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CN100437830C - shift register circuit - Google Patents

shift register circuit Download PDF

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CN100437830C
CN100437830C CNB2005100995330A CN200510099533A CN100437830C CN 100437830 C CN100437830 C CN 100437830C CN B2005100995330 A CNB2005100995330 A CN B2005100995330A CN 200510099533 A CN200510099533 A CN 200510099533A CN 100437830 C CN100437830 C CN 100437830C
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shift register
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CN1767071A (en
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吕世香
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AUO Corp
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AU Optronics Corp
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Abstract

The invention discloses a shift register circuit, which is provided with a plurality of stages of shift buffer units and generates a sampling signal to a corresponding data latch circuit according to a signal provided by a timing control circuit. The 1 st level shift buffer unit of the shift register circuit is provided with a de-energizing circuit and a sampling circuit, receives the signal of the timing control circuit, captures a correct sampling signal and outputs the sampling signal to the corresponding data latch circuit and the next level shift buffer unit; the de-energizing circuit of the 1 st level shift buffer unit receives the sampling signal of the 2 nd level shift buffer unit and stops the action of the sampling circuit of the 1 st level shift buffer unit.

Description

移位寄存电路 shift register circuit

技术领域 technical field

本发明涉及一种用于显示器驱动电路的移位寄存电路(Shift Register),特别是涉及一种可改善输出时序信号不完整现象的移位寄存电路。The invention relates to a shift register circuit (Shift Register) used in a display driving circuit, in particular to a shift register circuit capable of improving the incompleteness of output timing signals.

背景技术 Background technique

液晶显示器(LCD)由于具备轻薄、省电、无幅射线等优点,而逐渐取代传统映像管(CRT)显示器,广泛应用于桌上型计算机、个人数字助理器、笔记型计算机、数字相机与移动电话等电子产品中。随着薄膜晶体管制作与封装技术的成熟,且为了符合大尺寸显示屏幕的要求,将驱动集成电路芯片(IC)、提供数据信号、时钟信号或控制信号的信号线制作在一液晶显示面板上。其中液晶显示面板的驱动电路安装于显示器边缘,以提供更小的封装面积,并改良结构强度。Liquid crystal display (LCD) has gradually replaced traditional image tube (CRT) displays due to its advantages of lightness, lightness, power saving, and radiation-free, and is widely used in desktop computers, personal digital assistants, notebook computers, digital cameras and mobile phones. Electronic products such as telephones. With the maturity of thin film transistor manufacturing and packaging technology, and in order to meet the requirements of large-size display screens, signal lines for driving integrated circuit chips (IC) and providing data signals, clock signals or control signals are fabricated on a liquid crystal display panel. The driving circuit of the liquid crystal display panel is installed on the edge of the display to provide a smaller packaging area and improve the structural strength.

主动矩阵式液晶显示器(Active Matrix Liquid Crystal Display,AMLCD)系利用电场控制液晶的光穿透率,以达到显示画面的目的。请参照图1所示,其为一主动矩阵式液晶显示器电路结构图。显示器电路结构1中包括一驱动系统10与一液晶显示面板100。Active Matrix Liquid Crystal Display (AMLCD) uses an electric field to control the light transmittance of liquid crystals to achieve the purpose of displaying images. Please refer to FIG. 1 , which is a circuit structure diagram of an active matrix liquid crystal display. The display circuit structure 1 includes a driving system 10 and a liquid crystal display panel 100 .

其中,驱动系统10具有一定时控制电路(Timing Controller)12、一数据驱动电路(Data Driver)14、一扫瞄驱动电路(Scan Driver)16、一显示信号输入端(R/G/B Data)18。其中,定时控制电路12提供水平时钟信号HCK与水平起始信号HST传送至数据驱动电路14,同时,亦产生垂直时钟信号VCK与垂直起始信号VST传送至扫描驱动电路16;显示信号输入端18传送显示数据D至数据驱动电路14。Wherein, the drive system 10 has a timing control circuit (Timing Controller) 12, a data drive circuit (Data Driver) 14, a scan drive circuit (Scan Driver) 16, a display signal input terminal (R/G/B Data) 18. Wherein, the timing control circuit 12 provides the horizontal clock signal HCK and the horizontal start signal HST to the data driving circuit 14, meanwhile, also generates the vertical clock signal VCK and the vertical start signal VST to the scanning driving circuit 16; the display signal input terminal 18 The display data D is sent to the data driving circuit 14 .

数据驱动电路14包括一移位寄存电路(Shift Register)142、多个数据锁存电路(Data Latch)144、多个直流交流转换电路与缓冲电路(D/A Converter andBuffer)146。其中,移位寄存电路具有多级(Stage)移位缓存单元,接收水平时钟信号HCK与水平起始信号HST,产生取样信号(sampling signal)并逐级输出,依序馈入数据锁存电路144、直流交流转换电路与缓冲电路146,而至像素矩阵中同一行的像素组件102。The data driving circuit 14 includes a shift register circuit (Shift Register) 142, multiple data latch circuits (Data Latch) 144, multiple DC/AC conversion circuits and buffer circuits (D/A Converter and Buffer) 146. Wherein, the shift register circuit has a multi-stage (Stage) shift buffer unit, receives the horizontal clock signal HCK and the horizontal start signal HST, generates a sampling signal (sampling signal) and outputs it step by step, and feeds it into the data latch circuit 144 in sequence , the DC/AC conversion circuit and the buffer circuit 146, and to the pixel components 102 in the same row in the pixel matrix.

液晶显示面板100上具有一像素阵列(pixel array),像素阵列内每一个像素组件102电连接至一薄膜晶体管104,而此薄膜晶体管104的源极电连接至数据驱动电路14,栅极电连接至扫描驱动电路16,以充作一开关,控制像素组件102的运作。The liquid crystal display panel 100 has a pixel array (pixel array), and each pixel element 102 in the pixel array is electrically connected to a thin film transistor 104, and the source of the thin film transistor 104 is electrically connected to the data driving circuit 14, and the gate is electrically connected to the To the scan driving circuit 16 to act as a switch to control the operation of the pixel element 102 .

请参照图2所示,其为一典型移位寄存电路的示意图。此移位寄存电路142具有多级移位缓存单元,其中,第1级移位缓存单元SR1受到定时控制电路12输出的反相水平时钟信号XHCK与水平起始信号HST所控制,产生一取样信号S1馈入数据锁存电路144与第2级移位缓存单元SR2内;第N级移位缓存单元SRN受到第N-1级移位缓存单元取样信号SN-1、反相水平时钟信号XHCK与水平时钟信号HCK所控制,产生一取样信号SN馈入数据锁存电路144与第N+1级移位缓存单元SRN+1内。Please refer to FIG. 2 , which is a schematic diagram of a typical shift register circuit. The shift register circuit 142 has a multi-stage shift register unit, wherein the shift register unit SR1 of the first stage is controlled by the inverted horizontal clock signal XHCK and the horizontal start signal HST output by the timing control circuit 12 to generate a sampling The signal S 1 is fed into the data latch circuit 144 and the shift register unit SR 2 of the second stage; the shift register unit SR N of the Nth stage receives the sampling signal S N-1 of the shift register unit of the N-1 stage, and inverts Controlled by the horizontal clock signal XHCK and the horizontal clock signal HCK, a sampling signal SN is generated and fed into the data latch circuit 144 and the N+1-th shift register unit SR N+1 .

请同时参照图3A、B所示,图3A为定时控制电路初始所输出的水平时钟讯号、反相水平时钟讯号与水平起始信号的时序图;图3B为抵达数据驱动电路的水平时钟讯号、反相水平时钟讯号与水平起始信号的时序图。图3A所示,其时钟信号HCK、XHCK与起始信号HST在初始输出时为一同步时钟,在理想状况下,此同步时钟将保持此状态输入数据驱动电路,则在时间点t至t’之间,数据驱动电路可撷取一50%周期的反相水平时钟讯号XHCK作为控制信号的工作周期。Please refer to FIG. 3A and B at the same time. FIG. 3A is a timing diagram of the horizontal clock signal, the inverted horizontal clock signal and the horizontal start signal initially output by the timing control circuit; FIG. 3B is the horizontal clock signal arriving at the data driving circuit, Timing diagram of inverted horizontal clock signal and horizontal start signal. As shown in Figure 3A, the clock signals HCK, XHCK and the start signal HST are a synchronous clock when they are initially output. Under ideal conditions, this synchronous clock will maintain this state and input to the data drive circuit. Meanwhile, the data driving circuit can pick up a 50% cycle inverted horizontal clock signal XHCK as the duty cycle of the control signal.

但现实中,所输出的同步时钟经过不同的传输路径到达数据驱动电路,而因各路径上具有不同的寄生电容与寄生电阻,使得原先在输出时为同步的信号,在到达数据驱动电路时变为不同步的现象,如图3B所示。使得数据驱动电路在时间点t1至t1’欲撷取信号时,因水平起始信号HST与水平时钟讯号HCK不同步,所对应撷取的反相水平时钟讯号XHCK将不再维持一50%的周期,此一不正常时钟输出(glitch),将造成以此时钟讯号做为参考时钟讯号的众多电路的误动作,因而影响系统的正常运作状态。But in reality, the output synchronous clock reaches the data drive circuit through different transmission paths, and because each path has different parasitic capacitance and parasitic resistance, the original synchronous signal at the time of output will change when it reaches the data drive circuit. It is an asynchronous phenomenon, as shown in Fig. 3B. Therefore, when the data driving circuit is about to capture signals at time points t1 to t1 ', because the horizontal start signal HST is not synchronized with the horizontal clock signal HCK, the correspondingly captured inverted horizontal clock signal XHCK will no longer maintain 150 % of the cycle, this abnormal clock output (glitch) will cause malfunctions of many circuits using the clock signal as the reference clock signal, thereby affecting the normal operation of the system.

请参照图3C所示,其为为理想状况移位寄存电路的输入讯号与输出讯号时序图。移位寄存电路接收水平起始信号HST与反相水平时钟讯号XHCK,其中,第1级移位缓存单元SR1在时间点t至t’之间,接收到起始信号HST为一脉冲输入,并同时撷取反相时钟讯号XHCK,产生一取样信号S1输出至对应的数据锁存电路与第2级移位缓存单元SR2,而接续的各级移位缓存单元将依序输出取样信号。Please refer to FIG. 3C , which is a timing diagram of an input signal and an output signal of an ideal shift register circuit. The shift register circuit receives the horizontal start signal HST and the inverted horizontal clock signal XHCK, wherein the shift register unit SR 1 of the first stage receives the start signal HST as a pulse input between the time point t and t', At the same time, the inverted clock signal XHCK is captured to generate a sampling signal S 1 and output to the corresponding data latch circuit and the second-level shift register unit SR 2 , and the subsequent shift register units of each level will sequentially output the sampling signals .

请参照图3D所示,其为寄存电路的输入讯号与输出讯号时序图。其中第1级移位缓存单元SR1在时间点t1至t1’之间,接收到起始信号HST为一脉冲输入,并撷取反相时钟讯号X HCK,由于传输过程中造成信号延迟,此时反相撷取信号恰好为0输入,因此无法得到一正确的取样信号输出,对取样的精确性,乃至于画面显示的正确性造成严重的影响。Please refer to FIG. 3D , which is a timing diagram of the input signal and output signal of the register circuit. Among them, the first-stage shift register unit SR 1 receives the start signal HST as a pulse input between time points t 1 and t 1 ', and extracts the inverted clock signal X HCK, due to signal delay during transmission , at this time, the inverting acquisition signal is exactly 0 input, so a correct sampling signal output cannot be obtained, which seriously affects the accuracy of sampling and even the correctness of screen display.

有鉴于此,本发明提供一种移位寄存电路的设计,可改善输出时钟信号不完整现象,使显示器数据取样与数据写入的动作更为精确,以避免由于时钟讯号和数据驱动电路之间长距离传输,造成信号不同步,导致数据驱动电路无法正常操作。In view of this, the present invention provides a design of a shift register circuit, which can improve the incompleteness of the output clock signal, make the display data sampling and data writing more accurate, and avoid the gap between the clock signal and the data driving circuit. Long-distance transmission causes the signal to be out of sync, resulting in the failure of the data drive circuit to operate normally.

发明内容 Contents of the invention

本发明的目的是提供一移位寄存电路,可改善传统移位寄存电路其输出的时钟信号不完整的问题。The purpose of the present invention is to provide a shift register circuit, which can solve the problem of incomplete clock signal output by the traditional shift register circuit.

本发明披露了一种移位寄存电路,具有多级移位缓存单元,依据一定时控制电路所提供的信号,产生一取样信号至相对应的一数据锁存电路。其中,移位寄存电路包括第1级移位缓存单元,耦接定时控制电路与相对应的数据锁存电路,具有一去能(Disable)电路与一取样电路,接收定时控制电路所提供的信号,撷取一正确的取样信号输出至相对应的数据锁存电路与下一级移位缓存单元内;及第2级至第N级移位缓存单元,各自具有一取样电路,且逐级串联并且该第2级移位缓存单元连接于第1级移位缓存单元。第1级移位缓存单元的去能电路,接收第2级移位缓存单元的取样信号,停止第1级移位缓存单元的取样电路的动作。The invention discloses a shift register circuit, which has a multi-stage shift buffer unit, and generates a sampling signal to a corresponding data latch circuit according to a signal provided by a timing control circuit. Wherein, the shift register circuit includes a first-stage shift register unit, which is coupled to the timing control circuit and the corresponding data latch circuit, has a disable circuit and a sampling circuit, and receives signals provided by the timing control circuit , to capture a correct sampling signal and output it to the corresponding data latch circuit and the shift register unit of the next stage; and the shift register units from the second stage to the Nth stage each have a sampling circuit and are connected in series step by step And the second-level shift register unit is connected to the first-level shift register unit. The disabling circuit of the shift register unit of the first stage receives the sampling signal of the shift register unit of the second stage, and stops the operation of the sampling circuit of the shift register unit of the first stage.

一种改善显示器的驱动电路信号不同步的方法,驱动电路具有一定时控制电路、一移位寄存电路与一扫瞄驱动电路,其中移位寄存电路由多级移位缓存单元及多个锁存电路所组成,其方法包括:定时控制电路提供一时钟信号与一起始信号;第1级移位缓存单元接收时钟信号与起始信号,当起始信号为高电平时,第一级移位寄存单位撷取对应该起始信号的下一个时钟信号作为一取样信号,藉此避免取样不完整所导致数据驱动电路无法正常操作。A method for improving the asynchronous signal of a drive circuit of a display, the drive circuit has a timing control circuit, a shift register circuit and a scan drive circuit, wherein the shift register circuit consists of a multi-stage shift buffer unit and a plurality of latches The circuit is composed of a circuit, and the method includes: the timing control circuit provides a clock signal and a start signal; the first-stage shift register unit receives the clock signal and the start signal, and when the start signal is high, the first-stage shift register The unit extracts the next clock signal corresponding to the start signal as a sampling signal, so as to prevent the data driving circuit from being unable to operate normally due to incomplete sampling.

