CN100452130C - Short-circuit detecting device and picture element unit and display panel using the device - Google Patents
Short-circuit detecting device and picture element unit and display panel using the device Download PDFInfo
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- CN100452130C CN100452130C CNB2007100002651A CN200710000265A CN100452130C CN 100452130 C CN100452130 C CN 100452130C CN B2007100002651 A CNB2007100002651 A CN B2007100002651A CN 200710000265 A CN200710000265 A CN 200710000265A CN 100452130 C CN100452130 C CN 100452130C
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- 230000002950 deficient Effects 0.000 claims description 15
- 239000000758 substrate Substances 0.000 claims description 14
- 239000004973 liquid crystal related substance Substances 0.000 claims description 7
- 230000007547 defect Effects 0.000 abstract 3
- 238000001514 detection method Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 10
- 239000002245 particle Substances 0.000 description 7
- 238000004891 communication Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
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Abstract
A short-circuit detection device for detecting pixel unit is prepared as forming said pixel unit by pixel electrode, scan electrode, common voltage electrode, data electrode and at least one redundant electrode; generating cross form defect at short-circuit position when pixel unit is on array test so that user can quickly find out defect position and can have defect repaired quickly.
Description
Technical field
The present invention relates to a kind of pick-up unit, and the particularly a kind of short-circuit detecting device that can find out location of short circuit on display panel.
Background technology
Be the epoch of a 3C at present, epoch of computing machine (Computer), communication (Communication) and consumption electronic products (Consumer electronics) just.Under such guiding, there are many a feast for the eyes information equipments constantly to be pushed out on the market, for example, mobile phone, PDA, GPS, digital camera and display etc.Wherein, most information equipment all is as main communication interface with flat-panel screens.
Yet, in display device in the past, nearly all be based on cathode-ray tube (CRT).Because the progress of semiconductor process techniques in recent years, make LCD compared to traditional cathode-ray tube (CRT) have gently, advantage such as thin, short, little and low consumpting power.Therefore, LCD is occupied sizable ratio in demonstration market.
Fig. 1 is the circuit diagram of prior art pixel cell.Please refer to Fig. 1, the pixel cell 100 of prior art comprises scan electrode 102, common voltage electrode 104, data electrode 106 and pixel electrode 108.Generally speaking, scan electrode 102 has different current potentials with common voltage electrode 104.Yet, in semiconductor technology,, can make these two electrodes form short circuit if there is particle (shown in 110) to fall on scan electrode 102 and the common voltage electrode 104.
Fig. 2 for the prior art pixel cell through the test result after the array test.Please refer to Fig. 2, when the pixel cell of prior art has defective for example shown in Figure 1, can make two electrodes form short circuits, and at pixel cell during in array test (array test) or liquid crystal born of the same parents tests (cell test), produce a horizontal flaw indication, shown in 210.But, according to this horizontal flaw indication 210, and can't be fast and the position of accurately finding out defective pixels, cause the time lengthening tested and the increase of cost.
Summary of the invention
Purpose of the present invention just provides a kind of display panel and pixel cell thereof, when display panel is done array test or liquid crystal born of the same parents and is tested, and can be fast and accurately find out the defective pixels unit.
From another viewpoint, of the present inventionly just provide a kind of short-circuit detecting device, can detect display panel and be short-circuited at scan electrode and common voltage electrode, or the situation that is short-circuited of pixel electrode and scan electrode.
The present invention proposes a kind of pixel cell, and it is disposed on the substrate.Pixel cell comprises pixel electrode, scan electrode, common voltage electrode, data electrode and at least one redundant electrode.Wherein, redundant electrode is disposed between pixel electrode and the scan electrode, and be disposed between scan electrode and the common voltage electrode the two at least one of them, and couple data electrode.
From another viewpoint, the present invention proposes a kind of display panel, comprises substrate, multiple display area and at least one redundant electrode.Wherein, multiple display area is disposed on the substrate, and each viewing area is surrounded by data electrode, scan electrode and common voltage electrode, and all disposes a pixel electrode in each viewing area.In addition, redundant electrode couple these data electrodes one of them, and be disposed between pixel electrode and the scan electrode, and be disposed between scan electrode and this common voltage electrode the two at least one of them.
From another viewpoint, the present invention proposes a kind of short-circuit detecting device, is suitable for detecting in a display panel, whether has scan electrode and the common voltage electrode is short-circuited, or pixel electrode and scan electrode are short-circuited.And short-circuit detecting device comprises redundant electrode and attachment plug.Wherein, redundant electrode couples and one of is configured in the display panel data electrode, and is configured between pixel electrode and the scan electrode, and be configured between scan electrode and the common voltage electrode the two at least one of them, and redundant electrode has a hole.In addition, in hole, also comprise an attachment plug, in order to redundant electrode is coupled to the substrate of display panel.
