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CA571169A - Method and apparatus for measuring the thickness of electroconductive films - Google Patents

Method and apparatus for measuring the thickness of electroconductive films

Info

Publication number
CA571169A
CA571169A CA571169A CA571169DA CA571169A CA 571169 A CA571169 A CA 571169A CA 571169 A CA571169 A CA 571169A CA 571169D A CA571169D A CA 571169DA CA 571169 A CA571169 A CA 571169A
Authority
CA
Canada
Prior art keywords
measuring
thickness
electroconductive films
electroconductive
films
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA571169A
Other languages
French (fr)
Inventor
E. Archer James
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PPG Industries Inc
Original Assignee
Pittsburgh Plate Glass Co
Publication date
Application granted granted Critical
Publication of CA571169A publication Critical patent/CA571169A/en
Expired legal-status Critical Current

Links

CA571169A Method and apparatus for measuring the thickness of electroconductive films Expired CA571169A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA571169T

Publications (1)

Publication Number Publication Date
CA571169A true CA571169A (en) 1959-02-24

Family

ID=35743718

Family Applications (1)

Application Number Title Priority Date Filing Date
CA571169A Expired CA571169A (en) Method and apparatus for measuring the thickness of electroconductive films

Country Status (1)

Country Link
CA (1) CA571169A (en)

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