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ATE246363T1 - System zur kontaktlosen prüfung von integrierten schaltungen - Google Patents

System zur kontaktlosen prüfung von integrierten schaltungen

Info

Publication number
ATE246363T1
ATE246363T1 AT99925741T AT99925741T ATE246363T1 AT E246363 T1 ATE246363 T1 AT E246363T1 AT 99925741 T AT99925741 T AT 99925741T AT 99925741 T AT99925741 T AT 99925741T AT E246363 T1 ATE246363 T1 AT E246363T1
Authority
AT
Austria
Prior art keywords
test
circuit
testing
microelectronic circuit
response signals
Prior art date
Application number
AT99925741T
Other languages
English (en)
Inventor
Stanley A White
Kenneth S Walley
James W Johnston
P Michael Henderson
Warner B Andrews Jr
Jonathan I Siann
Kelly H Hale
Original Assignee
Conexant Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Conexant Systems Inc filed Critical Conexant Systems Inc
Application granted granted Critical
Publication of ATE246363T1 publication Critical patent/ATE246363T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/3025—Wireless interface with the DUT
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AT99925741T 1999-05-21 1999-05-21 System zur kontaktlosen prüfung von integrierten schaltungen ATE246363T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US1999/011299 WO2000072030A1 (en) 1999-05-21 1999-05-21 Method and apparatus for wireless testing of integrated circuits

Publications (1)

Publication Number Publication Date
ATE246363T1 true ATE246363T1 (de) 2003-08-15

Family

ID=22272811

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99925741T ATE246363T1 (de) 1999-05-21 1999-05-21 System zur kontaktlosen prüfung von integrierten schaltungen

Country Status (6)

Country Link
EP (1) EP1188062B1 (de)
JP (1) JP2003500655A (de)
CN (1) CN1175277C (de)
AT (1) ATE246363T1 (de)
DE (1) DE69910084T2 (de)
WO (1) WO2000072030A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101556930B (zh) * 2003-08-25 2013-04-10 陶-梅特里克斯公司 用于评估半导体元件与晶片制造的技术
US7220990B2 (en) 2003-08-25 2007-05-22 Tau-Metrix, Inc. Technique for evaluating a fabrication of a die and wafer
JP2005175312A (ja) * 2003-12-12 2005-06-30 Alps Electric Co Ltd 面実装型電子モジュール、及びその検査方法
US7466157B2 (en) * 2004-02-05 2008-12-16 Formfactor, Inc. Contactless interfacing of test signals with a device under test
CN100460887C (zh) * 2004-04-02 2009-02-11 明基电通股份有限公司 无线检测系统
US7202687B2 (en) * 2004-04-08 2007-04-10 Formfactor, Inc. Systems and methods for wireless semiconductor device testing
FR2878963B1 (fr) 2004-12-07 2007-02-09 Eads Soc Par Actions Simplifie Sonde de test de circuit integre
CA2623257A1 (en) * 2008-02-29 2009-08-29 Scanimetrics Inc. Method and apparatus for interrogating an electronic component
CN104516798B (zh) * 2013-09-26 2018-06-15 晨星半导体股份有限公司 无线一对多测试系统
WO2015103395A1 (en) 2014-01-06 2015-07-09 Trustees Of Boston University Optical antennas for advanced integrated circuit testing
CN116990606B (zh) * 2023-07-17 2024-03-22 中国人民解放军陆军工程大学 一种电缆束注入各线对同时等效连续波电磁辐照试验方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2049616C (en) * 1991-01-22 2000-04-04 Jacob Soiferman Contactless test method and system for testing printed circuit boards
US6087842A (en) * 1996-04-29 2000-07-11 Agilent Technologies Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry
JP3717241B2 (ja) * 1996-07-11 2005-11-16 オー・エイチ・ティー株式会社 基板検査方法及び装置
WO1999032893A1 (en) * 1997-12-22 1999-07-01 Conexant Systems, Inc. Wireless test apparatus for integrated circuit die

Also Published As

Publication number Publication date
JP2003500655A (ja) 2003-01-07
CN1352747A (zh) 2002-06-05
EP1188062B1 (de) 2003-07-30
WO2000072030A1 (en) 2000-11-30
DE69910084D1 (de) 2003-09-04
DE69910084T2 (de) 2004-04-22
EP1188062A1 (de) 2002-03-20
CN1175277C (zh) 2004-11-10

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties