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CA1281385C - Timing generator - Google Patents

Timing generator

Info

Publication number
CA1281385C
CA1281385C CA000553324A CA553324A CA1281385C CA 1281385 C CA1281385 C CA 1281385C CA 000553324 A CA000553324 A CA 000553324A CA 553324 A CA553324 A CA 553324A CA 1281385 C CA1281385 C CA 1281385C
Authority
CA
Canada
Prior art keywords
local
clock
period
delay
values
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CA000553324A
Other languages
French (fr)
Inventor
George William Conner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of CA1281385C publication Critical patent/CA1281385C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31917Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922Timing generation or clock distribution
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K5/00Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/135Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals by the use of time reference signals, e.g. clock signals

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Pulse Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Manipulation Of Pulses (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

ABSTRACT OF THE DISCLOSURE
A system for providing a plurality of synchronous timing signals having period values that are not even multiples of the clock period. The system includes a plurality of local edge generators receiving the clock signals, each local generator including local programmable circuitry to count clock signals and provide local outputs upon receiving predetermined clock signals and local programmable delay circuitry for providing a timing signal after a delay interval following each local output, the resolution of the local delay circuitry being greater than that of the clock.

Description

~LZ~313~3.5 ' ~ ~ 0990X
Field of the Invention The invention relates to generating timing signals.
Background of the Invention Stable clocks such as crystal oscillators have been used to generate a sequence of timing signals of variable signal-to-signal interval by programming digital counters to ~rigger the timing signals at predetermined counts of the clock. Although tapped delay lines having resolution (e.g., 1 nanosecond~ higher than that ~e.g., 16 ns) of the clock have been used to additionally delay signals relative to the start of the sequence, timing signal interval resplution has in such systems been limited by the clock resolution, with the timing signal period equal to the crystal oscillator period or an integer multiple thereof.
In St. Clair U.S. Patent No. 4,231,1Q4, desired period ~';7 .
values that were not even multiples of the crystal period were obtained by dividing the desired period into a number of crystal . .
periods plus a remainder and a residue~v~lu~, which was added by :a-delay line. The remainder was simply the remainder of dividing the desired period by the crystal period (e.g., 2 ns remainder for dividing a 50 ns desired period by a 16 ns clock period). The residue values accounted for the fact that subsequent output pulses were not beginning at a clock signal.
(E.g., if the first 50 ns period output appears 2 ns after a clock signal, the next output will have this 2 ns residue in addition to the 2 ns remainder, and will appear 4 ns after a ~ .
~; -. . ~28~38S
clock signal, ;n order to be 50 ns after the preceding output.) A plurality of timing edge generators, emp:Loying further delay lines, were driven by thesP desirecl period output pulses plus delayed clock signals, obtained by passing clock signals through a delay line delayed by the residue value. The circuitry employing the timing edge generators thus had both the crystal clock signals and asychronous delayed clock signals distributed through it.

In some other timing signal generators, desired periods that are other than integer multiples of a crystal oscillator period are provided by splitting the clock signals into plural phases, and proqrammably selecting signals from a particular phase to trigger an output (e.g., a 4 ns clock split into four phases to obtain 1 ns resolution).
'r 15 Summary of the Invention It has been discovered that, by distributing crystal clock signals directly to local timing edge generators and selecting a desired clock signal and ad~gng the residue and remainder delay Ito come up with pulses having periods other ~ than integer multiples of the clock period~ in the edge generators near the final pulse used for edge g~neration/ using local programmable counting and delay means, important advantages would be obtained. Specifically, the timing system would be synchronous (promoting simplicity of manufacture and reliable operation); transmission line inaccuracies would not contribute to timing inaccuracies; there would be reduced crosstalk (owing to the need to distribute only one crystal .

~8~3~
3 6920~ 2 phase), and there would be a small number of gates (whieh tend to distort signals) between the clock signal and the final timlng signal, yielding improved accuracy.
According to a broad aspect of the invention there is provided a system for providing a plurality of synchronous timing signals having period values that are not even multiples o~ a clock period comprising a clock for generating clock slgnals separated in time by a clock period, and a plurality of local edge generators receiviny said clock signals, each said local edge generator including local programmable coun~ing means to provide local outputs upon receiving predetermined clock signals, means ~or generating a deskew value, and local programmable delay means connected to receive said local outputs for providing a timlng signal after a delay interval following each said local output, said local programmable delay means having a resolution, said local programmable delay means including a deskew circuit for receiving said deskew value, said deskew circuit providing a delay control signal to said local programmable delay means so that said timing signal is synchronous with timing signals of other local edge generators, the resolution of said local programmable delay means being greater than that of said clock.
In preferred embodimen~s the local programmable counting means includes l~ local counter and a coincidence detector that 38~
3a 69204-142 receives the output of the local counter plus the output of a first random access memory (RAM) including the most significant bi~s of the desired period value (i.e., the integer number of clock periods in a desired period); a local end-of-count (LEOC) output is provided at a predetermined count to a flip flop that ls triggered upon the next clock signal in order to select a desired clock signal, and that output is provided to khe local programmable delay means that adds the residue and remainder values; the programmable delay means ~8~;38~
- 3~ - 9204-142 includes a delay line that is controlled with a residue and remainder value provided from an adder that obtains the remainder value (also referred to as the least significant bits) from a second RAM and adds to it the residue of the prior output, both RAM5 being addressed by the same address bus; there is a master counter that counts clock signals and provides master end-of-count (MEOC) pulses to reset the local counters; there also are master R~ls that include the most significant bits and remainder values for the desired period and adders that are used to calculate the residue value and distribute it to the local edge generators; and the local edge generators include adders which are used to add deskew values (used to account for differences in transmission paths to and through various edge r r . .
generators) to the residue and remainder values, the summation being used to provide the delay period in the programmable delay line. A preferred application of the invention is automatic circuit testing equipment in which test patterns are provided to a large number of input nodes of a circuit under test at high speed.
Other advantages a~d features of the invention will be apparent from the following description of a preferred embodiment thereof.
Description of the Preferred ~mbodiment The preferred embodiment wil-l now be described.
Drawings Fig. l is block diagram of a period oscillator circuit used to provide master end-of-count pulses and residue values to ,15 a plurality of local edge generators.
Fig. 2 is a block diagram of a local edge generator _ using clock sisnals and the master end-of-count pulses and residue values of the Fig. l circuit to"~enerate a timing edge pulse.
20 Structure '~
Referring to the figures, in Fig. l is,-shown master period oscillator 10, which receives as inputs the clock signals (XTAL3 from 6.4 nanosecond crystal oscillator 12 and 8-bit time set addresses (for stored desired period values3 and provides outputs used by the plurality of local edge generators 16, one of which is shown in Fig. 2. The timing circuitry shown in the figures is used in an automatic circuit tester in which test 8~
-r ~ r _S
patterns are provided to a large number of input nodes of a circuit under test at high speed and the resulting outputs are detected and compared with expected output.
Referring to Fig. 1, period oscillator 10 includes presetable 10-bit master counter 18 and MSB period value random access memory (RAM) 20 (10-bit by 256-bit), the outputs of both of which are provided for comparison at coincidence detector 22 (plural exclusive or gates, the outputs of which are combined by or gates), to provide an output to flip flop 24 when the count at counter 18 matches the period value at the output of RAM 20.

MSB RAM 20 is addressed by addresses provided over 8-bit time set address bus 19 ~rom address register 14. Flip flop 24 is cloclced by XTAL signals and provides its output to crystal delay 26, which is also clocked by XTAL signals and can delay its ,15 output by l XTA~ signal when it receives a carry out signal on its delay input 28 from 6-bit residue adder 30. Time set .. address bus l9 is also provided to LSB period value RAM 32 (6 bit by 256 bit) and provides its output~to the B input of residue adder 30. The 6-bit, S summation output, designated RES(n), of residue adder 30 is connected to the input of register 33, which provides its 6-bit output, d~signated RES(n-l), to local edge generators 16 and to the A input of residue adder 30. ~he S summation output of residue adder 30 is also provided to proqrammable delay line 34, which provides an output period pulse each time it receives a master end-of-count (MEOC) pulse-from crystal delay 26, after delaying it a delay interval indicated by RES(n). Programmable delay line 34 is a , . . . . ... .. . ... . . .. _ ...... _ _ . _ .. _ .. . ...

