent contact pads 110, a sensing element 500 can be respectively provided on both sides and in the middle of the two contact pads 110; Three sensing elements 500 are arranged within group 111 . However, in different embodiments, in the two adjacent contact pads 110, separate sensing elements 500 may also be provided on both sides of each contact pad 110, therefore, between two adjacent contact pads 110 Two independent sensing elements 500 are arranged between them.

再者,第一组111的接触垫110设置于第二组112接触垫110的外侧。较佳地,第一组111中的接触垫110作为对位接触垫110、虚置接触垫(dummycontacted pad)110、或供其他非信号传递用途使用的接触垫110;而第二组112中的接触垫110则为供电路信号传递用的接触垫110,但并不限于此,可选择性地改变上述的功能。同样地,也可将对应于接触垫110的电路模块300上的导电凸块310分为第一组及第二组,以与接触垫110产生电性连接。此外,第一组111及第二组112接触垫110较佳地沿同一方向排列,且它们之间具有较大的间隙作为隔离;然而在不同实施例中,第一组111与第二组112也可沿不同的方向、具有不同的间隙,或以其他排列方式来改变。Moreover, the contact pads 110 of the first group 111 are disposed outside the contact pads 110 of the second group 112 . Preferably, the contact pads 110 in the first group 111 are used as alignment contact pads 110, dummy contact pads (dummycontacted pads) 110, or contact pads 110 for other non-signal transmission purposes; The contact pad 110 is a contact pad 110 for circuit signal transmission, but is not limited thereto, and the above functions can be selectively changed. Similarly, the conductive bumps 310 on the circuit module 300 corresponding to the contact pads 110 can also be divided into a first group and a second group, so as to be electrically connected to the contact pads 110 . In addition, the contact pads 110 of the first group 111 and the second group 112 are preferably arranged along the same direction, and there is a large gap between them as isolation; however, in different embodiments, the first group 111 and the second group 112 It can also be changed in a different direction, with a different gap, or in other arrangements.

图4b所示为图4a所示第二实施例的一变化实施例。在此实施例中,第一组111的接触垫110设置于第二组112接触垫110之中;换言之,第一组111的接触垫110穿插排列于第二组112的接触垫110之间。此时第一组111与第二组112的接触垫110较佳地均为供传递电路信号用的接触垫110。因此,在此实施例中,第一组111的接触垫110与第二组112的接触垫110的差别仅在于第一组111的接触垫110的两侧设有感测元件500;而第二组112接触垫110的两侧并未设有感测元件500。同样地,也可将对应于接触垫110的电路模块300上的导电凸块310分为第一组及第二组,以与接触垫110产生电性连接。Fig. 4b shows a modified embodiment of the second embodiment shown in Fig. 4a. In this embodiment, the contact pads 110 of the first group 111 are arranged in the contact pads 110 of the second group 112 ; At this time, the contact pads 110 of the first group 111 and the second group 112 are preferably contact pads 110 for transmitting circuit signals. Therefore, in this embodiment, the difference between the contact pads 110 of the first group 111 and the contact pads 110 of the second group 112 is that the sensing elements 500 are arranged on both sides of the contact pads 110 of the first group 111; The two sides of the group 112 contact pad 110 are not provided with the sensing element 500 . Similarly, the conductive bumps 310 on the circuit module 300 corresponding to the contact pads 110 can also be divided into a first group and a second group, so as to be electrically connected to the contact pads 110 .

图4c所示为图4a所示第二实施例的另一变化实施例。在此实施例中,部分第一组111的接触垫110设置于第二组112的接触垫110之中,而部分第一组111的接触垫110设置于第二组112的接触垫110的外侧。同样地,也可将对应于接触垫110的导电凸块310分为第一组及第二组,以与接触垫110产生电性连接。借助此设置,还可掌握不同区域位置中接触垫110与导电凸块110的接合状况。Fig. 4c shows another variant embodiment of the second embodiment shown in Fig. 4a. In this embodiment, part of the contact pads 110 of the first group 111 are disposed in the contact pads 110 of the second group 112 , and part of the contact pads 110 of the first group 111 are disposed outside the contact pads 110 of the second group 112 . Likewise, the conductive bumps 310 corresponding to the contact pads 110 can also be divided into a first group and a second group, so as to be electrically connected to the contact pads 110 . With this arrangement, the bonding status of the contact pads 110 and the conductive bumps 110 in different regions can also be grasped.

在图5a所示的第三实施例中,第一组111中包含单一接触垫110。此接触垫110的两侧分别设置感测元件500,第一组111的接触垫110设置于第二组112接触垫110的外侧,但不限于此,感测元件500也可设置于具有至少两个接触垫(例如两个、三个、四个、五个接触垫等)的第一组111的外侧,也就是至少两个接触垫的外侧。较佳地,第一组111中的接触垫110为对位接触垫110、虚置接触垫110、或供其他非信号传递用途使用的数个接触垫110;而第二组112中的接触垫110则不包含在第一组111内的其他接触垫110,且第二组112中的接触垫110包含供信号传递用途使用的数个接触垫110、对位接触垫110、虚置接触垫110、或供其他非信号传递用途使用的数个接触垫110。同样地,也可将对应于接触垫110的导电凸块310分为第一组及第二组,以与接触垫110产生电性连接。In the third embodiment shown in FIG. 5 a , the first group 111 includes a single contact pad 110 . Sensing elements 500 are arranged on both sides of the contact pads 110 respectively, and the contact pads 110 of the first group 111 are arranged outside the contact pads 110 of the second group 112, but not limited thereto, and the sensing elements 500 can also be arranged on at least two contact pads 110. The outer side of the first group 111 of three contact pads (for example, two, three, four, five contact pads, etc.), that is, the outer side of at least two contact pads. Preferably, the contact pads 110 in the first group 111 are alignment contact pads 110, dummy contact pads 110, or several contact pads 110 used for other non-signal transmission purposes; and the contact pads in the second group 112 110 does not include other contact pads 110 in the first group 111, and the contact pads 110 in the second group 112 include several contact pads 110, alignment contact pads 110, and dummy contact pads 110 for signal transmission purposes. , or several contact pads 110 for other non-signal transmission purposes. Likewise, the conductive bumps 310 corresponding to the contact pads 110 can also be divided into a first group and a second group, so as to be electrically connected to the contact pads 110 .

图5b所示为图5a所示第三实施例的另一变化实施例。在此实施例中,第一组111也只包含有单一的接触垫110,且其设置于第二组112的接触垫110之中;换言之,在第二组112的多个接触垫110中择一将感测元件500设置于所选择的接触垫110的两侧,使之成为第一组111的接触垫110,但不限于此,第一组111也可包含有至少两个接触垫110,且其设置于第二组112的接触垫110之中,且感测元件500设置于该第一组的接触垫的两侧。此时第一组111与第二组112的接触垫110较佳地均为供传递电路信号用的接触垫110,但不限于此,也可为非供传递电路信号用的接触垫110(如对位接触垫、虚置接触垫、或其它接触垫)。因此,在此实施例中,第一组111的接触垫110与第二组112的接触垫110的差别仅在于第一组111的接触垫110的两侧设有感测元件500;而第二组112的接触垫110的两侧并未均设有感测元件500。同样地,也可将对应于接触垫110的导电凸块310分为第一组及第二组,以与接触垫110产生电性连接。Fig. 5b shows another variant embodiment of the third embodiment shown in Fig. 5a. In this embodiment, the first group 111 only includes a single contact pad 110, and it is arranged among the contact pads 110 of the second group 112; arranging the sensing element 500 on both sides of the selected contact pad 110, making it the contact pad 110 of the first group 111, but not limited thereto, the first group 111 may also include at least two contact pads 110, And it is disposed in the contact pads 110 of the second group 112 , and the sensing element 500 is disposed on both sides of the contact pads of the first group. At this time, the contact pads 110 of the first group 111 and the second group 112 are preferably contact pads 110 for transmitting circuit signals, but are not limited thereto, and may also be non-contact pads 110 for transmitting circuit signals (such as alignment contact pads, dummy contact pads, or other contact pads). Therefore, in this embodiment, the difference between the contact pads 110 of the first group 111 and the contact pads 110 of the second group 112 is that the sensing elements 500 are arranged on both sides of the contact pads 110 of the first group 111; Sensing elements 500 are not provided on both sides of the contact pads 110 of the group 112 . Likewise, the conductive bumps 310 corresponding to the contact pads 110 can also be divided into a first group and a second group, so as to be electrically connected to the contact pads 110 .

此外,在图4a至图4c及图5a至图5b的实施例中,感测元件500为线状图案的电路,但不限于此,感测元件500也可如图6所示的第四实施例,为矩形图案的电路、或其它形状的电路、或上述形状的电路的组合(如感测元件的图案可为先矩形图案,再为线状图案,或是先为线状图案,然后为矩形图案,最后为线状图案)。此外,此实施例,也可与使用上述实施例所述,如排列方式、设计规范来搭配使用。In addition, in the embodiments of FIG. 4a to FIG. 4c and FIG. 5a to FIG. 5b, the sensing element 500 is a circuit with a linear pattern, but it is not limited thereto. The sensing element 500 can also be implemented as shown in FIG. 6 For example, a circuit of a rectangular pattern, or a circuit of other shapes, or a combination of circuits of the above shapes (for example, the pattern of the sensing element can be a rectangular pattern first, and then a linear pattern, or a linear pattern first, and then a linear pattern. rectangular pattern, and finally a linear pattern). In addition, this embodiment can also be used in conjunction with the above-mentioned embodiments, such as arrangement and design specifications.

在图4a至图4c及图5a至图5b的实施例中,以电路模块300为集成电路来当作实施范例,且与基板100进行连接。此时电路模块300上的导电凸块310与基板100上的接触垫110借助接合材料电连接;然而在不同实施例中,电路模块300也包含:柔性衬底,如软性电路板(FPC)、热塑性聚合物、热固性聚合物、或上述电路板或聚合物的组合;刚性基板,如印刷电路板(PCB)、陶瓷、或其它材料;或上述柔性衬底和刚性基板的组合作为衬底。其中,上述衬底可选择性地包含或不包含驱动电路(如集成电路,包含芯片)。In the embodiments of FIGS. 4 a to 4 c and FIGS. 5 a to 5 b , the circuit module 300 is used as an integrated circuit as an implementation example, and is connected to the substrate 100 . At this time, the conductive bump 310 on the circuit module 300 is electrically connected to the contact pad 110 on the substrate 100 by means of a bonding material; however, in different embodiments, the circuit module 300 also includes: a flexible substrate, such as a flexible circuit board (FPC) , thermoplastic polymers, thermosetting polymers, or a combination of the above circuit boards or polymers; rigid substrates, such as printed circuit boards (PCBs), ceramics, or other materials; or combinations of the above flexible substrates and rigid substrates as substrates. Wherein, the above-mentioned substrate may optionally include or not include a driving circuit (such as an integrated circuit, including a chip).

例如在图7所示的第五实施例中,电路模块300包含柔性电路板350作为衬底。其中,柔性电路板可选择性地包含或不包含驱动电路(如集成电路)。第一组111的接触垫110设置于第二组112的接触垫110的外侧。也可将对应于接触垫110的导电凸块310分为第一组及第二组,以与接触垫110产生电性连接。此外,在第五实施例的变化实施例中,也可使用上述实施例所述的方式,如:将第一组111的接触垫110穿插排列于第二组112接触垫110之间等。对应于接触垫110的导电凸块310则分别对应接触垫110设置,并产生电性连接。然而在图7所示的第五实施例中,也可用印刷电路板等刚性衬底作为柔性电路板的替代。其中,印刷电路板可选择性地包含或不包含驱动电路(如集成电路,包含芯片)。必需指出的是,电路接合检测装置并非仅限用于柔性电路板350与基板100上接触垫110的连接,也可选择性用于柔性电路板350与其他装置上接触垫110的连接,及用于基板100上接触垫110与其他形式电路模块300的连接至少其中之一。For example, in the fifth embodiment shown in FIG. 7 , the circuit module 300 includes a flexible circuit board 350 as a substrate. Wherein, the flexible circuit board may optionally include or not include a driving circuit (such as an integrated circuit). The contact pads 110 of the first group 111 are disposed outside the contact pads 110 of the second group 112 . The conductive bumps 310 corresponding to the contact pads 110 can also be divided into a first group and a second group, so as to be electrically connected to the contact pads 110 . In addition, in the variation of the fifth embodiment, the methods described in the above embodiments can also be used, such as: interspersing the contact pads 110 of the first group 111 with the contact pads 110 of the second group 112 . The conductive bumps 310 corresponding to the contact pads 110 are respectively disposed corresponding to the contact pads 110 and are electrically connected. However, in the fifth embodiment shown in FIG. 7, a rigid substrate such as a printed circuit board can also be used instead of the flexible circuit board. Wherein, the printed circuit board may optionally include or not include a driving circuit (such as an integrated circuit, including a chip). It must be pointed out that the circuit bonding detection device is not limited to the connection between the flexible circuit board 350 and the contact pads 110 on the substrate 100, and can also be selectively used for the connection between the flexible circuit board 350 and the contact pads 110 on other devices. At least one of the contact pads 110 on the substrate 100 is connected to other types of circuit modules 300 .

