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AU2003260288A1 - Method and apparatus for determination of layer thickness in a multi-layer structure - Google Patents

Method and apparatus for determination of layer thickness in a multi-layer structure

Info

Publication number
AU2003260288A1
AU2003260288A1 AU2003260288A AU2003260288A AU2003260288A1 AU 2003260288 A1 AU2003260288 A1 AU 2003260288A1 AU 2003260288 A AU2003260288 A AU 2003260288A AU 2003260288 A AU2003260288 A AU 2003260288A AU 2003260288 A1 AU2003260288 A1 AU 2003260288A1
Authority
AU
Australia
Prior art keywords
determination
layer
layer structure
layer thickness
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003260288A
Inventor
Henrik Christensen
Rymantas Kazys
Liudas Mazeika
Jorgen Nielsen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beta Lasermike Inc
Original Assignee
Beta Lasermike Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beta Lasermike Inc filed Critical Beta Lasermike Inc
Publication of AU2003260288A1 publication Critical patent/AU2003260288A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
AU2003260288A 2002-09-11 2003-09-11 Method and apparatus for determination of layer thickness in a multi-layer structure Abandoned AU2003260288A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US40959602P 2002-09-11 2002-09-11
DKPA200201336 2002-09-11
US60/409,596 2002-09-11
DKPA200201336 2002-09-11
PCT/DK2003/000587 WO2004025221A1 (en) 2002-09-11 2003-09-11 Method and apparatus for determination of layer thickness in a multi-layer structure

Publications (1)

Publication Number Publication Date
AU2003260288A1 true AU2003260288A1 (en) 2004-04-30

Family

ID=31995411

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003260288A Abandoned AU2003260288A1 (en) 2002-09-11 2003-09-11 Method and apparatus for determination of layer thickness in a multi-layer structure

Country Status (2)

Country Link
AU (1) AU2003260288A1 (en)
WO (1) WO2004025221A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3013454B1 (en) * 2013-11-20 2021-10-08 Snecma ULTRASONIC PROCESS FOR CHARACTERIZING A PART
CN105758347B (en) * 2016-03-18 2018-06-19 浙江大学 Product parameter ultrasound On-line Measuring Method in co-injection molding

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2650071B1 (en) * 1989-07-20 1991-09-27 Asulab Sa PROCESS FOR PROCESSING AN ELECTRICAL SIGNAL
US5974886A (en) * 1997-09-15 1999-11-02 General Electric Company Method and apparatus for thickness determination in multilayer articles
US6035717A (en) * 1998-05-12 2000-03-14 Krautkramer Branson, Inc. Method and apparatus for measuring the thickness of a coated material
US6494097B1 (en) * 2000-09-05 2002-12-17 Elias Edmond Shihadeh Method and apparatus for measuring thickness of a layer in a multi-layered object

Also Published As

Publication number Publication date
WO2004025221A1 (en) 2004-03-25

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase