"Power-Safe Application of Transition Delay Fault Patterns Considering ..."

Wei Zhao et al. (2010)

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DOI: 10.1109/ATS.2010.58

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Wei Zhao, Junxia Ma, Mohammad Tehranipoor, Sreejit Chakravarty:
Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test. Asian Test Symposium 2010: 301-306

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