然而电路模块300也可同时包含柔性衬底及刚性衬底。例如在图8所示的第六实施例中,电路模块300同时包含有柔性电路板350及印刷电路板370,其中印刷电路板370连接于柔性电路板350,且柔性电路板350及印刷电路板370至少其中之一可选择性地包含或不包含驱动电路(如集成电路)。第一组111的接触垫110设置于第二组112接触垫110的外侧。也可将对应于接触垫110的导电凸块310分为第一组及第二组,以与接触垫110产生电连接。在第六实施例的变化实施例中,也可使用上述实施例所述的方式,如:将第一组111的接触垫110穿插排列于第二组112的接触垫110之间等。对应于接触垫110的导电凸块310则分别对应接触垫110设置,并产生电性连接。必需指出的是,电路接合检测装置并非仅限用于柔性电路板350与基板100上接触垫110的连接,也可选择性用于柔性电路板350与刚性衬底370的连接,及用于刚性衬底370与其他装置上接触垫110的连接至少其中之一。However, the circuit module 300 may also include a flexible substrate and a rigid substrate at the same time. For example, in the sixth embodiment shown in FIG. 8, the circuit module 300 includes a flexible circuit board 350 and a printed circuit board 370, wherein the printed circuit board 370 is connected to the flexible circuit board 350, and the flexible circuit board 350 and the printed circuit board At least one of 370 may optionally include or not include driver circuitry (eg, integrated circuits). The contact pads 110 of the first group 111 are disposed outside the contact pads 110 of the second group 112 . The conductive bumps 310 corresponding to the contact pads 110 can also be divided into a first group and a second group to generate electrical connection with the contact pads 110 . In a variation of the sixth embodiment, the methods described in the above embodiments may also be used, such as: interspersing the contact pads 110 of the first group 111 with the contact pads 110 of the second group 112 . The conductive bumps 310 corresponding to the contact pads 110 are respectively disposed corresponding to the contact pads 110 and are electrically connected. It must be pointed out that the circuit bonding detection device is not limited to the connection between the flexible circuit board 350 and the contact pad 110 on the substrate 100, and can also be selectively used for the connection between the flexible circuit board 350 and the rigid substrate 370, and for rigid At least one of the connections between the substrate 370 and the contact pads 110 on other devices.

在图9a所示的第七实施例中,第一组111由三个相邻的接触垫110组成。感测元件500分别设置于第一组111的两侧及相邻的接触垫110之间。换言之,第一组111的三个接触垫110与四个感测元件500交错排列。而在图9b所示第七实施例的变化实施例中,第一组111由彼此间隔开的三个接触垫110组成。此时每一接触垫110的两侧分别设置有一个感测元件500。In the seventh embodiment shown in FIG. 9 a , the first group 111 consists of three adjacent contact pads 110 . The sensing elements 500 are respectively disposed on two sides of the first group 111 and between adjacent contact pads 110 . In other words, the three contact pads 110 of the first group 111 are arranged alternately with the four sensing elements 500 . However, in a variant of the seventh embodiment shown in FIG. 9 b , the first group 111 consists of three contact pads 110 spaced apart from each other. At this time, a sensing element 500 is respectively disposed on two sides of each contact pad 110 .

本发明还提供了电路压合状态的检测方法。在如图10所示的实施例中,步骤1010为设置感测元件500于第一组111中接触垫110的两侧。感测元件500的设置方式包含使用各种半导体工艺、薄膜电路工艺或其他的工艺方式,例如溅镀工艺、黄光工艺、蚀刻工艺等等。此外,此步骤也可改为将感测元件500设置于电路模块300上导电凸块310的两侧或二者(如电路模块及基板)都设置有感测元件500。The invention also provides a detection method for the pressing state of the circuit. In the embodiment shown in FIG. 10 , step 1010 is disposing the sensing element 500 on both sides of the contact pad 110 in the first group 111 . The arrangement of the sensing element 500 includes using various semiconductor processes, thin film circuit processes or other processes, such as sputtering process, yellowing process, etching process and so on. In addition, this step can also be changed to dispose the sensing element 500 on both sides of the conductive bump 310 on the circuit module 300 or both (such as the circuit module and the substrate) are provided with the sensing element 500 .

