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"Two-Dimensional Principal Component Analysis-Based Convolutional ..."
Jianbo Yu, Jiatong Liu (2021)
- Jianbo Yu
, Jiatong Liu:
Two-Dimensional Principal Component Analysis-Based Convolutional Autoencoder for Wafer Map Defect Detection. IEEE Trans. Ind. Electron. 68(9): 8789-8797 (2021)

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