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CA2371602A1 - High speed laser micrometer - Google Patents

High speed laser micrometer Download PDF

Info

Publication number
CA2371602A1
CA2371602A1 CA 2371602 CA2371602A CA2371602A1 CA 2371602 A1 CA2371602 A1 CA 2371602A1 CA 2371602 CA2371602 CA 2371602 CA 2371602 A CA2371602 A CA 2371602A CA 2371602 A1 CA2371602 A1 CA 2371602A1
Authority
CA
Canada
Prior art keywords
high speed
laser micrometer
speed laser
detector
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA 2371602
Other languages
French (fr)
Other versions
CA2371602C (en
Inventor
John Keightley
Eric Rechner
Adriano Cunha
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3DM Devices Inc
Original Assignee
3DM Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from CA002334375A external-priority patent/CA2334375A1/en
Application filed by 3DM Devices Inc filed Critical 3DM Devices Inc
Priority to CA 2371602 priority Critical patent/CA2371602C/en
Publication of CA2371602A1 publication Critical patent/CA2371602A1/en
Application granted granted Critical
Publication of CA2371602C publication Critical patent/CA2371602C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

A large profile, high speed laser micrometer is formed from a light source unit comprised of a plurality of emitter modules that combine to emit a laser sheet and a detector array comprised of a plurality of detector modules. The laser micrometer also includes a data processing unit. Each of the emitter modules is aligned with a corresponding detector module such that an object passing between the light source unit and the detector array can be measured to an accuracy of at least 4/100ths of an inch.
CA 2371602 2001-02-02 2002-02-01 High speed laser micrometer Expired - Lifetime CA2371602C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA 2371602 CA2371602C (en) 2001-02-02 2002-02-01 High speed laser micrometer

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CA2,334,375 2001-02-02
CA002334375A CA2334375A1 (en) 2001-02-02 2001-02-02 Laser micrometer
CA 2371602 CA2371602C (en) 2001-02-02 2002-02-01 High speed laser micrometer

Publications (2)

Publication Number Publication Date
CA2371602A1 true CA2371602A1 (en) 2002-08-02
CA2371602C CA2371602C (en) 2006-04-18

Family

ID=25682381

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2371602 Expired - Lifetime CA2371602C (en) 2001-02-02 2002-02-01 High speed laser micrometer

Country Status (1)

Country Link
CA (1) CA2371602C (en)

Also Published As

Publication number Publication date
CA2371602C (en) 2006-04-18

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Legal Events

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EEER Examination request
MKEX Expiry

Effective date: 20220201