CN100461126C - Computer peripheral interface testing device - Google Patents

Abstract

The invention provides a computer peripheral interface testing device which comprises a hard disk drive testing module and an optical drive testing module. The hard disk drive test module comprises: the connector can be electrically connected with a hard disk drive interface of a computer so as to test the hard disk drive interface by means of a program. The optical drive testing module comprises: the hard disk drive testing module comprises a substrate, a first connector electrically connected with the hard disk drive testing module, and a second connector electrically connected with the first connector. The second connector is electrically connected with the optical drive interface of the computer so as to test the optical drive interface by means of a program.

Description

Computer Peripheral Interface Test Device

technical field

The invention relates to a test device for computer peripherals, in particular to a test device for testing the interface between a hard disk drive and an optical drive.

Background technique

Generally speaking, the method of testing the hard disk drive and optical drive in the prior art is to use the actual hard drive and optical drive for testing, because the finished products of the hard drive and optical drive are directly consumed, which makes the test cost relatively high.

The prior art also has a way to replace the actual hard disk drive or optical drive. After the PATA (Parallel ATA) transmission interface or SATA (Serial ATA) transmission interface of the hard disk drive or optical drive is used, an interface adapter is used to electrically connect the memory card. The test program of the memory card is used to test the hard disk drive or optical drive. The disadvantage is that the function is simple, and no matter whether the test hard drive or optical drive is tested, its appearance and size are different from the actual hard drive or optical drive, causing the interface to be transferred during the test. It is inconvenient to connect or remove the device.

Contents of the invention

The main purpose of the present invention is to provide a kind of computer peripheral interface test device, utilize the test device of the present invention, can simulate the hard disk machine that meets the PATA transmission interface standard, the hard disk machine that meets the SATA transmission interface standard, and the hard disk drive that meets the PATA transmission interface standard. It can be tested under the conditions of hardware devices such as optical drives, avoiding direct consumption of actual hard drives or finished products of optical drives, so as to save testing costs.

Another main purpose of the present invention is to provide a computer peripheral interface testing device which is substantially the same size as the actual computer peripheral device, so that the test device can be easily disassembled during testing.

In order to achieve the above-mentioned purpose, the computer peripheral interface testing device of the present invention is used in a computer, the computer includes a hard disk drive interface and an optical drive interface, and the computer peripheral interface testing device includes a hard disk drive testing module, which is electrically connected to the memory card. The memory card stores at least one program, and the hard disk test module includes: a first substrate, a plurality of grooves, a memory card slot, a first connector and a second connector. The first substrate includes four sides, respectively the first side, the second side, the third side and the fourth side; a plurality of grooves are located around the substrate to fix the first substrate; the memory card slot is provided On the first substrate, it is used to accommodate the memory card; the first connector is located on the second side, and the first connector is electrically connected to the memory card slot; thereby, when the first connector interfaces with the hard disk drive of the computer When electrically connected, the interface of the hard disk can be tested by the at least one program; the second connector is located on the fourth side, and the second connector is electrically connected to the memory card slot, so that when the first When the two connectors are electrically connected with the hard disk interface of the computer, the hard disk interface can be tested by the at least one program.

The computer peripheral interface testing device, when testing the optical drive, includes the optical drive testing module in addition to the hard disk drive testing module, and the module includes: a second substrate, a fourth connector, and a fifth connector. The second substrate includes four sides, respectively the first side, the second side, the third side and the fourth side; the fourth connector is located on the first side of the second substrate, and the fourth connector and The first connector of the hard disk test module is electrically connected so that the second substrate is combined with the first substrate; the fifth connector is located on the third side of the second substrate, and the fifth connector is electrically connected to the fourth connector. connected, so that when the fifth connector is electrically connected with the optical drive interface of the computer, the optical drive interface can be tested by at least one program.

Description of drawings

FIG. 1 is a top view of a hard disk test module of the present invention.

FIG. 2 is a top view of the optical drive test module of the present invention.

Fig. 3 is a top view of the combination of the hard disk test module and the optical drive test module of the present invention.

Fig. 4 is a schematic diagram of the audio signal generation circuit of the optical drive test module of the present invention.

