Abstract
Molecular monolayers and similar nanoarchitectures are indicative of the promising future of nanotechnology. Therefore, many scientists recently devoted their efforts to the synthesis, characterization, and properties of mono- and multilayer-based systems. In this context, X-ray photoelectron spectroscopy is an important technique for the in-depth chemical and structural characterization of nanoscopic systems. In fact, it is a surface technique suitable for probing thicknesses of the same order of the photoelectron inelastic mean free paths (a few tens of ångströms) and allows one to immediately obtain qualitative and quantitative data, film thickness, surface coverage, molecule footprint, oxidation states, and presence of functional groups. Nevertheless, other techniques are important in obtaining a complete spectroscopic characterization of the investigated systems. Therefore, in the present review we report on X-ray photoelectron spectroscopy of self-assembled molecular mono- and multilayer materials including some examples on which other characterization techniques produced important results.

X-ray photoelectron spectroscopy revealed to be an important technique for an in-depth chemical and structural characterization of self-assembled molecular mono- and multi-layer materials














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The author thanks the FIRB project ITALNANONET (RBPR05JH2P), MIUR: P.R.I.N. 2008 and University of Catania.
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Published in the topical collection Characterization of Thin Films and Membranes with guest editors Daniel Mandler and Pankaj Vadgama.
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Gulino, A. Structural and electronic characterization of self-assembled molecular nanoarchitectures by X-ray photoelectron spectroscopy. Anal Bioanal Chem 405, 1479–1495 (2013). https://doi.org/10.1007/s00216-012-6394-8
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DOI: https://doi.org/10.1007/s00216-012-6394-8