128138~j . .
digital interpolator that has 100 ps resolution and can provide delays up to 6.4 ns. The MEOC output of crystal delay Z6 is also provided to reset master counter 18 and to clock address register address 14.
Referring to Fig. Z, local edqe generator 16 includes presetable 10-bit local counter 36, which is reset by MEOC
pulses, clocked by XTAL signals, and provides its 10-bit output to coincidence detector 38, which also receives as an input the output of MS~ time value RAM 40 (10-bit by 256-bit). The output of coincidence detector is provided to flip flop 42, which is ~. .
clocked by XTAL signals and provides its output to crystal delay 44, which is also clocked by XTAL signals. Crystal delay 44 includes two delay inputs ~6, 48, each of which is capable of delaying the local end-of-count (LEOC) output of crystal delay ;~r15 44 to programmable delay line 50 by 1 XTAL signal. Delay input .
46 is connected to receive a carry out signal from 6-bit residue adder 53, and delay input 48 is connected to receive a carry out signal from 6-bit delay adder 54. LSB t~ime value RAM 52 (6-bit by 256-bit) is also addressed by time set address bus l9 and provides its output, designated REM(T~(n)/XTAL), to the A input --of residue adder 53. The ~ input of residue adaer 53 receives the RES(n-l) output from master period oscillator 10, and the 6-bit S summation output of residue adder 53 is provided to the A input of delay adder 44. The B input of adder S4 receives a deskew value, D~S, from deskew value generator 56 in order to deskew the edge provided by edge generator 16 so that it is synchronous with edges provided by edge generators for other , ~LZB1385 channels. Generator 56 is reset by MEOC and receives control signals, CNTRL, indicating a deskew value to be used. The 6-bit S summation output (designated DELAY(n)) of deIay adder 54 is provided by programmable delay line 50, which is a digital interpolator having 100 ps resolution and provides an output pulse each time it receives a pulse from crystal delay 44, after delaying it a delay inter~ai indicated by the value of DELAY(n).
Operation In operation, period oscillator 10 provides period pulses having programmed period values for cycle n, PV(n), that are other than integer multiples of the crystal period, similar to the operation described in St. Clair U.S. Patent No.
4,231jlO4. However, the residue value is not used to delay ;~15 crystal signals, to which are added further deïays in the edge generators, as in St. Clair; instead the crystal signals, the residue value, and the digital master end-of-count signal are sent to all of the local edge generator~ 16; in which all delay is added to the crystal signal at once.
Referring to Fig. 1, the integer values (designated -;
INT(PV(n)/XTAL) in Fig. 1), of dividing PV(n) b~ the crystal period (XTAL) are loaded into MSB period value RAM 20, and the remainder values ~in 100 ps increments) of this division (designated REM(PV(n)/XTAL) in Fig. 1) are loaded into LS~
period value RAM 32. PV(n) can range from lg.2 ns (a minimum of three crystal periods are needed to accommodate routing through the circuitry to perform calculations) to 6.5 microseconds 3~35 -8-.
(2' crystal periods) and is one of the 256 values stored in RAM's 20, 32. The period value, PV(n), is thus a summation of the integer values loaded in RAM 20 (in clock period units~, and . the remainder values loaded into RAM 32 (in 100 ps units).
Master counter 18 counts XTAL signals and provides its output to coincidence detector 22, which provides a pulse to flip flop 24 when the count on counter 1~ equals the integer values provided by MSB RAM 20. This is provided to flip flop 24, which on the next XTAL signal provides a pulse to crystal delay 26, which on the next XTAL signal (unless delayed by a carry out at input delay 28) provides an MEOC pulse, which resets counter 18 and clocks time set address register 14 to provide the next time set address to RAMs 20, 32. The remainder value provided from LSB
RAM 32 to residue adder 30 is added to ~he value at input-A and .,15 provided as a sum, RES(n), to delay line 34 and register 33.
Time delay line 34 provides a period pulse each time it receives _ an MEOC pulse, after delaying it by the RES(n) value. Register 33, upon receiving an XTAL signal, provi~es its output, designated RES(n-l), to indicate that it is one MEOC cycle behind the input to register 33. The RES(n) value provided by residue adder 30 to programmable delay 34 and t~ register 33 has the value o~ the last 6 bits given by the following equation:
RES(n) = RES(n~ REM(PV(n)/XTAL) where:
PV(n) = Programmed Period Value for cycle n, XTAL , Crystal Period Value, REM(x/y) = remainder of dividing x by y, and RES(n) = Residue for the nth cycle (RES(0)-0).

- 1~8~L3~3S
-( ~ r _9_ . Thus, if it is the beginning cycle, RES(n) simply equals the remainder value that was provided by LSB RAM 32. In subsequent cycles, RES(n) equals the summation of this value plus the residue value from the precediny cycle, fed back from the output of register 33. In this manner period pulses with values PV(n) that are other than integer values of the period of oscillator lZ are provided ~y counting an integer number of clock signals to obtain an MEOC pulse and delaying the MEOC

pulse by the remainder value in the first cycle and delaying the MEOC by the sum of the remainder and residue values in subsequent cycles, to account for the fact that the prior period pulse was not synchronous with a clock signal. Because the oscillator has a ~.4 ns period, and programmable delay 34 adds delays in increments of 100 ps, when residue adder 30 has .15 counted to 64, it will overflow and provide a carry out, and the.

MEOC will once again be synchronous with the crystal signal, so _~ a one-crystal-signal delay is provided at crystal delay 26. The period pulse is used by a pa~tern gener~tor (not shoNn) to send the next cycle's data to be foLmatted.
Referring to Fig. 2, edge generator 16 receives MEOC

pulses, XTAL signals, addresses on time set address bus 19, and the RES(n-1) residue values from period oscillator 10. The MEOC
pulses reset counter 36, which counts XTAL signals and provides its output to coincidence detector 38. The time value for edge generator 16 for cycle n, TV(n~, is split up into some integer number of crystal periods (designated INT(TV~n)~XTAL)) plus a remainder value (designated REM(TV(n~/XTAL) in RAMs 40, 52, as - ~28~38~
-(- r ~
--10--,..
- was the period value. When the value of the output of counter 36 matches the integer values in MSB time value RAM 40, a pulse is provided to flip flop 42, which provides a pulse to crystal delay 44 upon the next XTAL signal. The remainder value, REM~TVtn)/XTAL), is provided to the A input of 6-bit adder 53, which adds to this the residue value, RES(n-l), provided from oscillator 10. The 6-bit summation of these values is then provided to delay adder 54, which adds in any deskew value, DES, from deskew value generator 56. The summation of these values is then provided to programmable delay line 50. The delay value thus is determined by the the last 6 bits of the number provided by the following equation:
DELAY(n) = RES(n-l) ~ REM(TV~n)~XTAL) + DES
where:
.15 TV~n) = Programmed Time Value for cycle n, and DES - deskew for local edge generator 16.
-_~ As in period oscillator 10, crystal delay 44 provides its LEOC
pulse to programmable delay 50, which a~ds to it a delay interval, here DELAY(n). The two delay inputs 46, 48 are used when ~-bit adders 53, 54 over~low and provide carry outs. The output of programmable delay line 50 is a timing edge pulse, which is used to generate an edge, used, e.g., with an edge from another local edge generator to provide a data pulse to a digital circuit being tested by automatic test equipment employing the tim:ing signal generator. Thus the time value TV(n) may differ from the period values PV(n), depending upon, e.g., whether the time pulse is a beginning edge or an ending ~L~8~35 edge and the deslred pulse width. The DES values provide deskew that varies depending upon the path to and through the generator, whether the edge is used for rising or falling edges and whether i-t is used in a driver or a detector.
There are substantial advantages associated with providing pure crystal signals to local edge generators and adding all delays at once. The timing system is totally synchronous so that it is simple to manufacture and reliable in operation. Only a pure crystal is fanned out to the system so that transmission line inaccuracies do not contribute to timing inaccuracies; residue and remainder delays are distributed and added in the digital domain. Because there is only one crystal phase, crosstalk is xeduced. Deskewed values are easily added in the digital domain rather than the analog domain. There are an absolute minimum of gates between the pure crystal signal and the final timing signals, yielding improved accuracy by avoiding having the ultimate timing signals based upon signals that have passed through a plurality of gates, each of which adds some distortion.

Other Embodiments Other embodiments of the invention are within the scope of the following claims. E.g., the timing system would have application in circuitry othex than multiple-channel automatic circuit testers, in particular circuitry requiring precise timing edges that can be varied on a cycle-by-cycle basis.

Claims (9)

