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ORCID"Universal Test Interface for Embedded-DRAM Testing."
Shinji Miyano, Katsuhiko Sato, Kenji Numata (1999)
- Shinji Miyano, Katsuhiko Sato, Kenji Numata:
Universal Test Interface for Embedded-DRAM Testing. IEEE Des. Test Comput. 16(1): 53-58 (1999)
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