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CN100474574C - Chip package - Google Patents

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Publication number
CN100474574C
CN100474574C CNB2006100581560A CN200610058156A CN100474574C CN 100474574 C CN100474574 C CN 100474574C CN B2006100581560 A CNB2006100581560 A CN B2006100581560A CN 200610058156 A CN200610058156 A CN 200610058156A CN 100474574 C CN100474574 C CN 100474574C
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chip
mentioned
conductive
body according
projections
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Expired - Fee Related
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CNB2006100581560A
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CN101034692A (en
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黄铭亮
蔡嘉益
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Chipmos Technologies Inc
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Chipmos Technologies Bermuda Ltd
Chipmos Technologies Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L24/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/35Mechanical effects
    • H01L2924/351Thermal stress

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

A chip package comprises a flexible substrate, a plurality of conductive plugs, a circuit layer and a chip. The flexible substrate has a first surface and a second surface opposite to each other. The conductive plugs penetrate through the flexible substrate. The circuit layer is located on the first surface. The circuit layer is provided with a plurality of inner pins which are respectively and electrically connected with the conductive plugs. The chip is arranged on the second surface of the flexible substrate and is jointed with the conductive plugs through the bumps, each bump is completely or partially overlapped with the corresponding conductive plug, and the joint surface of each bump and the chip is completely or partially overlapped with the corresponding conductive plug. Based on the structure, when the bump on the chip is electrically connected to the conductive plug through the hot pressing process, the chip can be quickly and firmly electrically connected to the inner pin.

Description

芯片封装体 chip package

技术领域 technical field

本发明涉及一种封装结构(chip package),且特别涉及一种使用可挠曲性基板(flexible substrate)的封装结构。The present invention relates to a package structure (chip package), and in particular to a package structure using a flexible substrate.

背景技术 Background technique

在目前的封装技术中,芯片主要是通过打线接合(wire bonding)技术、倒装芯片接合(flip chip)技术或是卷带自动接合(tape automated bonding,TAB)技术,来与芯片承载器电连接。在这些接合技术中,由于卷带自动接合技术具有:能在可挠曲性基材上直接进行电性的测试、能够利用可挠曲性基材来完成电子元件的立体组装以及能够制作出薄型且小型的芯片封装体等等优点,因此通过卷带自动接合技术所制作的芯片封装体已被广泛地应用于个人计算机、液晶电视、助听器以及存储卡等等电子产品中。In the current packaging technology, the chip is mainly connected to the chip carrier by wire bonding technology, flip chip bonding technology or tape automated bonding (TAB) technology. connect. Among these bonding technologies, the tape-and-roll automatic bonding technology has the following advantages: it can conduct electrical tests directly on flexible substrates, it can use flexible substrates to complete three-dimensional assembly of electronic components, and it can make thin And small chip package and other advantages, so the chip package made by automatic tape and roll bonding technology has been widely used in electronic products such as personal computers, LCD TVs, hearing aids and memory cards.

图1是公知的芯片封装体的剖面示意图。请参照图1,芯片封装体100包括可挠曲性基板110、线路层120、芯片130、多个凸块140以及封装胶体150。可挠曲性基板110的材质为聚乙酰胺(polyimide)。线路层120设置于可挠曲性基板110的表面112上。线路层120具有多个内引脚122、多条迹线124以及多个外引脚126,其中内引脚122分别通过这些迹线124来与对应的外引脚126电连接。FIG. 1 is a schematic cross-sectional view of a known chip package. Referring to FIG. 1 , the chip package 100 includes a flexible substrate 110 , a circuit layer 120 , a chip 130 , a plurality of bumps 140 and an encapsulant 150 . The material of the flexible substrate 110 is polyimide. The circuit layer 120 is disposed on the surface 112 of the flexible substrate 110 . The wiring layer 120 has a plurality of inner pins 122 , a plurality of traces 124 and a plurality of outer pins 126 , wherein the inner pins 122 are respectively electrically connected to the corresponding outer pins 126 through the traces 124 .

芯片130设置于线路层120上,并且通过这些凸块140来与这些内引脚122电连接。一般而言,公知技术是将热压机的压头(pressure head)160压合于可挠曲性基板110的相对于表面112的表面114上,并且通过压头160对可挠曲性基板110所施加的压力以及热量以使得芯片130通过这些凸块140电连接于内引脚122。封装胶体150设置于表面112上。封装胶体150设置于芯片130的外围并且将这些凸块140包覆于其内。此外,封装胶体150还充满于可挠曲性基板110与芯片130之间的间隙。The chip 130 is disposed on the circuit layer 120 and is electrically connected to the inner pins 122 through the bumps 140 . Generally speaking, the known technology is to press the pressure head (pressure head) 160 of the hot press on the surface 114 of the flexible substrate 110 opposite to the surface 112, and press the flexible substrate 110 by the pressure head 160. The applied pressure and heat make the chip 130 electrically connected to the inner pins 122 through the bumps 140 . The encapsulant 150 is disposed on the surface 112 . The encapsulant 150 is disposed on the periphery of the chip 130 and wraps the bumps 140 therein. In addition, the encapsulant 150 is also filled in the gap between the flexible substrate 110 and the chip 130 .