1. A system for providing a plurality of synchronous timing signals having period values that are not even multiples of a clock period comprising a clock for generating clock signals separated in time by a clock period, and a plurality of local edge generators receiving said clock signals, each said local edge generator including local programmable counting means to provide local outputs upon receiving predetermined clock signals, means for generating a deskew value, and local programmable delay means connected to receive said local outputs for providing a timing signal after a delay interval following each said local output, said local programmable delay means having a resolution, said local programmable delay means including a deskew circuit for receiving said deskew value, said deskew circuit providing a delay control signal to said local programmable delay means so that said timing signal is synchronous with timing signals of other local edge generators, the resolution of said local programmable delay means being greater than that of said clock.
2. The system of claim 1 wherein said local programmable counting means includes a local counter that counts clock signals and a coincidence detector that compares the output of the local 12a 69204-142 counter with an integer number corresponding to a desired time value and provides an output to a flip flop that is triggered on the next clock signal.
3. The apparatus of claim 2 wherein said local programmable counting means includes a first random access memory (RAM) loaded with integer numbers of clock periods in desired time values and wherein said integer number is obtained from said first RAM.
4. The system of claim 3 wherein said local programmable delay means includes a delay line and a second RAM loaded with remainder values of dividing said desired time values by said clock period, and further comprising a common address bus connected to said first and second RAMs in all said local generators.
5. The apparatus of claim 4 wherein said programmable delay means includes a first adder for adding residue values to said remainder values and for providing the sum to said delay line.
6. The apparatus of claim 5 wherein said programmable delay means includes a second adder for adding a deskew value to the residue and remainder values and providing the sum to the delay line.
7. The apparatus of claim 6 wherein said deskew value is provided by a deskew generator that can vary the deskew value on a cycle-by-cycle basis.
8. The system of claim 1 wherein there is a master control circuit that provides master end-of-count pulses and residue values to the local edge generators.
9. The system of claim 8 wherein said master control circuit is a period oscillator including master programmable counting means to provide master end-of-count outputs upon receiving predetermined clock signals and master programmable delay means for providing a period output signal after a delay interval following each said master end-of-count output, the resolution of said master delay means being greater than that of said clock.
CA000553324A 1987-02-09 1987-12-02 Timing generator Expired - Lifetime CA1281385C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US1281587A 1987-02-09 1987-02-09
US012,815 1987-02-09

Publications (1)

Publication Number Publication Date
CA1281385C true CA1281385C (en) 1991-03-12

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Family Applications (1)

Application Number Title Priority Date Filing Date
CA000553324A Expired - Lifetime CA1281385C (en) 1987-02-09 1987-12-02 Timing generator

Country Status (5)

Country Link
JP (1) JPH06103832B2 (en)
CA (1) CA1281385C (en)
DE (1) DE3743434A1 (en)
FR (1) FR2610742B1 (en)
GB (1) GB2200774B (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2684209B1 (en) * 1990-10-30 1995-03-10 Teradyne Inc FAST TIME BASE GENERATOR.
EP0618677A1 (en) * 1993-03-31 1994-10-05 STMicroelectronics S.r.l. Programmable time-interval generator
CA2127192C (en) * 1993-07-01 1999-09-07 Alan Brent Hussey Shaping ate bursts, particularly in gallium arsenide
US5566188A (en) * 1995-03-29 1996-10-15 Teradyne, Inc. Low cost timing generator for automatic test equipment operating at high data rates
JP2909218B2 (en) * 1995-04-13 1999-06-23 株式会社アドバンテスト Period generator for semiconductor test equipment
FR2871963B1 (en) * 2004-06-22 2006-09-15 Thales Sa ELECTRONIC DEVICE FOR GENERATING SYNCHRONIZATION SIGNALS
CN112968691B (en) * 2021-02-10 2023-04-11 西南电子技术研究所(中国电子科技集团公司第十研究所) Pulse time delay precision self-adaptive synchronization method

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3633113A (en) * 1969-12-22 1972-01-04 Ibm Timed pulse train generating system
US4231104A (en) * 1978-04-26 1980-10-28 Teradyne, Inc. Generating timing signals
US4409564A (en) * 1981-03-20 1983-10-11 Wavetek Pulse delay compensation for frequency synthesizer
EP0080970B1 (en) * 1981-11-26 1985-12-18 Deutsche ITT Industries GmbH Frequency divider programmable for non-integer division
JPS59105123A (en) * 1982-12-08 1984-06-18 Fujitsu Ltd clock circuit
JPS59174016A (en) * 1983-03-24 1984-10-02 Fujitsu Ltd Clock distributing system
JPS6089774A (en) * 1983-08-01 1985-05-20 フエアチアイルド カメラ アンド インストルメント コ−ポレ−シヨン Control of signal timing device in automatic test system using minimum memory
JP2539600B2 (en) * 1985-07-10 1996-10-02 株式会社アドバンテスト Timing generator

Also Published As

Publication number Publication date
DE3743434C2 (en) 1990-07-19
GB8802937D0 (en) 1988-03-09
GB2200774B (en) 1990-11-07
DE3743434A1 (en) 1988-08-18
JPH06103832B2 (en) 1994-12-14
GB2200774A (en) 1988-08-10
JPS63203005A (en) 1988-08-22
FR2610742A1 (en) 1988-08-12
FR2610742B1 (en) 1994-05-20

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