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CA1265356A - High resolution geologic sample scanning apparatus and process of scanning geologic samples - Google Patents

High resolution geologic sample scanning apparatus and process of scanning geologic samples

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Publication number
CA1265356A
CA1265356A CA000509921A CA509921A CA1265356A CA 1265356 A CA1265356 A CA 1265356A CA 000509921 A CA000509921 A CA 000509921A CA 509921 A CA509921 A CA 509921A CA 1265356 A CA1265356 A CA 1265356A
Authority
CA
Canada
Prior art keywords
sample
radiation
spectrometer
plane
reflected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CA000509921A
Other languages
French (fr)
Inventor
Frank D. Pruett
Floyd F. Sabins, Jr.
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chevron USA Inc
Original Assignee
Chevron Research and Technology Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chevron Research and Technology Co filed Critical Chevron Research and Technology Co
Priority to CA000509921A priority Critical patent/CA1265356A/en
Application granted granted Critical
Publication of CA1265356A publication Critical patent/CA1265356A/en
Expired - Fee Related legal-status Critical Current

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Abstract

ABSTRACT OF THE DISCLOSURE
An apparatus and process of analyzing samples using reflected and/or emitted radiation is described.
The apparatus includes a means for containing the sample and moving the sample and/or a reflector at a uniform rate through a fixed plane. A radiation source irradiates the core sample. The reflected or emitted radiation is directed onto a detector means capable of forming electri-cal signals which are digitally encoded and recorded on a digital recorder for further interactive analysis and/or processing.

Description

i3~

HIGH RESOLUTION GEOLOGIC SAMPLE
SCANNING APPARATUS AND PROC~SS
OF_SCANNING GEOLOGIC SAMPLES
The invention relates to analyzing geologic samples.
More specifically, the invention relates to an apparatus capable of obtaining multispectral scanned data of well bore cuttinys and/or well bore cores and a process of scanning these geologic samp]es.
BACKGROUND OF THE IMVENTIO~
As the prospecting industries, such as the oil-gas and mining industries, discover -the easily identified deposits (accumulations) of minerals and oil and gas, the search for new reserves and supplies oE the.se materials becomes increasingly difficult and costly. During the exploration for these accumulations and following the discovery of these accumulations, extensive further analysis of well bore cuttings and core samples is required to determine if it is economically feasible to proceed with commercial development.
Petrographic, x-ray and chemical analysis of the well bore, well bore cuttings and core samples are costly and extremely time-consuming. Thus, it would be desirable to have an apparatus and process o~ analyzing drill cuttings and well bore, well bore cores which can supplement or repIace current time-consuming and analytical processes, but yield greater ; amounts of data more precisely and rapidly rom a larger number of samples within a reasonable period of time.
Satellite and airplane scanning/imaging, hereinafter "scanning", of broad~geographic areas has been used before in attempts to locate potential sites for further exploration and/or eva~uation. Elowever, due to the coarse spatial ~iSi3~
- 2 - 61936-1711 resoIution of these scanning techniques, they are only useful for locating general areas of potential commercial interest.
These scanning techniques usually involve the measurement of reElected solar infrared radiation and emitted black-body infrared radiation. ~ue to atmospheric interference and absorp-tion, measuremen-t of reflected radiation at shorter than about 0.3 ~m waveleng-ths provides very little, if any, useful informa-tion. In addition, satellite and airplane scanning are limited solely to viewing the surface geology of the area.
Thus, it would also be desirable to have an apparatus and process to efficiently scan and image or analyze geological cuttings and/or core samples to determine if further investiga-tion is warranted. In addition, it would be desirable to have a technique which can ex-tend satellite and airplane scanning tech-nology to investigate a wider range of electromagnetic radiation wavelengths to provide additional information in analyzing these samples. Furthermore, it would be desirable to have an appa-ratus and process which can measure additional properties, such as differential thermal reflectance. This additional measure-ment is made by the heating of the sample and then measuriny the change in thermal infrared radiation (radiant temperature) emit-tsd as the sample cools. Other desirable attributes of an appa-ratus and process of analysis would be to measure long wave-length reflected IR to determine types of oil in a core sa~ple and the relativs saturations of the cuttings or core sample.
additional desirable applications of such an apparatus and process would be to identity and define the location of different clays and cements, provide a means for distinguishing between rocks which are normally difficult to distinguish, such an quarts and opal CT, and delineate porosity . .