附图说明Description of drawings

图1为一主动矩阵式液晶显示器电路结构图;Fig. 1 is an active matrix liquid crystal display circuit structure diagram;

图2为一典型移位寄存电路的示意图;2 is a schematic diagram of a typical shift register circuit;

图3A为定时控制电路各信号的时序图;3A is a timing diagram of each signal of the timing control circuit;

图3B为抵达数据驱动电路的各信号的时序图;FIG. 3B is a timing diagram of signals arriving at the data driving circuit;

图3C为理想移位寄存电路的输入与输出讯号时序图;3C is a timing diagram of input and output signals of an ideal shift register circuit;

图3D为移位寄存电路的输入与输出讯号时序图;3D is a timing diagram of input and output signals of the shift register circuit;

图4为本发明一实施例移位寄存电路结构的示意图;4 is a schematic diagram of a shift register circuit structure according to an embodiment of the present invention;

图5A为本发明一实施例第1级移位缓存单元的电路图;FIG. 5A is a circuit diagram of a first-stage shift register unit according to an embodiment of the present invention;

图5B为各节点信号相对应的时序图;FIG. 5B is a timing diagram corresponding to each node signal;

图6A为本发明一实施例第1级移位缓存单元理想的输入与输出讯号时序图;FIG. 6A is an ideal timing diagram of input and output signals of the first-stage shift register unit according to an embodiment of the present invention;

图6B为本发明一实施例移位寄存电路的输入与输出讯号时序图;6B is a timing diagram of input and output signals of a shift register circuit according to an embodiment of the present invention;

图7A为本发明一实施例第1级移位缓存单元的电路图;FIG. 7A is a circuit diagram of a first-stage shift register unit according to an embodiment of the present invention;

图7B为各节点信号相对应的时序图;FIG. 7B is a timing diagram corresponding to each node signal;

图8A为本发明一实施例第1级移位缓存单元的电路图;FIG. 8A is a circuit diagram of a first-stage shift register unit according to an embodiment of the present invention;

图8B为各节点信号相对应的时序图;FIG. 8B is a timing diagram corresponding to each node signal;

图9A为本发明一实施例第1级移位缓存单元的输入讯号与输出讯号时序图;9A is a timing diagram of an input signal and an output signal of a first-stage shift register unit according to an embodiment of the present invention;

图9B为各节点信号相对应的时序示意图;及FIG. 9B is a schematic timing diagram corresponding to each node signal; and

图10为本发明一实施例驱动电路信号同步方法的流程图。FIG. 10 is a flowchart of a method for synchronizing signals of a driving circuit according to an embodiment of the present invention.

附图符号说明Description of reference symbols

1显示器电路结构            10驱动系统1 Display Circuit Structure 10 Drive System

102像素组件                104薄膜晶体管102 pixel components 104 thin film transistors

100液晶显示面板            16扫瞄驱动电路100 liquid crystal display panel 16 scanning drive circuit

18显示信号输入端           246缓冲电路18 display signal input terminal 246 buffer circuit

12、22定时控制电路         14、24数据驱动电路12, 22 timing control circuit 14, 24 data drive circuit

142、242移位寄存电路142, 242 shift register circuit

144、244多个数据锁存电路144, 244 multiple data latch circuits

HST水平起始信号            VST垂直起始信号HST horizontal start signal VST vertical start signal

HCK水平时钟信号            XHCK水平反相时钟信号HCK horizontal clock signal XHCK horizontal inversion clock signal

VCK垂直时钟信号            XVXK垂直反相时钟信号VCK vertical clock signal XVXK vertical inversion clock signal

CK时钟信号                 XCK反相时钟信号CK clock signal XCK inverted clock signal

AND与门                    ST起始信号AND gate ST start signal

VDD第一电源                VSS第二电源VDD first power supply VSS second power supply

Q、Q1、Q2输出信号Q, Q 1 , Q 2 output signals

C、C1、C2时钟触发讯号输入端C, C 1 , C 2 clock trigger signal input terminal

D、D1、D2数据输入端        R、R1、R2重置端D, D 1 , D 2 data input terminals R, R 1 , R 2 reset terminals

NOT1、NOT2反相器NOT 1 , NOT 2 inverter

DFF、DFF1、DFF2            D型触发器DFF, DFF 1 , DFF 2 D-type flip-flop

S1、S2、...、SN取样信号S 1 , S 2 ,..., S N sampling signal

SR1、SR2、...、SRN移位缓存单元SR 1 , SR 2 , ..., SRN shift buffer unit

N1、N2、N3、N4、N5、N6、N7晶体管N 1 , N 2 , N 3 , N 4 , N 5 , N 6 , N 7 transistors

t、t’、t1、t1’、t2、t2’、t2”、t3、t3’、t4、t4’、t5、t6、t7、t8    时间点t, t', t 1 , t 1 ', t 2 , t 2 ', t 2 ", t 3 , t 3 ', t 4 , t 4 ', t 5 , t 6 , t 7 , t 8 time points

具体实施方式 Detailed ways

本发明提供一种移位寄存电路设计,特别是一种关于显示器数据电路中的移位寄存电路的取样信号。在本发明中,利用起始信号持续时间的大小不同,并结合第1级移位缓存单元的电路设计,藉以控制移位缓存单元输出正确无误的取样信号。本发明显示器结构和图1相同,故在此不多加赘述。The invention provides a shift register circuit design, especially a sampling signal related to the shift register circuit in the display data circuit. In the present invention, the duration of the initial signal is different, combined with the circuit design of the first-stage shift register unit, so as to control the shift register unit to output correct sampling signals. The structure of the display of the present invention is the same as that of FIG. 1 , so no more details are given here.

请参照图4所示,图4为本发明一实施例移位寄存电路结构的示意图。移位寄存电路24具有多级移位缓存单元,其中,第1级移位缓存单元SR1受到定时控制电路输出的反相时钟信号XCK与起始信号ST所控制,具有一取样电路与一去能电路。在本发明的实施例中,其起始信号ST对于第1级移位缓存单元SR1的取样电路有两种不同的作用:一种是可将起始信号ST视为一触发信号,因此起始信号ST持续时间(duration)的大小并不影响其取样动作,单纯触发第1级移位缓存单元SR1的取样电路,使其撷取一完整的取样信号;另一种则是依据起始信号ST持续时间与反相时钟信号XCK上升周期重叠的部分,进而撷取一完整的取样信号,因此起始信号ST的持续时间需大于反相时钟信号XCK的一又二分的一周期以上。Please refer to FIG. 4 , which is a schematic diagram of a shift register circuit structure according to an embodiment of the present invention. The shift register circuit 24 has a multi-stage shift register unit, wherein the shift register unit SR 1 of the first stage is controlled by the inverted clock signal XCK and the start signal ST output by the timing control circuit, and has a sampling circuit and a demultiplexing circuit. capable circuit. In an embodiment of the present invention, its start signal ST has two different effects on the sampling circuit of the first-stage shift register unit SR 1 : one is that the start signal ST can be regarded as a trigger signal, thus acting as The duration (duration) of the start signal ST does not affect its sampling action, it simply triggers the sampling circuit of the first-stage shift register unit SR 1 to make it capture a complete sampling signal; the other is based on the start The duration of the signal ST overlaps with the rising period of the inverted clock signal XCK to capture a complete sampling signal. Therefore, the duration of the start signal ST needs to be longer than one and half periods of the inverted clock signal XCK.

当第1级移位缓存单元SR1产生一取样信号S1馈入数据锁存电路与第2级移位缓存单元SR2内;第2级移位缓存单元SR2受到第1级移位缓存单元取样信号S1、反相时钟信号XCK与时钟信号CK所控制,产生一取样信号S2馈入数据锁存电路、第1级移位缓存单元SR1的去能电路与第3级移位缓存单元SR3内。取样信号S2驱动第1级移位缓存单元SR1的去能电路,以停止第1级移位缓存单元SR1的取样动作,直至下一次取样动作开始。When the first-stage shift register unit SR 1 generates a sampling signal S 1 and feeds it into the data latch circuit and the second-stage shift register unit SR 2 ; the second-stage shift register unit SR 2 is received by the first-stage shift register Controlled by the unit sampling signal S 1 , the inverted clock signal XCK and the clock signal CK, a sampling signal S 2 is generated and fed into the data latch circuit, the disabling circuit of the first-stage shift register unit SR 1 and the third-stage shift Inside cache unit SR 3 . The sampling signal S2 drives the disabling circuit of the first-stage shift register unit SR1 to stop the sampling operation of the first-stage shift register unit SR1 until the next sampling operation starts.

请同时参照图5A、B所示,图5A为本发明第一实施例第1级移位缓存单元的电路图,图5B为各节点信号相对应的时序图。如图5A所示,第1级移位缓存单元SR1由一D型触发器DFF、二反相器(又称作非门,NOTGate)NOT1、NOT2与一与门(AND Gate)AND所组成。Please refer to FIG. 5A and B at the same time. FIG. 5A is a circuit diagram of the first-stage shift register unit in the first embodiment of the present invention, and FIG. 5B is a timing diagram corresponding to each node signal. As shown in Figure 5A, the first stage shift register unit SR 1 is composed of a D-type flip-flop DFF, two inverters (also called NOT gate, NOTGate) NOT 1 , NOT 2 and an AND gate (AND Gate) AND composed of.

在本发明中,D型触发器DFF的数据输入端D连接一电压电平VDD,使数据输入端D保持在高逻辑电平,其时钟触发讯号输入端C则以定时控制电路所提供的起始信号ST做为输入讯号,其输出端馈出一讯号Q1至与门AND的一输入端,而与门AND另一输入端则接收反相时钟信号XCK,触发器DFF重置端R接收经过反相器NOT2转换的第2级移位缓存单元SR2的取样信号S2,另一反相器NOT1则将反相时钟讯号XCK作一转换成为时钟讯号CK,传递至后续多级移位缓存单元中。In the present invention, the data input terminal D of the D-type flip-flop DFF is connected to a voltage level VDD, so that the data input terminal D remains at a high logic level, and its clock trigger signal input terminal C is started by the timing control circuit. The start signal ST is used as the input signal, and its output terminal feeds out a signal Q 1 to one input terminal of the AND gate AND, while the other input terminal of the AND gate AND receives the inverted clock signal XCK, and the reset terminal R of the flip-flop DFF receives The sampling signal S 2 of the second-stage shift register unit SR 2 is converted by the inverter NOT 2 , and the other inverter NOT 1 converts the inverted clock signal XCK into a clock signal CK, which is transmitted to subsequent stages in the shift buffer unit.

当第1级移位缓存单元于时间点t2时,数据输入端D接收一电压电平VDD输入的一高逻辑电平,起始信号ST正好位在上升缘的触发状态输入时钟触发讯号输入端C,即起始信号由低态转为高态,根据D型触发器的输出特性,输出讯号Q1会呈现数据输入端D所输入的电平,即馈出讯号Q1将由原先的低态转变为高态,输入至与门的一输入端中。When the shift register unit of the first stage is at the time point t2 , the data input terminal D receives a high logic level of a voltage level VDD input, and the start signal ST is just in the trigger state of the rising edge input clock trigger signal input Terminal C, that is, the start signal changes from a low state to a high state. According to the output characteristics of the D-type flip-flop, the output signal Q 1 will present the level input by the data input terminal D, that is, the output signal Q 1 will change from the original low The state changes to a high state and is input to an input terminal of the AND gate.

与门依据两输入端的讯号Q1、XCK,在时间点t2’至t2”之间,撷取一高态的取样信号S1其为反相时钟讯号XCK的50%工作周期,输出至第2级移位缓存单元SR2中;而第2级移位缓存单元SR2接收取样信号S1,在时间点t2”时,输出取样信号S2至下一级移位缓存单元、数据锁存电路(图中未显示)与第1级移位缓存单元SR1,取样信号S2经过第1级移位缓存单元SR1的反相器后,输入至D型触发器的重置端R,将D型触发器重新设置(reset),使馈出讯号Q1从高态转回低态,停止第1级移位缓存单元SR1取样动作。According to the signals Q 1 and XCK at the two input terminals, the AND gate captures a high-state sampling signal S 1 which is 50% of the duty cycle of the inverted clock signal XCK between the time point t 2 ′ and t 2 ″, and outputs it to In the second-stage shift register unit SR 2 ; and the second-stage shift register unit SR 2 receives the sampling signal S 1 , and at the time point t 2 ", outputs the sampling signal S 2 to the next-stage shift register unit, data The latch circuit (not shown in the figure) and the first-stage shift register unit SR 1 , the sampling signal S 2 is input to the reset terminal of the D-type flip-flop after passing through the inverter of the first-stage shift register unit SR 1 R, reset the D-type flip-flop to make the output signal Q 1 change from high state to low state, and stop the sampling operation of the first-stage shift register unit SR 1 .

请参照图6A所示,其为本发明第一实施例第1级移位缓存单元理想状况的输入讯号与输出讯号时序图。移位寄存电路接收起始信号ST与反相时钟讯号XCK,其中,第1级移位缓存单元在时间点t至t’之间,接收到起始信号ST为一脉冲输入,并同时撷取反相时钟讯号XCK,产生一取样信号S1输出至对应的数据锁存电路与第2级移位缓存单元,而接续的各级移位缓存单元将依序输出取样信号。Please refer to FIG. 6A , which is a timing diagram of an input signal and an output signal in an ideal state of the first-stage shift register unit according to the first embodiment of the present invention. The shift register circuit receives the start signal ST and the inverted clock signal XCK, wherein the first-stage shift register unit receives the start signal ST as a pulse input between the time point t and t', and simultaneously captures The inverted clock signal XCK generates a sampling signal S1 that is output to the corresponding data latch circuit and the second-stage shift register unit, and the successive stages of shift register units will sequentially output the sample signal.

请参照图6B所示,其为本发明第一实施例移位寄存电路的输入讯号与输出讯号时序图。其中,第1级移位缓存单元在时间点t2至t2’之间,接收到起始信号ST为一脉冲输入,并触发D型触发器输出一高电平讯号(因其数据输入端D为一高电平)至与门一输入端,与门接收两讯号Q1与XCK,在时间点t2’至t2”产生一取样信号S1输出至下一级移位缓存单元,使接续的各级移位缓存单元将依序输出取样信号。Please refer to FIG. 6B , which is a timing diagram of input signals and output signals of the shift register circuit according to the first embodiment of the present invention. Among them, the shift register unit of the first stage receives the start signal ST as a pulse input between the time points t2 and t2 ', and triggers the D-type flip-flop to output a high-level signal (because the data input terminal D is a high level) to an input terminal of the AND gate, and the AND gate receives two signals Q 1 and XCK, and generates a sampling signal S 1 at the time point t 2 ′ to t 2 ” and outputs it to the next-stage shift register unit, The successive levels of shift buffer units will sequentially output sampling signals.