Component representative symbol description

HDD Test Module 1

First Substrate 10

First Side of Hard Drive Test Module 101

second side of hard drive test module 102

Third side of the HDD test module 103

Fourth Side of Hard Drive Test Module 104

first connector 11

Second connector 12

Third connector 13

memory card slot 14

Groove 15, 16, 17, 18

Optical Drive Test Module 2

Second Substrate 20

First side of the optical drive test module 201

Second side of the optical drive test module 202

third side of the optical drive test module 203

Fourth Side of the Optical Drive Test Module 204

Fourth connector 21

Fifth connector 22

Sixth connector 23

Seventh connector 24

Audio signal generation line 25

Oscillation circuit 26

First divider line 27

Second divider line 28

Detailed ways

In order to better understand the technical content of the present invention, specific embodiments are given and described as follows with accompanying drawings.

FIG. 1 is a top view of a hard disk drive test module of the present invention, and FIG. 2 is a top view of an optical drive test module of the present invention. The computer peripheral testing device of the present invention includes a hard disk drive testing module 1 as shown in FIG. 1 and an optical drive testing module 2 as shown in FIG. 2 . When testing a hard disk drive, use the hard disk drive test module 1; when testing an optical drive, use the hard drive test module 1 together with the optical drive test module 2. The hard disk test module 1 and the optical drive test module 2 will be described respectively below.

Please refer to FIG. 1 , which is a top view of a hard disk drive testing module 1 according to a first embodiment of the present invention. The overall appearance of the hard disk test module 1 is substantially the same as the size of the actual hard disk, so that the hard disk test module 1 is placed in the position of the hard disk drive of the computer. The hard disk test module 1 includes a first substrate 10, a groove 15 , 16 , 17 , 18 , memory card slot 14 , first connector 11 , second connector 12 and third connector 13 . The first substrate 10 includes four sides, respectively the first side 101, the second side 102, the third side 103 and the fourth side 104 of the first substrate 10; a plurality of grooves 15, 16, 17 , 18 are located around the first base plate 10 for fixing the hard disk drive test module 1; the memory card slot 14 is arranged on the first base plate 10 for accommodating a memory card (not shown); the first connector 11 is located at the first base plate 10 On the two sides 102, the first connector 11 is electrically connected to the memory card slot.

In this way, when the first connector 11 is electrically connected to a hard disk interface (not shown) of a computer, the hard disk interface can be tested by at least one program. The at least one program may include, for example, a boot program, a test program, etc., and the at least one program is stored in a memory card, and the memory card is electrically connected to the hard disk test module 1 . It should be noted here that the memory card is not a part of the hard disk test module 1 of the present invention, but an external device that can be installed in the memory card slot 14 and electrically connected to the memory card slot 14 .

Since the current hard disk interface mainly includes the hard disk interface of the 2.5-inch hard disk and the hard disk interface of the 1.8-inch hard disk, the hard disk data transmission interface standard mainly includes the PATA (Parallel ATA) interface standard and the SATA (Serial ATA) interface standard. Different types of hard disk interfaces for different hard disks, or the requirement that the hard disk has multiple hard disk interfaces at the same time, so the first substrate 10 of this embodiment has multiple connectors of different types at the same time, so that only the same hard disk can be used. The machine test module 1 can carry out the test of different hard disk machine interfaces. The first substrate 10 of this embodiment includes a first connector 11, a second connector 12, and a third connector 13, which are currently commonly used interface specifications. The first connector 11 is located on the second side 102, and the second connector 12 is located on the fourth side 104 , and the third connector is located on the third side 103 . The first connector 11, the second connector 12 and the third connector 13 are connectors of different specifications, which are suitable for different types of hard disk drive interfaces. Among the three connectors 13, a connector matching the specifications of the hard disk interface (not shown) of the computer is selected, and the matched connector is electrically connected with the hard disk interface, so as to test the hard disk interface. In this embodiment, the first connector 11 can be electrically connected to a 2.5-inch hard disk interface conforming to the PATA transmission interface standard, and the second connector 12 can be electrically connected to a 2.5-inch hard disk interface conforming to the SATA transmission interface standard. The third connector 13 can be electrically connected with a 1.8-inch hard disk interface conforming to the PATA transmission interface standard.

It should be noted that in this embodiment, there are three connectors of different specifications, but the number of connectors can also be one, two or four. When the connector is only a first connector 11, the first connector 11 can be: it can be electrically connected with a 2.5-inch hard disk drive interface conforming to the PATA transmission interface standard, and can be electrically connected with a 2.5-inch hard disk drive conforming to the SATA transmission interface standard The interface is electrically connected, and can be electrically connected with a 1.8-inch hard disk drive interface conforming to the PATA transmission interface standard or can be electrically connected with a 1.8-inch hard disk drive interface conforming to the PATA transmission interface standard. At this time, the hard disk test device 1 can only be used for A single type of hard drive interface. When there are two or four connectors, select different types of connector interfaces according to the commonly used specifications of the hard disk drive interface to be tested. When there are four connectors, one connector can be placed on one side, or two connectors can also be placed on one side if the side length permits.

