"Batch Process Fault Monitoring Based on LPGD-kNN and Its Applications in ..."

Ting Li et al. (2017)

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DOI: 10.1007/978-3-319-70087-8_56

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-05

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Ting Li, Dongsheng Yang, Qinglai Wei, Huaguang Zhang:
Batch Process Fault Monitoring Based on LPGD-kNN and Its Applications in Semiconductor Industry. ICONIP (1) 2017: 534-544

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