"Defect-LoRA: Controllable defect data augmentation based on low-rank ..."

Zhe Zhang, Yuhang Zhou, Jie Ma (2025)

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DOI: 10.1016/J.ESWA.2024.126251

access: closed

type: Journal Article

metadata version: 2025-01-25

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Zhe Zhang, Yuhang Zhou, Jie Ma:
Defect-LoRA: Controllable defect data augmentation based on low-rank adaptation for surface defect recognition under limited data. Expert Syst. Appl. 268: 126251 (2025)

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