AU2002222170A1 - Method and system for icosaborane implantation - Google Patents
Method and system for icosaborane implantationInfo
- Publication number
- AU2002222170A1 AU2002222170A1 AU2002222170A AU2217002A AU2002222170A1 AU 2002222170 A1 AU2002222170 A1 AU 2002222170A1 AU 2002222170 A AU2002222170 A AU 2002222170A AU 2217002 A AU2217002 A AU 2217002A AU 2002222170 A1 AU2002222170 A1 AU 2002222170A1
- Authority
- AU
- Australia
- Prior art keywords
- icosaborane
- implantation
- icosaborane implantation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H10P30/20—
-
- H10P30/21—
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/48—Ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
-
- H10P30/204—
-
- H10P30/224—
-
- H10P30/225—
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/738,486 | 2000-12-15 | ||
| US09/738,486 US6479828B2 (en) | 2000-12-15 | 2000-12-15 | Method and system for icosaborane implantation |
| PCT/GB2001/005477 WO2002048425A2 (en) | 2000-12-15 | 2001-12-11 | Method and system for icosaborane implantation |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU2002222170A1 true AU2002222170A1 (en) | 2002-06-24 |
Family
ID=24968227
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2002222170A Abandoned AU2002222170A1 (en) | 2000-12-15 | 2001-12-11 | Method and system for icosaborane implantation |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US6479828B2 (en) |
| EP (1) | EP1341949A2 (en) |
| JP (1) | JP4029394B2 (en) |
| KR (1) | KR100856807B1 (en) |
| CN (1) | CN1269990C (en) |
| AU (1) | AU2002222170A1 (en) |
| TW (1) | TW527619B (en) |
| WO (1) | WO2002048425A2 (en) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7372043B2 (en) * | 2002-02-22 | 2008-05-13 | Agilent Technologies, Inc. | Apparatus and method for ion production enhancement |
| US7135689B2 (en) * | 2002-02-22 | 2006-11-14 | Agilent Technologies, Inc. | Apparatus and method for ion production enhancement |
| US7132670B2 (en) * | 2002-02-22 | 2006-11-07 | Agilent Technologies, Inc. | Apparatus and method for ion production enhancement |
| US6825462B2 (en) * | 2002-02-22 | 2004-11-30 | Agilent Technologies, Inc. | Apparatus and method for ion production enhancement |
| GB2387022B (en) * | 2002-03-28 | 2005-12-21 | Applied Materials Inc | Monatomic boron ion source and method |
| US7518124B2 (en) * | 2002-03-28 | 2009-04-14 | Applied Materials, Inc. | Monatomic dopant ion source and method |
| EP1579481B1 (en) * | 2002-06-26 | 2013-12-04 | Semequip, Inc. | A method of semiconductor manufacturing by the implantation of boron hydride cluster ions |
| CN101908473B (en) * | 2002-06-26 | 2013-03-13 | 山米奎普公司 | Method of manufacturing CMOS devices by the implantation of N- and P-type cluster ions and negative ions |
| US6686595B2 (en) * | 2002-06-26 | 2004-02-03 | Semequip Inc. | Electron impact ion source |
| US7791047B2 (en) * | 2003-12-12 | 2010-09-07 | Semequip, Inc. | Method and apparatus for extracting ions from an ion source for use in ion implantation |
| WO2005059942A2 (en) | 2003-12-12 | 2005-06-30 | Semequip, Inc. | Method and apparatus for extending equipment uptime in ion implantation |
| JP2007266022A (en) * | 2004-05-25 | 2007-10-11 | Matsushita Electric Ind Co Ltd | Plasma generator, plasma processing apparatus using the same, and electronic equipment |
| ATE546824T1 (en) * | 2004-06-08 | 2012-03-15 | Dichroic Cell S R L | SYSTEM FOR PLASMA-ASSISTED CHEMICAL VAPOR DEPOSION AT LOW ENERGY |
| US7397048B2 (en) * | 2004-09-17 | 2008-07-08 | Varian Semiconductor Equipment Associates, Inc. | Technique for boron implantation |
| US7446326B2 (en) * | 2005-08-31 | 2008-11-04 | Varian Semiconductor Equipment Associates, Inc. | Technique for improving ion implanter productivity |
| WO2009039382A1 (en) | 2007-09-21 | 2009-03-26 | Semequip. Inc. | Method for extending equipment uptime in ion implantation |
| US7759657B2 (en) | 2008-06-19 | 2010-07-20 | Axcelis Technologies, Inc. | Methods for implanting B22Hx and its ionized lower mass byproducts |
| CN102165561A (en) * | 2008-09-25 | 2011-08-24 | 应用材料股份有限公司 | Defect-free junction formation using self-amorphizing implants using octadecaborane |
| US20110070724A1 (en) * | 2009-09-21 | 2011-03-24 | Applied Materials, Inc. | Defect-free junction formation using octadecaborane self-amorphizing implants |
| US8350236B2 (en) * | 2010-01-12 | 2013-01-08 | Axcelis Technologies, Inc. | Aromatic molecular carbon implantation processes |
| US8344337B2 (en) | 2010-04-21 | 2013-01-01 | Axcelis Technologies, Inc. | Silaborane implantation processes |
| JP6120259B2 (en) * | 2012-05-10 | 2017-04-26 | 株式会社アルバック | Ion implantation method |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3305696A (en) * | 1965-10-24 | 1967-02-21 | Electro Optical Systems Inc | Negative ion source having gas nozzle integral with the cathode |
| JP3215898B2 (en) * | 1992-04-28 | 2001-10-09 | 日本電信電話株式会社 | Plasma CVD method and plasma CVD apparatus |
| JP3749924B2 (en) * | 1996-12-03 | 2006-03-01 | 富士通株式会社 | Ion implantation method and semiconductor device manufacturing method |
-
2000
- 2000-12-15 US US09/738,486 patent/US6479828B2/en not_active Expired - Fee Related
-
2001
- 2001-11-30 TW TW090129636A patent/TW527619B/en not_active IP Right Cessation
- 2001-12-11 WO PCT/GB2001/005477 patent/WO2002048425A2/en not_active Ceased
- 2001-12-11 KR KR1020037007772A patent/KR100856807B1/en not_active Expired - Fee Related
- 2001-12-11 CN CNB018226663A patent/CN1269990C/en not_active Expired - Fee Related
- 2001-12-11 AU AU2002222170A patent/AU2002222170A1/en not_active Abandoned
- 2001-12-11 EP EP01270637A patent/EP1341949A2/en not_active Withdrawn
- 2001-12-11 JP JP2002550136A patent/JP4029394B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| WO2002048425A3 (en) | 2002-09-06 |
| US20020074521A1 (en) | 2002-06-20 |
| KR100856807B1 (en) | 2008-09-05 |
| CN1269990C (en) | 2006-08-16 |
| JP4029394B2 (en) | 2008-01-09 |
| TW527619B (en) | 2003-04-11 |
| EP1341949A2 (en) | 2003-09-10 |
| JP2004528703A (en) | 2004-09-16 |
| WO2002048425A2 (en) | 2002-06-20 |
| CN1489639A (en) | 2004-04-14 |
| KR20030061841A (en) | 2003-07-22 |
| US6479828B2 (en) | 2002-11-12 |
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