CN100480784C - Burn-in test device - Google Patents

Abstract

The invention discloses a burn-in test device, which is used for testing a plurality of liquid crystal panels, and comprises: at least one first backlight plate for carrying and providing backlight to the liquid crystal panel; at least one second backlight plate for carrying and providing backlight to the liquid crystal panel; at least one supporting structure for supporting the first backlight plate and the second backlight plate so that the second backlight plate and the first backlight plate are arranged in a relatively stacked manner; and the driving unit is used for providing a test signal for the liquid crystal panel. The testing device utilizes the supporting structure to enable the plurality of backlight plates to be arranged in a laminated mode, and fully utilizes the space of the combustor through the arrangement mode of liquid crystal panel lamination, thereby improving the use efficiency of the combustor and increasing the yield of each detection of the liquid crystal panel.

Description

Burn-in test device

technical field

The invention relates to a test device, in particular to a burn-in test device for a liquid crystal panel.

Background technique

With the high development of liquid crystal display (Liquid Crystal Display, LCD) technology and the wide application of liquid crystal display in various products, users have higher and higher requirements for its quality. Therefore, it is particularly necessary to conduct more types of reliability tests (such as tests in high temperature, high humidity and low temperature environments) for liquid crystal displays. Related technologies such as China Taiwan Patent Gazette No. 509329 patent disclose a power-on frame for making relevant fixtures for reliability testing of liquid crystal display modules to drive and fix multiple liquid crystal displays. The power supply frame at least includes a first support plate, a second support plate, two connection plates, a base plate, multiple rectifiers and multiple wires, wherein one of the four sides of the first support plate has multiple first slots, And the first support plate has a plurality of openings distributed at intervals. One of the four sides of the second supporting board has a plurality of second slots. The two connection plates are respectively used to connect the first support plate and the second support plate, so that the board surfaces of the first support plate and the second support plate are opposite and separated by a certain distance, and the connection plate has a plurality of interval adjustment slots for adjusting The interval between the first support board and the second support board. Three of the four sides of the bottom plate are respectively fixed to the first supporting plate and the connecting plate. A plurality of rectifiers are fixed to one side of the bottom plate at intervals, and one ends of the plurality of wires are respectively electrically connected to the plurality of rectifiers, and the other ends are passed through openings of the first supporting board and connected to a joint, and the joint is electrically connected Connect to the LCD module. China Taiwan No. 509329 patent is to utilize the mode of upright arrangement to fix and drive the liquid crystal display, but, because the space of burn-in room is often fixed, when the liquid crystal display of different sizes wants to be tested, only the single-layer upright Arrangement, the space in the burn-in room cannot be fully utilized, resulting in a reduction in the throughput of a single test.

Contents of the invention

In view of the problems encountered in the above-mentioned prior art, the present invention provides a burn-in test device, which can make the liquid crystal panels present the best arrangement, so as to greatly improve the utilization rate of the burn-in room space, and increase the production capacity of the liquid crystal panel for each measurement .

Therefore, in order to solve the technical problems of the above burn-in test device, the present invention discloses a burn-in test device for testing a plurality of liquid crystal panels, the burn-in test device includes at least one first backlight panel, at least one second backlight Board, at least one supporting structure and a driving unit. The above-mentioned first backlight plate and the above-mentioned second backlight plate are used to carry and provide backlight on the liquid crystal panel, and the second backlight plate and the first backlight plate are stacked oppositely, and the second backlight plate and the first backlight plate The plates can rotate relative to each other. The supporting structure is used for supporting the first backlight board and the second backlight board, and the driving unit is used for providing a test signal to the liquid crystal panel to test the liquid crystal panel.

In order to make the first backlight panel and the second backlight panel stacked, different forms of supporting structures are used to realize it. In order to facilitate placing the liquid crystal panel on the first backlight plate of the lower layer, the first backlight plate and the second backlight plate in the support structure can be realized by mutual rotation or adjusting the distance.

Preferably, the support structure includes: a support frame; and at least one coupling member, used to connect the second backlight board to the support frame, so that the second backlight board can be opposite to the first backlight board sports.

Preferably, the connecting member is a hinge, which connects the supporting frame and the second backlight panel in a pivotal manner.

Preferably, the second backlight panel is rotatable relative to the first backlight panel.

Preferably, the combining part includes a motor for driving the second backlight panel to rotate.

Preferably, the support structure includes a positioning switch, and when the second backlight panel is turned to a working position, the positioning switch controls the motor to stop rotating.

Preferably, when the second backlight panel is turned to the working position, the second backlight panel and the first backlight panel are parallel to each other.

Preferably, the support structure includes a ㄈ-shaped frame, the ㄈ-shaped frame has a stacked first platform and a second platform, and the first platform and the second platform are used to carry the first backlight panel and the second Backlight.

Preferably, the second platform of the U-shaped frame can rotate relative to the first platform.

Preferably, the support structure includes: a plurality of platforms for carrying the first backlight panel and the second backlight panel; and at least one support column for supporting the platforms and making the platforms stacked set up.

Preferably, said support column includes a linear actuator for moving said platform.

Preferably, the supporting structures are repeatedly arranged along a direction.

Preferably, the supporting structures are arranged repeatedly in a matrix.

Preferably, the driving unit includes a signal generating unit for providing the test signal.

Preferably, the driving unit includes a control circuit for controlling the driving capability required by the liquid crystal panel test.

Preferably, the control circuit includes a plurality of distributed buffer circuits.

Preferably, one of the distributed buffer circuits is used to drive a set of first backlight boards and second backlight boards that are stacked opposite to each other.

Therefore, in the burn-in test device of the present invention, through the stacked configuration of backlight panels, the liquid crystal panels are not only arranged in one layer, but can also use multiple layers to amplify the output of a single detection, thereby increasing one More than double the detection capacity.

Regarding other objectives, features and advantages of the present invention, preferred embodiments are described in detail below with reference to the accompanying drawings.

Description of drawings

Fig. 1 is a combined schematic diagram of the first embodiment of the present invention.

FIG. 2 is a schematic perspective view of the first embodiment of the present invention.

Fig. 3 is a combined schematic diagram of the second embodiment of the present invention.

Fig. 4 is a combined schematic view of the first embodiment of the supporting structure of the present invention.

FIG. 5A and FIG. 5B are respectively a schematic diagram of a hinge and a rotary motor according to the present invention.

FIG. 6A and FIG. 6B are respectively a side view and a top view of the first embodiment of the supporting structure of the present invention arranged repeatedly in a matrix along one direction.

Fig. 7 is a combined schematic view of the second embodiment of the supporting structure of the present invention.

Fig. 8 is a combined schematic view of the third embodiment of the support structure of the present invention.

FIG. 9 is a combined schematic view of the fourth embodiment of the supporting structure of the present invention.

Fig. 10 is a combined schematic diagram of the third embodiment of the present invention.

Detailed ways

Please refer to FIG. 1 and FIG. 2 , which are a combination schematic diagram and a three-dimensional schematic diagram of the first embodiment of the present invention. As shown in FIG. 1 and FIG. 2, the present invention is a burn-in test device for testing a plurality of liquid crystal panels 700. The burn-in test device includes at least one first backlight 100 and at least one second backlight 110. , at least one supporting structure 300 and one driving unit 500 . The first backlight plate 100 and the second backlight plate 110 can be used to support and provide backlight for the liquid crystal panel 700 . The support structure 300 is used to support the first backlight panel 100 and the second backlight panel 110 , and the support structure 300 enables the second backlight panel 110 and the first backlight panel 100 to be stacked oppositely. The driving unit 500 is used for providing a test signal to the liquid crystal panel 700 . In this embodiment, the driving unit 500 is fixed on the supporting structure 300 , and the driving unit 500 can also be an external driving unit, that is, it is not fixed on the supporting structure 300 but is an independent driving unit.