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- 3 - 61~36-1711 variations in the core samples in hopes of providing superior, enhanced oil recovery methods for known discovered deposits/-accumulations of minerals and hydrocarbons.
SUMMARY OF THE INVENTION
We ha~e invented an apparatus for and a process of analyzing samples such as cores, well bore cuttings, rock thin 6ections, mined minerals, and the like quickly and efficiently.
The apparatus and process produce the desired analyses previously recited. The apparatus includes a means for contain-ing a sample. The containing means is connected to a means formoving the sampLe relative to a reElecting means. The reElect-ing means is located in a plane above the sample to direct -the reflected radiation along a predetermined p:lane. The reflecting means further includes a means for scanning the reflecting means across the sample while maintaining the reflected radiation within the predetermined plane.
A spectrometer i5 located in the plane of reflected radiation. The ~pectrometer is capable of receiving reflected radiation from the sample and dividing it into a predetermined number of discrete bands of radiation from the ultraviolet through the infrared. Preferably, the spectrometer divides the reflected radiation into the reflected infrared from about 1 ~m to about 2.5 ~m, the visible and near infrared from about 0.4 to about 1.0 ~m, the thermal infrared from about 8 to about 14 ~m, and the ultraviolet from about 0.2 to about 0.4 ~m. subdividlng the 8 to 14 ~m regions permits -the scan image to distinguish between silicate rocks and carbonate rocks due to fundamental Si-O vibrations. I'he higher the degree of spectral resolution, ~the more accurate the analy~is, e~peciaIly in the re1ected infrared region of from about 1.7 to about 2.4 ~m.

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- 4 - 61936-1711 However, suitable spectral resolu-tions Eor the infrared and near infrared are on the order of a~out 0.05 ~m or less and from about 0.1 ~m to about 0.2 ~m Eor the thermal infrared.
The apparatus further includes an electromagnetic radiation source(s) directed towards the sample and preferably a calibration source(s) located in the plane of reflected radiation and/or alongside the sample. These create known color densities, colors or thermal radiation peaks for comparison with the sample being evaluated.
The output from the spectrometer is directed towards a detector mean(s). The detector(s) are capable oE producing digital data from the analog wavelength bands of radiation.
The detectors are selected to be responsive to the desired radiation bands. Finally, the data is recorded on a digital recorder for further interactive processing and to produce sample scan images.
Of course the higher the resolution, the better, but the reflector means-spectrometer is typically located so as to be able to resolve portions of the sample having dimensions of less than about 3.5 mm by about 0.5 mm and preferably less than O.l mm about 0.1 mm. This most preferred surface resolution size (picture elements), although requiring vast amounts of data volume, would produce a processed image which is equal to or better than color photography. In addition, the scanner images surpass color photographs for conveying information about the sample because the scanner is more sensitive to reflectance variations than the human eye, it can detect and record wave-lengths such as the reflected inErared which cannot be seen by the human eye or recorded on color photographic ~ilm, and '.. : ,
- 5 - ~1936-1711 the digital recording of the image permits its manipulation and enhancement by computer processing to calculate, inter alia, rocX type and mineral distribution.
~ he process of analyzing the sample involves employ-ing the apparatus previously described and irradiating the sample with radiation having a predetermined wavelength distri-butionO The reflected radiation from the sample is directed by a reflector such as a mirror on-to a spectrometer which divides the radiation into selected wavelength bands of radiation and then focuses this radiation onto suitable detectors such as photo-conduc-tors or photovoltaic cells capable of converting the radiation into an electrical signal. rhereafter, the electrical signal from these devices is encoded digitally for further digital processing to produce a correlative image of the sample. Through the appropriate processing, such as mixing recorded radiation wavelength bands and/or biasing certain colors, the sample image can be manipulated to highlight and emphasize framework, composition, and texture of the sample and enable the determination of types of oil and other fluids contained in the sample and the relative fluid saturation of the sample. In addition, the processing can delineate various porosities and distinguish closely-allied rocks, such quartz from opal CT, and help map distribution of clays and cements.
BRIEF DESCRIPTION OF THF DRAWING
The Flgure illustrates an embodiment of a scanning apparatus of our invention.
DETAILED DESCRIPTIO~ OF THE INVENTIO~
An apparatus for carrying out the process of our invention is illustrated as apparatus 10 in the Figure.

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- 6 - ~1936-1711 Although the apparatus 10 can be used to analy~e mined minerals, well bore cuttings or well bore core samples, it will be described for the analysis of well bore core samples. The apparatus 10 includes a holder 12 for positioni}lg a core sample 100. Core samples are cylinders extracted from the geological formation during drilling. The core samples are typically cut into two halves to expose the inner portion of the core sample.
The holder 12 will have a shape which can contain a half cylinder of the core sample placed thereinO A standard U-shaped holder having a width across the mouth of about 15 cm, and a depth of about 10 cm, with a radius of about 10 cm, is suitable. The length of the holder is limited only by the length of core sample to be ana]yzed~ The holder is connected to a core transport system capable of moving the core sample in a fixed plane and direction 13 while malntaining a fixed distance from a reflector means 1~. Depending upon the reflector means, a suitable distance from the sample is from about six inches to about 12 feet. Preferably, the reflecto~
means such as a scanning mirror is adjusted to provide an 20 instantaneous field of view 17a o about 0.62 mrad. This is far superior to airplanes or satel~ites instantaneous fields of view on the order of about 2.5 mrad. In addition, ihe angular fleld of view is reduoed from about 100 degrees to about 22 ; degrees. ~he angular field of view 17b is adjusted to cover the width of the holder 12. A suitable core transport system is a worm-drive geared system oonnected to the base of core holder 12. Suitable worm-drive gears and transport motors are available from the Daedalus Enterprises, Incorporated.
The apparatus further includes at least one electromagnetic radiation source 14 for irradiating the core sample. The radiation source 14 will contain a source of ~53~6
- 7 - 51936-1711 electromagnetic radiation having the specific wavelength bands of interest. The radiation source can irradiate preferably from the ultraviolet through the far infrared. A suitable broad band radiation source is a quartz-halogen lamp. Alterna-tiv~ly, the radiation source can be any number of individual sources having predetermined radiation wavelengths, such as GaAs lasers, GaP lasers, U.V. helium cadmium lasers, and the like. Optionally, not illustrated, the apparatus includes a means for heating the core sample so that measurements of thermal infrared radiation can be measured. A]ternatively, the core sample can be heated in an external oven and then placed in the core holder 12.
~ reflector means 16, such as a scanning mirror, scans the core sample as it passes through the scan plane per-pendicular to the sample. The reflector further includes a scanner control to control the motion of the reflector. A
suitable scanning motion 17 is along the axis of rotation of the reflector, i.e., æcan mirror, is parallel to the plane of the core surface being scanned. The resultlng scan lines are parallel lines oriented normal to the long axis of the core.
Alternatively, the scanning motion of the reflector is controlled such that the axis of rotation of the scan mirror is normal to the plane of the core surface being scanned. The resulting scan lines are parallel clrcles on the core surface.
The only limitation on scanning of the core is that it be done in a uniform manner 80 that comparisons can be made between the scans of different core samples. The scanning mirror 16 reflects the radiation from the core sample along a fixed plane onto a spectrometer 20. Optionally, lenses, not shown, can be used to diverge or converge the radiation from the reflector 3~
- 7a - 61936-1711 16. The distance from the sample to the reflector means 16 and the reflector means 16 to the spectrometer 20 is adjusted so that the detector means is capable of resolving areas 15 at least I mm by 1 mm of the sample, preferably, resolving areas finer tha~ about 0.5 mm by 0.5 mm and most pr~ferably, resolv-ing area finer about 0.1 mm by about 0.1 mm as it sweeps across the core surface. The absolute levels of reflected energy are calibrated with calibration sources 18a, b, and c. Suitable calibration sources 18a and b for calibrating thermal infrared are uniform high or low temperature sources. As the scanning mirror moves across the sample, it sees the high temperature source at the beginning and the low temperature source at the end or vice versa. Sources 18c are pure color squares 5uch as red, blue, green, and the like or known shade densities of the same colcr. These sources give ~he recorded data prospective.
These sources are available from Daedalus Enterprises, Incorpo-rated. A suitable spectrometer can also be obtained from Daedalus Enterprises, Incorporated. Due to the sh~rt distances involved, the wavelengths around l.4 ~m, 1.9 ~m, and 2.6 ~m can be used for analysis because atmospheric C02 and water vapor cause only a 15~ reduc~ion of transmittance in the apparatus configuration. These wavelength cannot be used by airborne or satellite systems. This is another advantage of our apparatus.
The spectrometer 20 is configured to-divide the xeflected radiation into di crete bandwidths and focus the reflected radiation onto the photo-detectors 22. Suitable detectors are photo-conductor cells, photovoltaic cells, or mixtures thereof. Suitable detectors IN Sb for reflected radiation from about 1.55 ~m to about 2.35 ~m, HgCdTe from about 8.5 ~m to about 13 ~m, and Cds, Si and GaAs for the visible and near in~rared. The detectors 22 create an electrical signal based upon their irradiation by that ' ~2~5~
- 8 - 61936-1711 discrete portion of the radiation separated by the spectrometer. The electrlcal signal from the detectors 22 is ampllfied if needed and encoded digitally. Thereafter, the digital signal is recorded by digital recorder 24 for image reconstruction and manipulation of the recorded radiation with suitable processing on a general purpose computer. The routines are used to read the digitally recorded data, enhance contrast and brightness, enhance edges, perform classifications, principal components, and color transformations and make image hard copies.
Although we have described specific embodiments of our invention comprising the apparatus to analyze core samples, the broadest limits of our invention are covered by the process of analyzing core samples. The apparatus can be configured in any fashion using available detectors, drive units, reflectors, and the like. The process covers irradiating a core sample with radiation having a predetermined wavelength distribution as the sample travels along its path. The reflected radiation from the core sample is focused or directed spectrometer capable of dividing the reflected radiation into predetermlned wavelength bands and suitable detectors capable of converting the divided radiation into an electrical signal. The electrical signals from the detector are encoded digltally as digital data and recorded for processing so as to produce a correlative image(s) of the core sample. The apparatus is adjusted so that during the process of analysis, the resolution of areas of the core samples is finer than about 0.5 mm by about 0.5 mm, and preferably finer than 0.1 mm by 0.1 mm.

