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AU2001261838A1 - Method and system for self-replicating manufacturing stations - Google Patents

Method and system for self-replicating manufacturing stations

Info

Publication number
AU2001261838A1
AU2001261838A1 AU2001261838A AU6183801A AU2001261838A1 AU 2001261838 A1 AU2001261838 A1 AU 2001261838A1 AU 2001261838 A AU2001261838 A AU 2001261838A AU 6183801 A AU6183801 A AU 6183801A AU 2001261838 A1 AU2001261838 A1 AU 2001261838A1
Authority
AU
Australia
Prior art keywords
assembly
preferred
stations
scale
srms
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001261838A
Inventor
Ralph C. Merkle
Eric G. Parker
George D. Skidmore
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zyvex Corp
Original Assignee
Zyvex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zyvex Corp filed Critical Zyvex Corp
Publication of AU2001261838A1 publication Critical patent/AU2001261838A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/4188—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by CIM planning or realisation
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41805—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by assembly
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/40—Robotics, robotics mapping to robotics vision
    • G05B2219/40261—Self reproducing, replicating fabrication machine, tools, structure, info for this
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/45—Nc applications
    • G05B2219/45031—Manufacturing semiconductor wafers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/70—Nanostructure
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/882—Assembling of separate components, e.g. by attaching
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/887—Nanoimprint lithography, i.e. nanostamp

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Micromachines (AREA)
  • Peptides Or Proteins (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Lift-Guide Devices, And Elevator Ropes And Cables (AREA)
  • Prostheses (AREA)
  • Road Signs Or Road Markings (AREA)
  • Curing Cements, Concrete, And Artificial Stone (AREA)
  • Aerials With Secondary Devices (AREA)
  • Small-Scale Networks (AREA)
  • Particle Formation And Scattering Control In Inkjet Printers (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)

Abstract

A system and method which provide a non-biological self replicating manufacturing system ("SRMS") are disclosed. A preferred embodiment provides an SRMS that enables assembly stations to replicate. In a preferred embodiment, positional assembly is utilized by one or more assembly stations to construct like assembly stations. Furthermore, in a most preferred embodiment, such assembly stations are small scale devices that are capable of working with small scale parts, such as micron-scale, nanometer-scale or even molecular-scale parts, in order to construct like assembly devices. The SRMS of a preferred embodiment performs surface-to-surface assembly. For example, an assembly station on a first surface (e.g., wafer), Surface A, constructs a like assembly station on another surface (e.g., wafer), Surface B. Most preferably, the assembly stations replicate at an exponential rate.
AU2001261838A 2000-05-11 2001-05-10 Method and system for self-replicating manufacturing stations Abandoned AU2001261838A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/569,330 US6510359B1 (en) 2000-05-11 2000-05-11 Method and system for self-replicating manufacturing stations
US09569330 2000-05-11
PCT/US2001/040719 WO2001086361A2 (en) 2000-05-11 2001-05-10 Method and system for self-replicating manufacturing stations

Publications (1)

Publication Number Publication Date
AU2001261838A1 true AU2001261838A1 (en) 2001-11-20

Family

ID=24274975

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001261838A Abandoned AU2001261838A1 (en) 2000-05-11 2001-05-10 Method and system for self-replicating manufacturing stations

Country Status (9)

Country Link
US (1) US6510359B1 (en)
EP (1) EP1281108B1 (en)
JP (1) JP2003533059A (en)
KR (1) KR100550817B1 (en)
CN (1) CN1636169A (en)
AT (1) ATE300060T1 (en)
AU (1) AU2001261838A1 (en)
DE (1) DE60112074T2 (en)
WO (1) WO2001086361A2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6679055B1 (en) * 2002-01-31 2004-01-20 Zyvex Corporation Electrothermal quadmorph microactuator
US7309476B2 (en) * 2002-07-18 2007-12-18 Chevron U.S.A. Inc. Diamondoid-based components in nanoscale construction
EP1587594B1 (en) * 2003-01-15 2012-01-18 Andrzej Pietrzyk A system of three-dimensional multipurpose elements
JP2007148749A (en) * 2005-11-28 2007-06-14 Fujifilm Corp Device and program for specification modification
WO2016179435A1 (en) * 2015-05-07 2016-11-10 Massachusetts Institute Of Technology Self-assembling assemblers
CN116009503B (en) * 2023-03-22 2023-06-20 智昌科技集团股份有限公司 Self-organizing ternary intelligent manufacturing control system based on super-circulation network
CN119165817A (en) * 2024-09-05 2024-12-20 深圳市海铭德科技有限公司 A rapidly replicable digital factory and a replicating method

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4740410A (en) 1987-05-28 1988-04-26 The Regents Of The University Of California Micromechanical elements and methods for their fabrication
US5660680A (en) 1994-03-07 1997-08-26 The Regents Of The University Of California Method for fabrication of high vertical aspect ratio thin film structures
US5645684A (en) 1994-03-07 1997-07-08 The Regents Of The University Of California Multilayer high vertical aspect ratio thin film structures
US5659477A (en) * 1994-12-28 1997-08-19 Collins; Charles Michael Self reproducing fundamental fabricating machines (F-Units)
JP2826635B2 (en) * 1996-10-08 1998-11-18 工業技術院長 Automatic assembly of three-dimensional structures
DE19708472C2 (en) 1997-02-20 1999-02-18 Atotech Deutschland Gmbh Manufacturing process for chemical microreactors
US5994159A (en) * 1997-12-22 1999-11-30 Lucent Technologies, Inc. Self-assemblying micro-mechanical device
US6233502B1 (en) * 1998-10-16 2001-05-15 Xerox Corporation Fault tolerant connection system for transiently connectable modular elements
US6185107B1 (en) * 1998-12-23 2001-02-06 Raytheon Company MEMS based tile assemblies and methods of fabrication

Also Published As

Publication number Publication date
DE60112074T2 (en) 2006-04-20
KR100550817B1 (en) 2006-02-10
JP2003533059A (en) 2003-11-05
DE60112074D1 (en) 2005-08-25
KR20030007592A (en) 2003-01-23
EP1281108B1 (en) 2005-07-20
WO2001086361A2 (en) 2001-11-15
EP1281108A2 (en) 2003-02-05
ATE300060T1 (en) 2005-08-15
CN1636169A (en) 2005-07-06
US6510359B1 (en) 2003-01-21
WO2001086361A3 (en) 2002-06-20

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