Visualized Multiprobe Electrical Impedance Measurements with STM Tips Using Shear Force Feedback Control
<p>Schematic representation of the geometries of the two tips. The wires should be tilted at a minimum angle <span class="html-italic">β</span> from the horizontal axis to ensure that the tip end interacts with the sample. Additionally, the wires should be tilted a minimum angle <span class="html-italic">β</span>’ from the vertical axes to ensure the tip visibility from the optical microscope.</p> "> Figure 2
<p>(<b>a</b>) 3D CAD design of the head; (<b>b</b>) Photograph of the designed head for the multitip system. The wire and the QTF can be positioned independently and precisely by using micrometric screws. Rubber strips are used to maintain the mechanical contact between the wire and the QTF without the need of any glue.</p> "> Figure 3
<p>The nanopositioning station with the end-effectors integrated. Microstepper motors are used for coarse positioning and piezoelectric actuators for fine positioning. The sample and the end-effectors are visualized by an upright optical microscope.</p> "> Figure 4
<p>Scheme of the electronics and control system. The shear force between the tips and the surface are measured through custom-designed electronics, and the digital controller uses them to control the tip-sample distance (PI control) by adjusting the <span class="html-italic">Z</span>-axis of the piezoelectric actuators. The impedance between the two tips is measured independently by an I–V and a lock-in amplifier.</p> "> Figure 5
<p>Series of I–V curves over the resistor sample recorded while changing the tip-sample distance. The non-linear behavior due to the tip-sample capacitance is observed for distances greater than 150 nm.</p> "> Figure 6
<p>Capacitors measurements. (<b>a</b>) Curves obtained at 5 kHz over known-value capacitors by varying the voltage amplitude and measuring the current. (<b>b</b>) Error in the measurements. The I–V curves display the expected linear behavior. The measured values are in great accordance with nominal values, with errors lower than 6%. Linear fit equation is 0.07 + 1.045x with adjusted R<sup>2</sup> of 0.9997.</p> "> Figure 7
<p>Microparticle measurement experiment as visualized with the optical microscope at distances of 22 μm, 45 μm, and 56 μm between the tips. (<b>a</b>) Both tips over the same microparticle; (<b>b</b>) tips over microparticles in contact with each other; (<b>c</b>) tips over microparticles that are not in contact with each other.</p> "> Figure 8
<p>Current–voltage curves with one tip over a microparticle and the second tip at different distances. As expected, the impedance increased with the distance between the tips, and as the tips contacted the same microparticle (a distance of 22 μm), two microparticles in contact with each other, (a distance of 45 μm) and two microparticles not in contact with each other (a distance 56 of μm).</p> ">
Abstract
:1. Introduction
2. Shear Force Control on Metallic Sharp Probes
3. Multiprobe Experimental Setup
4. Results and Discussion
4.1. Calibration Experiments
4.2. Microparticle Impedance Measurement
5. Conclusions
Acknowledgments
Author Contributions
Conflicts of Interest
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Botaya, L.; Coromina, X.; Samitier, J.; Puig-Vidal, M.; Otero, J. Visualized Multiprobe Electrical Impedance Measurements with STM Tips Using Shear Force Feedback Control. Sensors 2016, 16, 757. https://doi.org/10.3390/s16060757
Botaya L, Coromina X, Samitier J, Puig-Vidal M, Otero J. Visualized Multiprobe Electrical Impedance Measurements with STM Tips Using Shear Force Feedback Control. Sensors. 2016; 16(6):757. https://doi.org/10.3390/s16060757
Chicago/Turabian StyleBotaya, Luis, Xavier Coromina, Josep Samitier, Manel Puig-Vidal, and Jorge Otero. 2016. "Visualized Multiprobe Electrical Impedance Measurements with STM Tips Using Shear Force Feedback Control" Sensors 16, no. 6: 757. https://doi.org/10.3390/s16060757