"High-Resolution Analog Measurement on Mixed-Signal LSI Tester."

Kohei Akiyama et al. (1989)

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DOI: 10.1109/TEST.1989.82286

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Kohei Akiyama, Hiroshi Nishimura, Kyoji Anazawa, Akito Kishida, Nobuyuki Kasuga:
High-Resolution Analog Measurement on Mixed-Signal LSI Tester. ITC 1989: 124-128

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