CN100346221C - Liquid crystal display panel and testing method thereof - Google Patents

Abstract

A liquid crystal display panel and a test method thereof, wherein the liquid crystal display panel comprises a display area and an external pin press-fit area, the external pin press-fit area is positioned at the periphery of the display area and is provided with a first test pad, a second test pad, a third test pad and a test pixel, and the first test pad, the second test pad and the third test pad are respectively and electrically connected with the test pixel.

Description

Liquid crystal display panel and testing method thereof

technical field

The invention relates to a liquid crystal display panel and a testing method thereof, in particular to a liquid crystal display which can utilize a liquid crystal cell test pad (cell test pad) as a thin film transistor current-voltage curve test pad (TFT I-Vcurve test pad) panel.

Background technique

Referring to Figures 1a and 1b, most of the known small and medium-sized liquid crystal display panels 10 have very tight panel layout space, because there may be no space to place a discharge test component group (TEG mark) 11 in the panel, Therefore, the electrical test component group 11 is placed on the outer edge of the panel for array test (array test), but when cutting into small pieces, the electrical test component group 11 will be removed together. If an electrical problem occurs, it needs to be removed. When measuring the current-voltage curve, since there is no discharge test component group in the panel, the test probe needs to directly measure the pixels inside the panel. However, because the lines of the pixels are very thin, it will increase the difficulty of measurement and reduce the accuracy.

In addition, after the liquid crystal cell test, the shorting bar 12 located on the left side of the panel can be removed by grinding or laser, which will make the liquid crystal cell test gasket 13 useless.

Contents of the invention

In view of this, the purpose of the present invention is to provide a liquid crystal display panel, which can use the liquid crystal cell test pad as the TFT current-voltage curve test pad.

According to the present invention, a liquid crystal display panel is provided, which includes a display area and an external pin pressing area, wherein the external pin pressing area is located at the periphery of the display area, and has a first test pad, a second test pad Pad, a third test pad, and a test pixel, and the first test pad, the second test pad, and the third test pad are respectively electrically connected to the test pixel.

In a preferred embodiment, the first test pad is the control electrode of the test pixel, the second test pad is the first electrode of the test pixel, and the third test pad is the second electrode of the test pixel .

It should be understood that the first test pad can be the gate of the test pixel, and the second test pad and the third test pad can be the source or drain of the test pixel, respectively.

In another preferred embodiment, the display area has a plurality of display pixels, and the first test pad and the second test pad are test pads for display pixels.

Also in the present invention, a method for testing a liquid crystal display panel is provided, comprising the following steps: first, a liquid crystal display panel and a plurality of test probes are provided, wherein the liquid crystal display panel has a first test pad, a second test pad Pad, a third test pad, and a test pixel, and the first test pad, the second test pad, and the third test pad are electrically connected to the test pixel respectively; then, the test probes are respectively connected to the first test pad A test pad, the second test pad, and the third test pad are in contact, and a test signal is transmitted to the test pixel to obtain a current-voltage curve of the test pixel.

In a preferred embodiment, the test method further includes providing a current-voltage curve measuring machine, which is respectively electrically connected to the test probes, so as to pass through the test probes, the first test pad, the second test pad, and the first test pad. Three test pads provide test signals to test pixels.

In addition, the test pixel transmits a signal to the current-voltage curve measurement machine through the first test pad, the second test pad, the third test pad, and the test probe, and the current-voltage curve measurement machine uses the signal from the test pixel The signal is calculated and analyzed to obtain the current-voltage curve of the test pixel

In order to make the above and other objects, features, and advantages of the present invention more comprehensible, a preferred embodiment will be described in detail below in conjunction with the accompanying drawings.

Description of drawings

Figure 1a is a schematic diagram of a known liquid crystal display panel;

Figure 1b is an enlarged view of part A in Figure 1a;

Figure 2a is a schematic diagram of a liquid crystal display panel of the present invention;

Figure 2b is an enlarged view of part B in Figure 2a;

Figure 2c is an enlarged view of part C in Figure 2b; and

FIG. 3 is a flow chart of the method for testing the current-voltage curve of the liquid crystal display panel of the present invention.

Explanation of reference symbols:

10 LCD display panel

11 Electrical test component group

12 short circuit metal strip

13 Liquid crystal cell test gasket

20 LCD display panel

21 display area

22 External pin pressing area

22a First Test Shim

22b Second Test Shim

22c third test shim

22d test pixels

22e, 22f, 22g lines

Detailed ways

2a, 2b, 2c, a liquid crystal display panel 20 of the present invention includes a display area 21 and an outer lead bonding area (OLB, outer lead bonding) 22, wherein there are a plurality of display pixels (not shown in the figure) in the display area 21 display) to display the desired image.