值得注意的是,当压头160对可挠曲性基板110施加热量时,热量的传递路径主要是通过可挠曲性基板110以及线路层120而传递至这些凸块140上。然而,由于可挠曲性基板110的材质为聚乙酰胺,其具有相当高的热阻(thermal resistance),因此在不伤及可挠曲性基板110的条件之下,公知技术需要较长的时间才能将这些凸块140的温度提高至适合热压的温度。因此芯片封装体100的生产效率较低。It should be noted that when the indenter 160 applies heat to the flexible substrate 110 , the heat transfer path is mainly transferred to the bumps 140 through the flexible substrate 110 and the circuit layer 120 . However, since the material of the flexible substrate 110 is polyacetamide, which has a relatively high thermal resistance, the conventional technology requires a relatively long time without damaging the flexible substrate 110. It takes time to raise the temperature of these bumps 140 to a temperature suitable for hot pressing. Therefore, the production efficiency of the chip package 100 is low.

此外,具有较高热阻的可挠曲性基板110也容易造成压头160传递至这些凸块140的热量不均匀,以使得这些凸块140在同一时间内被加热至不同的温度。如此一来,部分的凸块140就容易在不适当的热压温度下与内引脚122接合,进而造成线路层120与芯片130之间电连接的质量的瑕疵。In addition, the flexible substrate 110 with higher thermal resistance is likely to cause uneven heat transfer from the pressure head 160 to the bumps 140 , so that the bumps 140 are heated to different temperatures at the same time. As a result, some of the bumps 140 are easily bonded to the inner pins 122 at an improper hot-pressing temperature, thereby causing defects in the quality of the electrical connection between the circuit layer 120 and the chip 130 .

另外,芯片封装体100得位于表面112上的内引脚122与迹线124也可能会造成封装胶体150无法充分地充满可挠曲性基板110与芯片130之间的间隙。请参照图2,其为图1之封装胶体未充分地填充于可挠曲性基板与芯片之间的间隙的示意图,其中为了说明上的方便芯片130是被透明化并且以虚线表示芯片130的轮廓。在形成封装胶体150的过程中,当液态的胶体流入可挠曲性基板110与芯片130之间的间隙时,由于表面112上设置有多条内引脚122以及多条迹线124,因此液态的胶体会受到较大的流动阻力(flow resistance)。如此一来,液态的胶体就不容易将可挠曲性基板110与芯片130之间的间隙填满,因而容易使封装胶体150中产生孔洞(void)A。In addition, the internal leads 122 and traces 124 of the chip package 100 located on the surface 112 may also cause the encapsulant 150 to fail to fully fill the gap between the flexible substrate 110 and the chip 130 . Please refer to FIG. 2 , which is a schematic diagram showing that the encapsulant in FIG. 1 is not sufficiently filled in the gap between the flexible substrate and the chip, wherein the chip 130 is transparentized and the chip 130 is indicated by a dotted line for the convenience of illustration. contour. In the process of forming the encapsulant 150, when the liquid colloid flows into the gap between the flexible substrate 110 and the chip 130, since the surface 112 is provided with a plurality of internal pins 122 and a plurality of traces 124, the liquid colloid The colloid will be subject to greater flow resistance (flow resistance). In this way, the liquid colloid is not easy to fill the gap between the flexible substrate 110 and the chip 130 , so it is easy to generate voids (voids) A in the packaging colloid 150 .