~7 ~ r~
- ~ - 61936-1711 Having described the invention with reference to particularly preferred embodiments, i-t should be understood that modifications which would be obvious to the ordinary skil-led artisan are intended -to be within the scope of the inven-tion. For example, the sample can be held in a fixed position and the reflector can be moved along the sample. Alterna-tively, the spectrometer can be located at the position of the reflector to eliminate the requirement for it. Additionally, the apparatus can scan dri.ll pipe, well bores, cement, and any application where high resolution analysis is desired.

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Claims (22)

THE EMBODIMENTS OF THE INVENTION IN WHICH AN EXCLUSIVE
PROPERTY OR PRIVILEGE IS CLAIMED ARE DEFINED AS FOLLOWS:
1. An apparatus for analyzing the reflected radiation from a geologic sample comprising:
means for holding a sample in a fixed plane;
means for moving said sample at a uniform rate along said fixed plane connected to said holding means;
means for irradiating the sample with a source of electromagnetic radiation;
reflector means located in a plane above the sample and oriented at an angle and distance therefrom such that said reflector means is capable of receiving reflected/
emitted radiation from said sample and directing said reflected/emitted radiation along a predetermined plane;
means for moving said reflector means connected thereto;
a spectrometer located in the plane of reflected/
emitted radiation, said spectrometer capable of dividing said reflected radiation into predetermined energy band-widths and directing said predetermined energy bandwidths towards detector means, said reflector means and said spectrometer adjusted to have a sample spatial resolution finer than about 0.5 mm by about 0.5 mm.
detector means responsive to said predetermined energy bandwidths, said detector means capable of converting said predetermined energy bandwidths into electrical signals;
means for encoding the electrical signals digitally from said detector means; and means for recording said digitally encoded signal.
2. The apparatus according to Claim 1 wherein the detectors are selected from the group consisting of photo-conductor cells, photovoltaic cells, or mixtures thereof.
3. The apparatus according to Claim 2 wherein said scan-ning mirror is capable of producing a scanning motion in which the axis of rotation of the scan mirror is parallel with the plane of the sample surface.
4. The apparatus according to Claim 3 wherein the means for irradiation is selected from the group consisting of lasers, light-emitting diodes, or mixtures thereof.
5. The apparatus according to Claim 4 further including calibration sources along said sample and adjacent to said reflector means.
6. The apparatus according to Claim 5 further comprising means for heating cooling the sample.
7. The apparatus according to Claim 6 wherein the scan mirror and the spectrometer are positioned so as to obtain a resolution of the sample is finer than about 0.1 mm by about 0.1 mm.
8. The apparatus according to Claim 2 wherein the means for rotating the scanning mirror is capable of producing an axis of rotation of the scan mirror which is normal to the plane of the sample surface.
9. The apparatus according to Claim 8 wherein the means for irradiation is selected from the group consisting of lasers, light-emitting diodes, or mixtures thereof.
10. The apparatus according to Claim 9 further including means for heating cooling the sample.
11. An apparatus for analyzing the reflected radiation from a well bore core sample comprising:
means for holding a core sample in a fixed plane;
means for heating said core sample connected to said means for holding;
means for moving said core sample at a uniform rate along said fixed plane connected to said holding means;
means for irradiating the core sample with a source of electromagnetic radiation;
a scanning mirror located in a plane above said core sample for directing the reflected/emitted radiation from said core sample along a predetermined plane, said scanning mirror capable of producing a scanning motion in which the axis of rotation of the scanning mirror is parallel with the plane of the core surface;
a spectrometer located in said predetermined plane, said spectrometer capable of dividing the reflected/