6A, the driving unit 500 includes a signal generating unit 501 and a control circuit 503, the signal generating unit 501 is used to provide a test signal to the liquid crystal panel 700, and the control circuit 503 is used to control the driving required for the test of the liquid crystal panel 700 ability. The control circuit 503 further includes a plurality of distributed buffer circuits 505 , each buffer circuit 505 is used to drive a group of first backlight panels 100 and second backlight panels 110 stacked opposite to each other, and each buffer circuit 505 can be individually controlled.

Please refer to FIG. 3 , which is a combined schematic view of the second embodiment of the present invention. As shown in FIG. 3 , when the size of the liquid crystal panel 700 is small or the space of the burn-in room (not shown in the figure) is large, the single-row structure can be changed into a matrix structure, so that The yield of the assay will be doubled. In addition, because the first backlight panel 100 and the second backlight panel 110 are stacked, when the space in the burn-in chamber is sufficient, they can always be stacked upwards, and the output of each single detection will increase with each layer stacked.

As shown in FIG. 2 , the supporting structures 300 may be repeatedly arranged along a direction. As shown in FIG. 3 , the supporting structure 300 can also be arranged in a matrix form repeatedly.

The following will illustrate various ways to achieve backlight stacking:

Please refer to FIG. 4 , which is a combined schematic diagram of the first embodiment of the supporting structure of the present invention. As shown in FIG. 4 , the supporting structure 300 includes a supporting frame 310 and at least one connecting part 330 . The combination part 330 is used to connect the first backlight board 100 and the second backlight board 110 to the support frame 310 , and make the first backlight board 100 or the second backlight board 110 rotate relative to the support frame 310 .

Please refer to FIG. 5A and FIG. 5B , which respectively show a schematic view of the joint part of the present invention as a hinge and a schematic view of the joint part including a rotating motor. As shown in FIG. 5A , the combining member 330 can be a hinge 331 , so that the second backlight panel 110 is pivotally combined with the supporting frame 310 . As shown in FIG. 5B , the coupling member 330 includes a rotation motor 333 so that the second backlight panel 110 can rotate relative to the first backlight panel 100 ( FIG. 4 ). A positioning switch 335 can be provided on the support frame 310. When the second backlight panel 110 reaches the working position, the positioning switch 335 can control the motor 333 to stop its rotation, so that the second backlight panel 110 is positioned. At this time, the second backlight panel 110 is parallel to the first backlight panel 100 .

FIG. 6A and FIG. 6B are respectively a side view and a top view of the first embodiment of the supporting structure of the present invention arranged repeatedly in a matrix along one direction. In the first embodiment of the support structure, as shown in FIG. 6A and FIG. 6B, the support structure 300 is arranged in a matrix like two rows, and is arranged repeatedly in one direction, so as to cover various burn-in chambers. Length and width dimensions. Please refer to FIG. 7 , which is a combined schematic diagram of the second embodiment of the supporting structure of the present invention. As shown in FIG. 7 , the support structure 300 is a U-shaped frame, and the U-shaped frame has a stacked first platform 351 and a second platform 353, and the first platform 351 and the second platform 353 are respectively used to carry the second backlight panel 110. and the first backlight panel 100 , and both the first platform 351 and the second platform 353 can rotate, so that the first backlight panel 100 and the second backlight panel 110 can rotate relative to each other. In this way, when the liquid crystal panel 700 is placed, the second backlight plate 110 is rotated relative to the first backlight plate 100, so that the liquid crystal panel 700 is placed on the first backlight plate 100, and the liquid crystal panel 700 is placed on the second backlight plate 110 , and then rotate the second backlight panel 110 to be stacked parallel to the first backlight panel 100 to the working position.

Please refer to FIG. 8 , which is a combined schematic view of the third embodiment of the supporting structure of the present invention. As shown in FIG. 8 , the support structure 300 includes a plurality of platforms 370 and at least one support column 371 . A plurality of platforms 370 can be used to carry the first backlight panel 100 and the second backlight panel 110 , and the support columns 371 are used to support the platforms 370 , and the platforms 370 can be stacked.