图3是另一种公知的芯片封装体的剖面示意图。芯片封装体200包括可挠曲性基板210、线路层220、线路层230、多个导电插塞240、芯片250、多个凸块260以及封装胶体270。可挠曲性基板210的材质为聚乙酰胺,其具有彼此相对的表面212与表面214。线路层220设置于表面212上,并且线路层220具有多个外引脚222与多条迹线224。线路层230设置于表面214上,并且线路层230具有多个内引脚232与多条迹线234。这些导电插塞240分别贯穿可挠曲性基板210,并且将线路层220电连接于线路层230。如此一来,这些内引脚232就可以通过这些迹线234、这些导电插塞240以及这些迹线224来电连接于外引脚222。芯片250通过这些凸块260电连接于内引脚232上。封装胶体270设置于表面214上,其中封装胶体270设置于芯片130的外围并且将这些凸块140包覆于其内。此外封装胶体270还填充于可挠曲性基板210与芯片250之间的间隙。FIG. 3 is a schematic cross-sectional view of another known chip package. The chip package 200 includes a flexible substrate 210 , a circuit layer 220 , a circuit layer 230 , a plurality of conductive plugs 240 , a chip 250 , a plurality of bumps 260 and an encapsulant 270 . The flexible substrate 210 is made of polyacetamide, and has a surface 212 and a surface 214 opposite to each other. The circuit layer 220 is disposed on the surface 212 , and the circuit layer 220 has a plurality of external pins 222 and a plurality of traces 224 . The circuit layer 230 is disposed on the surface 214 , and the circuit layer 230 has a plurality of inner pins 232 and a plurality of traces 234 . The conductive plugs 240 respectively penetrate through the flexible substrate 210 and electrically connect the circuit layer 220 to the circuit layer 230 . In this way, the inner pins 232 can be electrically connected to the outer pins 222 through the traces 234 , the conductive plugs 240 and the traces 224 . The chip 250 is electrically connected to the internal pins 232 through the bumps 260 . The encapsulant 270 is disposed on the surface 214 , wherein the encapsulant 270 is disposed on the periphery of the chip 130 and encapsulates the bumps 140 therein. In addition, the encapsulant 270 also fills the gap between the flexible substrate 210 and the chip 250 .

与前述的理由相同,由于可挠曲性基板210的材质为聚乙酰胺,因此在不伤及可挠曲性基板210的条件之下,公知技术需要较长的时间才能将这些凸块260的温度提高至适合热压的温度。是以芯片封装体200的生产效率偏低。并且具有较高热阻的可挠曲性基板210也容易造成压头160传递至这些凸块260的热量不均匀,内引脚232与芯片250之间电连接的质量也容易产生瑕疵。For the same reason as above, since the material of the flexible substrate 210 is polyacetamide, under the condition that the flexible substrate 210 is not damaged, it takes a long time for the conventional technology to remove the bumps 260. The temperature is raised to a temperature suitable for hot pressing. Therefore, the production efficiency of the chip package 200 is relatively low. Moreover, the flexible substrate 210 with high thermal resistance may easily cause uneven heat transfer from the indenter 160 to the bumps 260 , and the quality of the electrical connection between the inner pins 232 and the chip 250 may also be easily flawed.

另外,由于表面214上设置有多条内引脚232以及多条迹线234,因此在形成封装胶体270时,容易使得液态的封装胶体270无法充分地充满可挠曲性基板210与芯片250之间的间隙,而在液态的封装胶体270固化后在可挠曲性基板210与芯片250之间产生类似于图2的孔洞A的问题。In addition, since the surface 214 is provided with a plurality of inner pins 232 and a plurality of traces 234, when forming the encapsulant 270, it is easy to make the liquid encapsulant 270 not be able to fully fill the gap between the flexible substrate 210 and the chip 250. However, after the liquid encapsulant 270 solidifies, a problem similar to the hole A in FIG. 2 occurs between the flexible substrate 210 and the chip 250 .

发明内容 Contents of the invention

本发明的目的就是在提供一种芯片封装体,其中芯片与内引脚之间的具有较可靠的电连接。The purpose of the present invention is to provide a chip package, wherein there is a more reliable electrical connection between the chip and the inner pins.

本发明的再一目的是提供一种芯片封装体,其中封装胶体能够充分的填充于可挠曲性基板与芯片之间的间隙。Another object of the present invention is to provide a chip package, wherein the encapsulant can fully fill the gap between the flexible substrate and the chip.

本发明提出一种芯片封装体,其包括可挠曲性基板、多个导电插塞、线路层以及芯片。可挠曲性基板具有彼此相对的第一表面以及第二表面。这些导电插塞贯穿可挠曲性基板。线路层位于第一表面上。线路层具有多个内引脚,且这些内引脚分别与这些导电插塞电连接。芯片具有主动表面以及位于主动表面上的多个凸块,其中芯片设置于可挠曲性基板的第二表面上,并通过这些凸块与这些导电插塞接合,每一凸块与其所对应的导电插塞完全或部分重叠,且上述每一凸块与所述芯片的接合面会与其所对应的导电插塞完全或部分重叠。The invention provides a chip package, which includes a flexible substrate, a plurality of conductive plugs, a circuit layer and a chip. The flexible substrate has a first surface and a second surface opposite to each other. These conductive plugs run through the flexible substrate. The circuit layer is located on the first surface. The circuit layer has a plurality of internal pins, and these internal pins are respectively electrically connected to the conductive plugs. The chip has an active surface and a plurality of bumps on the active surface, wherein the chip is arranged on the second surface of the flexible substrate, and is bonded to the conductive plugs through the bumps, and each bump is connected to its corresponding The conductive plugs are completely or partially overlapped, and the bonding surface of each bump and the chip is completely or partially overlapped with the corresponding conductive plugs.

