Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO

Special Section on Analog Circuits and Related SoC Integration Technologies

Junichiro KADOMOTO, So HASEGAWA, Yusuke KIUCHI, Atsutake KOSUGE, Tadahiro KURODA

Author information

Keywords: TCI, 3D integration, LC-VCO, EMI

JOURNAL RESTRICTED ACCESS

2016 Volume E99.C Issue 6 Pages 659-662

DOI https://doi.org/10.1587/transele.E99.C.659

Details

Abstract

This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.

Corresponding author

Register with J-STAGE for free!