步骤1030为压合基板100与电路模块300,使基板110上的上述多个接触垫110与电路模块300上的上述多个导电凸块310电性连接。此步骤较佳地包含在基板110及电路模块300之间提供接合材料。接合材料较佳地包含具有/不具有导电粒子的接合物,例如各向异性导电胶膜或其它聚合物,本发明是以具有导电粒子的各向异性导电胶膜为例;然而在不同实施例中,接合材料也可用其他适当材料(如焊锡、贴布、或其它材料)代替。此外,此步骤也可包含将基板110上的上述多个接触垫110与电路模块300上的上述多个导电凸块310进行对位,以减少接触垫110与导电凸块310接合时的错位状况发生。Step 1030 is to press the substrate 100 and the circuit module 300 to electrically connect the plurality of contact pads 110 on the substrate 110 to the plurality of conductive bumps 310 on the circuit module 300 . This step preferably includes providing a bonding material between the substrate 110 and the circuit module 300 . The bonding material preferably includes a bonding material with/without conductive particles, such as anisotropic conductive adhesive film or other polymers. The present invention takes an anisotropic conductive adhesive film with conductive particles as an example; however, in different embodiments In the present invention, the bonding material can also be replaced by other suitable materials (such as solder, patch, or other materials). In addition, this step may also include aligning the plurality of contact pads 110 on the substrate 110 with the plurality of conductive bumps 310 on the circuit module 300 to reduce misalignment when the contact pads 110 are bonded to the conductive bumps 310 occur.

步骤1050为以检测单元700测量该组感测元件500,以判断位于该组感测元件500之间的接触垫110和/或其对应的导电凸块310是否产生变形。当第一组111中的接触垫110和/或其对应的导电凸块310因压合或其他原因产生变形并接触任感测元件500时,检测单元700即可借助传递和/或检测到感测元件500上的信号而得知此状态的改变。此外,若同一接触垫110两侧的检测单元700同时遭到接触时,检测单元700也可检测到此状态的改变。而位于接触垫110一侧的感测元件500,较佳地,是用以传输接地信号Vg,而位于同一接触垫110另一侧的感测元件500,较佳地,是用以传输共通信号Vcom,该共通信号Vcom例如为基板100上的电路所传输的Vcom,但不限于此,也可选择性地传输基板100上电路所提供的信号、电路模块300所提供的信号以及其他信号源所提供的信号或电压电位的至少其中之一。接着该组感测元件500将反馈信号传输到检测单元700,以供检测单元700判断反馈信号是否实质上等于原本发出的信号。当第一组111中的接触垫110和/或其所对应的导电凸块310因压合或其他原因产生变形并接触任一感测元件500时,即会影响或改变感测元件500上所接收的信号或电压电平,进而改变感测元件500传送至检测单元700的反馈信号。此时检测单元700判断反馈信号实质上不等于原本发出的信号,即可得知接触垫110或其对应的导电凸块310发生变形或压合不良的状况。Step 1050 is to use the detection unit 700 to measure the set of sensing elements 500 to determine whether the contact pads 110 and/or their corresponding conductive bumps 310 between the set of sensing elements 500 are deformed. When the contact pad 110 in the first group 111 and/or its corresponding conductive bump 310 is deformed due to pressing or other reasons and contacts any sensing element 500, the detection unit 700 can detect the sensing element 500 by means of transmission and/or detection. This change of state is known by the signal on the sensing element 500. In addition, if the detection units 700 on both sides of the same contact pad 110 are touched at the same time, the detection units 700 can also detect the state change. The sensing element 500 on one side of the contact pad 110 is preferably used to transmit the ground signal Vg, and the sensing element 500 on the other side of the same contact pad 110 is preferably used to transmit the common signal. Vcom, the common signal Vcom is, for example, the Vcom transmitted by the circuit on the substrate 100, but is not limited thereto, and can also selectively transmit the signal provided by the circuit on the substrate 100, the signal provided by the circuit module 300, and other signal sources. At least one of a signal or voltage potential is provided. Then the group of sensing elements 500 transmits the feedback signal to the detection unit 700 for the detection unit 700 to judge whether the feedback signal is substantially equal to the originally sent signal. When the contact pads 110 in the first group 111 and/or the corresponding conductive bumps 310 are deformed due to pressing or other reasons and contact any sensing element 500, it will affect or change all the sensing elements 500. The received signal or voltage level further changes the feedback signal transmitted from the sensing element 500 to the detection unit 700 . At this time, the detection unit 700 judges that the feedback signal is substantially not equal to the original signal, and can know that the contact pad 110 or its corresponding conductive bump 310 is deformed or poorly bonded.