依照本发明的较佳实施例所述之芯片封装体,上述线路层还包括多条迹线以及多个外引脚,并且这些迹线是连接于这些内引脚以及这些外引脚之间。According to the chip package described in a preferred embodiment of the present invention, the circuit layer further includes a plurality of traces and a plurality of external leads, and the traces are connected between the internal leads and the external leads.

依照本发明的较佳实施例所述之芯片封装体,还包括各向异性导电胶(ACP)或各向异性导电膜(ACF)。各向异性导电胶设置于可挠曲性基板与芯片之间,以使这些凸块与这些导电插塞电连接。The chip package according to a preferred embodiment of the present invention further includes anisotropic conductive paste (ACP) or anisotropic conductive film (ACF). The anisotropic conductive adhesive is disposed between the flexible substrate and the chip to electrically connect the bumps and the conductive plugs.

依照本发明的较佳实施例所述之芯片封装体,更包括一两阶段特性(Bstage)胶材,设置于可挠曲性基板与芯片之间,以使这些凸块与这些导电插塞电连接。The chip package according to the preferred embodiment of the present invention further includes a two-stage characteristic (Bstage) adhesive material disposed between the flexible substrate and the chip, so that the bumps and the conductive plugs are electrically connected to each other. connect.

依照本发明的较佳实施例所述之芯片封装体,其中这些凸块是两阶段(B stage)导电凸块。In the chip package according to a preferred embodiment of the present invention, the bumps are two-stage (B stage) conductive bumps.

依照本发明的较佳实施例所述之芯片封装体,还可包含导电胶或金属,设置于凸块与导电插塞之间,通过导电胶或金属以使这些凸块与这些导电插塞电连接。The chip package according to the preferred embodiment of the present invention may further include conductive glue or metal disposed between the bumps and the conductive plugs, through which the bumps and the conductive plugs are electrically connected. connect.

依照本发明的较佳实施例所述之芯片封装体,还包括非导电聚合材质。非导电聚合材质设置于可挠曲性基板与芯片之间,以通过非导电聚合材质的固化,使得这些凸块电连接于这些导电插塞。The chip package according to a preferred embodiment of the present invention further includes a non-conductive polymer material. The non-conductive polymer material is disposed between the flexible substrate and the chip, so that the bumps are electrically connected to the conductive plugs through the solidification of the non-conductive polymer material.

依照本发明的较佳实施例所述之芯片封装体,还包括底胶。底胶设置于可挠曲性基板与芯片之间,以包覆住这些凸块。The chip package according to a preferred embodiment of the present invention further includes a primer. The primer is disposed between the flexible substrate and the chip to cover the bumps.

依照本发明的较佳实施例所述之芯片封装体,上述这些导电插塞更突出于第二表面外。According to the chip package described in the preferred embodiment of the present invention, the above-mentioned conductive plugs are more protruded from the second surface.

依照本发明的较佳实施例所述之芯片封装体,还包括封装胶体设置于第二表面上,以包覆住芯片。另外,封装胶体还可以具有开口,而且此开口暴露出芯片的与主动表面相对的背面。The chip package according to a preferred embodiment of the present invention further includes an encapsulant disposed on the second surface to cover the chip. In addition, the encapsulant may also have an opening, and the opening exposes the backside of the chip opposite to the active surface.

依照本发明的较佳实施例所述之芯片封装体,上述可挠曲性基板的材质是高分子材料,其中此高分子材料例如是聚乙酰胺。According to the chip package described in a preferred embodiment of the present invention, the material of the flexible substrate is a polymer material, wherein the polymer material is, for example, polyacetamide.

由于本发明之芯片和内引脚分别位于可挠曲性基板的相对两侧,并且由于导电插塞是直接与凸块电接触,因此当本发明通过热压工艺而使芯片通过凸块而电连接于导电插塞时,凸块的温度可以更快速地升高到适合热压的温度。是以在不伤害可挠曲性基板的条件下,本发明可以快速地并且确实地将芯片电连接于内引脚。另外,由于本发明之芯片与可挠曲性基板之间仅具有多个凸块,因此形成封装胶体的时候,液态的封装胶体可以充分地充满芯片与可挠曲性基板之间的间隙。Since the chip and the inner pins of the present invention are respectively located on opposite sides of the flexible substrate, and since the conductive plugs are in direct electrical contact with the bumps, when the chip passes through the bumps and electrically When connected to the conductive plug, the temperature of the bump can be raised to a temperature suitable for hot pressing more quickly. Therefore, under the condition of not damaging the flexible substrate, the present invention can quickly and surely electrically connect the chip to the inner pin. In addition, since there are only a plurality of bumps between the chip and the flexible substrate of the present invention, when forming the encapsulant, the liquid encapsulant can fully fill the gap between the chip and the flexible substrate.

为让本发明之上述和其它目的、特征和优点能更明显易懂,下文特举较佳实施例,并配合附图,作详细说明如下。In order to make the above and other objects, features and advantages of the present invention more comprehensible, preferred embodiments are specifically cited below and described in detail with accompanying drawings.

附图说明 Description of drawings

图1是公知的芯片封装体的剖面示意图。FIG. 1 is a schematic cross-sectional view of a known chip package.

图2是图1之封装胶体未充分地填充于可挠曲性基板与芯片之间的间隙的示意图。FIG. 2 is a schematic diagram showing that the encapsulant in FIG. 1 is not fully filled in the gap between the flexible substrate and the chip.

图3是另一种公知之芯片封装体的剖面示意图。FIG. 3 is a schematic cross-sectional view of another known chip package.

图4是本发明一实施例之芯片封装体的剖面示意图。FIG. 4 is a schematic cross-sectional view of a chip package according to an embodiment of the present invention.

图5是本发明另一实施例之芯片封装体的剖面示意图。FIG. 5 is a schematic cross-sectional view of a chip package according to another embodiment of the present invention.

图6是本发明又一实施例之芯片封装体的剖面示意图。FIG. 6 is a schematic cross-sectional view of a chip package according to another embodiment of the present invention.

图7是本发明再一实施例之芯片封装体的剖面示意图。FIG. 7 is a schematic cross-sectional view of a chip package according to yet another embodiment of the present invention.

主要元件标记说明Description of main component marking

100:芯片封装体100: chip package

110:可挠曲性基板110: Flexible substrate

112:表面112: surface

114:表面114: surface

120:线路层120: line layer

122:内引脚122: inner pin

124:迹线124: trace

126:外引脚126: External pin

130:芯片130: chip

140:凸块140: Bump

150:封装胶体150: encapsulation colloid

160:压头160: pressure head

200:芯片封装体200: chip package

210:可挠曲性基板210: Flexible substrate

212:表面212: surface

214:表面214: surface

220:线路层220: Line layer

222:外引脚222: External pin

224:迹线224: trace

230:线路层230: Line layer

232:内引脚232: inner pin

234:迹线234: trace

240:导电插塞240: Conductive plug

250:芯片250: chips

260:凸块260: Bump

270:封装胶体270: encapsulation colloid

300:芯片封装体300: chip package

301:芯片封装体301: chip package

302:芯片封装体302: chip package

303:芯片封装体303: chip package

310:可挠曲性基板310: Flexible substrate

320:导电插塞320: Conductive plug

322:半圆形突出部322: semi-circular protrusion

324:焊垫324: welding pad

330:线路层330: line layer

332:内引脚332: inner pin

334:迹线334: trace

336:外引脚336: external pin

340:芯片340: chip

342:主动表面342: Active Surface

344:凸块344: bump

346:背面346: back

312:第一表面312: First Surface

314:第二表面314: second surface

350:封装胶体350: encapsulation colloid

352:开口352: opening

360:各向异性导电胶360: Anisotropic conductive adhesive

362:导电粒子362: Conductive particles

370:非导电聚合材质370: Non-conductive polymer material

380:底胶380: primer

390:导电胶390: Conductive adhesive

A:孔洞A: hole

具体实施方式 Detailed ways

图4是本发明一实施例之芯片封装体的剖面示意图。请参照图4,芯片封装体300主要包括可挠曲性基板310、多个导电插塞320、线路层330以及芯片340。可挠曲性基板310具有彼此相对的第一表面312以及第二表面314。可挠曲性基板310的材质例如是聚乙酰胺或是其它种类的具可挠曲性的高分子材质。这些导电插塞320贯穿可挠曲性基板310并且导电插塞320的材质例如是金属材质。在本实施例中导电插塞320具有突出于第二表面314的半圆形突出部322。FIG. 4 is a schematic cross-sectional view of a chip package according to an embodiment of the present invention. Referring to FIG. 4 , the chip package 300 mainly includes a flexible substrate 310 , a plurality of conductive plugs 320 , a circuit layer 330 and a chip 340 . The flexible substrate 310 has a first surface 312 and a second surface 314 opposite to each other. The material of the flexible substrate 310 is, for example, polyacetamide or other kinds of flexible polymer materials. These conductive plugs 320 penetrate through the flexible substrate 310 and the material of the conductive plugs 320 is, for example, metal. In this embodiment, the conductive plug 320 has a semicircular protrusion 322 protruding from the second surface 314 .