In sum, the present invention can be by being configured between pixel electrode and the scan electrode, and be disposed between scan electrode and the common voltage electrode the two redundant electrode of one of them at least, and can be fast and accurately find out on the display panel locations of pixels that defective takes place, make that the user can be more efficiently with its repairing.
State with other purpose, feature and advantage and can become apparent on the present invention for allowing, preferred embodiment cited below particularly, and conjunction with figs. are described in detail below.
Description of drawings
Fig. 1 is the circuit diagram of prior art pixel cell;
Fig. 2 for the prior art pixel cell through the test result after the array test;
Fig. 3 is the circuit diagram according to a kind of display panel of one of the present invention preferred embodiment;
Fig. 4 is the circuit diagram according to a kind of pixel cell of one of the present invention preferred embodiment;
Fig. 5 is the test result after the pixel cell of present embodiment is tested through array;
Fig. 6 is the circuit diagram according to the another kind of pixel cell of the present invention;
Fig. 7 is the circuit diagram according to the another kind of pixel cell of the present invention.
Wherein, Reference numeral is:
100,400,600,700: pixel cell
102,405: scan electrode
104,403: the common voltage motor
106,407: data electrode
108,409: pixel electrode
110,420,605,705,707: particle
210: horizontal flaw indication
300: display panel
303: substrate
305: the viewing area
413,601,701,703: redundant electrode
415: hole
417: attachment plug
501: cross flaw indication
Embodiment
Fig. 3 is the circuit diagram according to a kind of display panel of one of the present invention preferred embodiment.Please refer to Fig. 3, display panel 300 of the present invention comprises substrate 303 and a plurality of viewing area 305.Wherein, these viewing areas 305 are that mode with array is disposed on the substrate 303.
Fig. 4 is the circuit diagram according to a kind of pixel cell of one of the present invention preferred embodiment, goes for the viewing area of Fig. 3.Please refer to Fig. 4, pixel cell 400 of the present invention comprises common voltage electrode 403, scan electrode 405, pixel electrode 409, data electrode 407 and redundant electrode 413.Well known ground, the bearing of trend of the bearing of trend of scan electrode 405 and voltage electrode 403 jointly can be for parallel, and are vertical haply with the bearing of trend of data electrode 407, and do not contact with each other each other.Pixel electrode 409 then is disposed in the zone that scan electrode 405, data electrode 407 and common voltage electrode 403 surrounded.
Whether specifically, the present invention has also disposed the structure of a short-circuit detecting device on data electrode 407, to detect between scan electrode 405 and common voltage electrode 403, be short-circuited.Short-circuit detecting device provided by the present invention comprises a redundant electrode 413.Redundant electrode 413 then comprises a hole 415, and also disposes attachment plug 417 in the hole 415, by this redundant electrode 413 is coupled to substrate.In addition, in the present invention, common voltage electrode 403 is coupled to common voltage.
Please continue with reference to Fig. 4, in the technology of pixel cell 400,, then can cause scan electrode 405 and 403 short circuits of common voltage electrode if there is a particle (paticle) 420 to be attached to scan electrode 405 and common voltage electrode 403 simultaneously.In the present embodiment, because configuration one redundant electrode 413 between scan electrode 405 and the common voltage electrode 403, and redundant electrode 413 is coupled to data electrode 407.By this, when particle 420 is attached to scan electrode 405 and common voltage electrode 403 simultaneously, make scan electrode 405, common voltage electrode 403 and data electrode 407 three's short circuits.
Fig. 5 is the test result after the pixel cell of present embodiment is tested through array.Please merge with reference to Fig. 4 and Fig. 5, when pixel cell 400 is driven,, then can cause scan electrode 405, common voltage electrode 403 and data electrode 407 to have identical current potential if pixel cell 400 has the defective that for example Fig. 1 illustrated.Therefore, when the pixel cell 400 of defectiveness when doing array test (array test) or liquid crystal born of the same parents tests (cell test), can produce cross flaw indication 501.By this, the user can find out defective locations exactly according to cross flaw indication 501, and with its repairing.
Fig. 6 is the circuit diagram according to the another kind of pixel cell of the present invention, goes for the viewing area of Fig. 3.Please refer to Fig. 6, the assembly of identical numbering is wherein arranged with the pixel cell of Fig. 4, represent identical functions and principle of work.The pixel cell 600 and first embodiment of present embodiment do not exist together, for redundant electrode 601 is disposed between scan electrode 405 and the pixel electrode 409.In addition, when particle 605 is attached to scan electrode 405 and pixel electrode 409 simultaneously, know this operator when can be, push away to such an extent that the position of defective takes place according to the explanation of Fig. 4.
