ATE143175T1 - Dünnschicht-halbleiterbauelement - Google Patents
Dünnschicht-halbleiterbauelementInfo
- Publication number
- ATE143175T1 ATE143175T1 AT91302640T AT91302640T ATE143175T1 AT E143175 T1 ATE143175 T1 AT E143175T1 AT 91302640 T AT91302640 T AT 91302640T AT 91302640 T AT91302640 T AT 91302640T AT E143175 T1 ATE143175 T1 AT E143175T1
- Authority
- AT
- Austria
- Prior art keywords
- thin film
- film semiconductor
- semiconductor component
- layer
- ohmic
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 4
- 239000010409 thin film Substances 0.000 title 1
- 239000002184 metal Substances 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0312—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes
- H10D30/0316—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes of lateral bottom-gate TFTs comprising only a single gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0321—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
- H10D30/6732—Bottom-gate only TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
- H10D30/6743—Silicon
- H10D30/6746—Amorphous silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
- H10F30/282—Insulated-gate field-effect transistors [IGFET], e.g. MISFET [metal-insulator-semiconductor field-effect transistor] phototransistors
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Thin Film Transistor (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Junction Field-Effect Transistors (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2078402A JPH03278470A (ja) | 1990-03-27 | 1990-03-27 | 薄膜半導体装置 |
JP2078401A JPH03278469A (ja) | 1990-03-27 | 1990-03-27 | 薄膜半導体装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE143175T1 true ATE143175T1 (de) | 1996-10-15 |
Family
ID=26419477
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT91302640T ATE143175T1 (de) | 1990-03-27 | 1991-03-26 | Dünnschicht-halbleiterbauelement |
Country Status (4)
Country | Link |
---|---|
US (1) | US5150181A (de) |
EP (1) | EP0449585B1 (de) |
AT (1) | ATE143175T1 (de) |
DE (1) | DE69122148T2 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69117785T2 (de) * | 1990-03-27 | 1997-02-06 | Canon Kk | Dünnschicht-Halbleiterbauelement |
US5254480A (en) * | 1992-02-20 | 1993-10-19 | Minnesota Mining And Manufacturing Company | Process for producing a large area solid state radiation detector |
JP3348531B2 (ja) * | 1994-07-08 | 2002-11-20 | ソニー株式会社 | 薄膜トランジスタの水素化方法および薄膜トランジスタの形成方法 |
JPH09270519A (ja) * | 1996-03-31 | 1997-10-14 | Furontetsuku:Kk | 薄膜トランジスタの製造方法 |
JP3082679B2 (ja) | 1996-08-29 | 2000-08-28 | 日本電気株式会社 | 薄膜トランジスタおよびその製造方法 |
KR100537376B1 (ko) * | 1998-12-16 | 2006-03-14 | 엘지.필립스 엘시디 주식회사 | 박막트랜지스터 광센서의 제조방법 |
KR100776514B1 (ko) * | 2000-12-30 | 2007-11-16 | 엘지.필립스 엘시디 주식회사 | 액정표시장치 및 그 제조방법 |
KR20070059559A (ko) * | 2005-12-07 | 2007-06-12 | 삼성전자주식회사 | 표시 장치 및 그 제조 방법 |
KR20110081694A (ko) * | 2010-01-08 | 2011-07-14 | 삼성모바일디스플레이주식회사 | 박막 트랜지스터의 제조 방법 및 표시 장치의 제조 방법 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4522663A (en) * | 1980-09-09 | 1985-06-11 | Sovonics Solar Systems | Method for optimizing photoresponsive amorphous alloys and devices |
US4441113A (en) * | 1981-02-13 | 1984-04-03 | Energy Conversion Devices, Inc. | P-Type semiconductor material having a wide band gap |
JPS5961964A (ja) * | 1982-10-01 | 1984-04-09 | Fujitsu Ltd | 薄膜トランジスタの製造方法 |
JPH0614560B2 (ja) * | 1983-03-11 | 1994-02-23 | キヤノン株式会社 | フォトセンサ |
JPS60101940A (ja) * | 1983-11-07 | 1985-06-06 | Ricoh Co Ltd | イメ−ジセンサ |
JPS6129170A (ja) * | 1984-07-19 | 1986-02-10 | Canon Inc | フオトセンサ及びその製造法 |
JPS6213274A (ja) * | 1985-07-11 | 1987-01-22 | Honda Motor Co Ltd | 自動シ−ム溶接装置における軌道修正方法及び軌道修正装置 |
JPH06104370B2 (ja) * | 1985-07-12 | 1994-12-21 | キヤノン株式会社 | 記録装置 |
JPS639157A (ja) * | 1986-06-30 | 1988-01-14 | Canon Inc | 薄膜トランジスタの製造方法 |
JPH0668484B2 (ja) * | 1985-09-25 | 1994-08-31 | 株式会社神戸製鋼所 | ステンレス被覆管の超音波探傷方法 |
JPH0740711B2 (ja) * | 1986-06-20 | 1995-05-01 | キヤノン株式会社 | 光センサの駆動方法及び画像入力装置 |
JPH01137674A (ja) * | 1987-11-25 | 1989-05-30 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタ |
-
1991
- 1991-03-26 US US07/675,280 patent/US5150181A/en not_active Expired - Fee Related
- 1991-03-26 EP EP91302640A patent/EP0449585B1/de not_active Expired - Lifetime
- 1991-03-26 DE DE69122148T patent/DE69122148T2/de not_active Expired - Fee Related
- 1991-03-26 AT AT91302640T patent/ATE143175T1/de active
Also Published As
Publication number | Publication date |
---|---|
DE69122148T2 (de) | 1997-02-06 |
US5150181A (en) | 1992-09-22 |
EP0449585B1 (de) | 1996-09-18 |
EP0449585A1 (de) | 1991-10-02 |
DE69122148D1 (de) | 1996-10-24 |
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