线路层330是由金属材质所形成,其设置于第一表面312上,并且线路层330包括多个内引脚332、多条迹线334以及多个外引脚336。导电插塞320与分别与这些内引脚332电连接,而这些外引脚336适于通过适当的外部连接端子来与其它的电路元件电连接。The circuit layer 330 is formed of metal material and disposed on the first surface 312 , and the circuit layer 330 includes a plurality of inner pins 332 , a plurality of traces 334 and a plurality of outer pins 336 . The conductive plugs 320 are electrically connected to the inner pins 332 respectively, and the outer pins 336 are adapted to be electrically connected to other circuit elements through appropriate external connection terminals.

芯片340具有主动表面342,并且芯片340还具有位于主动表面342上的多个凸块344,其中这些凸块344例如是金凸块、两阶段(B stage)导电凸块或是其它的导电凸块。这些凸块344分别与这些导电插塞320电连接,以使得芯片340可以通过凸块344、导电插塞320、内引脚332、迹线334以及外引脚336来与芯片封装体300以外的电路元件电连接。The chip 340 has an active surface 342, and the chip 340 also has a plurality of bumps 344 on the active surface 342, wherein these bumps 344 are, for example, gold bumps, two-stage (B stage) conductive bumps, or other conductive bumps. piece. These bumps 344 are electrically connected with these conductive plugs 320 respectively, so that the chip 340 can communicate with other parts of the chip package 300 through the bumps 344, the conductive plugs 320, the inner pins 332, the traces 334 and the outer pins 336. The circuit elements are electrically connected.

承上述,本实施例将芯片340电连接于导电插塞320的方法是先将热压机的压头160压合于内引脚332上。通过压头160施加于内引脚332的压力以及热量,使得芯片340电连接于导电插塞320。更详细地说,由于内引脚332以及导电插塞320均由金属材质所形成,且凸块与导电插塞是直接完全重叠,或者是部分重叠,因此自压头160所输出的热量可通过内引脚332以及导电插塞320而更快速、直接地传导至凸块344。如此一来,导电插塞320以及凸块344的温度便能够被快速地提高至热压所需的温度,并且完成导电插塞320以及凸块344之间的连结。Based on the above, the method for electrically connecting the chip 340 to the conductive plug 320 in this embodiment is to firstly press the pressure head 160 of the heat press onto the inner pin 332 . The chip 340 is electrically connected to the conductive plug 320 through the pressure and heat applied by the indenter 160 to the inner pin 332 . In more detail, since the inner pin 332 and the conductive plug 320 are both made of metal material, and the bump and the conductive plug are directly completely overlapped or partially overlapped, the heat output from the pressure head 160 can pass through The inner pin 332 and the conductive plug 320 are more quickly and directly conducted to the bump 344 . In this way, the temperature of the conductive plug 320 and the bump 344 can be rapidly increased to the temperature required by the thermal pressing, and the connection between the conductive plug 320 and the bump 344 is completed.

此外,芯片封装体300还可以包括封装胶体350,其中封装胶体350的材质为树脂(resin)或是其它种类的保护树脂。封装胶体350设置于第二表面314上,并且围绕于芯片340的周围。此外,封装胶体350还填充于芯片340与可挠曲性基板310之间的间隙。封装胶体350具有开口352,其中开口352暴露出芯片340之相对于主动表面342的背面346。如此一来,芯片340所发出的热量的部分便可以通过开口352而与外界环境进行热交换。本实施例形成封装胶体350的方法是通过点胶机(dispensingtool)将液态的封装胶体350设置于芯片340的周围,以使封装胶体350填充于芯片340与可挠曲性基板310之间的间隙。之后,将液态的封装胶体350固化,而得到固态的封装胶体350。值得注意的是,由于本实施例的线路层330是位于第一表面312上,并且在第二表面314上不具有迹线或是引脚,因此与公知技术相比而言,本实施例的封装胶体350在芯片340与可挠曲性基板310之间的间隙流动时不会受到迹线或是引脚的阻碍。是以封装胶体350会受到较小的流动阻力。In addition, the chip package 300 may further include an encapsulant 350 , wherein the material of the encapsulant 350 is resin or other types of protective resin. The encapsulant 350 is disposed on the second surface 314 and surrounds the chip 340 . In addition, the encapsulant 350 also fills the gap between the chip 340 and the flexible substrate 310 . The encapsulant 350 has an opening 352 , wherein the opening 352 exposes the backside 346 of the chip 340 opposite to the active surface 342 . In this way, part of the heat emitted by the chip 340 can exchange heat with the external environment through the opening 352 . The method of forming the encapsulant 350 in this embodiment is to place the liquid encapsulant 350 around the chip 340 by a dispensing tool, so that the encapsulant 350 fills the gap between the chip 340 and the flexible substrate 310 . Afterwards, the liquid encapsulant 350 is cured to obtain a solid encapsulant 350 . It should be noted that since the circuit layer 330 of this embodiment is located on the first surface 312, and there is no trace or lead on the second surface 314, compared with the known technology, the circuit layer 330 of this embodiment When the encapsulant 350 flows in the gap between the chip 340 and the flexible substrate 310 , it will not be hindered by traces or leads. Therefore, the encapsulant 350 will experience less flow resistance.

