20 September 2009, Volume 48, Issue 27, pp. 5015-5204
26 articles
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A Fourier transform of the far-field diffraction intensity pattern of a wave through a tri-arm multipinhole plate (top) and the wavefront measured by using the tri-arm (or Y-shaped) multipinhole interferometer (bottom). For details, see the paper by Wei et al., pp. 5099-5104.
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