CA984523A - Process for the formation of self-aligned silicon and aluminum gates - Google Patents
Process for the formation of self-aligned silicon and aluminum gatesInfo
- Publication number
- CA984523A CA984523A CA171,132A CA171132A CA984523A CA 984523 A CA984523 A CA 984523A CA 171132 A CA171132 A CA 171132A CA 984523 A CA984523 A CA 984523A
- Authority
- CA
- Canada
- Prior art keywords
- self
- formation
- aligned silicon
- aluminum gates
- gates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 title 1
- 229910052782 aluminium Inorganic materials 0.000 title 1
- 230000015572 biosynthetic process Effects 0.000 title 1
- 229910052710 silicon Inorganic materials 0.000 title 1
- 239000010703 silicon Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/66—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
- H10D64/665—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes the conductor comprising a layer of elemental metal contacting the insulator, e.g. tungsten or molybdenum
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/66—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
- H10D64/661—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes the conductor comprising a layer of silicon contacting the insulator, e.g. polysilicon having vertical doping variation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0198—Integrating together multiple components covered by H10D44/00, e.g. integrating charge coupled devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Semiconductor Memories (AREA)
- Electrodes Of Semiconductors (AREA)
- Weting (AREA)
- Non-Volatile Memory (AREA)
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US00267879A US3834959A (en) | 1972-06-30 | 1972-06-30 | Process for the formation of selfaligned silicon and aluminum gates |
Publications (1)
Publication Number | Publication Date |
---|---|
CA984523A true CA984523A (en) | 1976-02-24 |
Family
ID=23020517
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA171,132A Expired CA984523A (en) | 1972-06-30 | 1973-05-08 | Process for the formation of self-aligned silicon and aluminum gates |
Country Status (7)
Country | Link |
---|---|
US (1) | US3834959A (fr) |
JP (1) | JPS543599B2 (fr) |
CA (1) | CA984523A (fr) |
DE (1) | DE2331393C2 (fr) |
FR (1) | FR2191274A1 (fr) |
GB (1) | GB1418231A (fr) |
IT (1) | IT987430B (fr) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51147226A (en) * | 1975-06-13 | 1976-12-17 | Nec Corp | Semiconductor memory device |
US4075045A (en) * | 1976-02-09 | 1978-02-21 | International Business Machines Corporation | Method for fabricating FET one-device memory cells with two layers of polycrystalline silicon and fabrication of integrated circuits containing arrays of the memory cells charge storage capacitors utilizing five basic pattern deliberating steps |
US4827448A (en) * | 1976-09-13 | 1989-05-02 | Texas Instruments Incorporated | Random access memory cell with implanted capacitor region |
US4182636A (en) * | 1978-06-30 | 1980-01-08 | International Business Machines Corporation | Method of fabricating self-aligned contact vias |
US4238275A (en) * | 1978-12-29 | 1980-12-09 | International Business Machines Corporation | Pyrocatechol-amine-water solution for the determination of defects |
JPS5660052A (en) * | 1980-10-20 | 1981-05-23 | Toshiba Corp | Semiconductor memory device |
JPH0630355B2 (ja) * | 1983-05-16 | 1994-04-20 | ソニー株式会社 | 半導体装置 |
JPH0618263B2 (ja) * | 1984-02-23 | 1994-03-09 | 日本電気株式会社 | 電荷転送素子 |
JP2642523B2 (ja) * | 1991-03-19 | 1997-08-20 | 株式会社東芝 | 電荷結合素子を持つ半導体集積回路装置の製造方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2050320A1 (de) * | 1970-10-13 | 1972-04-20 | Siemens Ag | Halbleiteranordnung |
-
1972
- 1972-06-30 US US00267879A patent/US3834959A/en not_active Expired - Lifetime
-
1973
- 1973-05-08 CA CA171,132A patent/CA984523A/en not_active Expired
- 1973-05-15 IT IT24078/73A patent/IT987430B/it active
- 1973-06-04 JP JP6208273A patent/JPS543599B2/ja not_active Expired
- 1973-06-06 FR FR7321788A patent/FR2191274A1/fr not_active Withdrawn
- 1973-06-08 GB GB2730873A patent/GB1418231A/en not_active Expired
- 1973-06-20 DE DE2331393A patent/DE2331393C2/de not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB1418231A (en) | 1975-12-17 |
DE2331393C2 (de) | 1984-08-09 |
FR2191274A1 (fr) | 1974-02-01 |
DE2331393A1 (de) | 1974-01-17 |
US3834959A (en) | 1974-09-10 |
JPS543599B2 (fr) | 1979-02-24 |
JPS4964382A (fr) | 1974-06-21 |
IT987430B (it) | 1975-02-20 |
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