[go: up one dir, main page]

ATE161636T1 - Optisches nahfeldabtastmikroskop - Google Patents

Optisches nahfeldabtastmikroskop

Info

Publication number
ATE161636T1
ATE161636T1 AT92810813T AT92810813T ATE161636T1 AT E161636 T1 ATE161636 T1 AT E161636T1 AT 92810813 T AT92810813 T AT 92810813T AT 92810813 T AT92810813 T AT 92810813T AT E161636 T1 ATE161636 T1 AT E161636T1
Authority
AT
Austria
Prior art keywords
sample
probe tip
microscope
scaning
lightwaves
Prior art date
Application number
AT92810813T
Other languages
English (en)
Inventor
Daniel Dr Courjon
Optics Lab Duffieux
Wolfgang Dieter Dr Pohl
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of ATE161636T1 publication Critical patent/ATE161636T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22Probes, their manufacture, or their related instrumentation, e.g. holders
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00Methods or apparatus for measurement or analysis of nanostructures
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/84Manufacture, treatment, or detection of nanostructure
    • Y10S977/849Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86Scanning probe structure
    • Y10S977/862Near-field probe

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Nanotechnology (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Analytical Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Lenses (AREA)
AT92810813T 1992-10-22 1992-10-22 Optisches nahfeldabtastmikroskop ATE161636T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP92810813A EP0593835B1 (de) 1992-10-22 1992-10-22 Optisches Nahfeldabtastmikroskop

Publications (1)

Publication Number Publication Date
ATE161636T1 true ATE161636T1 (de) 1998-01-15

Family

ID=8212010

Family Applications (1)

Application Number Title Priority Date Filing Date
AT92810813T ATE161636T1 (de) 1992-10-22 1992-10-22 Optisches nahfeldabtastmikroskop

Country Status (5)

Country Link
US (1) US5539197A (de)
EP (1) EP0593835B1 (de)
JP (1) JP2555531B2 (de)
AT (1) ATE161636T1 (de)
DE (1) DE69223789T2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2170860C (en) * 1993-10-04 2002-07-23 Bert Hecht Near-field optical microscope
US5812724A (en) * 1994-05-31 1998-09-22 Kanagawa Academy Of Science & Technology Optical fiber having core with sharpened tip protruding from light-shielding coating
US5479024A (en) * 1994-08-11 1995-12-26 The Regents Of The University Of California Method and apparatus for performing near-field optical microscopy
JP2936311B2 (ja) * 1994-09-09 1999-08-23 セイコーインスツルメンツ株式会社 液中観察機能付き走査型近視野原子間力顕微鏡
US5859364A (en) * 1995-06-05 1999-01-12 Olympus Optical Co., Ltd. Scanning probe microscope
US5625617A (en) * 1995-09-06 1997-04-29 Lucent Technologies Inc. Near-field optical apparatus with a laser having a non-uniform emission face
US5952562A (en) * 1995-11-22 1999-09-14 Olympus Optical Co., Ltd. Scanning probe microscope incorporating an optical microscope
US5796487A (en) * 1996-06-28 1998-08-18 Polaroid Corporation Dark field, photon tunneling imaging systems and methods for optical recording and retrieval
DE19741122C2 (de) * 1997-09-12 2003-09-25 Forschungsverbund Berlin Ev Anordnung zur Vermessung und Strukturierung (Nahfeldanordnung)
JP3416589B2 (ja) 1999-09-14 2003-06-16 理化学研究所 部材の先端部に金属微粒子を生成して固定する方法およびその装置ならびにプローブ
US7170842B2 (en) * 2001-02-15 2007-01-30 Hewlett-Packard Development Company, L.P. Methods for conducting current between a scanned-probe and storage medium
US7234343B2 (en) * 2004-03-08 2007-06-26 Virginia Tech Intellectual Properties, Inc. Method and apparatus for evanescent filed measuring of particle-solid separation

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0112401B1 (de) * 1982-12-27 1987-04-22 International Business Machines Corporation Optisches Nahfeldabtastmikroskop
US5202004A (en) * 1989-12-20 1993-04-13 Digital Instruments, Inc. Scanning electrochemical microscopy
US5105305A (en) * 1991-01-10 1992-04-14 At&T Bell Laboratories Near-field scanning optical microscope using a fluorescent probe

Also Published As

Publication number Publication date
JPH07140155A (ja) 1995-06-02
EP0593835B1 (de) 1997-12-29
US5539197A (en) 1996-07-23
DE69223789D1 (de) 1998-02-05
DE69223789T2 (de) 1998-06-25
JP2555531B2 (ja) 1996-11-20
EP0593835A1 (de) 1994-04-27

Similar Documents

Publication Publication Date Title
US4600302A (en) Flow cytometry apparatus with uniform incoherent light excitation
ATE161636T1 (de) Optisches nahfeldabtastmikroskop
US3864044A (en) Method and apparatus for the analysis of a dispersed phase capable of transmitting and focusing light
BR8907735A (pt) Processo para detectar as propriedades de um campo proximo de luz adjacente a uma area de amostra sobre uma superficie,processo de microscopia e microscopio de efeito tunel com deteccao de fotons
WO2004046307A3 (en) Scanning of biological samples
DE69320992T2 (de) Optisches nahfeldmikroskop
DE3176552D1 (en) Examination apparatus for a finger-relief
HK1052220A1 (en) Method and arrangement for depth resolving optical detection of a probe
KR870009305A (ko) 광학적 정보판독장치
KR940022116A (ko) 주사 근시야 광학/원자력 현미경과, 주사 근시야 광학 원자력 현미경에 사용하기 위한 프로브 및 프로브의 제조방법
SE8503295L (sv) Forfarande och anordning for att detektera, avstandsmeta och avbilda foremal i omholjande grumliga medier med lasrar
KR920700388A (ko) 싱글빔 ac 간섭계
US4297587A (en) Absolute DC system for a laser inspection system
ATE88273T1 (de) Scanner zur optischen abtastung von objekten, insbesondere aufzeichnungsplatten.
KR850008217A (ko) 투명물체내의 결함탐지 방법
DE69105977D1 (de) Gerät und methode zur transmissions- und reflexionsabbildung.
KR960014991A (ko) 광학 프로브 현미경 및 표면 검사 방법
JPS59155825A (ja) 走査装置
EP0291708A3 (en) Apparatus for measuring the velocity of light scattering moving particles
JPH08210829A (ja) 微細表面観察装置
DE4040101A1 (de) Materialfeuchte-messverfahren, verwendung und messeinrichtung zur durchfuehrung des verfahrens
JP2822279B2 (ja) 走査型近視野顕微鏡
JP2000146802A (ja) 近接場光学顕微鏡
ATE110169T1 (de) Vorrichtung zur optischen inspektion von bewegten materialoberflächen.
JPS55411A (en) Surface roughness measurement with laser beam

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties