"Characterization and modeling of dynamic variability induced by BTI in ..."

Xavier Garros et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.11.025

access: closed

type: Journal Article

metadata version: 2020-02-22

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Xavier Garros, Antoine Laurent, Alexandre Subirats, X. Federspiel, E. Vincent, Gilles Reimbold:
Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors. Microelectron. Reliab. 80: 100-108 (2018)

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