若检测单元700判断接触垫110或其对应的导电凸块310已产生变形,则进行步骤1070,输出错误信号,以供辨视。然而,为了使人员容易得知信号是否有误,较佳地,检测单元700传递错误信号至警示装置710并借助警示装置710发出警示。在较佳实施例中,此错误信号为与感测元件500接触的接触垫110和/或导电凸块310的信号变化(即差值),较佳地,为绝对信号差值,但不限于此,也可依原信号差值来判断。此警示装置710可包含显示屏幕、扬声装置、表单产生装置、其他装置或上述的组合;而警示的形态则包含荧幕显示、警示音、报表、其他形式、或上述的组合。If the detection unit 700 determines that the contact pad 110 or its corresponding conductive bump 310 has been deformed, it proceeds to step 1070 to output an error signal for identification. However, in order to make it easy for personnel to know whether the signal is wrong, preferably, the detection unit 700 transmits the wrong signal to the warning device 710 and issues a warning through the warning device 710 . In a preferred embodiment, the error signal is a signal change (ie difference) of the contact pad 110 and/or conductive bump 310 in contact with the sensing element 500, preferably an absolute signal difference, but not limited to Therefore, it can also be judged according to the original signal difference. The warning device 710 may include a display screen, a speaker device, a form generating device, other devices, or a combination thereof; and the form of the warning includes screen display, warning sound, report, other forms, or a combination of the above.

此外,本发明上述实施例所述的基板100均以显示面板中的基板为例,但也可选择性地依设计需求、基板的运用领域、材料而做适当的改变。此外,本发明上述实施例所述的接触垫及导电凸块均以元件(如基板、电路模块、柔性电路板及印刷电路板等)的某一侧为例,但也可选择性地依设计需求而在元件的所有侧都采用,也就是在元件的至少一侧设置有本发明的设计。而且,本发明上述实施例所述的感测元件是以传输接地信号Vg及共通信号Vcom为实施范例,但不限于此,也可选择性地传输接地信号、共通信号Vcom、传输基板100上电路所提供的信号、电路模块300所提供的信号以及其他信号源所提供的信号或电压电位的至少其中之一、或其它易于判别的信号。In addition, the substrate 100 described in the above-mentioned embodiments of the present invention is an example of a substrate in a display panel, but can also be appropriately changed according to design requirements, application fields and materials of the substrate. In addition, the contact pads and conductive bumps described in the above-mentioned embodiments of the present invention all take a certain side of a component (such as a substrate, a circuit module, a flexible circuit board, a printed circuit board, etc.) It is required to be used on all sides of the element, that is, the design of the invention is provided on at least one side of the element. Moreover, the sensing element described in the above-mentioned embodiments of the present invention is exemplified by transmitting the ground signal Vg and the common signal Vcom, but is not limited thereto, and can also selectively transmit the ground signal, the common signal Vcom, and the circuit on the transmission substrate 100 The signal provided, the signal provided by the circuit module 300 and the signal provided by other signal sources or at least one of the voltage potential, or other easily distinguishable signals.

本发明的检测装置及检测方法可用于显示面板,如液晶显示面板、电致发光二极管显示面板(如有机、无机、或上述的组合)、或其它类型的显示面板、或上述显示面板的组合的电路接合状况;然而也可用于检测集成电路封装、各种电子装置电路、各种电路板封装或其他电路的接合状况。此外,如图11所示,本发明以上所说明的显示面板830及电子元件810组合成电子设备800。电子元件810例如包括控制元件、操作元件、处理元件、输入元件、存储元件、驱动元件、发光元件、保护元件、感测元件、检测元件、或其它功能元件、或上述元件的组合。而电子设备的类型包括便携式产品(如手机、摄影机、照相机、笔记本型电脑、电子相框、游戏机、手表、音乐播放器、电子信件收发器、地图导航器或类似的产品)、音像产品(如音像播放器或类似的产品)、荧幕、电视、室内/室外看板、投影机内的面板等。The detection device and detection method of the present invention can be used in display panels, such as liquid crystal display panels, electroluminescent diode display panels (such as organic, inorganic, or combinations of the above), or other types of display panels, or combinations of the above display panels. Circuit bond conditions; however, may also be used to detect bond conditions of integrated circuit packages, various electronic device circuits, various circuit board packages, or other circuits. In addition, as shown in FIG. 11 , the display panel 830 and the electronic component 810 described above in the present invention are combined into an electronic device 800 . The electronic element 810 includes, for example, a control element, an operation element, a processing element, an input element, a storage element, a drive element, a light emitting element, a protection element, a sensing element, a detection element, or other functional elements, or a combination of the above elements. The types of electronic equipment include portable products (such as mobile phones, video cameras, cameras, notebook computers, electronic photo frames, game consoles, watches, music players, electronic mail transceivers, map navigators or similar products), audio-visual products (such as audio-visual players or similar products), screens, TVs, indoor/outdoor signage, panels inside projectors, etc.