图5是本发明另一实施例之芯片封装体的剖面示意图。请共同参照图4与图5,芯片封装体301与芯片封装体300之间主要的差异在于,芯片封装体301的导电插塞320突出于第二表面314的突出部是焊垫324。详细地说,本发明主要的精神是在于导电插塞与凸块之间的完全重叠或是部分重叠,是以在上述的实施例中导电插塞320突出于第二表面314的突出部可以是半圆形突出部322、焊垫324或是其它种外型的突出结构。在导电插塞320与凸块344之间完全重叠或部分重叠,并且彼此电连接的情况下,导电插塞320也可以不突出于第二表面314外。FIG. 5 is a schematic cross-sectional view of a chip package according to another embodiment of the present invention. Please refer to FIG. 4 and FIG. 5 together. The main difference between the chip package 301 and the chip package 300 is that the protruding portion of the conductive plug 320 of the chip package 301 protruding from the second surface 314 is a solder pad 324 . In detail, the main spirit of the present invention lies in the complete overlap or partial overlap between the conductive plug and the bump, so in the above-mentioned embodiment, the protruding part of the conductive plug 320 protruding from the second surface 314 can be The semicircular protruding part 322 , the welding pad 324 or other types of protruding structures. In the case that the conductive plug 320 and the bump 344 completely overlap or partially overlap and are electrically connected to each other, the conductive plug 320 may not protrude from the second surface 314 .

另外,芯片封装体301还可以包括一层各向异性导电胶(ACP)或者是各向异性导电膜(ACF)360,以使得凸块344可以通过各向异性导电胶360内的导电粒子362而与焊垫324电连接。In addition, the chip package 301 can also include a layer of anisotropic conductive paste (ACP) or anisotropic conductive film (ACF) 360, so that the bumps 344 can pass through the conductive particles 362 in the anisotropic conductive paste 360. It is electrically connected to the pad 324 .

当然,本发明所提出的芯片封装体除了可以在芯片与可挠曲性基板之间设置一层各向异性导电胶外,还可以设置一层非导电聚合材质或是一层底胶于两者之间,其示意图分别如图6与图7所示。首先请参照图6,芯片封装体302与芯片封装体301之间主要的差异在于,芯片封装体302之芯片340与可挠曲性基板310之间是设置一层非导电聚合材质370。如此一来,本实施例便可以通过非导电聚合材质370受热固化后的体积会产生收缩的特性,使得焊垫324与凸块344之间的接合更为紧密。Of course, the chip package proposed by the present invention can not only have a layer of anisotropic conductive adhesive between the chip and the flexible substrate, but also a layer of non-conductive polymeric material or a layer of primer between the two. The schematic diagrams are shown in Figure 6 and Figure 7 respectively. First please refer to FIG. 6 , the main difference between the chip package 302 and the chip package 301 is that a layer of non-conductive polymer material 370 is disposed between the chip 340 and the flexible substrate 310 of the chip package 302 . In this way, in this embodiment, the volume of the non-conductive polymer material 370 shrinks after being heated and solidified, so that the bond between the solder pad 324 and the bump 344 is tighter.

请参照图7,芯片封装体303与芯片封装体301之间主要的差异在于芯片封装体303之芯片340与可挠曲性基板310之间是设置一层底胶380,其中底胶380将这些凸块包覆于其内。如此一来,底胶380便可以作为芯片340与可挠曲性基板310之间的缓冲,以避免芯片340与可挠曲性基板310之间的电连接关系受到热应力的作用而遭到破坏。此外,在本实施例中焊垫324与凸块344之间还可以设置一层导电胶或金属390,以使得焊垫324通过导电胶390来与凸块344电连接。当然,上述实施例并非用以限定本发明,在本发明之其它实施例中还可以在芯片340与可挠曲性基板310之间设置一层两阶段性胶或是其它种类的间隙物(interposer)。Please refer to FIG. 7 , the main difference between the chip package 303 and the chip package 301 is that a layer of primer 380 is provided between the chip 340 of the chip package 303 and the flexible substrate 310, wherein the primer 380 covers these The bump is covered inside. In this way, the primer 380 can serve as a buffer between the chip 340 and the flexible substrate 310, so as to prevent the electrical connection between the chip 340 and the flexible substrate 310 from being damaged by thermal stress. . In addition, in this embodiment, a layer of conductive glue or metal 390 may be disposed between the pad 324 and the bump 344 , so that the pad 324 is electrically connected to the bump 344 through the conductive glue 390 . Of course, the above-mentioned embodiments are not intended to limit the present invention. In other embodiments of the present invention, a layer of two-stage glue or other types of interposer (interposer) can also be provided between the chip 340 and the flexible substrate 310. ).

