10 January 2014, Volume 53, Issue 2, pp. 156-315
23 articles
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Differential interference contrast (DIC) images obtained for a liquid phase epitaxy-grown GaAs sample surface using a Sagnac interferometer-based DIC microscope for different biased phase difference between the laterally sheared interfering white light beams. For details, see Chatterjee and Kumar, pp. 296-300.
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