AU6014594A - Method and apparatus for imaging surfaces - Google Patents
Method and apparatus for imaging surfacesInfo
- Publication number
- AU6014594A AU6014594A AU60145/94A AU6014594A AU6014594A AU 6014594 A AU6014594 A AU 6014594A AU 60145/94 A AU60145/94 A AU 60145/94A AU 6014594 A AU6014594 A AU 6014594A AU 6014594 A AU6014594 A AU 6014594A
- Authority
- AU
- Australia
- Prior art keywords
- imaging surfaces
- imaging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
- G01N2021/8825—Separate detection of dark field and bright field
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
- G01N2021/8918—Metal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/102—Video camera
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US1231093A | 1993-02-02 | 1993-02-02 | |
US012310 | 1993-02-02 | ||
PCT/US1993/012141 WO1994018643A1 (en) | 1993-02-02 | 1993-12-13 | Method and apparatus for imaging surfaces |
Publications (1)
Publication Number | Publication Date |
---|---|
AU6014594A true AU6014594A (en) | 1994-08-29 |
Family
ID=21754366
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU60145/94A Abandoned AU6014594A (en) | 1993-02-02 | 1993-12-13 | Method and apparatus for imaging surfaces |
Country Status (2)
Country | Link |
---|---|
AU (1) | AU6014594A (en) |
WO (1) | WO1994018643A1 (en) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5917588A (en) * | 1996-11-04 | 1999-06-29 | Kla-Tencor Corporation | Automated specimen inspection system for and method of distinguishing features or anomalies under either bright field or dark field illumination |
ATE197503T1 (en) * | 1997-08-22 | 2000-11-11 | Fraunhofer Ges Forschung | METHOD AND DEVICE FOR AUTOMATICALLY TESTING MOVING SURFACES |
US6294327B1 (en) | 1997-09-08 | 2001-09-25 | Affymetrix, Inc. | Apparatus and method for detecting samples labeled with material having strong light scattering properties, using reflection mode light and diffuse scattering |
US6327374B1 (en) | 1999-02-18 | 2001-12-04 | Thermo Radiometrie Oy | Arrangement and method for inspection of surface quality |
DE19946520B4 (en) * | 1999-09-28 | 2010-09-16 | Parsytec Ag | Apparatus and method for surface inspection of a continuously tapered strip material |
GB2384852A (en) * | 2001-09-03 | 2003-08-06 | Millennium Venture Holdings Lt | Workpiece inspection apparatus |
US7137182B2 (en) | 2002-11-22 | 2006-11-21 | The Boeing Company | Parallel configuration composite material fabricator |
US7236625B2 (en) | 2003-07-28 | 2007-06-26 | The Boeing Company | Systems and method for identifying foreign objects and debris (FOD) and defects during fabrication of a composite structure |
US7289656B2 (en) | 2003-12-02 | 2007-10-30 | The Boeing Company | Systems and methods for determining inconsistency characteristics of a composite structure |
US8934702B2 (en) | 2003-12-02 | 2015-01-13 | The Boeing Company | System and method for determining cumulative tow gap width |
US7039485B2 (en) | 2004-03-12 | 2006-05-02 | The Boeing Company | Systems and methods enabling automated return to and/or repair of defects with a material placement machine |
US7193696B2 (en) | 2004-04-12 | 2007-03-20 | United Technologies Corporation | Systems and methods for using light to indicate defect locations on a composite structure |
US20060108048A1 (en) | 2004-11-24 | 2006-05-25 | The Boeing Company | In-process vision detection of flaws and fod by back field illumination |
US7424902B2 (en) | 2004-11-24 | 2008-09-16 | The Boeing Company | In-process vision detection of flaw and FOD characteristics |
US7889907B2 (en) | 2005-01-12 | 2011-02-15 | The Boeing Company | Apparatus and methods for inspecting tape lamination |
DE102006009593B4 (en) * | 2005-10-01 | 2008-12-18 | Vistec Semiconductor Systems Gmbh | Device for taking multiple images of disc-shaped objects |
US7435947B2 (en) | 2005-10-31 | 2008-10-14 | The Boeing Company | Apparatus and methods for integrating encoding functions in material placement machines |
US7372556B2 (en) | 2005-10-31 | 2008-05-13 | The Boeing Company | Apparatus and methods for inspecting a composite structure for inconsistencies |
DE102007007828B4 (en) * | 2007-02-16 | 2011-02-24 | Bst International Gmbh | Method and device for illuminating a printed image on a material web |
EP2144052A1 (en) * | 2008-07-11 | 2010-01-13 | Dr. Schenk GmbH Industriemesstechnik | Method and device for detecting and classifying defects |
EP3025145B1 (en) * | 2013-07-22 | 2017-06-28 | ZS-Handling GmbH | Device for inspecting workpiece surfaces and strip materials |
BR112017021163A2 (en) * | 2015-03-31 | 2018-07-17 | Nisshin Steel Co., Ltd. | surface defect inspection device and method for hot-dip coated steel sheets |
DE102016100437B4 (en) | 2016-01-12 | 2018-08-02 | Stephan Krebs | Device for image control |
CN106168580A (en) * | 2016-07-18 | 2016-11-30 | 广东华冠新型材料有限公司 | Band hole real-time detection apparatus |
KR102632169B1 (en) * | 2018-11-12 | 2024-02-02 | 삼성디스플레이 주식회사 | Apparatus and method for inspecting glass substrate |
DE102019107174B4 (en) * | 2019-03-20 | 2020-12-24 | Thyssenkrupp Rasselstein Gmbh | Method and apparatus for inspecting the surface of a moving belt |
CN113447485A (en) * | 2020-03-26 | 2021-09-28 | 捷普电子(新加坡)公司 | Optical detection method |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4922337B1 (en) * | 1988-04-26 | 1994-05-03 | Picker Int Inc | Time delay and integration of images using a frame transfer ccd sensor |
US5030008A (en) * | 1988-10-11 | 1991-07-09 | Kla Instruments, Corporation | Method and apparatus for the automated analysis of three-dimensional objects |
-
1993
- 1993-12-13 AU AU60145/94A patent/AU6014594A/en not_active Abandoned
- 1993-12-13 WO PCT/US1993/012141 patent/WO1994018643A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO1994018643A1 (en) | 1994-08-18 |
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