Fig. 7 is the circuit diagram according to the another kind of pixel cell of the present invention, goes for the viewing area of Fig. 3.Please refer to Fig. 7, the assembly of identical numbering is wherein arranged with the pixel cell of Fig. 4, represent identical functions and principle of work.The pixel cell 700 and first embodiment of present embodiment do not exist together, for redundant electrode 701 and 703 be disposed between scan electrode 405 and the pixel electrode 409 respectively and scan electrode 405 and common voltage electrode 403 between.In addition, be attached to scan electrode 405 and pixel electrode 409 simultaneously and be attached to scan electrode 405 simultaneously and during, know this skill person when can be, push away to such an extent that the position of defective takes place according to the explanation of Fig. 4 with common voltage electrode 403 as particle 705 and 707.
In sum, the pixel cell of the present invention's display panel comprises a redundant electrode at least, when particle is attached to any two electrodes of pixel cell, then can make the mutual short circuit of pixel electrode, scan electrode and data electrode.Therefore, when the pixel cell of defectiveness when doing array test (array test) or liquid crystal born of the same parents tests (cell test), can produce a cross flaw indication, by this, the user can be according to finding defective locations fast and with its repairing.
Though the present invention discloses as above with aforementioned preferred embodiment; right its is not in order to limit the present invention; under the situation that does not deviate from spirit of the present invention and essence thereof; those of ordinary skill in the art work as can make various corresponding changes and distortion according to the present invention, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.
Claims (11)
1. a pixel cell is disposed on the substrate, it is characterized in that, this pixel cell comprises:
One pixel electrode;
The one scan electrode;
One common voltage electrode;
One data electrode; And
At least one redundant electrode is disposed between this pixel electrode and this scan electrode, and be disposed between this scan electrode and this common voltage electrode the two at least one of them, and couple this data electrode;
When this redundancy electrode is disposed between this pixel electrode and this scan electrode, be used to detect this pixel electrode and whether this scan electrode is short-circuited; When this redundancy electrode is disposed between this scan electrode and this common voltage electrode, be used to detect this scan electrode and whether this common voltage electrode is short-circuited; And when the pixel cell of the defective of described short circuit is being array test or liquid crystal born of the same parents and is tested, produce cross flaw indication, thereby find out defective locations according to this cross flaw indication.
2. pixel cell according to claim 1 is characterized in that, the bearing of trend almost parallel of the bearing of trend of this common voltage electrode and this scan electrode.
3. pixel cell according to claim 1 is characterized in that, the bearing of trend approximate vertical of the bearing of trend of this data electrode and this scan electrode.
4. pixel cell according to claim 1 is characterized in that, this redundancy electrode comprises:
One hole, configuration one attachment plug in this hole will be being coupled to this substrate by the redundancy electrode.
5. a display panel is characterized in that, comprising:
One substrate;
A plurality of viewing areas be positioned on this substrate, and each viewing area are surrounded by a data electrode, one scan electrode and a common voltage electrode, and all dispose a pixel electrode in each viewing area; And
At least one redundant electrode, couple those data electrodes one of them, and be disposed between this pixel electrode and this scan electrode, and be disposed between this scan electrode and this common voltage electrode the two at least one of them;
When this redundancy electrode is disposed between this pixel electrode and this scan electrode, be used to detect this pixel electrode and whether this scan electrode is short-circuited; When this redundancy electrode is disposed between this scan electrode and this common voltage electrode, be used to detect this scan electrode and whether this common voltage electrode is short-circuited; And when the pixel cell of the defective of described short circuit is being array test or liquid crystal born of the same parents and is tested, produce cross flaw indication, thereby find out defective locations according to this cross flaw indication.
6 display panels according to claim 5 is characterized in that, the bearing of trend almost parallel of the bearing of trend of this common voltage electrode and this scan electrode.
7. display panel according to claim 5 is characterized in that, the bearing of trend approximate vertical of the bearing of trend of this data electrode and this scan electrode.
8. display panel according to claim 5 is characterized in that, this common voltage electrode is coupled to a common voltage.
9. display panel according to claim 5 is characterized in that, this redundancy electrode comprises:
One hole, configuration one attachment plug in this hole will be being coupled to this substrate by the redundancy electrode.
10. short-circuit detecting device is suitable for detecting in a display panel, whether has the one scan electrode and a common voltage electrode is short-circuited, or a pixel electrode and this scan electrode are short-circuited, and it is characterized in that this short-circuit detecting device comprises:
One redundant electrode couples a data electrode that is configured in this display panel, and is disposed between this pixel electrode and this scan electrode, and is disposed between this scan electrode and this common voltage electrode the two one of them, and should have a hole by the redundancy electrode; And
One attachment plug is disposed in this hole, in order to should the redundancy electrode to be coupled to the substrate of this display panel;
When this redundancy electrode is disposed between this pixel electrode and this scan electrode, be used to detect this pixel electrode and whether this scan electrode is short-circuited; When this redundancy electrode is disposed between this scan electrode and this common voltage electrode, be used to detect this scan electrode and whether this common voltage electrode is short-circuited; And when the pixel cell of the defective of described short circuit is being array test or liquid crystal born of the same parents and is tested, produce cross flaw indication, thereby find out defective locations according to this cross flaw indication.
11. short-circuit detecting device according to claim 10 is characterized in that, this display panel is a display panels.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2007100002651A CN100452130C (en) | 2007-01-16 | 2007-01-16 | Short-circuit detecting device and picture element unit and display panel using the device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2007100002651A CN100452130C (en) | 2007-01-16 | 2007-01-16 | Short-circuit detecting device and picture element unit and display panel using the device |
Publications (2)
| Publication Number | Publication Date |
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| CN101000736A CN101000736A (en) | 2007-07-18 |
| CN100452130C true CN100452130C (en) | 2009-01-14 |
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| CNB2007100002651A Expired - Fee Related CN100452130C (en) | 2007-01-16 | 2007-01-16 | Short-circuit detecting device and picture element unit and display panel using the device |
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Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101359105B (en) * | 2007-08-01 | 2011-01-12 | 比亚迪股份有限公司 | Method for detecting electrical property of conductivity lead wire of glass substrate of liquid crystal display |
| TWI369562B (en) | 2008-06-23 | 2012-08-01 | Au Optronics Corp | Lcd panel apparatus and testing method using the same |
| CN101900893B (en) * | 2009-05-26 | 2012-04-04 | 北京京东方光电科技有限公司 | Method for detecting foreign particles in LCD panel and LCD panel control circuit |
| WO2011096029A1 (en) * | 2010-02-02 | 2011-08-11 | シャープ株式会社 | Method of inspecting foreign object and lighting inspection device |
| CN104077989B (en) * | 2014-06-30 | 2016-04-13 | 深圳市华星光电技术有限公司 | Display panel |
| KR102426757B1 (en) * | 2016-04-25 | 2022-07-29 | 삼성디스플레이 주식회사 | Display device and driving method thereof |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5621555A (en) * | 1993-12-31 | 1997-04-15 | Goldstar Co., Ltd. | Liquid crystal display having redundant pixel electrodes and thin film transistors and a manufacturing method thereof |
| JPH09127550A (en) * | 1995-10-30 | 1997-05-16 | Sharp Corp | Active matrix liquid crystal panel and method for correcting its defect |
| US20030122762A1 (en) * | 2001-12-29 | 2003-07-03 | Lg.Philips Lcd Co., Ltd. | Array substrate for liquid crystal display device having redundancy line and fabricating method thereof |
| CN1862648A (en) * | 2006-05-25 | 2006-11-15 | 友达光电股份有限公司 | A pixel structure, repair method and manufacturing method thereof |
| US20060279322A1 (en) * | 2005-06-10 | 2006-12-14 | Ming-Sheng Lai | Testing circuit and testing method for liquid crystal display device |
-
2007
- 2007-01-16 CN CNB2007100002651A patent/CN100452130C/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5621555A (en) * | 1993-12-31 | 1997-04-15 | Goldstar Co., Ltd. | Liquid crystal display having redundant pixel electrodes and thin film transistors and a manufacturing method thereof |
| JPH09127550A (en) * | 1995-10-30 | 1997-05-16 | Sharp Corp | Active matrix liquid crystal panel and method for correcting its defect |
| US20030122762A1 (en) * | 2001-12-29 | 2003-07-03 | Lg.Philips Lcd Co., Ltd. | Array substrate for liquid crystal display device having redundancy line and fabricating method thereof |
| US20060279322A1 (en) * | 2005-06-10 | 2006-12-14 | Ming-Sheng Lai | Testing circuit and testing method for liquid crystal display device |
| CN1862648A (en) * | 2006-05-25 | 2006-11-15 | 友达光电股份有限公司 | A pixel structure, repair method and manufacturing method thereof |
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| CN101000736A (en) | 2007-07-18 |
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