CH557598A - Einrichtung fuer die sekundaer-ionen-massenspektroskopie. - Google Patents
Einrichtung fuer die sekundaer-ionen-massenspektroskopie.Info
- Publication number
- CH557598A CH557598A CH1574373A CH1574373A CH557598A CH 557598 A CH557598 A CH 557598A CH 1574373 A CH1574373 A CH 1574373A CH 1574373 A CH1574373 A CH 1574373A CH 557598 A CH557598 A CH 557598A
- Authority
- CH
- Switzerland
- Prior art keywords
- mass spectroscopy
- ion mass
- secondary ion
- spectroscopy
- mass
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/067—Ion lenses, apertures, skimmers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
- H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
- H01J49/4215—Quadrupole mass filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2255302A DE2255302C3 (de) | 1972-11-11 | 1972-11-11 | Einrichtung für die Sekundär-Ionen-Massenspektroskopie |
Publications (1)
Publication Number | Publication Date |
---|---|
CH557598A true CH557598A (de) | 1974-12-31 |
Family
ID=5861444
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH1574373A CH557598A (de) | 1972-11-11 | 1973-11-09 | Einrichtung fuer die sekundaer-ionen-massenspektroskopie. |
Country Status (5)
Country | Link |
---|---|
US (1) | US3859226A (de) |
CH (1) | CH557598A (de) |
DE (1) | DE2255302C3 (de) |
FR (1) | FR2206579B1 (de) |
GB (1) | GB1399588A (de) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH583460A5 (de) * | 1974-09-30 | 1976-12-31 | Balzers Patent Beteilig Ag | |
US3939344A (en) * | 1974-12-23 | 1976-02-17 | Minnesota Mining And Manufacturing Company | Prefilter-ionizer apparatus for use with quadrupole type secondary-ion mass spectrometers |
US4058724A (en) * | 1975-06-27 | 1977-11-15 | Minnesota Mining And Manufacturing Company | Ion Scattering spectrometer with two analyzers preferably in tandem |
DE2534665C2 (de) * | 1975-08-02 | 1985-09-05 | Leybold-Heraeus GmbH, 5000 Köln | Massenspektroskopische Einrichtung |
DE2540505A1 (de) * | 1975-09-11 | 1977-03-24 | Leybold Heraeus Gmbh & Co Kg | Flugzeit-massenspektrometer fuer ionen mit unterschiedlichen energien |
DE2556291C3 (de) * | 1975-12-13 | 1980-11-27 | Gesellschaft Fuer Strahlen- Und Umweltforschung Mbh, 8000 Muenchen | Raster-Ionenmikroskop |
US4075479A (en) * | 1976-03-04 | 1978-02-21 | Finnigan Corporation | Focusing ion lens system for mass spectrometer for separating charged and neutral particles |
DE2753412C2 (de) * | 1977-11-30 | 1983-06-23 | Max Planck Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen | Rotationssymmetrischer Ionen-Elektronen-Konverter |
DE2947542A1 (de) * | 1979-11-26 | 1981-06-04 | Leybold-Heraeus GmbH, 5000 Köln | Einrichtung zur ueberwachung und/oder steuerung von plasmaprozessen |
DE3048392A1 (de) * | 1980-12-22 | 1982-07-22 | Leybold-Heraeus GmbH, 5000 Köln | Linsensystem fuer analysatoren |
US4442354A (en) * | 1982-01-22 | 1984-04-10 | Atom Sciences, Inc. | Sputter initiated resonance ionization spectrometry |
US4556794A (en) * | 1985-01-30 | 1985-12-03 | Hughes Aircraft Company | Secondary ion collection and transport system for ion microprobe |
CA1245778A (en) * | 1985-10-24 | 1988-11-29 | John B. French | Mass analyzer system with reduced drift |
GB9204524D0 (en) * | 1992-03-03 | 1992-04-15 | Fisons Plc | Mass spectrometer |
GB9219457D0 (en) * | 1992-09-15 | 1992-10-28 | Fisons Plc | Reducing interferences in plasma source mass spectrometers |
US8921803B2 (en) | 2011-03-04 | 2014-12-30 | Perkinelmer Health Sciences, Inc. | Electrostatic lenses and systems including the same |
US8461524B2 (en) * | 2011-03-28 | 2013-06-11 | Thermo Finnigan Llc | Ion guide with improved gas dynamics and combined noise reduction device |
DE102012200211A1 (de) * | 2012-01-09 | 2013-07-11 | Carl Zeiss Nts Gmbh | Vorrichtung und Verfahren zur Oberflächenbearbeitung eines Substrates |
CN105849857A (zh) * | 2013-12-31 | 2016-08-10 | Dh科技发展私人贸易有限公司 | 用于质谱分析法的离子导向件 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3501630A (en) * | 1969-03-17 | 1970-03-17 | Bell & Howell Co | Mass filter with removable auxiliary electrode |
-
1972
- 1972-11-11 DE DE2255302A patent/DE2255302C3/de not_active Expired
-
1973
- 1973-11-08 GB GB5199473A patent/GB1399588A/en not_active Expired
- 1973-11-09 CH CH1574373A patent/CH557598A/de not_active IP Right Cessation
- 1973-11-12 FR FR7340225A patent/FR2206579B1/fr not_active Expired
- 1973-11-12 US US414768A patent/US3859226A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
GB1399588A (en) | 1975-07-02 |
FR2206579B1 (de) | 1978-03-10 |
DE2255302A1 (de) | 1974-05-22 |
US3859226A (en) | 1975-01-07 |
FR2206579A1 (de) | 1974-06-07 |
DE2255302B2 (de) | 1980-01-17 |
DE2255302C3 (de) | 1980-09-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PL | Patent ceased |