"Hardware Efficient Built-in Self-test Architecture for Power and Ground ..."

Donghyun Han et al. (2021)

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DOI: 10.1109/ISOCC53507.2021.9613959

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-27

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Donghyun Han, Youngkwang Lee, Sooryeong Lee, Sungho Kang:
Hardware Efficient Built-in Self-test Architecture for Power and Ground TSVs in 3D IC. ISOCC 2021: 101-102

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