"Comparison of Single-Particle Monte Carlo Simulation with Measured Output ..."

Fabian M. Bufler et al. (2002)

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DOI: 10.1080/106551402100012327

access: open

type: Journal Article

metadata version: 2024-05-29

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  - https://dblp.org/rec/journals/vlsi/BuflerSZIAF02
Fabian M. Bufler, Andreas Schenk, Christoph Zechner, Natsuko Inada, Yoshinori Asahi, Wolfgang Fichtner:
Comparison of Single-Particle Monte Carlo Simulation with Measured Output Characteristics of an 0.1µm n-MOSFET. VLSI Design 15(4): 715-720 (2002)

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