本发明已由上述相关实施例加以描述,然而上述实施例仅为实施本发明的范例。必需指出的是,已揭示的实施例并未限制本发明的范围。相反地,针对本发明所做的等效修改及等效设置均包含于本发明的权利要求范围内。The present invention has been described by the above-mentioned related embodiments, however, the above-mentioned embodiments are only examples for implementing the present invention. It must be pointed out that the disclosed embodiments do not limit the scope of the present invention. On the contrary, equivalent modifications and equivalent arrangements made for the present invention are included in the scope of the claims of the present invention.

Claims (31)

1. circuit joint detector comprises:
Substrate, this substrate is provided with a plurality of contact mats, and wherein said a plurality of contact mats comprise at least one first group, and this first group has at least one contact mat;
Circuit module, correspondence are arranged on this substrate, and comprise a plurality of conductive projections, and described a plurality of conductive projections are corresponding to described a plurality of contact mats;
One group of sensing element, be arranged in this first group this contact mat and corresponding to the conductive projection of this contact mat in this first group both sides of one of them at least; And
Detecting unit, be connected in this group sensing element, with box lunch in this first group this contact mat and corresponding to this conductive projection of this contact mat in this first group one of them produces distortion and when contacting at least one sensing element in this group sensing element at least, the output error signal.
2. device as claimed in claim 1, wherein this rub-out signal be in this first group this contact mat and corresponding at least one signal difference of this conductive projection of this contact mat in this first group.
3. device as claimed in claim 1, wherein at least one sensing element in this group sensing element comprises the combination of linear pattern, rectangular patterns or above-mentioned pattern.
4. device as claimed in claim 1, wherein said a plurality of contact mat comprises at least one second group, this second group has a plurality of contact mats, and this first group the position that is provided with that so has at least one contact mat comprises and is arranged at this outside of second group with described a plurality of contact mats, has among this second group of described a plurality of contact mats or above-mentioned combination.
5. device as claimed in claim 1, wherein one of them sensing element of this group sensing element have ground signalling and common signal one of them.
6. device as claimed in claim 5, wherein one of them sensing element of this group sensing element has ground signalling, and another sensing element has common signal.
7. device as claimed in claim 1, wherein the distance of a wherein side of this contact mat in one of them sensing element of this group sensing element and this first group in fact greater than or equal 2 microns in fact.
8. device as claimed in claim 1, wherein this contact mat in this first group and the deflection when producing distortion corresponding at least one at least one side of this conductive projection of this contact mat in this first group in fact greater than or equal 50% in fact.
9. device as claimed in claim 1, wherein this circuit module comprises integrated circuit, flexible substrate, rigid substrate or above-mentioned combination.
10. device as claimed in claim 1, wherein the material of this substrate comprises transparent material, opaque material or flexible material.
11. a circuit joint detector comprises:
Substrate, this substrate is provided with a plurality of contact mats, and wherein this contact mat comprises at least one first group, and this first group has at least two contact mats;
Circuit module, correspondence are arranged on this substrate, and comprise a plurality of conductive projections, and described a plurality of conductive projections are corresponding to described a plurality of contact mats;
One group of sensing element, with this first group in each contact mat and corresponding to the conductive projection of each contact mat in this first group one of them is staggered accordingly at least; And
Detecting unit, be connected in this group sensing element, when contacting at least one sensing element in this group sensing element with at least one of described a plurality of contact mats of box lunch in this first group and corresponding at least one of described a plurality of conductive projections of the described a plurality of contact mats in this first group produces distortion, the output error signal.
12. device as claimed in claim 11, wherein this rub-out signal be in this first group described a plurality of contact mats at least one and corresponding at least one signal difference of this conductive projection of this contact mat in this first group.
13. device as claimed in claim 11, wherein at least one sensing element in this group sensing element comprises the combination of linear pattern, rectangular patterns or above-mentioned pattern.
14. device as claimed in claim 11, wherein said a plurality of contact mat comprises at least one second group, this second group has a plurality of contact mats, and this first group the position that is provided with that so has described a plurality of contact mats comprises and is arranged at this outside of second group with described a plurality of contact mats, has among this second group of described a plurality of contact mats or above-mentioned combination.
15. device as claimed in claim 11, wherein one of them sensing element of this group sensing element have ground signalling and common signal one of them.
16. device as claimed in claim 11, wherein, one of them sensing element of this group sensing element has ground signalling, and another sensing element has common signal.
