"Enhanced Data Pattern to Detect Defects in Flash Memory Address Decoder."

Weng Joe Soh, Chen He (2022)

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DOI: 10.1109/ITC50671.2022.00069

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Weng Joe Soh, Chen He:
Enhanced Data Pattern to Detect Defects in Flash Memory Address Decoder. ITC 2022: 544-548

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