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CA2090936A1 - Visual inspection support system for printed-circuit board - Google Patents

Visual inspection support system for printed-circuit board

Info

Publication number
CA2090936A1
CA2090936A1 CA 2090936 CA2090936A CA2090936A1 CA 2090936 A1 CA2090936 A1 CA 2090936A1 CA 2090936 CA2090936 CA 2090936 CA 2090936 A CA2090936 A CA 2090936A CA 2090936 A1 CA2090936 A1 CA 2090936A1
Authority
CA
Canada
Prior art keywords
support system
visual inspection
inspection support
printed
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA 2090936
Other languages
French (fr)
Other versions
CA2090936C (en
Inventor
Okie Tani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TANI ELECTRONICS INDUSTRY Co Ltd
Original Assignee
TANI ELECTRONICS INDUSTRY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP024234U external-priority patent/JPH0573565U/en
Priority claimed from JP1992039696U external-priority patent/JP2573219Y2/en
Priority claimed from JP04188524A external-priority patent/JP3076451B2/en
Priority claimed from JP4188525A external-priority patent/JP2944827B2/en
Priority claimed from JP04302805A external-priority patent/JP3105365B2/en
Priority claimed from JP7798892U external-priority patent/JPH0633060U/en
Application filed by TANI ELECTRONICS INDUSTRY Co Ltd filed Critical TANI ELECTRONICS INDUSTRY Co Ltd
Publication of CA2090936A1 publication Critical patent/CA2090936A1/en
Application granted granted Critical
Publication of CA2090936C publication Critical patent/CA2090936C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Signal Processing (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Multimedia (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)

Abstract

A visual inspection support system comprises a display for showing a real-time image of an object projected by projecting means, an input device for pointing out a spot on the real-time image, and a controller for controlling a horizontal drive for an XY table and a vertical drive for a camera focusing mechanism, the controller processing data relative to the spot pointed out by the input device.
CA 2090936 1992-03-04 1993-03-03 Visual inspection support system for printed-circuit board Expired - Fee Related CA2090936C (en)

Applications Claiming Priority (12)

Application Number Priority Date Filing Date Title
JP024234U JPH0573565U (en) 1992-03-04 1992-03-04 Visual inspection system
JPU4-24234 1992-03-04
JPU4-39696 1992-04-27
JP1992039696U JP2573219Y2 (en) 1992-04-27 1992-04-27 Camera focusing mechanism
JP04188524A JP3076451B2 (en) 1992-06-08 1992-06-08 Automatic video display system
JPP4-188524 1992-06-08
JPP4-188525 1992-06-08
JP4188525A JP2944827B2 (en) 1992-06-08 1992-06-08 Visual inspection system
JP04302805A JP3105365B2 (en) 1992-10-02 1992-10-02 Visual inspection system with automatic inspection function
JP7798892U JPH0633060U (en) 1992-10-02 1992-10-02 Visual inspection system with automatic inspection function
JPP4-302805 1992-10-02
JPU4-77988 1992-10-02

Publications (2)

Publication Number Publication Date
CA2090936A1 true CA2090936A1 (en) 1993-09-05
CA2090936C CA2090936C (en) 1998-12-01

Family

ID=27549159

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2090936 Expired - Fee Related CA2090936C (en) 1992-03-04 1993-03-03 Visual inspection support system for printed-circuit board

Country Status (3)

Country Link
AU (1) AU648458B2 (en)
CA (1) CA2090936C (en)
GB (1) GB2271683B (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19650234C1 (en) * 1996-12-04 1998-04-30 Duerkopp Adler Ag Object for marking a selection area in a work piece, in particular an animal skin
WO1999017102A1 (en) * 1997-09-30 1999-04-08 Siemens Aktiengesellschaft A method of and apparatus for inspecting printed information
US8388204B2 (en) 2009-09-22 2013-03-05 Cyberoptics Corporation High speed, high resolution, three dimensional solar cell inspection system
US8894259B2 (en) 2009-09-22 2014-11-25 Cyberoptics Corporation Dark field illuminator with large working area
US8681211B2 (en) 2009-09-22 2014-03-25 Cyberoptics Corporation High speed optical inspection system with adaptive focusing
US8670031B2 (en) 2009-09-22 2014-03-11 Cyberoptics Corporation High speed optical inspection system with camera array and compact, integrated illuminator
US8872912B2 (en) 2009-09-22 2014-10-28 Cyberoptics Corporation High speed distributed optical sensor inspection system
WO2011056976A1 (en) * 2009-11-06 2011-05-12 Cyberoptics Corporation High speed optical inspection system with adaptive focusing
CN102879395A (en) * 2011-07-11 2013-01-16 昆山华扬电子有限公司 PCB auxiliary contraposition inspection device
JP5948797B2 (en) * 2011-11-07 2016-07-06 オムロン株式会社 System, apparatus and method for supporting visual confirmation of inspection results
DE102016201803A1 (en) * 2016-02-05 2017-08-10 Baum Retec Ag Screen reader
CN110567988A (en) * 2019-10-16 2019-12-13 东莞市科纯电子有限公司 Method and device for visual inspection of circuit board quality

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4672437A (en) * 1985-07-08 1987-06-09 Honeywell Inc. Fiber optic inspection system
JPH0737892B2 (en) * 1988-01-12 1995-04-26 大日本スクリーン製造株式会社 Pattern defect inspection method
WO1991007683A1 (en) * 1989-11-09 1991-05-30 Insystems, Inc. Specimen review station
DE69112272T2 (en) * 1990-05-21 1996-02-01 Ntn Toyo Bearing Co Ltd Method and device for laser processing.
WO1992011541A1 (en) * 1990-12-21 1992-07-09 Huntron Instruments, Inc. Image acquisition system for use with a printed circuit board test apparatus

Also Published As

Publication number Publication date
GB2271683B (en) 1996-09-18
GB9304354D0 (en) 1993-04-21
AU648458B2 (en) 1994-04-21
AU3399293A (en) 1993-09-23
GB2271683A (en) 1994-04-20
CA2090936C (en) 1998-12-01

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Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed