"Fully X-tolerant, very high scan compression."

Peter Wohl et al. (2010)

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DOI: 10.1145/1837274.1837366

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Peter Wohl, John A. Waicukauski, Frederic Neuveux, Emil Gizdarski:
Fully X-tolerant, very high scan compression. DAC 2010: 362-367

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