17. device as claimed in claim 11, wherein at least one of the described a plurality of contact mats in this first group and corresponding to this conductive projection of the described a plurality of contact mats in this first group at least one one of them deflection when producing distortion at least in fact greater than or equal 50% in fact.
18. device as claimed in claim 11, wherein this circuit module comprises integrated circuit, flexible substrate, rigid substrate or above-mentioned combination.
19. device as claimed in claim 11, wherein the material of this substrate comprises transparent material, opaque material or flexible material.
20. an electronic equipment comprises as claim 1 or 11 described circuit joint detector.
21. the detection method of a circuit pressing pick-up unit, this method comprises:
Circuit pressing pick-up unit is provided, and this circuit pressing pick-up unit comprises substrate, and this substrate is provided with a plurality of contact mats, and wherein said a plurality of contact mats comprise at least one first group, and this first group has at least one contact mat; Circuit module, correspondence are arranged on this substrate, and comprise a plurality of conductive projections, and described a plurality of conductive projections are corresponding to described a plurality of contact mats; One group of sensing element, correspondence be arranged in this first group this contact mat and corresponding to the both sides of one of them at least of the conductive projection of this contact mat in this first group; And detecting unit, be connected in this group sensing element;
This substrate of pressing and this circuit module make described a plurality of contact mats on this substrate and the described a plurality of conductive projections on this circuit module electrically connect; And
Measure this group sensing element, with judge on this substrate have this first group of at least one contact mat with this circuit module on whether produce distortion corresponding at least one of this conductive projection of the described a plurality of contact mats in this first group.
22. method as claimed in claim 21, wherein the step of this substrate of pressing and this circuit module comprises: described a plurality of contact mats on this substrate and the described a plurality of conductive projections on this circuit module are carried out contraposition.
23. method as claimed in claim 21 also is included between this substrate and this circuit module grafting material is provided.
24. method as claimed in claim 21, the step of wherein measuring this group sensing element comprises a signal is transferred at least one sensing element in this group sensing element, and this group sensing element is transferred to this detecting unit with another signal, detects this another signal and whether equals this signal in fact.
25. method as claimed in claim 24, wherein this signal comprises the combination of common signal, ground signalling or above-mentioned signal.
26. the detection method of a circuit pressing pick-up unit, this method comprises:
Circuit pressing pick-up unit is provided, and this circuit pressing pick-up unit comprises substrate, and this substrate is provided with a plurality of contact mats, and wherein said a plurality of contact mats comprise at least one first group, and this first group has at least two contact mats; Circuit module, correspondence are arranged on this substrate, and comprise a plurality of conductive projections, and described a plurality of conductive projections are corresponding to described a plurality of contact mats; One group of sensing element, with this first group in each contact mat and corresponding to the conductive projection of each contact mat in this first group one of them is staggered accordingly at least; And detecting unit, be connected in this group sensing element;
This substrate of pressing and this circuit module make described a plurality of contact mats on this substrate and the described a plurality of conductive projections on this circuit module electrically connect; And
Measure this group sensing element, with judge on this substrate have this first group of at least two contact mats with this circuit module on whether produce distortion corresponding at least one of this conductive projection of the described a plurality of contact mats in this first group.
27. method as claimed in claim 26, wherein the step of this substrate of pressing and this circuit module comprises: described a plurality of contact mats on this substrate and the described a plurality of conductive projections on this circuit module are carried out contraposition.
28. method as claimed in claim 26 also is included between this substrate and this circuit module grafting material is provided.
29. method as claimed in claim 26, the step of wherein measuring this group sensing element comprises a signal is transferred at least two sensing elements in this group sensing element, and this group sensing element is transferred to this detecting unit with another signal, detects this another signal and whether equals this signal in fact.
30. method as claimed in claim 29, wherein this signal comprises the combination of common signal, ground signalling or above-mentioned signal.
31. the detection method of an electronic equipment comprises the detection method as claim 21 or 26 described circuit joint detector.
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CN102005165B (en) * 2009-08-28 2013-09-18 上海天马微电子有限公司 Press fit testing device and method
CN103675581B (en) 2012-09-06 2017-04-19 宸鸿科技(厦门)有限公司 Electrical connection component and detection method thereof
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