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CN100449260C - A Method of Measuring the Distance Deviation Between Objective Lens and Eyepiece of Telescope System Accurately Using Interferometer - Google Patents

A Method of Measuring the Distance Deviation Between Objective Lens and Eyepiece of Telescope System Accurately Using Interferometer Download PDF

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CN100449260C
CN100449260C CNB200710071644XA CN200710071644A CN100449260C CN 100449260 C CN100449260 C CN 100449260C CN B200710071644X A CNB200710071644X A CN B200710071644XA CN 200710071644 A CN200710071644 A CN 200710071644A CN 100449260 C CN100449260 C CN 100449260C
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eyepiece
telescopic system
interferometer
object lens
lambda
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CN101000232A (en
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谭立英
马晶
刘剑峰
韩琦琦
于思源
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Harbin Institute of Technology Shenzhen
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Harbin Institute of Technology Shenzhen
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Abstract

利用干涉仪精确测量望远系统物镜和目镜间距偏差的方法,涉及到望远系统中目镜和物镜间距偏差的测量方法。本发明提供了一种高精度测量望远系统中目镜和物镜间距偏差的方法,它的步骤为:将被测望远系统和标准平面反射镜同轴放置在干涉仪的出射光路上;干涉仪向望远系统发射参考光束;参考光束经望远系统发射到标准平面反射镜上,经标准平面反射镜反射后经望远系统返回到干涉仪中的CCD探测器上;计算机采集、分析CCD探测器上的数据得到干涉条纹数Δn;根据干涉条纹数Δn以及干涉仪和望远系统的物理参数,计算得到望远系统中物镜和目镜间距偏差距离Δd。本发明可以精确测量出望远系统中物镜和目镜间距的偏差,可以应用到望远系统的目镜和物镜间距校准系统中。

Figure 200710071644

A method for accurately measuring the distance deviation between the objective lens and the eyepiece of a telescopic system by using an interferometer relates to a method for measuring the distance deviation between the eyepiece and the objective lens in the telescopic system. The invention provides a method for measuring the distance deviation between the eyepiece and the objective lens in the telescopic system with high precision. Send a reference beam to the telescopic system; the reference beam is sent to the standard plane mirror through the telescopic system, and then returned to the CCD detector in the interferometer through the telescopic system after being reflected by the standard plane mirror; the computer collects and analyzes the CCD detection The number of interference fringes Δn is obtained from the data on the instrument; according to the number of interference fringes Δn and the physical parameters of the interferometer and the telescopic system, the deviation distance Δd between the objective lens and the eyepiece in the telescopic system is calculated. The invention can accurately measure the deviation of the distance between the objective lens and the eyepiece in the telescopic system, and can be applied to a calibration system for the distance between the eyepiece and the objective lens of the telescopic system.

Figure 200710071644

Description

Utilize interferometer accurately to measure the method for telescopic system object lens and width between eyepiece deviation
Technical field
The present invention relates to the eyepiece in the telescopic system and the measuring method of object lens spacing deviation.
Background technology
The spacing of object lens and eyepiece is the important parameter of telescopic system in the telescopic system, the levels of precision of object lens and width between eyepiece determined the to look in the distance quality of system performance.The application of telescopic system is extensive day by day at present, the performance requirement of telescopic system improves constantly, reached micron order for the spacing accuracy requirement between eyepiece and the object lens, and existing determine that object lens are all processed by high accuracy mechanical with the method for width between eyepiece in the telescopic system and guarantee, only use for micron-sized accuracy requirement that to have the high-accuracy mechanical manufacturing process now be inaccessiable far away.
Summary of the invention
In order accurately to measure the deviation of object lens and object lens spacing in the telescopic system, so that it is proofreaied and correct, the present invention has designed a kind of method of utilizing interferometer accurately to measure telescopic system object lens and width between eyepiece deviation.
The method of utilizing interferometer accurately to measure telescopic system object lens and width between eyepiece deviation of the present invention, step is:
A, with on the coaxial emitting light path that is placed on the interferometer that has ccd detector of tested telescopic system and standard flat catoptron, tested telescopic system is placed between interferometer and the standard flat catoptron, eyepiece in the tested telescopic system is near the standard flat catoptron, and spacing is L;
B, to adjust the interferometer have ccd detector be the reference beam that the tested telescopic system emission wavelength of λ 2 is λ 1 to operation wavelength;
After C, reference beam object lens, the eyepiece in tested telescopic system reflects, be transmitted on the standard flat catoptron, through the eyepiece in tested telescopic system, object lens refraction turn back on the ccd detector of interferometer again after the standard flat mirror reflects;
D, the described ccd detector that has the interferometer of ccd detector, the interference fringe of the wave front that detection reflected wavefront and reference beam form;
E, by computer acquisition, analyze the pattern of the interference fringe that detects on the ccd detector, obtain the interference fringe quantity Δ n of actual generation;
The physical characteristics of F, the eyepiece by interference fringe quantity Δ n and tested telescopic system, object lens calculates that the range deviation Δ d between the object lens and eyepiece is in the tested telescopic system:
Δd = Δn * λ 1 ( 1 cos a - 1 ) + L ( 1 cos β - 1 ) ,
Wherein α = arctan ( D 2 2 * f 2 λ 1 ) , β = arctan ( D 2 * ( f 2 λ 2 - f 2 λ 1 ) 2 * f 2 λ 1 * f 2 λ 2 ) ,
In the formula
Figure C20071007164400044
,
Figure C20071007164400045
Be respectively that object lens are λ corresponding to wavelength in the tested telescopic system 1, λ 2The focal length of light wave,
Figure C20071007164400046
, Be respectively that eyepiece is λ corresponding to wavelength in the tested telescopic system 1, λ 2The focal length of light wave, D 2It is the effective aperture of eyepiece in the tested telescopic system.
The present invention utilizes interferometer to obtain the formed interference fringe of tested telescopic system, and the quantity Δ n by the COMPUTER DETECTION interference fringe then calculates the spacing deviation between the object lens and eyepiece in the tested telescopic system.Difference according to the performance of using interferometer can make measuring accuracy of the present invention can reach micron order.The present invention can promote the use of in the calibration system of the object lens of telescopic system and width between eyepiece.
Description of drawings
Fig. 1 is the employed apparatus structure synoptic diagram of the method for utilizing interferometer accurately to measure telescopic system object lens and width between eyepiece deviation of the present invention.
Embodiment
A kind of method of utilizing interferometer accurately to measure telescopic system object lens and width between eyepiece deviation, concrete steps are:
A, with on the coaxial emitting light path that is placed on the interferometer 1 that has ccd detector of tested telescopic system 2 and standard flat catoptron 4, described tested telescopic system 2 is placed between the interferometer 1 and standard flat catoptron 4 that has ccd detector, eyepiece 22 in the tested telescopic system 2 is near standard flat catoptron 4, and spacing is L;
B, to adjust the interferometer 1 have ccd detector be that telescopic system 2 emission wavelengths of λ 2 are the reference beam 31 of λ 1 to operation wavelength;
After C, reference beam 31 object lens 21, the eyepiece 22 in telescopic system 2 reflects, be transmitted on the standard flat catoptron 4, the eyepiece in telescopic system 2 22, object lens 21 refractions turn back on the ccd detector of interferometer again after 4 reflections of standard flat catoptron;
D, the described ccd detector that has the interferometer 1 of ccd detector are surveyed the interference fringe of the wave front of reflected wavefront and reference beam 31 formation;
E, by computer acquisition, analyze the pattern of the interference fringe that detects on the CCD, obtain the number of interference fringes Δ n of actual generation;
The physical characteristics of F, the eyepiece 22 by interference fringe quantity Δ n and telescopic system 2, object lens 21 calculates that the range deviation Δ d between the object lens 21 and eyepiece 22 is in the telescopic system 2:
Δd = Δn * λ 1 ( 1 cos a - 1 ) + L ( 1 cos β - 1 ) ,
Wherein α = arctan ( D 2 2 * f 2 λ 1 ) , β = arctan ( D 2 * ( f 2 λ 2 - f 2 λ 1 ) 2 * f 2 λ 1 * f 2 λ 2 ) ,
In the formula
Figure C20071007164400054
,
Figure C20071007164400055
Be respectively that object lens 21 are λ corresponding to wavelength in the telescopic system 2 1, λ 2The focal length of light wave,
Figure C20071007164400056
,
Figure C20071007164400057
Be respectively that eyepiece 22 is λ corresponding to wavelength in the telescopic system 2 1, λ 2The focal length of light wave, D 2It is the effective aperture of eyepiece in the telescopic system 2.
Realize the device of this method in the present embodiment, form by the computing machine 3 that has image pick-up card, the interferometer 1 that has ccd detector and standard flat catoptron 4, on the emitting light path of the interferometer 1 that has ccd detector, coaxial 10 are placed with tested telescopic system 2 and standard flat catoptron 4, and described tested telescopic system 2 is placed between the interferometer 1 and standard flat catoptron 4 that has ccd detector; The object lens 21 of described telescopic system 2 and the focal length of eyepiece 22 are respectively f1, f2, the eyepiece 22 and the distance between the plane mirror 4 of telescopic system 2 are L, and the described image information output terminal that has the interferometer 1 of ccd detector is connected with the image input end of the computing machine 3 that has image pick-up card.
The GHI-4 that the interferometer 1 that has ccd detector in the present embodiment selects for use U.S. ZYGO company to produce " HS type interferometer; it is that the level crossing of φ 80 is as catoptron that described standard flat catoptron 4 adopts bores; surface precision RMS is 1/70 λ; adopt the device that utilizes object lens and width between eyepiece deviation in the interferometer measurement telescopic system of this configuration, the processing accuracy of computer acquisition interference fringe pattern is 1/10 striped.
Use these measurement device telescopic system object lens and width between eyepiece deviation, the route of reference beam is: it is λ that the interferometer 1 that has a ccd detector is launched wavelength 1Parallel reference beam 31, parallel reference beam 31 is transmitted on the standard flat catoptron 4 after the refraction of the object lens 21 of telescopic system 2 and eyepiece 22, the folded light beam that reflects to form through standard flat catoptron 4 reflexes on the eyepiece 22 of telescopic system 2, turns back on the ccd detector of the interferometer 1 that has ccd detector after the eyepiece 22 of telescopic system 2 and object lens 21 refractions.
When eyepiece 22 during at physical location A, the object lens deflecting light beams 32 that parallel reference beam 31 forms after object lens 21 refractions, object lens deflecting light beams 32 is α with the angle of axle 10, object lens deflecting light beams 32 a little is b injecting of eyepiece 22, object lens deflecting light beams 32 forms eyepiece deflecting light beams 33 after eyepiece 22 refractions, eyepiece deflecting light beams 33 a little is c injecting of standard flat catoptron 4, and the angle between eyepiece deflecting light beams 33 and the central shaft 10 is β; When eyepiece 22 moves to ideal position B, to establish object lens deflecting light beams 32 and a little be a injecting of eyepiece 22, eyepiece deflecting light beams 33 is a parallel beam, the desirable deflecting light beams 34 of eyepiece a little is e injecting of standard flat catoptron 4.Distance between the physical location A of eyepiece and the ideal position B is will need the spacing deviation delta d that measures.Eyepiece 22 is during at physical location A with at ideal position B, and the spacing deviation of object lens and eyepiece is: Δd = ( f 1 λ 1 + f 2 λ 1 ) - ( f 1 λ 2 + f 2 λ 2 ) .
The computing method of striped quantity are as described below:
When eyepiece 22 during at physical location A and ideal position B, the one way change in optical path length in the system is:
OPD = ( ab + bc ) - ( Δd + L ) = ( ab - Δd ) + ( bc - L ) = Δd * ( 1 cos α - 1 ) + L ( 1 cos β - 1 ) ,
Angle [alpha] and β in the formula are respectively: α = arctan ( D 2 2 * f 2 λ 1 ) , β = arctan ( D 2 * ( f 2 λ 2 - f 2 λ 1 ) 2 * f 2 λ 1 * f 2 λ 2 ) ,
When the distance of the physical location A of eyepiece 22 and ideal position B was Δ d, the quantity of interference fringe was:
Δn = OPD λ 1 .
The corresponding relation of deriving between number of interference fringes Δ n and separation delta d is:
Δd = Δn * λ 1 ( 1 cos a - 1 ) + L ( 1 cos β - 1 ) .
In the present embodiment, establish λ 1=632.8nm, f2 λ 1=151.6mm, f2 λ 2=153.2mm, D 2=40mm, L=10mm, computing machine is 1/10 striped to the resolution of interference fringe, the minor increment Δ d that then can measure in the present embodiment is by formula
Δd = Δn * λ 1 ( 1 cos a - 1 ) + L ( 1 cos β - 1 )
Calculate to obtain Δ d=0.007mm, promptly the present embodiment minor increment that can measure is 0.007mm.