Please refer to FIG. 9 , which is a combined schematic diagram of a fourth embodiment of the support structure of the present invention. As shown in FIG. 9 , the support column 371 includes a linear actuator 373 . The linear actuator 373 can generate linear movement, such as a hydraulic cylinder and other components, and the linear actuator 373 can be used to move the platforms 370 to adjust the distance between the platforms 370 . In this way, when both the first backlight panel 100 and the second backlight panel 110 are placed on the platform 370, the distance between them can be changed by using the linear actuator 373, and the liquid crystal panel 700 can be conveniently placed on the first backlight panel 100 .

Please refer to FIG. 10 , which is a combined schematic view of the third embodiment of the present invention. As shown in FIG. 10 , the support structure 300 is used to make multiple backlight panels arranged in multiple layers. Taking the three-layer structure as an example, the support structure 300 can fix the first backlight panel 100, the second backlight panel 110 and the third backlight panel 130, so that the first backlight panel 100, the second backlight panel 110 and the third backlight panel 130 are opposite to each other. Cascading settings. In this way, the combination of the support structure and the backlight panel can be continuously expanded upwards to increase the number of liquid crystal panels tested each time when the space in the burn-in room is allowed.

Therefore, the burn-in test device of the present invention can make the liquid crystal panels present the best arrangement mode, and be used for placing in the burn-in room, so as to fully utilize the space of the burn-in room.

Although the present invention has been disclosed above with the aforementioned preferred embodiments, it is not intended to limit the protection scope of the present invention. Any person skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be determined by the scope of the claims.

Claims (17)

1. aging testing device, it is in order to test a plurality of liquid crystal panels, and this aging testing device comprises:

At least one first backlight is in order to carry and to provide backlight in described liquid crystal panel;

At least one second backlight is in order to carry and to provide backlight in described liquid crystal panel;

At least one supporting construction, in order to support described first backlight and described second backlight, so that described second backlight and described first backlight are the stacked setting of opposite layer, and described second backlight and described first backlight can relatively rotate; And

Driver element is in order to provide a test signal to described liquid crystal panel.

2. aging testing device according to claim 1, wherein this supporting construction comprises:

One bracing frame; And

At least one conjunction in order to described second backlight is linked on this bracing frame, and makes described second backlight can described relatively first backlight motion.

3. aging testing device according to claim 2, wherein said conjunction are hinge, its in the mode of being pivoted in conjunction with this bracing frame and described second backlight.

4. aging testing device according to claim 3, wherein said second backlight can be rotated relative to described first backlight.

5. aging testing device according to claim 2, wherein this conjunction comprises motor, rotates in order to drive this second backlight.

6. aging testing device according to claim 5, wherein this supporting construction comprises positioning switch, when described second backlight went to a working position, this positioning switch was controlled this motor and is stopped operating.

7. aging testing device according to claim 6, wherein when described second backlight went to this working position, described second backlight and described first backlight were state parallel to each other.

8. aging testing device according to claim 1, wherein this supporting construction comprises a ㄈ shape frame, this ㄈ shape frame has the first stacked platform and second platform, and this first platform and this second platform are in order to carry described first backlight and described second backlight.

9. aging testing device according to claim 8, wherein second platform of this ㄈ shape frame can rotate relative to this first platform.

10. aging testing device according to claim 1, wherein this supporting construction comprises:

A plurality of platforms are in order to carry described first backlight and described second backlight; And

At least one support column in order to supporting described platform, and makes described platform be the layered laminate setting.

11. aging testing device according to claim 10, wherein said support column comprises linear actuators, in order to move described platform.

12. aging testing device according to claim 1, wherein said supporting construction is along a direction repeated arrangement.

13. aging testing device according to claim 1, wherein said supporting construction is rectangular repeated arrangement.

14. aging testing device according to claim 1, wherein this driver element comprises the signal generation unit, in order to this test signal to be provided.

15. according to claim 1 or 14 described aging testing devices, wherein this driver element comprises control circuit, in order to control the required driving force of this liquid crystal panel test.

16. aging testing device according to claim 15, wherein this control circuit comprises a plurality of distributed buffering circuit.

17. aging testing device according to claim 16, first backlight and second backlight of one of wherein said distributed buffering circuit in order to drive one group of stacked relatively setting.

Images