Then please refer to FIG. 2 and FIG. 3 for the structure of the optical drive test module 2. FIG. 2 is a top view of the optical drive test module of the present invention, and FIG. Top view when combined. When testing the optical drive, the first substrate 10 and the second substrate 20 must be combined before testing the optical drive.

Please refer to FIG. 2 , which is a top view of the optical drive testing module 2 . The optical drive test module 2 includes a second substrate 20 , a fourth connector 21 , a fifth connector 22 , a sixth connector 23 , and a seventh connector 24 . The second substrate 20 includes four sides, namely a first side 201 , a second side 202 , a third side 203 and a fourth side 204 of the second substrate 20 .

The fourth connector 21 is located on the first side 201 of the second substrate 20, the fourth connector 21 can be electrically connected with the first connector 11 of the hard disk drive test module, and makes the second substrate 20 and the first substrate 10 In combination, the combined length and width of the second substrate 20 and the first substrate 10 are substantially the same as the length and width of the actual optical drive, so that it can be placed in the position where the optical drive is accommodated in the computer.

The fifth connector 22 is located on the third side 203 of the second substrate 20 , and the fifth connector 22 is electrically connected to the fourth connector 21 . When the fourth connector 21 of the second substrate 20 is combined with the first connector 11 of the first substrate 10, it is electrically connected to the optical drive interface (not shown) of the computer through the fifth connector 22. At least one program tests the optical drive interface.

The sixth connector 23 is located on the third side 203 of the second substrate 20, the sixth connector 23 can be electrically connected with the first connector 11 of the first substrate 10, and makes the second substrate 20 and the first substrate 10 In combination, the combined length and width of the second substrate 20 and the first substrate 10 are substantially the same as the length and width of the actual optical drive, so that it can be placed in the position where the optical drive is accommodated in the computer.

The seventh connector 24 is located on the first side 201 of the second substrate 20 , and the seventh connector 24 is electrically connected to the sixth connector 23 . When the fourth connector 21 of the second substrate 20 is combined with the first connector 11 of the first substrate 10, it is electrically connected to the optical drive interface (not shown) of the computer through the seventh connector 24, by at least A program to test the optical drive interface. In this embodiment, the fourth connector 21 can be electrically connected with a 2.5-inch hard disk drive interface conforming to the PATA transmission interface standard, the fifth connector 22 can be electrically connected with the optical drive interface conforming to the PATA transmission interface standard, and the sixth connection The connector 23 can be electrically connected with a 2.5-inch hard disk drive interface conforming to the PATA transmission interface standard, and the seventh connector 24 can be electrically connected with an optical drive interface conforming to the PATA transmission interface standard. The fourth connector 21 and the fifth connector 22 form a group, and the sixth connector 23 and the seventh connector 24 form a group. When performing an optical drive test, one group is selected from the two groups. At this time, the first substrate The first connector 11 of 10 must be electrically connected with the fourth connector 21 or the sixth connector 23 of the second substrate 20, so the fourth connector 21 and the sixth connector 23 have the same specifications. In this embodiment Among them, both the fourth connector 21 and the sixth connector 23 can be electrically connected with a 2.5-inch hard disk drive interface conforming to the PATA transmission interface standard. The purpose of using two groups is to be applicable to two kinds of optical drive connection interfaces, such as the fifth connector 22 and the seventh connector 24, although both are PATA transmission interfaces suitable for optical drives, but the fifth connector 22 is a male connector. , the seventh connector 24 is a female connector. In addition, the fourth connector 21 matches the specifications of the first connector 11 of the first substrate 10, the first connector 11 is a male joint, and the fourth connector 21 is a female joint, and the fourth connector 21 is connected to the first The device 11 is electrically connected to combine the first substrate 10 and the second substrate 20 . Similarly, the sixth connector 23 matches the specifications of the first connector 11 of the first substrate 10, the first connector 11 is a male joint, and the sixth connector 23 is a female joint. By means of the sixth connector 23 and the first The connector 11 is electrically connected to combine the first substrate 10 and the second substrate 20 .

