"Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode ..."

Sying-Jyan Wang et al. (2007)

> Home

Details and statistics

DOI: 10.1109/ATS.2007.33

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ats/WangTWL07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/WangTWL07
Sying-Jyan Wang, Po-Chang Tsai, Hung-Ming Weng, Katherine Shu-Min Li:
Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture. ATS 2007: 95-100

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.