"Hot carrier and PBTI induced degradation in silicon nanowire ..."

Jin Hyung Choi et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.044

access: closed

type: Journal Article

metadata version: 2022-10-02

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Jin Hyung Choi, Jin-Woo Han, Chong-Gun Yu, Jong Tae Park:
Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs. Microelectron. Reliab. 54(9-10): 2325-2328 (2014)

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