AT317573B - Längenmeßgerät - Google Patents
LängenmeßgerätInfo
- Publication number
- AT317573B AT317573B AT793270A AT793270A AT317573B AT 317573 B AT317573 B AT 317573B AT 793270 A AT793270 A AT 793270A AT 793270 A AT793270 A AT 793270A AT 317573 B AT317573 B AT 317573B
- Authority
- AT
- Austria
- Prior art keywords
- measuring device
- length measuring
- length
- measuring
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
- G01N2223/0566—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction analysing diffraction pattern
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH835770A CH509567A (de) | 1970-06-04 | 1970-06-04 | Längenmessgerät zur Bestimmung des Abstandes von auf einem durchsichtigen Aufzeichnungsträger befindlichen Markierungen längs einer Geraden |
Publications (1)
Publication Number | Publication Date |
---|---|
AT317573B true AT317573B (de) | 1974-09-10 |
Family
ID=4339086
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT793270A AT317573B (de) | 1970-06-04 | 1970-09-01 | Längenmeßgerät |
Country Status (3)
Country | Link |
---|---|
AT (1) | AT317573B (de) |
CH (1) | CH509567A (de) |
DE (1) | DE2127627A1 (de) |
-
1970
- 1970-06-04 CH CH835770A patent/CH509567A/de not_active IP Right Cessation
- 1970-09-01 AT AT793270A patent/AT317573B/de not_active IP Right Cessation
-
1971
- 1971-06-03 DE DE19712127627 patent/DE2127627A1/de active Pending
Also Published As
Publication number | Publication date |
---|---|
CH509567A (de) | 1971-06-30 |
DE2127627A1 (de) | 1972-01-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ELJ | Ceased due to non-payment of the annual fee |