由于本发明之芯片和内引脚分别位于可挠曲性基板的相对两侧,并且由于导电插塞是直接与凸块电接触,因此当本发明通过热压工艺而使芯片通过凸块而电连接于导电插塞时,凸块的温度可以快速地升高到热压所需的温度。是以在不伤害可挠曲性基板的条件下,本发明可以快速地并且确实地将芯片电连接于内引脚。Since the chip and the inner pins of the present invention are respectively located on opposite sides of the flexible substrate, and since the conductive plugs are in direct electrical contact with the bumps, when the chip passes through the bumps and electrically When connected to the conductive plug, the temperature of the bump can be quickly raised to the temperature required for thermal pressing. Therefore, under the condition of not damaging the flexible substrate, the present invention can quickly and surely electrically connect the chip to the inner pin.

另外,由于本发明之芯片与可挠曲性基板之间仅具有多个凸块,因此形成封装胶体的时候,液态的封装胶体可以充分地充满芯片与可挠曲性基板之间的间隙。In addition, since there are only a plurality of bumps between the chip and the flexible substrate of the present invention, when forming the encapsulant, the liquid encapsulant can fully fill the gap between the chip and the flexible substrate.

虽然本发明已以较佳实施例披露如上,然其并非用以限定本发明,任何所属技术领域的技术人员,在不脱离本发明之精神和范围内,当可作些许之更动与改进,因此本发明之保护范围当视权利要求所界定者为准。Although the present invention has been disclosed above with preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art may make some modifications and improvements without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention should be defined by the claims.

Claims (14)

1. chip packing-body is characterized in that comprising:
Flexible foundation plate has each other relative first surface and the second surface;
A plurality of conductive plungers run through this flexible foundation plate;
Line layer is positioned on this first surface, and this line layer has a plurality of interior pins, and above-mentioned these interior pins are electrically connected with above-mentioned these conductive plungers respectively; And
Chip, have active surface and be positioned at a plurality of projections on this active surface, wherein this chip is arranged on this second surface of this flexible foundation plate, and engage with above-mentioned these conductive plungers by above-mentioned these projections, above-mentioned each projection conductive plunger pairing with it is overlapping wholly or in part, and the composition surface of above-mentioned each projection and described chip is can conductive plunger pairing with it overlapping wholly or in part.
2. chip packing-body according to claim 1 is characterized in that this line layer also comprises many traces and a plurality of outer pin, and above-mentioned these traces are to be connected between above-mentioned these interior pins and above-mentioned these outer pins.
3. chip packing-body according to claim 1 is characterized in that also comprising anisotropy conductiving glue, is arranged between this flexible foundation plate and this chip, so that above-mentioned these projections are electrically connected with above-mentioned these conductive plungers.
4. chip packing-body according to claim 1 is characterized in that also comprising anisotropic conductive film, is arranged between this flexible foundation plate and this chip, so that above-mentioned these projections are electrically connected with above-mentioned these conductive plungers.
5. chip packing-body according to claim 1 is characterized in that also comprising two stage property glue material, is arranged between this flexible foundation plate and this chip, so that above-mentioned these projections are electrically connected with above-mentioned these conductive plungers.
6. chip packing-body according to claim 1 is characterized in that above-mentioned these projections are two stage conductive projections.
7. chip packing-body according to claim 1 is characterized in that also comprising conducting resinl or metal, be arranged between projection and the conductive plunger, by this conducting resinl or metal so that above-mentioned these projections be electrically connected with above-mentioned these conductive plungers.
8. chip packing-body according to claim 1, it is characterized in that also comprising non-conductive polymerization material, be arranged between this flexible foundation plate and this chip,, make above-mentioned these projections be electrically connected on above-mentioned these conductive plungers with by the retractable property after the hot curing of non-conductive polymerization material.
9. chip packing-body according to claim 1 is characterized in that also comprising primer, is arranged between this flexible foundation plate and this chip, to envelope above-mentioned these projections.
10. chip packing-body according to claim 1 is characterized in that above-mentioned these conductive plungers also protrude in outside this second surface.
11. chip packing-body according to claim 1 is characterized in that also comprising that packing colloid is arranged on this second surface, to envelope this chip.
12. chip packing-body according to claim 11 it is characterized in that this packing colloid has opening, and this chip has and this active surface opposing backside surface, and this opening exposes this back side of this chip.
13. chip packing-body according to claim 1, the material that it is characterized in that this flexible foundation plate is a macromolecule material.
14. chip packing-body according to claim 13, the material that it is characterized in that this flexible foundation plate is a policapram.
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