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AU647064B2 - Process and arrangement for optoelectronic measurement of objects - Google Patents

Process and arrangement for optoelectronic measurement of objects

Info

Publication number
AU647064B2
AU647064B2 AU69000/91A AU6900091A AU647064B2 AU 647064 B2 AU647064 B2 AU 647064B2 AU 69000/91 A AU69000/91 A AU 69000/91A AU 6900091 A AU6900091 A AU 6900091A AU 647064 B2 AU647064 B2 AU 647064B2
Authority
AU
Australia
Prior art keywords
light
narrow
cameras
objects
arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
AU69000/91A
Other versions
AU6900091A (en
Inventor
Herbert Barg
Albert Niel
Werner Schwenzfeier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Broken Hill Proprietary Company Pty Ltd
Original Assignee
Broken Hill Proprietary Company Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Broken Hill Proprietary Company Pty Ltd filed Critical Broken Hill Proprietary Company Pty Ltd
Publication of AU6900091A publication Critical patent/AU6900091A/en
Assigned to BROKEN HILL PROPRIETARY COMPANY LIMITED, THE reassignment BROKEN HILL PROPRIETARY COMPANY LIMITED, THE Alteration of Name(s) of Applicant(s) under S113 Assignors: BOHLER GMBH
Application granted granted Critical
Publication of AU647064B2 publication Critical patent/AU647064B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Wire Bonding (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photovoltaic Devices (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

An arrangement for optoelectronic measurement of the shape of objects (4) comprises at least two light sources (5) each of which projects at least one narrow light beam (6) onto the object to be measured (light-section procedure). The narrow light beams (6) are recorded by a number of video cameras (7) equal to the number of light sources (5). The video cameras (7) are connected to an evaluation device (9) which comprises a computer and which evaluates the photos or calculates the dimensions of the object (4). Each light source (5) is associated with an individual camera (7) which responds only to the light from that light source. Each light source (5) generates a narrow light beam (6) by emitting light rays of different wavelengths and/or polarizations, or the times at which the light strikes the object (4) and the times at which the individual cameras (7) are free to record the corresponding narrow light beam (6) are synchronized and the imaging and recording times of the individual pairs of light sources and cameras (5, 7) do not overlap.
AU69000/91A 1989-12-05 1990-12-05 Process and arrangement for optoelectronic measurement of objects Ceased AU647064B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AT276489 1989-12-05
AT2764/89 1989-12-05

Publications (2)

Publication Number Publication Date
AU6900091A AU6900091A (en) 1991-06-26
AU647064B2 true AU647064B2 (en) 1994-03-17

Family

ID=3539929

Family Applications (1)

Application Number Title Priority Date Filing Date
AU69000/91A Ceased AU647064B2 (en) 1989-12-05 1990-12-05 Process and arrangement for optoelectronic measurement of objects

Country Status (8)

Country Link
EP (1) EP0502930B1 (en)
JP (1) JPH05502720A (en)
KR (1) KR920704092A (en)
AT (1) ATE109556T1 (en)
AU (1) AU647064B2 (en)
CA (1) CA2070822A1 (en)
DE (1) DE59006727D1 (en)
WO (1) WO1991008439A1 (en)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4301538A1 (en) * 1992-03-17 1994-07-28 Peter Dr Ing Brueckner Method and arrangement for contactless three-dimensional measurement, in particular for measuring denture models
DE4208455A1 (en) * 1992-03-17 1993-09-23 Peter Dr Ing Brueckner Contactless three=dimensional measurement e.g of teeth - using opto-electronic measurement in two dimensions and rotative or translation in third dimension and combining w.r.t actual position of measurement planes
US5383021A (en) * 1993-04-19 1995-01-17 Mectron Engineering Company Optical part inspection system
DE4411986A1 (en) * 1994-04-10 1995-10-12 Kjm Ges Fuer Opto Elektronisch System for measuring cross-sectional accuracy of bar-shaped material
US6175415B1 (en) 1997-02-19 2001-01-16 United Technologies Corporation Optical profile sensor
IT1292544B1 (en) * 1997-04-10 1999-02-08 Microtec Srl DEVICE FOR MEASURING THE DIMENSIONS OF A VERY LONGITUDINALLY EXTENDED OBJECT WITH A CURVED CONTOUR CROSS SECTION.
DE19749435B4 (en) * 1997-11-09 2005-06-02 Mähner, Bernward Method and device for the three-dimensional, areal, optical measurement of objects
US6094269A (en) * 1997-12-31 2000-07-25 Metroptic Technologies, Ltd. Apparatus and method for optically measuring an object surface contour
US6636310B1 (en) 1998-05-12 2003-10-21 Metroptic Technologies, Ltd. Wavelength-dependent surface contour measurement system and method
DE69943406D1 (en) 1998-05-25 2011-06-16 Panasonic Corp CLEARANCE KNIVES AND CAMERA
US6285034B1 (en) * 1998-11-04 2001-09-04 James L. Hanna Inspection system for flanged bolts
EP1044770A1 (en) * 1999-04-15 2000-10-18 Hermann Wein GmbH & Co. KG, Schwarzwäder Schinkenräucherei Method and apparatus for cutting pieces of predetermined weight out of smoked ham
US6882434B1 (en) 1999-04-20 2005-04-19 Formax, Inc. Automated product profiling apparatus and product slicing system using same
WO2000062983A1 (en) † 1999-04-20 2000-10-26 Formax, Inc. Automated product profiling apparatus and product slicing system using same
DE10044032A1 (en) * 2000-09-06 2002-03-14 Deutsche Telekom Ag 3-D vision
WO2003027608A1 (en) * 2001-09-28 2003-04-03 Sergei Vasilievich Plotnikov System for process control of parameters of rotating workpieces
EP1391690B1 (en) * 2002-08-14 2015-07-01 3D Scanners Ltd Optical probe for measuring features of an object and methods therefor
US7009717B2 (en) 2002-08-14 2006-03-07 Metris N.V. Optical probe for scanning the features of an object and methods therefor
DE102004057092A1 (en) * 2004-11-25 2006-06-01 Hauni Maschinenbau Ag Measuring the diameter of rod-shaped articles of the tobacco processing industry
DE102005054658A1 (en) 2005-11-16 2007-05-24 Sick Ag Method for automatically paramenting measuring systems
DE102005058873A1 (en) 2005-12-09 2007-06-14 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Device and method for measuring the surface of a body
DE102006040612B4 (en) * 2006-08-30 2011-12-08 Z-Laser Optoelektronik Gmbh Distance measuring device
EP2100092B1 (en) * 2006-12-15 2010-06-23 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Method and device for thickness measurement
DE102007063041A1 (en) * 2007-12-28 2009-07-02 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Laser light section arrangement for determining e.g. elevation profile of object, has image processing device for identifying and separating laser sectional lines from each other in recorded image, and assigning lines to respective lasers
ES2708792T3 (en) 2009-10-27 2019-04-11 Formax Inc Automatic product profiling device and product slicing system using the same
DE102010011217A1 (en) * 2010-03-11 2011-09-15 Salzgitter Mannesmann Line Pipe Gmbh Method and device for measuring the profile geometry of spherically curved, in particular cylindrical bodies
DE102012102649A1 (en) * 2012-03-27 2013-10-02 Uwe Reifenhäuser Method and device for weight-accurate cutting of a food strand
EP3865813A1 (en) * 2020-02-15 2021-08-18 Hewlett-Packard Development Company, L.P. Scanning of objects
CN113551611B (en) * 2021-06-15 2022-04-22 西安交通大学 Stereo vision measuring method, system, equipment and storage medium for large-size moving object

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4297513A (en) * 1979-05-16 1981-10-27 Ciba-Geigy Corporation Process for the preparation of benzophenone thioethers
EP0214120A2 (en) * 1985-08-28 1987-03-11 IGM Industriegeräte- und Maschinenfabriksgesellschaft mbH Method for detection of the position and geometry of work piece surfaces
EP0305107A2 (en) * 1987-08-24 1989-03-01 L.B.P. Partnership Three-dimensional scanner

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4183672A (en) * 1977-11-26 1980-01-15 United Technologies Corporation Optical inspection system employing spherical mirror
SE412286B (en) * 1978-07-10 1980-02-25 Saab Scania Ab SET AND DEVICE FOR PHOTOELECTRIC DIMENSION OF WIDES OR SIMILAR GEOMETRICALLY DETERMINED FORMS
US4279513A (en) * 1979-04-02 1981-07-21 Sangamo Weston, Inc. Optical inspection system for large parts and for multiple measurements
JPS57159148A (en) * 1981-03-25 1982-10-01 Fujitsu Ltd Adaptive modulation system
US4756007A (en) * 1984-03-08 1988-07-05 Codex Corporation Adaptive communication rate modem
DE3511347C2 (en) * 1985-03-28 1987-04-09 Gerd Dipl.-Phys. Dr. 8520 Erlangen Häusler Method and device for optical multidimensional shape detection of an object
DE3712513A1 (en) * 1987-04-13 1988-11-03 Roth Electric Gmbh METHOD AND DEVICE FOR DETECTING SURFACE DEFECTS

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4297513A (en) * 1979-05-16 1981-10-27 Ciba-Geigy Corporation Process for the preparation of benzophenone thioethers
EP0214120A2 (en) * 1985-08-28 1987-03-11 IGM Industriegeräte- und Maschinenfabriksgesellschaft mbH Method for detection of the position and geometry of work piece surfaces
EP0305107A2 (en) * 1987-08-24 1989-03-01 L.B.P. Partnership Three-dimensional scanner

Also Published As

Publication number Publication date
AU6900091A (en) 1991-06-26
CA2070822A1 (en) 1991-06-06
WO1991008439A1 (en) 1991-06-13
DE59006727D1 (en) 1994-09-08
ATE109556T1 (en) 1994-08-15
JPH05502720A (en) 1993-05-13
KR920704092A (en) 1992-12-19
EP0502930A1 (en) 1992-09-16
EP0502930B1 (en) 1994-08-03

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