"The effect of gate overlap on the device degradation in IGZO thin film ..."

Dae Hyun Kim, Jong Tae Park (2014)

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DOI: 10.1016/J.MICROREL.2014.07.011

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type: Journal Article

metadata version: 2022-04-20

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Dae Hyun Kim, Jong Tae Park:
The effect of gate overlap on the device degradation in IGZO thin film transistors. Microelectron. Reliab. 54(9-10): 2167-2170 (2014)

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