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BRPI0402556A - Métodos para determinar a profundidade de defeitos - Google Patents

Métodos para determinar a profundidade de defeitos

Info

Publication number
BRPI0402556A
BRPI0402556A BR0402556-3A BRPI0402556A BRPI0402556A BR PI0402556 A BRPI0402556 A BR PI0402556A BR PI0402556 A BRPI0402556 A BR PI0402556A BR PI0402556 A BRPI0402556 A BR PI0402556A
Authority
BR
Brazil
Prior art keywords
component
infrared radiation
methods
radiation detector
depth
Prior art date
Application number
BR0402556-3A
Other languages
English (en)
Inventor
John William Devitt
Anthony S Bauco
Craig Alan Cantello
Kevin G Harding
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of BRPI0402556A publication Critical patent/BRPI0402556A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

"MéTODOS PARA DETERMINAR A PROFUNDIDADE DE DEFEITOS." Um método para permitir a inspeção de uma superfície (28) de um componente, o método compreende posicionar a superfície do componente (10) a ser inspecionada no caminho ótico (24) de pelo menos um detetor (26) de radiação infravermelha, aquecer a superfície do componente usando uma radiação eletromagnética para causar um incremento na radiância de um defeito (70) presente na superfície do componente, e detectar as variações de temperatura na superfície do componente usando pelo menos um detetor de radiação infravermelha, de tal forma que a irradiação da superfície é medida em locais predeterminados ao longo da superfície do componente. O método ainda compreende detectar as rachaduras no componente através da análise dos dados de resposta transiente da radiação recebidos pelo detetor de radiação infravermelha, e correlacionar as variações de temperatura com os dados de resposta transiente da radiação para determinar a profundidade das rachaduras detectadas.
BR0402556-3A 2003-06-30 2004-06-28 Métodos para determinar a profundidade de defeitos BRPI0402556A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/609,812 US6874932B2 (en) 2003-06-30 2003-06-30 Methods for determining the depth of defects

Publications (1)

Publication Number Publication Date
BRPI0402556A true BRPI0402556A (pt) 2005-05-03

Family

ID=33540927

Family Applications (1)

Application Number Title Priority Date Filing Date
BR0402556-3A BRPI0402556A (pt) 2003-06-30 2004-06-28 Métodos para determinar a profundidade de defeitos

Country Status (6)

Country Link
US (1) US6874932B2 (pt)
EP (1) EP1505384A1 (pt)
JP (1) JP4504117B2 (pt)
BR (1) BRPI0402556A (pt)
CA (1) CA2471334C (pt)
SG (1) SG128465A1 (pt)

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Also Published As

Publication number Publication date
CA2471334C (en) 2010-02-09
US6874932B2 (en) 2005-04-05
CA2471334A1 (en) 2004-12-30
US20040262521A1 (en) 2004-12-30
JP4504117B2 (ja) 2010-07-14
EP1505384A1 (en) 2005-02-09
SG128465A1 (en) 2007-01-30
JP2005024556A (ja) 2005-01-27

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 11A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2312 DE 28-04-2015 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.