"Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and ..."

Mustapha Faqir et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.020

access: closed

type: Journal Article

metadata version: 2023-09-30

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Mustapha Faqir, Mohsine Bouya, Nathalie Malbert, Nathalie Labat, D. Carisetti, Benoit Lambert, Giovanni Verzellesi, Fausto Fantini:
Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations. Microelectron. Reliab. 50(9-11): 1520-1522 (2010)

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