Claims (2)

1, utilize interferometer accurately to measure the method for telescopic system object lens and width between eyepiece deviation, it is characterized in that step is:
A, with on the coaxial emitting light path that is placed on the interferometer (1) that has ccd detector of tested telescopic system (2) and standard flat catoptron (4), described tested telescopic system (2) is placed between the interferometer (1) and standard flat catoptron (4) that has ccd detector, eyepiece in the tested telescopic system (2) is near standard flat catoptron (4), and spacing is L;
B, to adjust the interferometer (1) have ccd detector be that tested telescopic system (2) emission wavelength of λ 2 is the reference beam (31) of λ 1 to operation wavelength;
After C, reference beam (31) object lens (21), the eyepiece (22) in tested telescopic system (2) reflects, be transmitted on the standard flat catoptron (4), the eyepiece (22) in tested telescopic system (2), object lens (21) refraction turn back on the ccd detector of interferometer again after standard flat catoptron (4) reflection;
D, the described ccd detector that has the interferometer (1) of ccd detector are surveyed the interference fringe of the wave front of reflected wavefront and reference beam (31) formation;
E, by computer acquisition, analyze the pattern of the interference fringe that detects on the ccd detector, obtain the interference fringe quantity Δ n of actual generation;
The physical characteristics of F, the eyepiece (22) by interference fringe quantity Δ n and tested telescopic system (2), object lens (21) calculates the range deviation Δ d between the object lens (21) and eyepiece (22) in the tested telescopic system (2).
2, the method for utilizing interferometer accurately to measure telescopic system object lens and width between eyepiece deviation according to claim 1, in step F, the computing formula that obtains the range deviation Δ d between object lens (21) and the eyepiece (22) according to interference fringe quantity Δ n is:
Δd = Δn * λ 1 ( 1 cos a - 1 ) + L ( 1 cos β - 1 ) ,
Wherein α = arctan ( D 2 2 * f 2 λ 1 ) , β = arctan ( D 2 * ( f 2 λ 2 - f 2 λ 1 ) 2 * f 2 λ 1 * f 2 λ 2 ) ,
In the formula
Figure C2007100716440002C4
Figure C2007100716440002C5
Be respectively that eyepiece (22) is λ corresponding to wavelength in the tested telescopic system (2) 1, λ 2The focal length of light wave, D 2It is the effective aperture of eyepiece in the tested telescopic system (2).
CNB200710071644XA 2007-01-17 2007-01-17 A Method of Measuring the Distance Deviation Between Objective Lens and Eyepiece of Telescope System Accurately Using Interferometer Expired - Fee Related CN100449260C (en)

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CN102749188B (en) * 2012-07-19 2014-12-17 苏州慧利仪器有限责任公司 Detection device applied to optical system
CN102901463B (en) * 2012-11-01 2015-08-12 中国科学院上海光学精密机械研究所 The measurement mechanism of axicon surface shape and measuring method
CN113834633B (en) * 2021-08-09 2025-03-04 中国工程物理研究院应用电子学研究所 A method for assembling and adjusting a transmission-type near-infrared beam expansion system

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Publication number Priority date Publication date Assignee Title
CN1080402A (en) * 1992-06-18 1994-01-05 天津大学 Automatic focusing system by interferometry
JP2000346612A (en) * 1999-06-04 2000-12-15 Sony Corp Interferometer and method for measuring interference
CN1858632A (en) * 2006-06-09 2006-11-08 中国科学院上海光学精密机械研究所 Method and device for accurately determining optical system focus plane by interferometer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1080402A (en) * 1992-06-18 1994-01-05 天津大学 Automatic focusing system by interferometry
JP2000346612A (en) * 1999-06-04 2000-12-15 Sony Corp Interferometer and method for measuring interference
CN1858632A (en) * 2006-06-09 2006-11-08 中国科学院上海光学精密机械研究所 Method and device for accurately determining optical system focus plane by interferometer

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