Visualization and Localization of Submicron-Sized Ammonium Sulfate Particles on Needles of Japanese Larch (Larix kaempferi) and Japanese Cedar (Cryptomeria japonica) and Leaves of Japanese Beech (Fagus crenata) and Japanese Chinquapin (Castanopsis sieboldii) after Artificial Exposure
<p>Secondary electron images captured by field-emission scanning electron microscope (FE-SEM) and energy dispersive X-ray spectrometry (EDX) spectra of the silicon substrates. (<b>a</b>) Ammonium sulfate (AS) particles (diameter 300–600 nm) were distributed on the silicon substrates and were not aggregated. (<b>b</b>) Higher magnification image of an AS particle. (<b>c</b>) EDX spectrum of Spot 1 in (<b>b</b>) showing a clear peak corresponding to sulfur. (<b>d</b>) EDX spectrum of Spot 2 in (<b>b</b>). No peaks corresponding to sulfur were obtained from the silicon substrate. Black arrows indicate focal points for the EDX analysis. White arrows indicate sulfur peaks.</p> "> Figure 2
<p>Secondary electron images captured by field-emission scanning electron microscope (FE-SEM) and energy dispersive X-ray spectrometry (EDX) spectra of leaves from Japanese cedar (<span class="html-italic">Cryptomeria japonica</span>) seedlings. (<b>a</b>) Secondary electron image of leaves from seedlings after exposure to ammonium sulfate (AS) particles. The leaf surface was covered with waxy structures. (<b>b</b>) Backscattered electron image of the leaves corresponding to (<b>a</b>). AS particles (white specks) contrasted with the waxy structures. (<b>c</b>–<b>f</b>). EDX spectra of spots 1 (<b>c</b>), 2 (<b>d</b>), 3 (<b>e</b>), and 4 (<b>f</b>) in (<b>b</b>). Clear peaks corresponding to sulfur were observed in particles (<b>c</b>–<b>e</b>), but no peak was observed in areas without such particles (<b>f</b>). Black arrows indicate focal points for the EDX analysis. Arrowheads indicate indistinguishable particles from the waxy structures shown in (<b>a</b>). White arrows indicate sulfur peaks.</p> "> Figure 3
<p>Field-emission electron scanning microscopy (FE-SEM) and energy dispersive X-ray spectrometry (EDX) images of ammonium sulfate (AS) particles on leaves from Japanese beech (<span class="html-italic">Fagus crenata</span>) seedlings. (<b>a</b>) Secondary electron image of leaves from <span class="html-italic">Fagus crenata</span> seedlings after exposure to AS particles. Non-aggregated AS particles were distributed on the leaves. (<b>b</b>) Elemental mapping image of the area marked by the rectangle in (<b>a</b>). Particles containing sulfur are shown in red. Arrowheads indicate particles containing sulfur. Small arrowhead indicates a particle without sulfur.</p> "> Figure 4
<p>The secondary electron images of the leaves and needles after exposure to ammonium sulfate (AS) particles: <span class="html-italic">Cryptomeria japonica</span> (<b>a</b>,<b>b</b>), Japanese larch (<span class="html-italic">Larix kaempferi</span>) (<b>c</b>,<b>d</b>), <span class="html-italic">Fagus crenata</span> (<b>e</b>), and Japanese chinquapin (<span class="html-italic">Castanopsis sieboldii</span>) (<b>f</b>). The surfaces of the leaves were either covered with tubules (<b>a</b>,<b>c</b>), smooth layers (<b>e</b>), and plates (<b>f</b>) of waxy structures, or rarely covered with these structures (<b>b</b>,<b>d</b>). AS particles were deposited on both dense (<b>a</b>,<b>c</b>) and sparse (<b>b</b>,<b>d</b>) areas of the waxy tubule structures. Black arrows indicate AS particles.</p> ">
Abstract
:1. Introduction
2. Materials and Methods
2.1. Plant Materials
2.2. Exposure to Ammonium Sulfate Particles
2.3. FE-SEM and Energy Dispersive X-ray Spectrometry (EDX) Analysis
3. Results and Discussion
3.1. Visualization of Deposited Ammonium Sulfate Particles on the Surfaces of Needles and Leaves after Exposure
3.2. Localization of Ammonium Sulfate Particles on the Surface of Leaves and Needles
4. Conclusions
Author Contributions
Funding
Acknowledgments
Conflicts of Interest
References
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Yamane, K.; Nakaba, S.; Yamaguchi, M.; Kuroda, K.; Sano, Y.; Lenggoro, I.W.; Izuta, T.; Funada, R. Visualization and Localization of Submicron-Sized Ammonium Sulfate Particles on Needles of Japanese Larch (Larix kaempferi) and Japanese Cedar (Cryptomeria japonica) and Leaves of Japanese Beech (Fagus crenata) and Japanese Chinquapin (Castanopsis sieboldii) after Artificial Exposure. Forests 2019, 10, 1151. https://doi.org/10.3390/f10121151
Yamane K, Nakaba S, Yamaguchi M, Kuroda K, Sano Y, Lenggoro IW, Izuta T, Funada R. Visualization and Localization of Submicron-Sized Ammonium Sulfate Particles on Needles of Japanese Larch (Larix kaempferi) and Japanese Cedar (Cryptomeria japonica) and Leaves of Japanese Beech (Fagus crenata) and Japanese Chinquapin (Castanopsis sieboldii) after Artificial Exposure. Forests. 2019; 10(12):1151. https://doi.org/10.3390/f10121151
Chicago/Turabian StyleYamane, Kenichi, Satoshi Nakaba, Masahiro Yamaguchi, Katsushi Kuroda, Yuzou Sano, I. Wuled Lenggoro, Takeshi Izuta, and Ryo Funada. 2019. "Visualization and Localization of Submicron-Sized Ammonium Sulfate Particles on Needles of Japanese Larch (Larix kaempferi) and Japanese Cedar (Cryptomeria japonica) and Leaves of Japanese Beech (Fagus crenata) and Japanese Chinquapin (Castanopsis sieboldii) after Artificial Exposure" Forests 10, no. 12: 1151. https://doi.org/10.3390/f10121151