The external pin pressing area 22 is located around the display area 21 and has a first test pad 22a, a second test pad 22b, a third test pad 22c, and a test pixel 22d, wherein the first test pad The sheet 22a and the second test pad 22b are test pads for display pixels in the display area 21, that is, the first test pad 22a and the second test pad 22b are like the test pad 13 in FIG. 1b, It is a cell test pad for liquid crystal cells.

The liquid crystal display panel 20 of the present invention is different from the known liquid crystal display panel in that: the external pin bonding area 22 is further provided with a third test pad 22c and a test pixel 22d, and the first test pad 22a, The second test pad 22b and the third test pad 22c are electrically connected to the test pixel 22d via lines 22e, 22f, and 22g respectively, which can make known useless liquid crystal cell test pads (the first test pad 22a and the second test pad 22a) The test pad 22b) is used as a thin film transistor current-voltage curve test pad (TFT I-V curve test pad).

In a word, when testing the current-voltage curve of the thin film transistor, the first test pad 22a can be used as the control electrode (gate) of the test pixel 22d, and the second test pad 22b is the first electrode (source or gate) of the test pixel 22d. drain), and the third test pad 22c is the second electrode (drain or source) of the test pixel 22d.

It should be understood that the surfaces of the first test pad 22a, the second test pad 22b, and the third test pad 22c are all covered with ITO (Indium Tin Oxide), and pass through the external pin bonding area 22 respectively. The through hole is connected to the underlying metal layer. As this is well known to those skilled in the art, its detailed description is omitted here.

The structure of the liquid crystal display panel of the present invention is as described above, and the current-voltage curve test method thereof will be described below.

Referring to Fig. 3, the test method includes the following steps: first, as shown in step s11, the above-mentioned liquid crystal display panel 20, a current-voltage curve measuring machine (not shown), and a plurality of test probes (not shown) are provided, wherein The current-voltage curve measuring machine is electrically connected with the test probes respectively, so as to provide a test signal to the test pixel 22d through the test probes; then, as shown in step s12, the test probes are respectively connected to the first test pad 22a, the second The second test pad 22b is in contact with the third test pad 22c, so that the test signal is transmitted to the test pixel 22d via the first test pad 22a, the second test pad 22b, and the third test pad 22c; finally, as As shown in step s13, the signal in the test pixel 22d is transmitted to the current-voltage curve measuring machine through the first test pad 22a, the second test pad 22b, the third test pad 22c, and the test probe, and the calculation and analysis are carried out , the current-voltage curve of the test pixel 22d can be obtained.

As mentioned above, since the known useless liquid crystal cell test gasket in the liquid crystal display panel can be fully utilized, it can be converted into a thin film transistor current-voltage curve test gasket, and only a test gasket and a test pixel need to be placed, that is, The current-voltage curve can be measured without finding space in the panel to place the electrical test component group (TEG mark) or to place two additional test pads, so that the space of the glass can be optimally utilized.

Although the present invention has been disclosed above with preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can certainly make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention should be defined by the claims.

Claims (6)

1. A liquid crystal display panel, comprising: a display area; and An external pin pressing area, the external pin pressing area is located at the periphery of the display area, and has a first test pad, a second test pad, a third test pad, and a test pixel, wherein The first test pad, the second test pad, and the third test pad are respectively connected to the test pixel. 2. The liquid crystal display panel as claimed in claim 1, wherein the first test pad is the gate of the test pixel, and the second test pad is the source of the test pixel, and the The third test pad is for the drain of the test pixel. 3. The liquid crystal display panel as claimed in claim 1, wherein the first test pad is the gate of the test pixel, and the second test pad is the drain of the test pixel, and the The third test pad is the source of the test pixel. 4. The liquid crystal display panel as claimed in claim 1, wherein the display area has a plurality of display pixels, and the first test pad and the second test pad are test pads for the display pixels. 5. A test method for a liquid crystal display panel, comprising: A liquid crystal display panel and a plurality of test probes are provided, wherein the liquid crystal display panel has a first test pad, a second test pad, a third test pad, and a test pixel, and the first test pad chip, the second test pad, and the third test pad are respectively electrically connected to the test pixel; these test probes are respectively connected to the first test pad, the second test pad, and the third test pad The pad contacts, and conducts a test signal to the test pixel, so as to obtain the current-voltage curve of the test pixel; and A current-voltage curve measuring machine is provided, which is respectively electrically connected to the test probes to provide a test via the test probes, the first test pad, the second test pad, and the third test pad signal to the test pixel. 6. the testing method of liquid crystal display panel as claimed in claim 5, is characterized in that: also comprises: The test pixel transmits a signal to the current-voltage curve measuring machine through the first test pad, the second test pad, the third test pad, and the test probes, and the current-voltage curve measuring machine The signal from the test pixel is calculated and analyzed to obtain the current-voltage curve of the test pixel.

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