emitted radiation into predetermined energy bandwidths, photo-detectors responsive to the predetermined energy bandwidths spaced apart from said spectrometer, said photo-detectors capable of converting the prede-termined energy bandwidths into electrical data signals, said scanning mirror, said spectrometer and said photo-detectors positioned such that said electrical data signals are capable of being processed to analyze portions of said core sample having dimensions finer than about 0.5 mm by about 0.5 mm;
means for encoding the electrical signals digitally;
and means for recording said digitally encoded signal.
12. The apparatus according to Claim 11 wherein the means for irradiation is selected from the group con-sisting of lasers, light-emitting diodes, or mixtures thereof.
13. The apparatus according to Claim 12 wherein the photo-detectors are selected from the group consisting of HgCdTe, InSb, Si, GaAs, and CdS.
14. The apparatus according to Claim 13 further including calibration sources along said sample and adjacent to said reflector means.
15. A process of analyzing a geological sample comprising:
irradiating a sample with radiation having prede-termined wavelength distribution;
focusing the reflected radiation from the sample onto a spectrometer;
dividing the reflected radiation into predetermined wavelength bands with said spectrometer;
directing the predetermined wavelength bands from said spectrometer onto a photo-detector, said photo-detector being capable of converting the radiation into an electrical signal;
encoding digitally the electrical signal from said photo-detector as digital data; and processing the digital data to produce a correlative image of the sample having a resolution finer than about 0.5 mm by about 0.5 mm.
16. The process according to Claim 15 wherein the wavelength(s) of irradiated radiation varies from the ultraviolet portion to the infrared portion of the electromagnetic radiation spectrum.
17. The process according to Claim 16 wherein the processing enhances the internal structure of core sample.
18. The process according to Claim 17 which further comprises analyzing mineralogically a portion of the core.
19. The process according to Claim 18 wherein the data from said mineralogical analysis is used in the digital data processing to determine a continuous mineralogical composition of the sample.
20. The process according to Claim 17 which further comprises heating the sample and measuring the emitted thermal infrared radiation so as to determine relative porosity and map distribution of porosity of the sample.
21. The process according to Claim 20 wherein the recorded emitted thermal infrared is used to produce an image of apparent thermal inertia wherein apparent thermal inertia is equal to 1-albedo divided by temperature change wherein albedo is the average reflectance in the visible and near infrared region.
22. The process according to Claim 16 wherein the processing superimposes different selected wavelength energy bands to produce a scan image having an enhanced visibility for a predetermined geologic property and/or distinguishes between different geologic compositions.
CA000509921A 1986-05-26 1986-05-26 High resolution geologic sample scanning apparatus and process of scanning geologic samples Expired - Fee Related CA1265356A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA000509921A CA1265356A (en) 1986-05-26 1986-05-26 High resolution geologic sample scanning apparatus and process of scanning geologic samples

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA000509921A CA1265356A (en) 1986-05-26 1986-05-26 High resolution geologic sample scanning apparatus and process of scanning geologic samples

Publications (1)

Publication Number Publication Date
CA1265356A true CA1265356A (en) 1990-02-06

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Family Applications (1)

Application Number Title Priority Date Filing Date
CA000509921A Expired - Fee Related CA1265356A (en) 1986-05-26 1986-05-26 High resolution geologic sample scanning apparatus and process of scanning geologic samples

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114594096B (en) * 2022-02-24 2024-05-31 中国石油大学(北京) Field core weathering layer automatic identification and stripping device and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114594096B (en) * 2022-02-24 2024-05-31 中国石油大学(北京) Field core weathering layer automatic identification and stripping device and method

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