在本发明中的移位寄存电路中,即使时钟讯号与起始信号在传输过程中有所延迟,而使得进入至第1级移位缓存单元时为异步讯号,将利用第1级移位缓存单元的电路设计,达到所输出的取样信号与时钟讯号为一同步时钟,以避免不正常时钟的出现,而严重影响显示画面正确性。In the shift register circuit of the present invention, even if the clock signal and the start signal are delayed during transmission, so that when entering the first-stage shift register unit, it is an asynchronous signal, the first-stage shift register will be used The circuit design of the unit achieves that the output sampling signal and the clock signal are a synchronous clock, so as to avoid the appearance of abnormal clock and seriously affect the accuracy of the display screen.

请同时参照图7A、B所示,图7A为本发明第二实施例第1级移位缓存单元的电路图,图7B为各节点信号相对应的时序图。如图7A所示,第1级移位缓存单元由二D型触发器DFF1、DFF2、二反相器NOT1、NOT2与一与门AND所组成。Please refer to FIG. 7A and B at the same time. FIG. 7A is a circuit diagram of the first-stage shift register unit according to the second embodiment of the present invention, and FIG. 7B is a timing diagram corresponding to each node signal. As shown in FIG. 7A , the first-stage shift buffer unit is composed of two D-type flip-flops DFF 1 , DFF 2 , two inverters NOT 1 , NOT 2 and an AND gate AND.

本实施例和第一实施例差别之处在于增加一D型触发器DFF2于DFF1之后,其中DFF1其输出端馈出一讯号Q1至DFF2的数据输入端D2,其时钟触发讯号输入端C2则以时钟讯号CK为输入讯号,其输出端馈出一讯号Q2至与门AND的一输入端,而与门AND另一输入端则接收反相时钟信号XCK,其触发器DFF1与DFF2的重置端R接收经过反相器NOT2转换的第2级移位缓存单元的取样信号S2,另一反相器NOT1则将反相时钟讯号XCK作一转换成为时钟讯号CK,传递至后续多级移位缓存单元中。The difference between this embodiment and the first embodiment is that a D-type flip-flop DFF 2 is added after DFF 1 , wherein the output terminal of DFF 1 feeds a signal Q 1 to the data input terminal D 2 of DFF 2 , and its clock triggers The signal input terminal C 2 takes the clock signal CK as the input signal, and its output terminal feeds out a signal Q 2 to an input terminal of the AND gate AND, while the other input terminal of the AND gate AND receives the inverted clock signal XCK, which triggers The reset terminal R of DFF 1 and DFF 2 receives the sampling signal S 2 of the second-level shift buffer unit converted by the inverter NOT 2 , and the other inverter NOT 1 converts the inverted clock signal XCK Becomes a clock signal CK, which is transmitted to subsequent multi-stage shift register units.

当第1级移位缓存单元于时间点t3时,数据输入端D1连接一电压电平VDD,使其保持在高逻辑电平,起始信号ST正好位在上升缘的触发状态输入时钟触发讯号输入端C1,即起始信号ST由低态转为高态,输出讯号Q1呈现数据输入端D1所输入的电平,即馈出讯号Q1将由原先的低态转变为高态,输入至DFF2的数据输入端D2;而于时间点t3’时,时钟触发讯号输入端C2所接收的时钟讯号CK正好位在上升缘的触发状态,则DFF2馈出讯号Q2为一高电平信号馈出,即馈出讯号Q2由低态转变为高态输出至与门的一输入端。When the first-stage shift register unit is at the time point t3 , the data input terminal D1 is connected to a voltage level VDD to keep it at a high logic level, and the start signal ST is just in the trigger state of the rising edge to input the clock trigger The signal input terminal C 1 , that is, the start signal ST changes from a low state to a high state, and the output signal Q 1 presents the level input by the data input terminal D 1 , that is, the output signal Q 1 will change from the original low state to a high state. , input to the data input terminal D 2 of DFF 2 ; and at the time point t 3 ', the clock signal CK received by the clock trigger signal input terminal C 2 is just in the trigger state of the rising edge, then DFF 2 feeds out the signal Q 2 is a high-level signal output, that is, the output signal Q2 changes from a low state to a high state and outputs to an input terminal of the AND gate.

与门AND依据两输入端的讯号Q2、XCK,在时间点t4至t4’之间,撷取一高态的取样信号S1其为反相时钟讯号XCK的50%工作周期,输出至第2级移位缓存单元SR2中;而第2级移位缓存单元SR2接收取样信号S1,在时间点t4’时,输出取样信号S2至下一级移位缓存单元、数据锁存电路(图中未显示)与第1级移位缓存单元SR1,取样信号S2经过反相器NOT2后输入至触发器DFF1与DFF2的重置端R1、R2,将DFF1与DFF2重新设置(reset),使馈出讯号Q1、Q2从高态转回低态,停止第1级移位缓存单元SR1取样动作。According to the signals Q 2 and XCK at the two input terminals, the AND gate AND gate extracts a high-state sampling signal S 1 which is 50% of the duty cycle of the inverted clock signal XCK between time points t 4 and t 4 ′, and outputs it to In the second-stage shift register unit SR 2 ; and the second-stage shift register unit SR 2 receives the sampling signal S 1 , and at the time point t 4 ', outputs the sampling signal S 2 to the next-stage shift register unit, data The latch circuit (not shown in the figure) and the first-stage shift register unit SR 1 , the sampling signal S 2 is input to the reset terminals R 1 and R 2 of the flip-flops DFF 1 and DFF 2 after passing through the inverter NOT 2 , Reset DFF 1 and DFF 2 to make the output signals Q 1 and Q 2 change from high state to low state, and stop the sampling operation of the first-stage shift register unit SR 1 .

由于D型触发器属于一边缘触发触发器(edge trigger flip flop),在上述两实施例中,选择正缘触发(positive edge trigger)的触发器,因此,只有在时钟触发讯号为上升缘的触发状态才开始对数据输入端D的输入讯号做取样(sampling)动作,并由输出端Q输出其数据输入端D的输入电平。当然亦可选择负缘触发的触发器,作为上述实施例的替换。Since the D-type flip-flop belongs to an edge trigger flip flop, in the above two embodiments, a positive edge trigger (positive edge trigger) flip-flop is selected, so only when the clock trigger signal is a rising edge trigger The state starts to sample the input signal of the data input terminal D, and the output terminal Q outputs the input level of the data input terminal D. Of course, a flip-flop triggered by a negative edge can also be selected as an alternative to the above-mentioned embodiment.

请同时参照图8A、B所示,图8A为本发明第三实施例第1级移位缓存单元的电路图,图8B为各节点信号相对应的时序图。如图8A所示,第1级移位缓存单元系由七个晶体管所组成。本实施例可由NMOS薄膜晶体管或是PMOS薄膜晶体管所组成。若由NMOS薄膜晶体管所组成,则第一电源VDD为高电压电平,第二电源VSS为低电压电平;若由PMOS薄膜晶体管所组成,则第一电源VDD为低电压电平,第二电源VSS为高电压电平;本实施例则由NMOS所组成。Please refer to FIG. 8A and B at the same time. FIG. 8A is a circuit diagram of the first-level shift register unit according to the third embodiment of the present invention, and FIG. 8B is a timing diagram corresponding to each node signal. As shown in FIG. 8A , the first-level shift register unit is composed of seven transistors. This embodiment can be composed of NMOS thin film transistors or PMOS thin film transistors. If it is composed of NMOS thin film transistors, the first power supply V DD is at a high voltage level, and the second power supply V SS is at a low voltage level; if it is composed of PMOS thin film transistors, the first power supply V DD is at a low voltage level , the second power supply V SS is a high voltage level; in this embodiment, it is composed of NMOS.

第1级移位缓存单元包括一第1晶体管N1,其栅极耦接于反相时钟信号XCK,漏极耦接于定时控制电路(图中未显示)输出的起始信号ST,源极则连接第3晶体管N3的栅极、第6晶体管N6的栅极与第7晶体管N7的漏极,其源极与第3晶体管N3栅极连接处为一节点A;一第2晶体管N2,其漏极与栅极共同连于一第一电源VDD,源极连于第4晶体管N4的栅极、第5晶体管N5的漏极与第6晶体管N6的漏极;第3晶体管N3,其漏极耦接于时钟讯号CK,源极连接第4晶体管N4的漏极与第5晶体管N5的栅极,第3晶体管N3的源极与第4晶体管N4漏极连接处为第1级移位缓存单元的输出端;而第4、第5、第6与第7晶体管的源极皆连于一第二电源VSS;又第7晶体管N7作为第1级移位缓存单元的去能电路,其栅极耦接于第2级移位缓存单元的输出端。The first-level shift register unit includes a first transistor N1 , the gate of which is coupled to the inverted clock signal XCK, the drain is coupled to the start signal ST output by the timing control circuit (not shown in the figure), and the source is Then connect the gate of the 3rd transistor N3, the gate of the 6th transistor N6 and the drain of the 7th transistor N7 , its source and the junction of the gate of the 3rd transistor N3 are a node A; Transistor N2 , its drain and gate are connected to a first power supply VDD, the source is connected to the gate of the fourth transistor N4 , the drain of the fifth transistor N5 and the drain of the sixth transistor N6 ; The drain of the third transistor N 3 is coupled to the clock signal CK, the source is connected to the drain of the fourth transistor N 4 and the gate of the fifth transistor N 5 , the source of the third transistor N 3 is connected to the gate of the fourth transistor N 4. The drain connection is the output terminal of the first-stage shift register unit; and the sources of the 4th, 5th, 6th and 7th transistors are all connected to a second power supply V SS ; and the 7th transistor N7 is used as The gate of the disabling circuit of the first-level shift register unit is coupled to the output terminal of the second-level shift register unit.

在时间点t5时,第1晶体管N1的栅极接收反相时钟讯号XCK的高电平信号,使第1晶体管N1导通,漏极接收起始信号ST的高电平信号通过,经由节点A导通第3晶体管N3,此时,当第1晶体管N1被导通时,A点的电平与输入的起始信号相同,A点为浮动状态(floating state),利用耦合压差(feed-though voltage drop)原理,在时间点t6时,当时钟信号CK为高电平信号时,为保持第3晶体管N3的栅极与第1晶体管N1源极的压差,使得A点的电平更高,则第3晶体管N3仍导通;则在时间点t6至t7时,时钟讯号CK为一高电平信号由第3晶体管N3通过,并从输出端输出一取样信号S1至下1级移位缓存单元,使后续取样电路依序取样。当在时间点t7时,第2级移位缓存单元SR2(图中未显示)开始取样动作,此时,第7晶体管N7的栅极接收来自第二移位缓存单元的高电平取样信号S2,导通第7晶体管N7,使A点电位接地,则第3晶体管N3被关闭,第一移位缓存单元SR1即停止取样动作,以停止输出高态取样信号S1At the time point t5 , the gate of the first transistor N1 receives the high-level signal of the inverted clock signal XCK, so that the first transistor N1 is turned on, and the drain receives the high-level signal of the start signal ST to pass through. Turn on the third transistor N 3 via node A. At this time, when the first transistor N 1 is turned on, the level of point A is the same as the input start signal, and point A is in a floating state. According to the principle of feed-though voltage drop, at the time point t6 , when the clock signal CK is a high-level signal, in order to maintain the voltage difference between the gate of the third transistor N3 and the source of the first transistor N1 , so that the level at point A is higher, then the third transistor N3 is still turned on; then at the time point t6 to t7 , the clock signal CK is a high level signal and passes through the third transistor N3 , and from The output terminal outputs a sampling signal S 1 to the shift buffer unit of the next stage, so that subsequent sampling circuits can sample in sequence. At the time point t7 , the second-stage shift register unit SR 2 (not shown in the figure) starts sampling operation, and at this time, the gate of the seventh transistor N7 receives a high level from the second shift register unit The sampling signal S 2 turns on the seventh transistor N 7 to ground the potential of point A, then the third transistor N 3 is turned off, and the first shift register unit SR 1 stops the sampling operation to stop outputting the high-state sampling signal S 1 .

请参照图9A所示,其为本发明第三实施例第1级移位缓存单元的输入讯号与输出讯号时序图。移位寄存电路接收起始信号ST与反相时钟讯号XCK,其中,第1级移位缓存单元在时间点t5时,接收到起始信号ST为一脉冲输入,驱动第1级移位缓存单元进行取样动作,根据上述取样原理,第1级移位缓存单元会在时间点t6至t7时,产生一取样信号S1输出至对应的数据锁存电路与第2级移位缓存单元。第2级移位缓存单元接收取样信号S1,产生一取样信号S2馈入至对应的数据锁存电路、下一级移位缓存单元与第1级移位缓存单元的去能电路,并驱动去能电路以停止第1级移位缓存单元的取样动作,因此在时间点t7至t8处,第1级移位缓存单元将不会撷取信号,以避免取样错误。Please refer to FIG. 9A , which is a timing diagram of input signals and output signals of the first-stage shift register unit according to the third embodiment of the present invention. The shift register circuit receives the start signal ST and the inverted clock signal XCK, wherein, at the time point t5 , the first-stage shift buffer unit receives the start signal ST as a pulse input to drive the first-stage shift buffer The unit performs a sampling operation. According to the above sampling principle, the first-level shift register unit will generate a sampling signal S1 at the time point t6 to t7 , and output it to the corresponding data latch circuit and the second-level shift register unit . The second-stage shift register unit receives the sampling signal S 1 , generates a sample signal S 2 and feeds it to the corresponding data latch circuit, the next-stage shift register unit and the disabling circuit of the first-stage shift register unit, and The disable circuit is driven to stop the sampling operation of the first-stage shift register unit, so at time points t7 to t8 , the first-stage shift register unit will not capture signals to avoid sampling errors.

此一实施例可进一步改变起始信号ST持续时间(duration)的大小,如图9B所示,为上述实施例一广义的作法。其中,移位寄存电路所接收反相时钟讯号XCK的工作周期为T,起始信号ST的持续时间设为(n+1/2)T,n为自然数。由于起始信号ST的持续时间可能增加,原先设计第1级移位缓存单元的中的去能电路,接收第2级移位缓存单元的取样讯号S2,而停止第1级移位缓存单元的取样动作,相对应增加接收多级的取样讯号至取样讯号Sm,m为大于或等于n+1。以避免重复取样的错误发生。In this embodiment, the duration of the start signal ST can be further changed, as shown in FIG. 9B , which is a generalized approach of the above-mentioned embodiment. Wherein, the duty cycle of the inverted clock signal XCK received by the shift register circuit is T, the duration of the start signal ST is set as (n+1/2)T, and n is a natural number. Since the duration of the start signal ST may increase, the disabling circuit in the first-stage shift register unit was originally designed to receive the sampling signal S 2 of the second-stage shift register unit, and stop the first-stage shift register unit The sampling action corresponds to adding multi-level sampling signals to the sampling signal Sm, where m is greater than or equal to n+1. to avoid repeated sampling errors.

举例说明:当n为5时,起始信号ST持续时间为5.5T,则第1级移位缓存单元的去能电路需设计为至少要接收第2级至第6级移位缓存单元的取样讯号S2~S6。依据上述实施例动作原理,由于起始信号ST持续时间比反相时钟信号XCK的周期大的多,因此不论起始信号ST与反相时钟信号XCK的延迟有多严重,都至少会有一个反相时钟信号XCK的高态半周期(XCK=1)与起始信号ST持续时间(ST=1)同时进入第1级移位缓存单元的取样电路,则取样电路便可正常操作,及取样一时钟信号CK的高态半周期作为取样信号S1;但由于起始信号ST持续时间很长,有可能会有多个周期的反相时钟信号XCK与起始信号ST同时输入第1级移位缓存单元的取样电路,会造成第1级移位缓存单元重复输出取样信号S1的情形,因此需藉由去能电路接收除第1级外的取样信号,以停止第1级移位缓存单元取样动作,避免重复取样的错误发生。For example: when n is 5, the duration of the start signal ST is 5.5T, then the disabling circuit of the shift register unit of the first stage needs to be designed to at least receive the samples of the shift register units of the second to sixth stages Signals S 2 -S 6 . According to the action principle of the above-mentioned embodiment, since the duration of the start signal ST is much longer than the period of the inverted clock signal XCK, no matter how serious the delay between the start signal ST and the inverted clock signal XCK is, there will be at least one inverted clock signal. The high-state half period (XCK=1) of the phase clock signal XCK and the duration of the start signal ST (ST=1) enter the sampling circuit of the first stage shift buffer unit simultaneously, then the sampling circuit can operate normally, and sample a The high-state half period of the clock signal CK is used as the sampling signal S1 ; but because the start signal ST lasts for a long time, there may be multiple cycles of the inverted clock signal XCK and the start signal ST input to the first stage of shifting at the same time The sampling circuit of the cache unit will cause the first-stage shift register unit to repeatedly output the sampling signal S 1 , so it is necessary to receive the sampling signals other than the first stage through the disabling circuit to stop the first-stage shift register unit Sampling action to avoid repeated sampling errors.

请参照图10,其为本发明一实施例使驱动电路信号同步方法的流程图。显示器的驱动电路具有一定时控制电路、一数据驱动电路与一扫瞄驱动电路,其中数据电路中包括一移位寄存电路及多个锁存电路,移位寄存电路系由多级移位缓存单元所组成。Please refer to FIG. 10 , which is a flowchart of a method for synchronizing driving circuit signals according to an embodiment of the present invention. The drive circuit of the display has a timing control circuit, a data drive circuit and a scan drive circuit, wherein the data circuit includes a shift register circuit and a plurality of latch circuits, and the shift register circuit is composed of a multi-stage shift buffer unit composed of.

驱动电路信号同步方法至少包括下列步骤:定时控制电路提供一反相时钟信号与一起始信号至扫瞄驱动电路与数据驱动电路(S1);数据驱动电路中第1级移位缓存单元接收反相时钟信号与起始信号(S2);在第1级移位缓存单元中,当起始信号为高电平时,撷取对应该起始信号的下一个时钟信号的50%工作周期作为一取样信号S1的持续时间(S3);将此同步的取样信号S1、时钟信号与反相时钟信号输出至相对应的锁存电路与第2级移位缓存单元(S4);第2级移位缓存单元接收第1级的取样信号S1,而产生取样信号S2(S5);第2级的取样信号S2输出至相对应的锁存电路及下一级移位缓存单元,并回授至第1级移位缓存单元的去能电路(S6);第1级移位缓存单元藉由第2级的取样信号S2停止取样动作(S7),避免重复取样,且能得到正确的取样信号,以避免已知技术取样信号不正确所导致数据驱动电路无法正常操作的情形。The drive circuit signal synchronization method at least includes the following steps: the timing control circuit provides an inverted clock signal and a start signal to the scan drive circuit and the data drive circuit (S1); Clock signal and start signal (S2); in the first-level shift register unit, when the start signal is high level, capture the 50% duty cycle of the next clock signal corresponding to the start signal as a sampling signal The duration of S 1 (S3); output the synchronous sampling signal S 1 , the clock signal and the inverted clock signal to the corresponding latch circuit and the second-level shift buffer unit (S4); the second-level shift The buffer unit receives the sampling signal S 1 of the first stage, and generates the sampling signal S 2 (S5); the sampling signal S 2 of the second stage is output to the corresponding latch circuit and the shift buffer unit of the next stage, and feedback To the disabling circuit (S6) of the first-stage shift register unit; the first-stage shift register unit stops the sampling operation (S7) by the sampling signal S2 of the second stage, so as to avoid repeated sampling and obtain correct sampling signal, so as to avoid the situation that the data driving circuit cannot operate normally due to the incorrect sampling signal of the known technology.

在步骤S7中由于起始信号持续时间的不同,以及第1级移位缓存单元电路设计的不同,而配合接收其它级或自身此级的输出来控制同步讯号的产生及停止取样动作。In step S7, due to the difference in the duration of the start signal and the design of the first-stage shift register unit, the synchronous signal is controlled to be generated and the sampling operation is stopped in conjunction with receiving the output of other stages or its own stage.

在本发明所举的实施例中,为求说明方便皆以双相时钟信号作为参考信号,即以双时钟驱动移位寄存电路为说明,但实际上除了应用在双时钟移位寄存电路中,亦可应用在单时钟(single-phase)或多时钟移位寄存电路(multi-phase clock shift register),皆可实现本发明所述的功能。本发明以第1级移位缓存单元接收来自定时控制电路的起始信号与反相时钟信号作为说明,当然亦可接收起始信号与时钟信号,以产生取样信号。In the embodiments of the present invention, for the convenience of explanation, the two-phase clock signal is used as the reference signal, that is, the dual-clock driving shift register circuit is used as an illustration, but in fact, except for the application in the dual-clock shift register circuit, It can also be applied to single-phase or multi-phase clock shift register circuits, both of which can realize the functions described in the present invention. In the present invention, the first-stage shift register unit receives the start signal and the inverted clock signal from the timing control circuit for illustration. Of course, it can also receive the start signal and the clock signal to generate the sampling signal.

另外在本发明移位寄存电路中,对第1级移位缓存单元重新设计并加入了去能电路(第一、第二实施例中的重置端,第三实施例中的第7晶体管N7),即使时钟讯号与起始讯号在传输过程中有所延迟,而使得进入至第1级移位缓存单元时为异步讯号,将利用第1级移位缓存单元的电路设计,实现所输出的取样信号与时钟讯号为一同步时钟,以避免不正常时钟的出现,而严重影响显示画面正确性。而第2级至第N级移位缓存单元则可用一般的移位缓存单元的电路,不需做特别的变更。In addition, in the shift register circuit of the present invention, the shift register unit of the first stage is redesigned and added with a disabling circuit (the reset terminal in the first and second embodiments, the seventh transistor N in the third embodiment 7 ), even if the clock signal and the start signal are delayed during the transmission process, so that it is an asynchronous signal when entering the first-level shift register unit, the circuit design of the first-level shift register unit will be used to realize the output The sampling signal and the clock signal are a synchronous clock to avoid the appearance of abnormal clock, which seriously affects the accuracy of the display screen. For the shift register units of the second to the Nth stages, the circuit of the general shift register unit can be used without any special modification.

本发明是利用第1级移位缓存单元接收来自定时控制电路的起始信号与反相时钟信号后,产生与反相时钟信号同步的时钟信号以及取样信号,而后续的各级移位缓存单元可藉此同步的反相时钟信号、时钟信号与取样信号逐级输出而完成移位寄存电路的功能。而此第1级移位缓存单元尚须其它级或自身此级的输出来控制同步讯号的产生。The present invention uses the first-stage shift buffer unit to receive the start signal and the inverted clock signal from the timing control circuit, and then generates a clock signal and a sampling signal synchronous with the inverted clock signal, while the subsequent stages of shift buffer units The synchronized inverted clock signal, clock signal and sampling signal can be output step by step to complete the function of the shift register circuit. However, the first-stage shift register unit still needs the output of other stages or its own stage to control the generation of synchronous signals.

本发明虽以较佳实例说明如上,然其并非用以限定本发明精神与发明实体仅止于上述实施例。本领域的技术人员可轻易了解并利用其它组件或方式来产生相同的功效。因此,在不脱离本发明的精神与范围的前提下所作的修改,均应包含在本发明的权利要求内。Although the present invention has been described above with preferred examples, it is not intended to limit the spirit and entities of the present invention to the above-mentioned examples. Those skilled in the art can easily understand and utilize other components or methods to produce the same effect. Therefore, modifications made without departing from the spirit and scope of the present invention should be included in the claims of the present invention.

Claims (10)

1. a shift register circuit has multistage shift cache unit, according to the signal that a timing control circuit is provided, produces a sampled signal to a corresponding data-latching circuit, and this shift register circuit comprises:
The 1st grade of shift cache unit, couple this timing control circuit and corresponding this data-latching circuit, have the circuit of deenergizing and a sample circuit, receive the signal that this timing control circuit provides, capture a correct sampled signal and export in corresponding this data-latching circuit and the next stage shift cache unit; With
The 2nd grade to N level shift cache unit, has a sample circuit separately, and series connection and the 2nd grade of shift cache unit are connected in the 1st grade of shift cache unit step by step;
Wherein, this circuit that deenergizes of the 1st grade of shift cache unit receives the sampled signal of the 2nd grade of shift cache unit, stops the action of this sample circuit of the 1st grade of shift cache unit.
2. shift register circuit as claimed in claim 1, wherein the 1st grade of shift cache unit by a trigger, two phase inverters and one and door form, by the replacement end of this trigger of the anti-phase back feed-in of the sampled signal of the 2nd grade of shift cache unit, to stop the sampling action of the 1st grade of shift cache unit.
3. shift register circuit as claimed in claim 1, wherein the 1st grade of shift cache unit by the triggers of two series connection, two phase inverters with one and an a plurality of logic module form, by the replacement end of this two trigger of the anti-phase back feed-in of the sampled signal of the 2nd grade of shift cache unit, to stop the sampling action of the 1st grade of shift cache unit.
4. shift register circuit as claimed in claim 1, this circuit that deenergizes of the 1st grade of shift cache unit wherein, comprise a N transistor npn npn, the source electrode of this N transistor npn npn is connected in this sample circuit, drain electrode end and is connected in the sampled signal that relative electronegative potential place, grid receive the 2nd grade of shift cache unit, when the sampled signal of the 2nd grade of shift cache unit is a high level pulse, this N transistor npn npn conducting is connected to relative electronegative potential place with sample circuit, to stop the sampling action of the 1st grade of shift cache unit.
5. shift register circuit as claimed in claim 4, wherein this timing control circuit provides an initial signal and a clock signal, and the cycle of this clock signal is T, and the cycle of this start signal equals (N+1/2) * T, N is a natural number.
6. the driving circuit of a display, this driving circuit comprises:
One timing control circuit;
One data drive circuit, couple this timing control circuit, has a shift register circuit, wherein this shift register circuit is made of multistage shift cache unit, by the signal that this timing control circuit provided, the 1st grade of shift cache unit of this shift register circuit captures a correct sampled signal, export the next stage shift cache unit to, sampled signal according to the 2nd grade of shift cache unit, the sampling action of the 1st grade of shift cache unit is stopped, and the multistage shift cache unit in back moves in regular turn; And
Scan driving circuit couples this timing control circuit, and controlled by it,
Scan the signal that driving circuit provides by this data drive circuit and this, the picture of controlling and drive this display shows.
7. driving circuit as claimed in claim 6, wherein the 1st grade of shift cache unit by a trigger, two phase inverters and one and door form, by the replacement end of this trigger of the anti-phase back feed-in of the sampled signal of one the 2nd grade of shift cache unit, to stop the sampling action of the 1st grade of shift cache unit.
8. driving circuit as claimed in claim 6, wherein the 1st grade of shift cache unit is by the triggers of two series connection, two phase inverters and one and form, by the replacement end of this two trigger of the anti-phase back feed-in of the sampled signal of one the 2nd grade of shift cache unit, to stop the sampling action of the 1st grade of shift cache unit.
9. driving circuit as claimed in claim 6, this circuit that deenergizes of the 1st grade of shift cache unit wherein, has a N transistor npn npn, the source electrode of this N transistor npn npn is connected in this sample circuit, drain electrode end and is connected in the sampled signal that relative electronegative potential place, grid receive one the 2nd grade of shift cache unit, when the sampled signal of the 2nd grade of shift cache unit is a high level pulse, this N transistor npn npn conducting is connected to relative electronegative potential place with sample circuit, to stop the sampling action of the 1st grade of shift cache unit.
10. driving circuit as claimed in claim 9, wherein this timing control circuit provides an initial signal and a clock signal, and the cycle of this clock signal is T, and the cycle of this start signal equals (N+1/2) * T, N is a natural number.
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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU503296A1 (en) * 1973-03-22 1976-02-15 Предприятие П/Я А-7438 -Shift shift register
EP0030005A1 (en) * 1979-11-30 1981-06-10 Siemens Aktiengesellschaft Circuit arrangement in a communication system with delta modulation
JPS62248312A (en) * 1986-04-21 1987-10-29 Nec Corp Serial-parallel conversion circuit
JPH043398A (en) * 1990-04-20 1992-01-08 Toyo Commun Equip Co Ltd Multistage shift register
JPH08212794A (en) * 1995-02-02 1996-08-20 Fuji Electric Co Ltd Shift register
JPH09147594A (en) * 1995-11-22 1997-06-06 Ricoh Co Ltd Shift register circuit
JP4003398B2 (en) * 2001-01-15 2007-11-07 株式会社ノーリツ bathroom

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU503296A1 (en) * 1973-03-22 1976-02-15 Предприятие П/Я А-7438 -Shift shift register
EP0030005A1 (en) * 1979-11-30 1981-06-10 Siemens Aktiengesellschaft Circuit arrangement in a communication system with delta modulation
JPS62248312A (en) * 1986-04-21 1987-10-29 Nec Corp Serial-parallel conversion circuit
JPH043398A (en) * 1990-04-20 1992-01-08 Toyo Commun Equip Co Ltd Multistage shift register
JPH08212794A (en) * 1995-02-02 1996-08-20 Fuji Electric Co Ltd Shift register
JPH09147594A (en) * 1995-11-22 1997-06-06 Ricoh Co Ltd Shift register circuit
JP4003398B2 (en) * 2001-01-15 2007-11-07 株式会社ノーリツ bathroom

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