When testing the optical drive, since the test program stored in the memory card does not support the analog audio signal output function, the optical drive test module must additionally be provided with an audio signal generating circuit 25 . Please refer to FIG. 4 , which is a schematic diagram of the audio signal generating circuit 25 . The audio signal generating circuit 25 is disposed on the second substrate 20 , and the audio signal generating circuit is electrically connected to the fifth connector 22 and the seventh connector 24 . The audio signal generation circuit 25 includes an oscillation circuit 26, a first frequency division circuit 27 and a second frequency division circuit 28, wherein the oscillation circuit 26 is electrically connected to the first frequency division circuit 27, and the first frequency division circuit 27 is connected to the second frequency division circuit. The line 28 is electrically connected. The purpose of using the frequency division circuit is to reduce the frequency generated by the oscillating circuit to the hearing range of the human ear (approximately between 10Hz and 10kHz), and the purpose of using two frequency division circuits is to generate high and low frequencies that can be distinguished by the human ear. Outputting audio signals, the output audio signals of different frequencies are respectively output to the left channel and the right channel of the output device (such as headphones or speakers), so as to test whether the audio signal output of the optical drive is normal. In this embodiment, the oscillating line can generate a 32kHz audio signal, and the first frequency division line can reduce the audio signal to a quarter of the original, so the 32kHz audio signal generates an 8kHz audio signal after passing through the first frequency division line , connect the signal to the right channel, which is a relatively high-frequency signal. The 8kHz audio signal generated after passing through the first frequency division line, and then through the second frequency division line that can reduce the audio frequency to one-eighth of the original, generates a 1kHz audio signal, which is connected to the left channel to form a relatively low frequency signals. At this time, since the output frequencies of the left and right audio channels are different, it is easy to distinguish whether the output of the left and right audio channels is normal by human ears. It should be noted that the oscillation circuit is not limited to generate 32kHz audio signal, the first frequency division circuit is not limited to the frequency division circuit that can reduce the audio signal to a quarter of the original frequency, and the second frequency division circuit is not limited to the frequency division circuit that can Reduce the audio signal to one-eighth of the original frequency division line, as long as the final frequency is within the range that the human ear can distinguish, the left channel and the right channel have two different frequencies, and are relatively high frequency and low frequency. , should be within the scope of the present invention.

It should be noted that the aforementioned fourth connector 21 and sixth connector 23 can also be male connectors. If the fourth connector 21 is a male connector, the first connector 11 is a female connector; similarly, the six connectors If 21 is a male connector, the first connector 11 is a female connector. In addition, the fourth connector 21 and the sixth connector 23 can also be other specifications except for the specifications that can be electrically connected with the 2.5-inch hard disk drive interface conforming to the PATA transmission interface standard, but when the fourth connector 21 and the sixth connector When the six connectors 23 have different specifications, the first connector 11 on the first substrate 10 electrically connected to the fourth connector 21 or the sixth connector 23 must use the corresponding specification, for example, when the fourth connector When 21 and the sixth connector 23 are connectors that can be electrically connected to a 2.5-inch hard drive interface conforming to the SATA transmission interface standard, the first connector 11 must also use a 2.5-inch hard drive interface that can conform to the SATA transmission interface standard Electrically connected connectors. In addition, the second substrate 20 may not include the sixth connector 23 and the seventh connector 24, but only the fourth connector 21 and the fifth connector 22 are provided. In this case, the fourth connector 21 and the fifth connector 22 is connected to a single type of optical drive interface.

It should also be noted that the first substrate 10 of the hard disk drive test module 1 and the second substrate 20 of the optical drive test module 2 of the present invention can be printed circuit boards, but can also be other types of substrates. In addition, the first connector 11, the second connector 12, the third connector 13, the fourth connector 21, the fifth connector 22, the sixth connector 23, and the seventh connector 24, in addition to the above specifications, If there are other specifications that can be used as connectors, it should also fall within the scope of the present invention.

In addition, the hard disk drive test module 1 or the optical drive test module 2 can additionally add a thin shell-shaped outer frame (not shown), the outer frame surrounds the substrate and is perpendicular to the substrate, and the height of the outer frame is substantially the same as the actual The thickness of the hard disk drive or the optical drive is the same. At this time, the hard drive test module 1 and the actual hard drive, or the optical drive test module 2 and the actual optical drive, not only have the same length and width, but also have the same height, so the convenience of the test process can be improved. and efficiency.

To sum up, the present invention shows its characteristics that are very different from the traditional technology in terms of purpose, means and efficacy. However, it should be noted that the above-mentioned embodiments are only illustrative to illustrate the principles and effects of the present invention, and are not intended to limit the scope of the present invention. Anyone in the industry can modify and change the embodiments without violating the technical principle and spirit of the present invention. The protection scope of the present invention should be described in the claims.

Claims (21)

1. A computer peripheral interface testing device is used in a computer, and the computer peripheral interface testing device includes a hard disk drive test module, which is electrically connected to a memory card, the memory card stores at least one program, and the hard disk Machine testing modules include: A first substrate, including a first side, a second side, a third side and a fourth side; a memory card slot, disposed on the first substrate, for accommodating the memory card; and A first connector is located on the second side, and the first connector is electrically connected with the memory card slot, whereby when the first connector is electrically connected with a hard disk drive interface of the computer, the hard drive interface can be tested by the at least one program; A second connector is located on the fourth side, and the second connector is electrically connected with the memory card slot, whereby when the second connector is electrically connected with the hard disk drive interface of the computer, The hard disk drive interface is tested by the at least one program. 2. The test device according to claim 1, wherein the first substrate is a printed circuit board. 3. The testing device according to claim 1, wherein the hard disk drive testing module further comprises a plurality of grooves located around the first substrate for fixing the first substrate. 4. The test device according to claim 1, wherein the first connector is a connector conforming to the PATA transmission interface standard. 5. The test device according to claim 1, wherein the first connector is a connector conforming to the SATA transmission interface standard. 6. The test device according to claim 4 or 5, wherein the hard disk interface electrically connected to the first connector is a hard disk interface of a 2.5-inch hard disk. 7. The testing device according to claim 4 or 5, wherein the hard disk interface electrically connected to the first connector is a hard disk interface of a 1.8-inch hard disk. 8. The test device according to claim 4, wherein the second connector is a connector conforming to the SATA transmission interface standard. 9 . The testing device according to claim 8 , wherein the hard disk interface electrically connected to the first connector and the second connector is a hard disk interface of a 2.5-inch hard disk. 10. The test device according to claim 9, wherein the hard disk test module further comprises a third connector located on the third side, wherein the hard disk electrically connected to the third connector The machine interface is a hard disk interface of a 1.8-inch hard disk, and the third connector is electrically connected with the memory card slot; thereby, when the third connector is electrically connected with the hard disk interface of the computer, it can be used The hard disk drive interface is tested by the at least one program. 11. The test device according to claim 10, wherein the third connector is a connector conforming to the PATA transmission interface standard. 12. The test device according to claim 10, wherein the third connector is a connector conforming to the SATA transmission interface standard. 13. The test device according to claim 1, further comprising an optical drive test module, the optical drive test module comprising: A second substrate, including a first side, a second side, a third side and a fourth side; a fourth connector, located on the first side of the second substrate, the fourth connector is electrically connected to the first connector of the hard disk test module, so that the second substrate and the first substrate Combine; a fifth connector, located on the third side of the second substrate, the fifth connector is electrically connected to the fourth connector; an audio signal generating line is arranged on the second substrate, and the audio signal generating line is electrically connected to the fifth connector; Thereby, when the fifth connector is electrically connected with an optical drive interface of the computer, the optical drive interface can be tested by the at least one program. 14. The test device according to claim 13, wherein the audio signal generating circuit comprises an oscillating circuit, a first frequency dividing circuit and a second frequency dividing circuit, wherein the oscillating circuit and the first frequency dividing The circuit is electrically connected, and the first frequency division circuit is electrically connected with the second frequency division circuit. 15. The testing device according to claim 14, characterized in that, the oscillating circuit can generate a 32kHz audio signal, the first frequency division circuit can reduce the audio signal to a quarter of its original value, and the second frequency division circuit The line reduces the audio signal by one-eighth. 16. The test device according to claim 13, wherein the second substrate is a printed circuit board. 17. The test device according to claim 13, wherein the fourth connector is a connector conforming to the PATA transmission interface standard. 18. The test device according to claim 13, wherein the fourth connector is a connector conforming to the SATA transmission interface standard. 19. The testing device according to claim 13, wherein the fifth connector is a male connector. 20. The testing device according to claim 13, wherein the fifth connector is a female connector. 21. The test device according to claim 19, further comprising: a sixth connector located on the third side of the second substrate; a seventh connector, located on the first side of the second substrate, the seventh connector is electrically connected to the sixth connector, and the seventh connector is a female connector; Thereby, when the seventh connector is electrically connected with the optical drive interface of the computer, the optical drive interface can be tested by the at least one program.

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